CN101738505B - 测试托盘 - Google Patents

测试托盘 Download PDF

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Publication number
CN101738505B
CN101738505B CN2009101801665A CN200910180166A CN101738505B CN 101738505 B CN101738505 B CN 101738505B CN 2009101801665 A CN2009101801665 A CN 2009101801665A CN 200910180166 A CN200910180166 A CN 200910180166A CN 101738505 B CN101738505 B CN 101738505B
Authority
CN
China
Prior art keywords
unit
connector
tray unit
backlight
panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2009101801665A
Other languages
English (en)
Chinese (zh)
Other versions
CN101738505A (zh
Inventor
宋汉玉
金圣旭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electro Mechanics Co Ltd
Original Assignee
Samsung Electro Mechanics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electro Mechanics Co Ltd filed Critical Samsung Electro Mechanics Co Ltd
Publication of CN101738505A publication Critical patent/CN101738505A/zh
Application granted granted Critical
Publication of CN101738505B publication Critical patent/CN101738505B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Environmental & Geological Engineering (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
CN2009101801665A 2008-11-25 2009-11-11 测试托盘 Expired - Fee Related CN101738505B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2008-0117723 2008-11-25
KR1020080117723A KR101011714B1 (ko) 2008-11-25 2008-11-25 테스트 트레이

Publications (2)

Publication Number Publication Date
CN101738505A CN101738505A (zh) 2010-06-16
CN101738505B true CN101738505B (zh) 2012-11-07

Family

ID=42360429

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009101801665A Expired - Fee Related CN101738505B (zh) 2008-11-25 2009-11-11 测试托盘

Country Status (2)

Country Link
KR (1) KR101011714B1 (ko)
CN (1) CN101738505B (ko)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101706982B1 (ko) * 2012-08-16 2017-02-16 (주)테크윙 테스트핸들러용 인서트
KR101718446B1 (ko) * 2015-07-01 2017-03-21 주식회사 딜라이브 마운팅 장치를 포함하는 검사 장치
CN109471280A (zh) * 2018-12-25 2019-03-15 中航华东光电有限公司 通用背光工装及制作方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2641630Y (zh) * 2003-06-20 2004-09-15 顺德市顺达电脑厂有限公司 母板夹具
CN1922687A (zh) * 2005-04-26 2007-02-28 创新塑科技有限公司 用于存储装置的测试托架
CN101114040A (zh) * 2006-07-27 2008-01-30 鸿富锦精密工业（深圳）有限公司 托盘定位平台
CN101191809A (zh) * 2006-11-28 2008-06-04 未来产业株式会社 处理机中用于转动测试托盘的装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19980027504A (ko) * 1996-10-16 1998-07-15 김영환 액정표시소자용 내열성 테스트 시스템의 구동회로 체크장치
KR100716038B1 (ko) * 2005-05-13 2007-05-08 강성일 액정모듈 테스트용 지그

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2641630Y (zh) * 2003-06-20 2004-09-15 顺德市顺达电脑厂有限公司 母板夹具
CN1922687A (zh) * 2005-04-26 2007-02-28 创新塑科技有限公司 用于存储装置的测试托架
CN101114040A (zh) * 2006-07-27 2008-01-30 鸿富锦精密工业（深圳）有限公司 托盘定位平台
CN101191809A (zh) * 2006-11-28 2008-06-04 未来产业株式会社 处理机中用于转动测试托盘的装置

Also Published As

Publication number Publication date
KR101011714B1 (ko) 2011-01-28
CN101738505A (zh) 2010-06-16
KR20100059080A (ko) 2010-06-04

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PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20121107

Termination date: 20151111

EXPY Termination of patent right or utility model