CN101989640A - 晶片加工方法 - Google Patents
晶片加工方法 Download PDFInfo
- Publication number
- CN101989640A CN101989640A CN2010102463550A CN201010246355A CN101989640A CN 101989640 A CN101989640 A CN 101989640A CN 2010102463550 A CN2010102463550 A CN 2010102463550A CN 201010246355 A CN201010246355 A CN 201010246355A CN 101989640 A CN101989640 A CN 101989640A
- Authority
- CN
- China
- Prior art keywords
- sapphire substrate
- wafer
- spacing track
- spacing
- metamorphic layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003672 processing method Methods 0.000 title claims abstract description 19
- 229910052594 sapphire Inorganic materials 0.000 claims abstract description 66
- 239000010980 sapphire Substances 0.000 claims abstract description 66
- 239000000758 substrate Substances 0.000 claims abstract description 65
- 230000003287 optical effect Effects 0.000 claims abstract description 20
- 230000001678 irradiating effect Effects 0.000 abstract description 9
- 238000000034 method Methods 0.000 abstract description 9
- 235000012431 wafers Nutrition 0.000 description 49
- 230000005855 radiation Effects 0.000 description 15
- 230000015572 biosynthetic process Effects 0.000 description 8
- 150000004767 nitrides Chemical class 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000001514 detection method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000005520 cutting process Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 238000005286 illumination Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229910009372 YVO4 Inorganic materials 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Dicing (AREA)
- Laser Beam Processing (AREA)
- Led Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009181505A JP2011035253A (ja) | 2009-08-04 | 2009-08-04 | ウエーハの加工方法 |
JP2009-181505 | 2009-08-04 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN101989640A true CN101989640A (zh) | 2011-03-23 |
Family
ID=43746078
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010102463550A Pending CN101989640A (zh) | 2009-08-04 | 2010-08-04 | 晶片加工方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2011035253A (ko) |
KR (1) | KR20110014102A (ko) |
CN (1) | CN101989640A (ko) |
TW (1) | TW201110221A (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102861992A (zh) * | 2011-07-05 | 2013-01-09 | 株式会社迪思科 | 蓝宝石基板的加工方法 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5886603B2 (ja) * | 2011-11-11 | 2016-03-16 | 株式会社ディスコ | 光デバイスウエーハの加工方法 |
CN103311115A (zh) * | 2012-03-16 | 2013-09-18 | 鑫晶钻科技股份有限公司 | 可辨识正反面的蓝宝石基板的制造方法 |
JP2014079791A (ja) * | 2012-10-17 | 2014-05-08 | Disco Abrasive Syst Ltd | レーザー加工方法 |
JP2017059685A (ja) * | 2015-09-16 | 2017-03-23 | 株式会社ディスコ | ウエーハの加工方法 |
JP6504977B2 (ja) * | 2015-09-16 | 2019-04-24 | 株式会社ディスコ | ウエーハの加工方法 |
JP2017059686A (ja) * | 2015-09-16 | 2017-03-23 | 株式会社ディスコ | ウエーハの加工方法 |
JP6521837B2 (ja) * | 2015-11-05 | 2019-05-29 | 株式会社ディスコ | ウエーハの加工方法 |
JP6576211B2 (ja) * | 2015-11-05 | 2019-09-18 | 株式会社ディスコ | ウエーハの加工方法 |
JP6576212B2 (ja) * | 2015-11-05 | 2019-09-18 | 株式会社ディスコ | ウエーハの加工方法 |
JP6721420B2 (ja) * | 2016-06-02 | 2020-07-15 | 株式会社ディスコ | 漏れ光検出方法 |
JP6745165B2 (ja) * | 2016-08-09 | 2020-08-26 | 株式会社ディスコ | ウェーハの加工方法 |
JP6821261B2 (ja) * | 2017-04-21 | 2021-01-27 | 株式会社ディスコ | 被加工物の加工方法 |
JP6837905B2 (ja) * | 2017-04-25 | 2021-03-03 | 株式会社ディスコ | ウエーハの加工方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1467863A (zh) * | 2002-06-10 | 2004-01-14 | 松下电器产业株式会社 | 半导体晶片、半导体装置及其制造方法 |
US20080023456A1 (en) * | 2006-07-25 | 2008-01-31 | Yosuke Watanabe | Method of forming embrittled areas inside wafer for division |
CN101452828A (zh) * | 2007-12-03 | 2009-06-10 | 株式会社迪思科 | 晶片的分割方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4767711B2 (ja) * | 2006-02-16 | 2011-09-07 | 株式会社ディスコ | ウエーハの分割方法 |
JP5225639B2 (ja) * | 2007-09-06 | 2013-07-03 | 浜松ホトニクス株式会社 | 半導体レーザ素子の製造方法 |
-
2009
- 2009-08-04 JP JP2009181505A patent/JP2011035253A/ja active Pending
-
2010
- 2010-06-28 TW TW099121028A patent/TW201110221A/zh unknown
- 2010-07-29 KR KR1020100073385A patent/KR20110014102A/ko not_active Application Discontinuation
- 2010-08-04 CN CN2010102463550A patent/CN101989640A/zh active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1467863A (zh) * | 2002-06-10 | 2004-01-14 | 松下电器产业株式会社 | 半导体晶片、半导体装置及其制造方法 |
US20080023456A1 (en) * | 2006-07-25 | 2008-01-31 | Yosuke Watanabe | Method of forming embrittled areas inside wafer for division |
CN101452828A (zh) * | 2007-12-03 | 2009-06-10 | 株式会社迪思科 | 晶片的分割方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102861992A (zh) * | 2011-07-05 | 2013-01-09 | 株式会社迪思科 | 蓝宝石基板的加工方法 |
CN102861992B (zh) * | 2011-07-05 | 2016-03-23 | 株式会社迪思科 | 蓝宝石基板的加工方法 |
Also Published As
Publication number | Publication date |
---|---|
TW201110221A (en) | 2011-03-16 |
KR20110014102A (ko) | 2011-02-10 |
JP2011035253A (ja) | 2011-02-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20110323 |