CN101646800A - 用于玻璃板半导体涂覆的系统和方法 - Google Patents

用于玻璃板半导体涂覆的系统和方法 Download PDF

Info

Publication number
CN101646800A
CN101646800A CN200880010147A CN200880010147A CN101646800A CN 101646800 A CN101646800 A CN 101646800A CN 200880010147 A CN200880010147 A CN 200880010147A CN 200880010147 A CN200880010147 A CN 200880010147A CN 101646800 A CN101646800 A CN 101646800A
Authority
CN
China
Prior art keywords
sheet glass
glass
sheet
transport unit
station
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN200880010147A
Other languages
English (en)
Inventor
詹姆士·E·海德
迈克尔·J·齐卡克
小里奥·阿多丽娜
加里·T·法伊科施
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WILLARD and KELSEY SOLAR GROUP LLC
Original Assignee
WILLARD and KELSEY SOLAR GROUP LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by WILLARD and KELSEY SOLAR GROUP LLC filed Critical WILLARD and KELSEY SOLAR GROUP LLC
Publication of CN101646800A publication Critical patent/CN101646800A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0657Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/20Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/063Transporting devices for sheet glass
    • B65G49/066Transporting devices for sheet glass being suspended; Suspending devices, e.g. clamps, supporting tongs
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/50Substrate holders
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/564Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
    • C23C14/566Means for minimising impurities in the coating chamber such as dust, moisture, residual gases using a load-lock chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/46Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67236Apparatus for manufacturing or treating in a plurality of work-stations the substrates being processed being not semiconductor wafers, e.g. leadframes or chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67706Mechanical details, e.g. roller, belt
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67712Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67721Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips, lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/6776Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/0603Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
    • H01L29/0642Isolation within the component, i.e. internal isolation
    • H01L29/0649Dielectric regions, e.g. SiO2 regions, air gaps
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2249/00Aspects relating to conveying systems for the manufacture of fragile sheets
    • B65G2249/02Controlled or contamination-free environments or clean space conditions

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Robotics (AREA)
  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)
  • Surface Treatment Of Glass (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Photovoltaic Devices (AREA)

Abstract

用于在玻璃板上涂覆半导体材料的系统(20)和方法通过将在其上端直立悬挂的玻璃板输送通过具有包括真空室(24)的外壳(22)的系统(20)来执行。玻璃板在传送装置(42)上输送通过入口负荷锁定站(26),进入外壳真空室(24),通过加热站(30)和外壳(22)的至少一个沉积站(32,34),并在通过出口负荷锁定站(28)从系统出来之前到达冷却站(36)。所得到的涂覆有半导体的玻璃板(G)具有在涂覆处理期间形成的夹具标记(44′)。

