CN101821947B - 容量变化检测电路、触摸面板及判定方法 - Google Patents

容量变化检测电路、触摸面板及判定方法 Download PDF

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Publication number
CN101821947B
CN101821947B CN2008801111875A CN200880111187A CN101821947B CN 101821947 B CN101821947 B CN 101821947B CN 2008801111875 A CN2008801111875 A CN 2008801111875A CN 200880111187 A CN200880111187 A CN 200880111187A CN 101821947 B CN101821947 B CN 101821947B
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CN
China
Prior art keywords
signal
resistance
unit
electrode
detection circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2008801111875A
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English (en)
Chinese (zh)
Other versions
CN101821947A (zh
Inventor
山内一人
村山靖典
田中贞彦
泷泽敬太郎
山野上耕一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Motors Corp
Visteon Japan Ltd
Original Assignee
Mitsubishi Motors Corp
Visteon Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Motors Corp, Visteon Japan Ltd filed Critical Mitsubishi Motors Corp
Publication of CN101821947A publication Critical patent/CN101821947A/zh
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Expired - Fee Related legal-status Critical Current
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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/945—Proximity switches
    • H03K17/955—Proximity switches using a capacitive detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
    • H03K2217/96—Touch switches
    • H03K2217/9607—Capacitive touch switches
    • H03K2217/96071—Capacitive touch switches characterised by the detection principle
    • H03K2217/96072—Phase comparison, i.e. where a phase comparator receives at one input the signal directly from the oscillator, at a second input the same signal but delayed, with a delay depending on a sensing capacitance

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Electronic Switches (AREA)
  • Position Input By Displaying (AREA)
  • Geophysics And Detection Of Objects (AREA)
CN2008801111875A 2007-10-10 2008-10-08 容量变化检测电路、触摸面板及判定方法 Expired - Fee Related CN101821947B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007-264112 2007-10-10
JP2007264112A JP4941938B2 (ja) 2007-10-10 2007-10-10 容量変化検出回路、タッチパネル及び判定方法
PCT/JP2008/068300 WO2009048077A1 (ja) 2007-10-10 2008-10-08 容量変化検出回路、タッチパネル及び判定方法

Publications (2)

Publication Number Publication Date
CN101821947A CN101821947A (zh) 2010-09-01
CN101821947B true CN101821947B (zh) 2012-09-05

Family

ID=40549221

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2008801111875A Expired - Fee Related CN101821947B (zh) 2007-10-10 2008-10-08 容量变化检测电路、触摸面板及判定方法

Country Status (7)

Country Link
US (1) US8587553B2 (enExample)
JP (1) JP4941938B2 (enExample)
KR (1) KR101126508B1 (enExample)
CN (1) CN101821947B (enExample)
DE (1) DE112008002731B4 (enExample)
RU (1) RU2433526C1 (enExample)
WO (1) WO2009048077A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101499024B1 (ko) * 2012-11-28 2015-03-06 에이디반도체(주) 정전용량 센서 장치
JP6115888B2 (ja) * 2013-03-29 2017-04-19 Toto株式会社 静電容量式タッチセンサ
JP6168470B2 (ja) * 2013-03-29 2017-07-26 Toto株式会社 静電容量式タッチセンサ
DE102017105957B3 (de) 2017-03-20 2018-09-13 Hochschule Osnabrück Bedienelement zum Schalten einer elektronischen Einrichtung
DE212018000330U1 (de) * 2017-11-10 2020-05-15 Alps Alpine Co., Ltd. Eingabevorrichtung
EP3547092A4 (en) * 2018-02-05 2020-02-12 Shenzhen Goodix Technology Co., Ltd. TOUCH CONTROL DEVICE, DEMODULATION METHOD, AND TOUCH CONTROL SYSTEM

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000295183A (ja) * 1999-03-29 2000-10-20 Gsl Research Technology Ltd タッチリンク
JP2003046383A (ja) * 2001-07-30 2003-02-14 Omron Corp タッチセンサ
CN1510836A (zh) * 2002-12-20 2004-07-07 阿尔卑斯电气株式会社 具有静电传感器的输入装置
JP2004206288A (ja) * 2002-12-24 2004-07-22 Alps Electric Co Ltd 入力装置を備えた電子機器
CN1908873A (zh) * 2005-08-05 2007-02-07 鸿富锦精密工业（深圳）有限公司 触摸式感应装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3761736A (en) * 1971-05-12 1973-09-25 Godwin Warren Engin Ltd Proximity switches
US3781736A (en) * 1972-10-26 1973-12-25 Gen Electric Shield for permanent magnet structure
JPS629423A (ja) * 1985-07-05 1987-01-17 Seiko Epson Corp 入力兼表示装置
JP2733300B2 (ja) * 1989-04-28 1998-03-30 松下電器産業株式会社 キー入力装置
SU1699357A3 (ru) * 1990-01-31 1991-12-15 М.И. Ананьев Сенсорна панель управлени
GB9209364D0 (en) 1992-04-30 1992-06-17 Varitronix Ltd A touch sensitive device
RU2029353C1 (ru) * 1992-07-15 1995-02-20 Владимир Михайлович Киселев Сенсорная панель для ввода информации
US5594222A (en) * 1994-10-25 1997-01-14 Integrated Controls Touch sensor and control circuit therefor
US5963277A (en) * 1996-08-24 1999-10-05 Lg Electronics Inc. Position sensible liquid crystal display device
JP2004028719A (ja) 2002-06-25 2004-01-29 Tdk Corp 静電容量センサ
JP4009953B2 (ja) 2003-05-14 2007-11-21 オムロン株式会社 物体検知センサ
KR101098635B1 (ko) * 2004-02-13 2011-12-23 큐알쥐 리미티드 정전용량 센서
DE102005063023A1 (de) * 2005-12-14 2007-06-21 Gerd Reime Anordnung zur Überwachung eines Objekts
US8279180B2 (en) * 2006-05-02 2012-10-02 Apple Inc. Multipoint touch surface controller
CN1877994B (zh) * 2006-06-27 2010-05-12 杭州电子科技大学 轻触式多点控制开关
US7812827B2 (en) * 2007-01-03 2010-10-12 Apple Inc. Simultaneous sensing arrangement
DE102007048402A1 (de) * 2007-10-09 2009-04-16 Gerd Reime Bedieneinheit und Verfahren zur Auslösung einer Funktion

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000295183A (ja) * 1999-03-29 2000-10-20 Gsl Research Technology Ltd タッチリンク
JP2003046383A (ja) * 2001-07-30 2003-02-14 Omron Corp タッチセンサ
CN1510836A (zh) * 2002-12-20 2004-07-07 阿尔卑斯电气株式会社 具有静电传感器的输入装置
JP2004206288A (ja) * 2002-12-24 2004-07-22 Alps Electric Co Ltd 入力装置を備えた電子機器
CN1908873A (zh) * 2005-08-05 2007-02-07 鸿富锦精密工业（深圳）有限公司 触摸式感应装置

Also Published As

Publication number Publication date
WO2009048077A1 (ja) 2009-04-16
KR101126508B1 (ko) 2012-03-29
US8587553B2 (en) 2013-11-19
JP4941938B2 (ja) 2012-05-30
CN101821947A (zh) 2010-09-01
US20100230180A1 (en) 2010-09-16
JP2009094849A (ja) 2009-04-30
KR20100080554A (ko) 2010-07-08
DE112008002731B4 (de) 2014-07-10
RU2433526C1 (ru) 2011-11-10
DE112008002731T5 (de) 2010-08-26

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