CN101894777A - 测试分选机的半导体器件接触装置及使用其的测试分选机 - Google Patents

测试分选机的半导体器件接触装置及使用其的测试分选机 Download PDF

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Publication number
CN101894777A
CN101894777A CN2010101766109A CN201010176610A CN101894777A CN 101894777 A CN101894777 A CN 101894777A CN 2010101766109 A CN2010101766109 A CN 2010101766109A CN 201010176610 A CN201010176610 A CN 201010176610A CN 101894777 A CN101894777 A CN 101894777A
Authority
CN
China
Prior art keywords
semiconductor device
test
insertion section
accommodation hole
support portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2010101766109A
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English (en)
Chinese (zh)
Inventor
申范浩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FUTURE INDUSTRIES Co Ltd
Mirae Corp
Original Assignee
FUTURE INDUSTRIES Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FUTURE INDUSTRIES Co Ltd filed Critical FUTURE INDUSTRIES Co Ltd
Publication of CN101894777A publication Critical patent/CN101894777A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
CN2010101766109A 2009-05-19 2010-05-19 测试分选机的半导体器件接触装置及使用其的测试分选机 Pending CN101894777A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2009-0043604 2009-05-19
KR1020090043604A KR101039857B1 (ko) 2009-05-19 2009-05-19 테스트 핸들러용 소자 접속장치 및 이를 이용한 테스트 핸들러

Publications (1)

Publication Number Publication Date
CN101894777A true CN101894777A (zh) 2010-11-24

Family

ID=43103927

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010101766109A Pending CN101894777A (zh) 2009-05-19 2010-05-19 测试分选机的半导体器件接触装置及使用其的测试分选机

Country Status (3)

Country Link
KR (1) KR101039857B1 (ko)
CN (1) CN101894777A (ko)
TW (1) TW201042725A (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104338682B (zh) * 2013-07-26 2017-04-12 泰克元有限公司 用于测试分选机的匹配板的推动件组件

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102836829A (zh) * 2012-09-19 2012-12-26 无锡红光微电子有限公司 To251/252分选机进料区保持块结构
KR101348422B1 (ko) * 2013-10-08 2014-01-10 주식회사 아이티엔티 자동 테스트 장비의 포고 블록 장치
KR101650520B1 (ko) * 2015-01-13 2016-08-23 주식회사 아이에스시 검사용 푸셔장치
KR101863559B1 (ko) * 2016-10-24 2018-06-01 (주) 나노에이스 테스트 핸들러 매치플레이트용 푸셔 조립체
KR102012745B1 (ko) * 2018-08-17 2019-08-21 (주) 나노에이스 테스트 핸들러 매치플레이트를 위한 헤드 교체 및 변위형 푸싱유닛
KR102103339B1 (ko) * 2018-12-28 2020-04-22 (주) 나노에이스 테스트 핸들러 매치플레이트를 위한 원스텝 탈착형 헤드를 갖는 푸싱유닛
KR102239739B1 (ko) * 2019-04-15 2021-04-13 주식회사 아테코 전자부품 테스트 핸들러
KR102227346B1 (ko) * 2019-11-07 2021-03-12 주식회사 아테코 전자부품 테스트 핸들러
TWI744205B (zh) * 2021-03-16 2021-10-21 力成科技股份有限公司 測試分類機的共用型匹配板

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1203884A (zh) * 1997-04-17 1999-01-06 株式会社爱德万测试 半导体器件用托盘取出装置和半导体器件用托盘收存装置
US20060170412A1 (en) * 2005-01-28 2006-08-03 Mirae Corporation Sokcet assembly for testing semiconductor device
CN1911537A (zh) * 2005-08-09 2007-02-14 未来产业株式会社 Ic分类器
KR20070077365A (ko) * 2006-01-23 2007-07-26 미래산업 주식회사 반도체 소자 테스트 핸들러의 소자 접속장치
CN101166897A (zh) * 2005-04-27 2008-04-23 坂东机工株式会社 往复式发动机

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100865132B1 (ko) * 2007-01-11 2008-10-24 가부시키가이샤 아드반테스트 누름 부재 및 전자 부품 핸들링 장치
KR20080002841U (ko) * 2007-01-22 2008-07-25 (주)테크윙 테스트핸들러의 매치플레이트용 푸셔블록

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1203884A (zh) * 1997-04-17 1999-01-06 株式会社爱德万测试 半导体器件用托盘取出装置和半导体器件用托盘收存装置
US20060170412A1 (en) * 2005-01-28 2006-08-03 Mirae Corporation Sokcet assembly for testing semiconductor device
CN101166897A (zh) * 2005-04-27 2008-04-23 坂东机工株式会社 往复式发动机
CN1911537A (zh) * 2005-08-09 2007-02-14 未来产业株式会社 Ic分类器
KR20070077365A (ko) * 2006-01-23 2007-07-26 미래산업 주식회사 반도체 소자 테스트 핸들러의 소자 접속장치

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104338682B (zh) * 2013-07-26 2017-04-12 泰克元有限公司 用于测试分选机的匹配板的推动件组件
CN106903066A (zh) * 2013-07-26 2017-06-30 泰克元有限公司 用于测试分选机的匹配板的推动件组件
CN106903066B (zh) * 2013-07-26 2019-06-21 泰克元有限公司 用于测试分选机的匹配板的推动件组件

Also Published As

Publication number Publication date
KR20100124544A (ko) 2010-11-29
TW201042725A (en) 2010-12-01
KR101039857B1 (ko) 2011-06-09

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Application publication date: 20101124