Description

用于玻璃板半导体涂覆的系统和方法
相关申请的交叉引用
本申请要求James E.Heider于2007年2月1日提交的题为“COATINGMACHINE AND PROCESS TO COAT SEMICONDUCTOR MATERIALSFOR USE IN PHOTOVOLTAIC DEVICES(用于光伏器件的涂覆机和涂覆半导体材料的方法)”的美国临时申请第60/898,849号的权益。
发明背景
1.发明领域
本发明涉及用于使玻璃薄板涂覆有半导体材料的系统和方法,并还涉及所得到的涂覆有半导体的玻璃板。
2.背景技术
诸如光伏板的半导体器件先前已经构造有半导体材料所涂覆的玻璃板基底。参见美国专利:Madan等人的5,016,562;Foote等人的5,248,349;Foote等人的5,372,646;Foote等人的5,470,397;和Foote等人的5,536,333,所有这些专利都公开了用于在这样的涂覆期间输送玻璃板的水平辊。
在进行与本发明有关的调查期间注意到的其他现有技术参考资料包括美国专利:Campbell等人的4,545,327;Hanak的4,593,644;Nakamura等人的5,288,329;Chu等人的6,013,134;和Takahashi的6,827,788,以及美国公布的专利申请US 2007/0137574。
发明概述
本发明的目的是提供一种用于在玻璃板上涂覆半导体材料的改进系统。
在实现上述目的时,根据本发明的用于在玻璃板上涂覆半导体材料的系统包括界定真空室的细长外壳。系统的入口负荷锁定站(entry load lockstation)用于进入到真空室内,而系统的出口负荷锁定站(exit load lockstation)用于从真空室出来。外壳包括用于加热玻璃板的加热站(heatingstation)和用于为沉积提供半导体材料的至少一个沉积站(depositionstation)。系统的输送机支撑直立玻璃板的上端,并且将直立玻璃板输送通过系统,首先进入并通过入口负荷锁定站,进入真空室内,然后通过用于加热玻璃板的加热站,其后通过用于在玻璃板上沉积半导体材料的沉积站,且最后通过出口负荷锁定站从真空室出来,以用于运送涂覆的玻璃板。
系统的输送机被公开为包括用于支撑直立玻璃板的上端的传送装置(shuttle),并且输送机还包括具有驱动机构的驱动器,该驱动机构沿系统定位,以用于将传送装置和悬挂在传送装置上的直立玻璃板输送通过系统,首先进入并通过入口负荷锁定站,进入真空室内,然后通过用于加热玻璃板的加热站,其后通过用于在玻璃板上沉积半导体材料的沉积站,且最后通过出口负荷锁定站从真空室出来,以用于运送涂覆的玻璃板。
如所公开的,每个传送装置具有包括用于支撑夹具的向下悬挂的支撑部分的细长形状,该夹具在输送期间支撑直立玻璃板的上端,并且输送机驱动器的驱动机构均具有细长形状,并包括沿其细长形状间隔开的旋转驱动构件,以旋转驱动传送装置来将直立玻璃板输送进入、通过系统以及输送出系统。如所公开的,旋转驱动构件具有磁性,并对用于输送玻璃板的传送装置提供旋转驱动,且传送装置具有上部支撑和驱动表面(uppersupport and drive surface),在该上部支撑和驱动表面,磁性旋转驱动构件从上方支撑并旋转驱动传送装置。如所公开的,传送装置还具有相对的横向侧面,并且驱动机构具有在传送装置的相对的横向侧面下方在相对的横向侧面处沿驱动机构的长度间隔开的故障保护辊(failsafe roller)。
如所公开的,加热站包括在输送的直立玻璃板的相对侧间隔开的辐射加热器,以在玻璃板上沉积半导体材料之前对玻璃板提供辐射加热。更具体地,辐射加热器包括以相互间隔开和相互平行的关系直立延伸的辐射加热板,并且直立玻璃板在辐射加热板之间输送以用于加热。
系统还被公开为包括对涂覆的玻璃板提供辐射冷却的辐射热吸收器(radiant heat absorber)。这些辐射热吸收器被公开为以相互间隔开和相互平行的关系直立延伸的辐射冷却板,并且在输送期间,直立玻璃板被定位在辐射冷却板之间以用于冷却。此外,辐射热吸收器被公开为位于出口负荷锁定站的上游的真空室中。
所公开的系统还包括与第一输送机并排定位的第二输送机,以便也支撑直立玻璃板的上端并将那些直立玻璃板与由第一输送机输送的直立玻璃板并排地输送通过系统,首先进入并通过入口负荷锁定站,进入真空室内,然后通过用于加热玻璃板的加热站,其后通过用于在玻璃板上沉积半导体材料的沉积站,且最后通过出口负荷锁定站从真空室出来,以用于运送涂覆的玻璃板。
如所公开的,系统的细长外壳包括具有连接到彼此以界定真空室的端部的模块。每个模块包括部分圆形的下外壳部分、上通道部分(upper accessportion)、端部密封件和可拆卸的盖子,上通道部分从下外壳部分向上延伸并具有上通道开口,端部密封件在每个模块的端部围绕下外壳部分和上通道部分延伸以用于与邻近的模块连接,可拆卸的盖子用于选择性地闭合通道开口,或提供通道开口的打开以进入模块进行维护或维修。框架支撑输送机,并且由外壳模块的上通道部分支撑。
本发明的另一个目的是提供一种用于在玻璃板上涂覆半导体材料的改进方法。
在执行紧接之前的目的时,通过沿直立方向在玻璃板的上端支撑玻璃板并将直立玻璃板输送通过入口负荷锁进入真空室内来执行根据本发明的用于在玻璃板上涂覆半导体材料的方法。在真空室中加热直立输送的玻璃板,并且然后将半导体材料沉积到加热并直立输送的玻璃板上。其后,将涂覆有半导体的玻璃板通过出口负荷锁输送出真空室以用于运送。
直立玻璃板被公开为由传送装置支撑,该传送装置由沿系统定位的驱动机构的磁性旋转驱动构件输送通过系统。
此外,玻璃板被公开为由辐射加热器加热,该辐射加热器包括在输送的直立玻璃板的相对侧间隔开的直立辐射加热板,并且涂覆的玻璃板被公开为由辐射热吸收器冷却,该辐射热吸收器包括以相互间隔开和相互平行的关系直立延伸的冷却板,并且在输送期间,直立玻璃板被定位在冷却板之间用于冷却。
本发明的另一个目的是提供一种改进的涂覆有半导体的玻璃板。
在执行紧接之前的目的时,根据本发明的涂覆有半导体的玻璃板包括具有至少一层半导体材料的玻璃板,该至少一层半导体材料在玻璃板以由夹具在玻璃板的上端进行悬挂的方式被直立地加热和输送时通过汽相沉积而沉积在玻璃板上,该夹具使玻璃板变形并留下在玻璃板被冷却之后保留的夹具标记。
如所公开的,玻璃板包括在其一个表面上的氧化锡层、涂覆在氧化锡层上的第一半导体层,以及涂覆在第一半导体层上的第二半导体层。
从当结合附图时优选实施方式的详细描述中,本发明的目的、特征和优点易于明白。
附图简述
图1是根据本发明构建的并执行本发明的方法以在玻璃板上涂覆半导体材料的系统的透视图。
图2是图解了驱动机构和传送装置的透视图,传送装置用于从玻璃板上端直立悬挂玻璃板,并用于将玻璃板输送通过系统。
图3是局部图,图解了磁性旋转驱动构件支撑并旋转驱动传送装置和悬挂在传送装置上的直立玻璃板的方式。
图4是系统的顶部示意图,图解了系统的模块构造以及所提供的一对并排的输送机,该对并排的输送机输送玻璃板直立地通过系统的外壳真空室以用于半导体沉积。
图5是其上已被涂覆有半导体材料的玻璃板的截面图,且为图解的目的而夸大了半导体材料厚度。
图6是示意性平面图,图解了在炉的加热站中用于为半导体沉积做准备而对直立输送的玻璃板提供辐射加热的辐射加热器。
图7是示意性顶部平面图,图解了在沉积半导体材料的沉积站内处于输送期间的直立玻璃板。
图8是示意性顶部平面图,图解了正被输送通过辐射热吸收器提供玻璃板的冷却的冷却站的涂覆有半导体的玻璃板。
图9是前视图,图解了细长玻璃板以其较长轴线水平输送的一种方式。
图10是与图9相似的视图,图解了细长玻璃板以其较长轴线直立输送的另一种方式。
图10a和10b是不管是如图9所示的输送还是如图10所示的输送的所得到的玻璃板的侧视图和端视图,并且图解了所得到的上端40在玻璃板的两个表面上包括夹具标记44′。
图11是图解了系统的一个外壳模块的透视图,该外壳模块与其他模块配合以提供界定真空室的外壳。
图12是图解了分别在图6和图8中图解的加热站或冷却站的外壳模块的构造的视图。
图13是图解了玻璃板进入外壳的真空室所通过的负荷锁定站的前侧视图,并且该图还图解了涂覆的玻璃板从外壳的真空室出来以用于运送所通过的出口负荷锁定站。
图14是沿图13线14-14的方向截取的端视图,以进一步图解负荷锁定站结构。
图15是沿图14线15-15的方向截取的负荷锁定站的顶部平面图。
优选实施方式详述
参照图1,用于在玻璃板上涂覆半导体材料的系统20一般由20表示,并被操作以执行根据本发明的用于使玻璃板涂覆有半导体材料的方法并提供根据本发明的涂覆有半导体的玻璃板。将以整合的方式描述该系统和该方法以及涂覆有半导体的玻璃板,以利于对本发明的所有方面的理解。
继续参照图1,系统20包括细长外壳,该细长外壳由22共同地表示,并具有在其中进行半导体涂覆的真空室24。该系统的入口负荷锁定站26为玻璃板进入真空室24提供准备,而出口负荷锁定站28提供在涂覆之后涂覆的玻璃板从真空室24出来。外壳包括用于加热玻璃板的加热站30、用于为汽相沉积提供半导体材料的一对沉积站32和34以及冷却站36,所有这些在下文中被更详细地说明。
图4所示的系统20包括以并排关系彼此并排延伸通过细长外壳22的一对输送机38。每个输送机38支撑图2所示的直立玻璃板G的上端40,并将这些直立玻璃板悬挂着输送通过系统。该输送首先进入并通过入口负荷锁定站26,从而进入外壳真空室24内,通过用于加热玻璃板的加热站30,其后通过用于在玻璃板上沉积半导体材料的两个沉积站32和34,然后到达冷却站36,并最后通过出口负荷锁定站28从真空室24出来以用于涂覆的玻璃板的运送。
如图2和图4所示,每个输送机38包括用于支撑直立玻璃板的上端40的传送装置42,具体地通过图2中所示的夹具44来支撑。夹具44可以是Furer的美国专利3,391,958所公开的类型,该专利的所有公开内容特此通过引用并入。图4中所示的每个输送机38还包括驱动器,该驱动器由46共同地表示,并具有驱动机构48,该驱动机构48沿系统定位以用于将传送装置和悬挂在传送装置上的直立玻璃板输送通过系统。由此,驱动器46通过其驱动机构48首先将传送装置输送到入口负荷锁定站26内,并从这里输送到细长外壳22的真空室24内,以将传送装置输送通过加热站30、沉积站32和34、冷却站36并最后到达出口负荷锁定站28,以从系统出来并运送涂覆的玻璃板。任何类型的合适的返回输送机(returnconveyer)50可用来在传送装置42从出口负荷锁定站28出来之后输送传送装置42返回到入口负荷锁定站26以进行另一个循环。
如图2和图4所示,每个传送装置42都具有细长形状和向下悬挂的支撑部分52(图2),其中孔54沿向下悬挂的支撑部分52间隔开,以针对被输送的玻璃板的具体长度在合适的位置容纳和支撑夹具44,使得悬挂支撑一般邻接被输送的玻璃板G的上端40的上游端56和下游端58。输送机驱动器46的驱动机构48均具有细长形状,并包括旋转驱动构件60,该旋转驱动构件60沿驱动机构48的细长形状间隔开以旋转驱动传送装置42,以用于将直立玻璃板输送进入、通过系统以及输送出系统。更具体地,旋转驱动构件60通过轴承64支撑在细长板62上并且是磁性的,以提供用于进行输送的传送装置42的旋转驱动。传送装置42具有支撑磁性旋转驱动构件60的上部支撑和驱动表面66,如图3所示,该磁性旋转驱动构件60向下凸出通过板62中的孔68,从而被支撑在传送装置上表面60上,并与其驱动接触。
如前所述的输送机驱动器46的输送机驱动机构48沿系统的长度间隔开,并且每个驱动机构48具有如图2所示的如示意性示出的从真空室24向外壳22外间隔开的关联的电驱动电动机70。每个驱动电动机70的轴输出延伸通过密封的轴承,到达邻近的磁性旋转驱动构件60的驱动轴72的一端,且轴的另一端连接到用于驱动连续环形传动带或链条76的主动链轮74,而连续环形传动带或链条76驱动邻近的磁性旋转驱动构件60的轴72的一端上的另一个链轮74,而且,驱动机构48的交替侧上的关联的链轮和连续驱动构件又提供所有相互配合的磁性旋转驱动构件60的旋转驱动。
如图5所示,在玻璃板G的一个表面上进行半导体材料沉积,该玻璃板G最初具有提供电接触的氧化锡涂层78。在图4所示的加热站30中加热之后,第一沉积站32提供一层硫化镉80,该硫化镉80是N型半导体并且大约为0.15微米的厚度。当玻璃板继续输送到第二沉积站34时,厚度大约为3微米的一层碲化镉82被沉积到硫化镉80上以提供I型半导体。在这样的沉积并从系统出来之后,氧化锡层78、硫化镉层80和碲化镉层82可被分成多个单元,并提供碲化镉层82上的另一个接触,以起用于从太阳光发电的多单元光伏板的作用。
图4中示意性示出的系统外壳22具有包括多个外壳模块84的模块结构,该外壳模块84具有连接到彼此的相对端85以提供外壳22,该外壳22包括加热站30、沉积站32和34以及冷却站36。输送机驱动器46的前述驱动机构48中的一个在其上游端和下游端之间沿各个外壳模块84的长度延伸,以将传送装置42和悬挂在传送装置42上的玻璃板输送通过系统外壳的真空室,以进行加热、沉积和冷却。入口负荷锁定站26和出口负荷锁定站28也均包括关联的外壳模块86,输送机38延伸通过该模块86,以将玻璃板输送进入由外壳22界定的真空室24并从外壳22界定的真空室24输送出。这些负荷锁定外壳86均具有入口门结构88和出口门结构90,下文中将更充分地描述这些结构。
当处理从如图4所示的从右向左地输送玻璃板开始时,打开入口负荷锁定站26的入口门结构88,以允许传送装置42和直立悬挂在传送装置42上的玻璃板输送到关联的外壳86内,然后,关闭入口门结构,并且通过真空泵将入口负荷锁定站抽空,以提供大约20托的真空。在达到需要的真空状态时,出口门结构98被打开,以允许传送装置输送到加热站30的初始驱动机构48,且当传送装置从入口负荷锁定站往前移动到各个外壳模块内接着通过加热站30、沉积站32和34以及冷却站36时,传送装置桥接驱动机构。在最初进入到外壳22的真空室内之后,入口负荷锁定站26的出口门结构90被关闭,于是,其外壳模块86恢复到外界压力,并且打开其入口门结构88,以允许下一个传送装置42和悬挂在传送装置42上的玻璃板输送到入口负荷锁定站内,以开始下一个循环的处理。
在各个传送装置42已经在系统20的外壳22的真空室内被处理之后,传送装置到达出口负荷锁定站28,当出口负荷锁定站28的外壳模块86被抽空到大约为20托的真空时,图4中所示的出口负荷锁定站28的入口门结构88和出口门结构90被关闭。然后,出口负荷锁定站的28的入口门结构88被打开,以允许传送装置和悬挂的玻璃板输送到出口负荷锁定站28内,然后,出口负荷锁定站28的入口门结构88被关闭,并且出口负荷锁定站28的外壳恢复到外界压力,并且出口负荷锁定站28的出口门结构90随后被打开,以允许传送装置和悬挂的玻璃板输送出系统以进行运送。
应该注意的是,如所公开的冷却站36位于出口负荷锁定站28的上游,以便于操作以及平常来构造入口负荷锁定站26和出口负荷锁定站28。尽管所示的上游位置是优选的,然而,也可以使冷却站位于出口负荷锁定站28内。在暴露于氧和任何随之发生的氧与半导体材料的反应之前,这种冷却将半导体材料的温度降低到大约400℃以下是重要的。
返回来参照图2,应该注意的是,各个传送装置具有相对的横向侧面92,并且驱动机构板62具有成角度的侧面93,该成角度的侧面93支撑位于传送装置的相对的横向侧面92下方的故障保护辊94。当磁性旋转驱动构件60将传送装置42支撑在故障保护辊94的稍微上方时,这些故障保护辊94确保传送装置42不在重力或其他力的作用下落下。
如图6所示,加热站的各个外壳模块84包括在直立输送的玻璃板的相对侧间隔开的辐射加热器96,且这些辐射加热器96通过辐射加热板98体现,其以相互间隔开和相互平行的关系直立地定位,使得直立输送的玻璃板在其间移动。任何类型的合适的位置调节器100可用来调节辐射加热器间距,以提供玻璃板距其的两个相对面向的表面的均匀性。
图4所示的沉积站32和34中的每一个具有类似于图7中所示的结构的结构,其中其外壳模块84容纳沉积模块102和直立延伸的辐射加热器104,玻璃板G在沉积模块102和直立延伸的辐射加热器104之间输送,以将关联的半导体材料沉积到玻璃板上。辐射加热器104,与加热站中的辐射加热器类似,包括直立延伸的加热板106,在沉积期间,该直立延伸的加热板106的位置能在必要时通过调节器108改变,以提供玻璃温度的均匀性。沉积模块102也可以包括结合在其中的辐射加热器,以另外提供作为半导体材料沉积的热气。
冷却站36,不管是位于出口负荷锁定站28的上游还是位于出口负荷锁定站内,均包括辐射热吸收器110,该辐射热吸收器110在图8中示出为被构造成以相互间隔开和相互平行的关系直立延伸的辐射冷却板112,且涂覆有半导体的直立玻璃板被放置在辐射冷却板112之间以进行冷却。辐射冷却板112具有通常相对的连续的平坦表面113,涂覆有半导体的热玻璃板的辐射热被吸收在该表面113上。调节器114控制辐射冷却板112和玻璃板G之间的定位,以提供冷却的均匀性。
如由James E.Heider等人一同提交的题为“SYSTEM AND METHODFOR COOLING SEMICONDUCTOR COATED HOT GLASS SHEETS(用于冷却涂覆有半导体的热玻璃板的系统和方法)”的相关的美国专利申请序列号(代理人案号:WKSG 0102 PUS)所公开的,在冷却期间,涂覆有半导体的热玻璃板也能被水平输送,上述美国专利申请的全部公开内容特此通过引用并入。
可利用不同的材料来提供加热站中的辐射加热板98、沉积模块102的任何辐射加热器和各个沉积站的辐射加热板106,以及冷却站的辐射冷却板112。例如,石墨是能利用的相对便宜的材料,并具有良好的导热性以提供所有各处的均匀性和温度;然而,石墨甚至在真空也呈扁球状并且对氧敏感。由于α态碳化硅是无孔的、抗震的以及对氧不可渗透的,因此也可利用α态碳化硅;然而,碳化硅也相对昂贵。可以在加热站和沉积站的辐射加热器内嵌入加热元件或通过加热器中的板,例如带有镍铬加热元件的石英管提供辐射热,使得该板充当热传播器(heat spreader)。也可以采用其它辐射加热器设计。
在玻璃板处理期间,可沿从入口端到出口端的单一方向在外壳模块内输送每个玻璃板,可沿前向方向在各个模块来回摆动每个玻璃板或可将玻璃板相继向前移动一定程度然后向后移动较小程度,例如以向前移动两级和向后移动一级的方式。
如图9和图10所图解的,可通过关联的传送装置42的夹具将细长玻璃板G的较长轴水平或直立地悬挂。直立悬挂将提供更大的涂覆能力,但是要求加热、涂覆和冷却站部件的直立高度更高。
不管是沿图9所示的水平延长的方向还是沿图10所示的竖直延长的方向直立悬挂和输送玻璃板,所得到的玻璃板的上端40变形成在玻璃板的两个相对面向的表面上具有夹具标记44′。这些夹具标记44′由当玻璃板被加热时由夹具提供的变形引起。这种位于上端的夹具标记44′在如图5所示的氧化锡层78之上的半导体层80和82的工作区域的外侧,并且例如当用作光伏板时不会对所得到的玻璃板的操作产生不利的影响。在输送的玻璃板的上端进行直立悬挂能在加热时保持玻璃板的平面性,并且也有利于均匀的温度加热,而不会有当例如在输送期间其辐射和导热会发生变化的输送机辊上加热时所导致的变化。
图1和图4中图解的细长外壳20具有前述的连接到彼此以界定真空室24的模块84的端部85。如图11和图12所示的每个外壳模块84包括部分圆形的下外壳部分116和上通道部分118,该上通道部分118从下外壳部分向上延伸并具有上通道开口120。端部密封件122在外壳模块84的端部85处围绕下外壳部分116和上通道部分118延伸,以通过未示出的螺栓连接件连接到邻近模块。可拆卸的盖子124通过铰接夹126固定在由实线表示所图解的闭合位置,且该夹被释放以允许盖子移动到如由图12中的双点划线表示部分示出的打开位置,以提供通过开口120的通道用于维护或维修。
每个外壳模块包括如图11和图12所示的装配式支撑肋128,其中这些肋的上端支撑盖子夹126,而其中端肋中的两个的下端具有支撑轮130,如在图13和图14中所最佳图解的,这些支撑轮130被安装在底部框架134的轨道132上,以允许外壳模块在组装和拆卸期间纵向移动。图13中所示的入口负荷锁定站26也具有类似的支撑肋128,安装在肋128的下端的支撑轮130沿底部框架轨道132支撑并可沿底部框架轨道132移动,且图4中所示的出口负荷锁定站28具有相同的支撑轮构造。
如图11和图12所示,由136共同表示的内部框架由外壳模块84的上通道部分118容纳并支撑,并且支撑输送机驱动器46的驱动机构48,还支撑图6中示出的加热站辐射加热器96、图7中示出的沉积站的沉积模块102和辐射加热器104以及图8中示出的冷却站36的辐射热吸收器110。
参考图13和图14,入口负荷锁定站26和出口负荷锁定站28具有通常相同的入口门结构88和出口门结构90。更具体地,门结构88和90中的每一个均包括图14中图解的一对铰接门138,并且为了图解输送机结构的目的而示出左门关闭和右门打开。这些门138围绕侧面外部竖直轴铰接,并且每个门均由如图15所示的关联的上致动器140操作以提供以前面结合图4所述的方式的打开和关闭。在门打开时,如图14的右输送机中所显示的,输送机驱动机构48将传送装置42输送通过门开口142。如前面结合图2所述的,位于外围的驱动电动机70被连接到这些驱动机构。此外,设有导管144,以用于在门操作期间在必要时与真空抽吸和外界压力供给连通。
现将说明处理上述系统20以提供光伏板的具体方式。该处理从600mm乘1200mm也就是大约24英寸乘48英寸的尺寸的大约3.2mm厚的涂覆有氧化锡的玻璃板开始。首先,将玻璃板基底的边缘金刚石研磨到1号笔(number 1 pencil),并进行抛光处理,以提供处理时的舒适度并消除在处理和加热处理期间可能引起破裂的裂缝。磨边速度必须是大约40mm/s,即90英寸/分钟,以便得到每分钟两片的循环率进入系统。在磨边之后,用合适的清洁剂清洗玻璃板基底,以移除微粒并为涂覆提供准备,然后用去离子水漂清以提供在风干之后的无矿物表面。在系统20的上游,合适的激光站将在玻璃板上印上代码,以用于在处理期间的生产控制和定位。
为了提供循环定时,使真空泵系统与负荷锁定室的容积匹配,以提供例如大约21秒达到20托的抽真空时间。在负荷锁定室容积在56立方英尺,抽速为每分钟580立方英尺的情况下,输送入和输送出各个负荷锁定站的时间加上排气和抽真空时间总计60秒的总循环时间,其中21秒抽真空时间、10秒用于输送入负荷锁定站、10秒用于输送出以及19秒来提供门致动和排气。
在前面结合图4所述的系统加热站30中,玻璃板基底将被加热到大约585℃,以便为最初的半导体涂覆做准备。由前面结合图6所述的辐射加热器96的加热将伴随大约在680℃的辐射加热室提供有在最初区域的每面大约25千瓦和在随后区域的每面16千瓦,以在大约150秒内提供期望的580℃的玻璃基底表面温度。当然,可根据具体的要被涂覆的玻璃板改变输送速度和必要的温度。
在如前面结合图4所述的沉积模块32和34中沉积半导体材料期间,由图7中所示的沉积模块102提供的热气与后侧辐射加热器104联合将基底维持在均匀的温度。直立定位消除了可能的小孔、有核物质和凝结蒸汽与玻璃板基底的接触。膜厚度的均匀性取决于玻璃板基底的温度和源蒸汽几何,而电量取决于粘结到表面的空洞或预成核物质的欠缺。
在如图4所示的第一沉积站32,提供N层的硫化镉由升华了的且加热到950℃温度的碲化镉气覆盖。相信,涂覆速度将大约是1000埃/每秒,以达到大约900埃至1500埃的总厚度,并且,位于沉积模块内的合适的检测装置用来检扫描涂层厚度。
前面结合图4所述的第二沉积站34提供是P层的碲化镉层。玻璃板基底温度将大约是605℃,碲化镉将被升华和加热到大约1050℃,并且将通过可变孔提供厚度将达到大约3微米的涂层,以控制被认为是2.5微米/每秒的速度的沉积速度。
然后,由前面结合图4所述的冷却站36接纳涂覆有半导体的玻璃板基底,以提供约400℃以下的冷却,以防止涂覆的材料暴露于氧和随后的与氧反应。应理解,可以通过利用出口负荷锁定站28中的大约99.5%的氮提供冷却,但是氮的成本会增加每件涂覆的玻璃板的成本。同样,尽管也可以如前所述在出口负荷锁定站中提供辐射冷却,但是这种处理将导致出来时间增加,这可增加循环时间。
在涂覆的玻璃板离开出口负荷锁定站以用于输送之后,后面的合适的冷却器将提供到大约50℃的冷却以进行处理。然后,测量碲化镉的厚度以确认正确性,将氯化镉的稀释的水溶液喷或滚到半导体涂层上,并且然后将玻璃板加热到大约400℃约15分钟,以便于将光转换成电。然后,用去离子水清洗、漂清和干燥处理过的玻璃板。之后,利用合适的激光划片和处理将涂覆有半导体的玻璃板转换成光伏板。
虽然已经图解和说明了本发明的实施方式,但是并不表明这些实施方式图解和说明了本发明的所有可能形式。而是,说明书中使用的词语是说明性词语而非限制性词语,且应理解的是,可以做各种变化,而不背离本发明的精神和范围。

Claims (22)

1.一种用于在玻璃板上涂覆半导体材料的系统,其包括:
细长外壳,其界定真空室;
入口负荷锁定站和出口负荷锁定站,所述入口负荷锁定站用于进入所述真空室,所述出口负荷锁定站用于从所述真空室出来;
所述外壳包括用于加热玻璃板的加热站和用于为沉积提供半导体材料的至少一个沉积站;
输送机,其用于支撑直立玻璃板的上端,并将直立玻璃板输送通过所述系统,首先进入并通过所述入口负荷锁定站,进入所述真空室,然后通过用于加热玻璃板的所述加热站,其后通过用于在玻璃板上沉积半导体材料的所述沉积站,并且最后通过所述出口负荷锁定站从所述真空室出来,以用于运送涂覆的玻璃板。
2.根据权利要求1所述的玻璃板半导体涂覆系统,其中,所述输送机包括用于支撑直立玻璃板的上端的传送装置,并且所述输送机还包括具有驱动机构的驱动器,所述驱动机构沿所述系统定位,以用于将所述传送装置和悬挂在所述传送装置上的直立玻璃板输送通过所述系统,首先进入并通过所述入口负荷锁定站,进入所述真空室,然后通过用于加热玻璃板的所述加热站,其后通过用于在玻璃板上沉积半导体材料的所述沉积站,并且最后通过所述出口负荷锁定站从所述真空室出来,以用于运送涂覆的玻璃板。
3.根据权利要求2所述的玻璃板半导体涂覆系统,其中,每个传送装置具有包括用于支撑夹具的向下悬挂的支撑部分的细长形状,所述夹具在输送期间支撑直立玻璃板的上端,并且,输送机驱动器的所述驱动机构中的每个都具有细长形状,并包括沿其细长形状间隔开的旋转驱动构件,以旋转驱动所述传送装置来将直立玻璃板输送进入、通过所述系统以及输送出所述系统。
4.根据权利要求3所述的玻璃板半导体涂覆系统,其中,所述旋转驱动构件具有磁性,并对所述传送装置提供旋转驱动,以用于输送玻璃板。
5.根据权利要求4所述的玻璃板半导体涂覆系统,其中,所述传送装置具有上部支撑和驱动表面,在所述上部支撑和驱动表面,所述磁性旋转驱动构件从上方支撑并旋转驱动所述传送装置。
6.根据权利要求5所述的玻璃板半导体涂覆系统,其中,所述传送装置还具有相对的横向侧面,并且所述驱动机构具有故障保护辊,所述故障保护辊在所述传送装置的相对的横向侧面下方在相对的横向侧面处沿所述驱动机构的长度间隔开。
7.根据权利要求1所述的玻璃板半导体涂覆系统,其中,所述加热站包括在输送的直立玻璃板的相对侧间隔开的辐射加热器,以在玻璃板上沉积半导体材料之前提供对玻璃板的辐射加热。
8.根据权利要求7所述的玻璃板半导体涂覆系统,其中,所述辐射加热器包括以相互间隔开和相互平行的关系直立延伸的辐射加热板,并且直立玻璃板在所述辐射加热板之间输送以进行加热。
9.根据权利要求1所述的玻璃板半导体涂覆系统,其还包括对涂覆的玻璃板提供辐射冷却的辐射热吸收器。
10.根据权利要求9所述的玻璃板半导体涂覆系统,其中,所述辐射热吸收器包括以相互间隔开和相互平行的关系直立延伸的辐射冷却板,并且在输送期间,直立玻璃板被定位在所述辐射冷却板之间以用于冷却。
11.根据权利要求10所述的玻璃板半导体涂覆系统,其中,所述辐射热吸收器位于所述出口负荷锁定站的上游的真空室中。
12.根据权利要求1所述的玻璃板半导体涂覆系统,其包括与第一次提到的输送机并排定位的第二输送机,以便也支撑直立玻璃板的上端,并将这些直立玻璃板与由第一输送机输送的直立玻璃板并排地输送通过所述系统,首先进入并通过所述入口负荷锁定站,进入所述真空室,然后通过用于加热玻璃板的所述加热站,其后通过用于在玻璃板上沉积半导体材料的所述沉积站,并且最后通过所述出口负荷锁定站从所述真空室出来,以用于运送涂覆的玻璃板。
13.根据权利要求1所述的玻璃板半导体涂覆系统,其中,所述细长外壳包括具有连接到彼此以界定所述真空室的端部的模块,每个模块包括部分圆形的下外壳部分、上通道部分、端部密封件和可拆卸的盖子,所述上通道部分从所述下外壳部分向上延伸并具有上通道开口,所述端部密封件在每个模块的端部围绕所述下外壳部分和所述上通道部分延伸,以与邻近的模块连接,并且所述可拆卸的盖子用于选择性地闭合所述通道开口,或提供所述通道开口的打开以进入所述模块进行维护或维修。
14.根据权利要求13所述的玻璃板半导体涂覆系统,其还包括框架,所述框架支撑所述输送机,并且由外壳模块的所述上通道部分支撑。
15.根据权利要求1所述的用于在玻璃板上涂覆半导体材料的系统,其中:
所述细长外壳包括具有连接到彼此以界定真空室的端部的外壳模块;
每个模块包括部分圆形的下外壳部分、上通道部分、端部密封件和可拆卸的盖子,所述上通道部分从所述下外壳部分向上延伸并具有上通道开口,所述端部密封件在所述模块的端部处围绕所述下外壳部分和所述上通道部分延伸以用于与邻近的模块连接,并且所述可拆卸的盖子用于选择性地闭合所述通道开口,或提供所述通道开口的打开以进入所述模块进行维护或维修;
所述外壳包括用于为沉积提供半导体材料的两个沉积站;
所述输送机包括传送装置、框架,所述传送装置用于支撑直立玻璃板的上端,所述框架由所述外壳模块的通道部分支撑,并且所述输送机还包括具有驱动机构的驱动器,所述驱动机构沿所述系统由所述框架支撑,以用于将所述传送装置和悬挂在所述传送装置上的直立玻璃板输送通过所述系统;
每个传送装置具有包括上表面、相对的横向侧面和向下悬挂的支撑部分的细长形状,所述向下悬挂的支撑部分用于支撑在输送期间支撑直立玻璃板的上端的夹具,输送机驱动器的所述驱动机构中的每个具有细长形状,并包括沿其细长形状间隔开的磁性旋转驱动构件,以在所述传送装置的上表面处支撑和旋转驱动所述传送装置,以用于将直立玻璃板输送进入、通过所述系统以及输送出所述系统,并且所述驱动机构具有故障保护辊,所述故障保护辊在所述传送装置的相对的横向侧面下方在相对的横向侧面处沿所述传送装置的长度间隔开;并且
辐射热吸收器包括以相互间隔开和相互平行的关系直立延伸的辐射冷却板,并且在输送期间,直立玻璃板被定位在所述辐射冷却板之间以用于冷却。
16.一种用于在玻璃板上涂覆半导体材料的方法,其包括:
沿直立方向在玻璃板的上端支撑玻璃板,并将直立玻璃板输送通过入口负荷锁定站进入真空室;
在所述真空室中加热直立输送的玻璃板;
然后在加热的且直立输送的玻璃板上沉积半导体材料;以及
其后,将涂覆有半导体的玻璃板通过出口负荷锁定站输送出所述真空室以用于运送。
17.根据权利要求16所述的玻璃板半导体涂覆方法,其中,直立玻璃板由传送装置支撑,所述传送装置由沿系统定位的驱动机构的磁性旋转驱动构件输送通过所述系统。
18.根据权利要求16所述的玻璃板半导体涂覆方法,其中,玻璃板由辐射加热器加热,所述辐射加热器包括在输送的直立玻璃板的相对侧间隔开的直立辐射加热板。
19.根据权利要求16所述的玻璃板半导体涂覆方法,其中,涂覆的玻璃板由辐射热吸收器冷却,所述辐射热吸收器包括以相互间隔开和相互平行的关系直立延伸的冷却板,并且在输送期间,直立玻璃板被定位在所述冷却板之间以用于冷却。
20.根据权利要求16所述的玻璃板半导体涂覆方法,其中,直立玻璃板:由传送装置支撑,所述传送装置由沿系统定位的驱动机构的磁性旋转驱动构件输送通过所述系统;由辐射加热器加热,所述辐射加热器包括在输送的直立玻璃板的相对侧间隔开的直立辐射加热板;并且由辐射热吸收器冷却,所述辐射热吸收器包括以相互间隔开和相互平行的关系直立延伸的冷却板,并且在输送期间,直立玻璃板被定位在所述冷却板之间以用于冷却。
21.一种涂覆有半导体的玻璃板,其包括:
玻璃板,其具有当所述玻璃板通过由夹具在所述玻璃板的上端进行悬挂而被直立地加热和输送时通过汽相沉积而沉积在所述玻璃板上的至少一层半导体材料,所述夹具使所述玻璃板变形,并留下在所述玻璃板被冷却之后保留的夹具标记。
22.根据权利要求21所述的涂覆有半导体的玻璃板,其包括在其一个表面上的氧化锡层、涂覆在所述氧化锡层上的第一半导体层,以及涂覆在所述第一半导体层上的第二半导体层。
CN200880010147A 2007-02-01 2008-01-28 用于玻璃板半导体涂覆的系统和方法 Pending CN101646800A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US89884907P 2007-02-01 2007-02-01
US60/898,849 2007-02-01

Publications (1)

Publication Number Publication Date
CN101646800A true CN101646800A (zh) 2010-02-10

Family

ID=39674745

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200880010147A Pending CN101646800A (zh) 2007-02-01 2008-01-28 用于玻璃板半导体涂覆的系统和方法

Country Status (14)

Country Link
US (2) US9337069B2 (zh)
EP (1) EP2132355A4 (zh)
JP (1) JP2010518604A (zh)
KR (1) KR20090110863A (zh)
CN (1) CN101646800A (zh)
AU (1) AU2008210794A1 (zh)
BR (1) BRPI0806833A2 (zh)
CA (1) CA2675532A1 (zh)
IL (1) IL199954A0 (zh)
MX (1) MX2009007819A (zh)
NZ (1) NZ579354A (zh)
RU (1) RU2009131761A (zh)
WO (1) WO2008094845A2 (zh)
ZA (1) ZA200905790B (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103814154A (zh) * 2011-09-27 2014-05-21 应用材料公司 薄型玻璃基板的载体及其用途
CN103814154B (zh) * 2011-09-27 2016-11-30 应用材料公司 薄型玻璃基板的载体及其用途
CN107275250A (zh) * 2016-04-08 2017-10-20 上海新昇半导体科技有限公司 降低预抽腔体中芯片温度的方法及芯片降温装置
CN110140224A (zh) * 2016-09-19 2019-08-16 美德安全玻璃制造(新)私人有限公司 一种用于在可变尺寸基板上制作光伏组件的方法和系统

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090324368A1 (en) * 2008-06-27 2009-12-31 Applied Materials, Inc. Processing system and method of operating a processing system
IT1399480B1 (it) 2010-03-15 2013-04-19 Stral S R L Apparecchiatura per la deposizione di materiale semiconduttore su vetro
KR101932578B1 (ko) * 2010-04-30 2018-12-28 어플라이드 머티어리얼스, 인코포레이티드 수직 인라인 화학기상증착 시스템
CN104302589B (zh) 2011-11-30 2017-11-28 康宁股份有限公司 光学涂覆方法、设备和产品
US9957609B2 (en) 2011-11-30 2018-05-01 Corning Incorporated Process for making of glass articles with optical and easy-to-clean coatings
US10077207B2 (en) 2011-11-30 2018-09-18 Corning Incorporated Optical coating method, apparatus and product
CN102529428A (zh) * 2011-12-14 2012-07-04 苏州工业园区高登威科技有限公司 汽车金属件冷却打标装置
CN103014660B (zh) * 2012-12-14 2015-06-10 广东志成冠军集团有限公司 Pecvd镀膜装置及其射频电源与真空腔体的连接装置
US9093599B2 (en) 2013-07-26 2015-07-28 First Solar, Inc. Vapor deposition apparatus for continuous deposition of multiple thin film layers on a substrate
JP2021091584A (ja) * 2019-12-12 2021-06-17 日本電気硝子株式会社 ガラス板の製造方法及び製造装置

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3391958A (en) * 1967-04-27 1968-07-09 Pittsburgh Plate Glass Co Glass gripping tongs with ballast
US3830540A (en) * 1971-01-21 1974-08-20 Ppg Industries Inc Treating glass sheets
US4159842A (en) * 1975-03-10 1979-07-03 Ppg Industries, Inc. Supporting glass sheets
CA1060923A (en) * 1975-03-10 1979-08-21 Alfred D. Perkowski Supporting glass sheets
US4274936A (en) * 1979-04-30 1981-06-23 Advanced Coating Technology, Inc. Vacuum deposition system and method
US4545327A (en) * 1982-08-27 1985-10-08 Anicon, Inc. Chemical vapor deposition apparatus
JPS59167013A (ja) * 1983-03-12 1984-09-20 Agency Of Ind Science & Technol プラズマcvd装置
US4593644A (en) * 1983-10-26 1986-06-10 Rca Corporation Continuous in-line deposition system
GB2206878B (en) * 1987-07-11 1991-07-17 Glaverbel Pyrolytically coated sheet glass and process of manufacturing same
US5016562A (en) * 1988-04-27 1991-05-21 Glasstech Solar, Inc. Modular continuous vapor deposition system
JP2948842B2 (ja) * 1989-11-24 1999-09-13 日本真空技術株式会社 インライン型cvd装置
JPH03287766A (ja) * 1990-04-03 1991-12-18 Mitsubishi Heavy Ind Ltd 基板搬送装置
US5248349A (en) * 1992-05-12 1993-09-28 Solar Cells, Inc. Process for making photovoltaic devices and resultant product
JP3175333B2 (ja) * 1992-06-15 2001-06-11 日新電機株式会社 基板処理装置
JP2854478B2 (ja) * 1992-12-18 1999-02-03 キヤノン株式会社 連続式スパッタリング装置
JPH0950992A (ja) * 1995-08-04 1997-02-18 Sharp Corp 成膜装置
US6921467B2 (en) * 1996-07-15 2005-07-26 Semitool, Inc. Processing tools, components of processing tools, and method of making and using same for electrochemical processing of microelectronic workpieces
US6013134A (en) * 1998-02-18 2000-01-11 International Business Machines Corporation Advance integrated chemical vapor deposition (AICVD) for semiconductor devices
US6206176B1 (en) * 1998-05-20 2001-03-27 Applied Komatsu Technology, Inc. Substrate transfer shuttle having a magnetic drive
JP4378790B2 (ja) * 1999-05-28 2009-12-09 株式会社日立プラズマパテントライセンシング ガラス基板のスパッタリング方法及びスパッタリング装置
JP2001089191A (ja) * 1999-09-27 2001-04-03 Nippon Sheet Glass Co Ltd ディスプレイ用ガラス基板の製造方法及び該製造方法により製造されたディスプレイ用ガラス基板
JP2001199745A (ja) * 2000-01-12 2001-07-24 Star Micronics Co Ltd 紫外線カットフィルタ膜の形成方法
US6500752B2 (en) * 2000-07-21 2002-12-31 Canon Sales Co., Inc. Semiconductor device and semiconductor device manufacturing method
JP4856308B2 (ja) * 2000-12-27 2012-01-18 キヤノンアネルバ株式会社 基板処理装置及び経由チャンバー
US6875468B2 (en) * 2001-04-06 2005-04-05 Rwe Solar Gmbh Method and device for treating and/or coating a surface of an object
US6559411B2 (en) * 2001-08-10 2003-05-06 First Solar, Llc Method and apparatus for laser scribing glass sheet substrate coatings
US7780787B2 (en) * 2004-08-11 2010-08-24 First Solar, Inc. Apparatus and method for depositing a material on a substrate
US8821099B2 (en) * 2005-07-11 2014-09-02 Brooks Automation, Inc. Load port module
TW200737533A (en) * 2005-12-21 2007-10-01 Nat Science And Technology Dev Agency Low-cost and high performance solar cell manufacturing machine
CN101601333A (zh) * 2006-12-28 2009-12-09 埃克阿泰克有限责任公司 用于等离子电弧涂敷的方法和设备
KR20100100958A (ko) * 2007-12-27 2010-09-15 엑사테크 엘.엘.씨. 멀티-패스 진공 코팅 시스템

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103814154A (zh) * 2011-09-27 2014-05-21 应用材料公司 薄型玻璃基板的载体及其用途
CN103814154B (zh) * 2011-09-27 2016-11-30 应用材料公司 薄型玻璃基板的载体及其用途
CN107275250A (zh) * 2016-04-08 2017-10-20 上海新昇半导体科技有限公司 降低预抽腔体中芯片温度的方法及芯片降温装置
CN110140224A (zh) * 2016-09-19 2019-08-16 美德安全玻璃制造(新)私人有限公司 一种用于在可变尺寸基板上制作光伏组件的方法和系统

Also Published As

Publication number Publication date
JP2010518604A (ja) 2010-05-27
ZA200905790B (en) 2010-05-26
NZ579354A (en) 2011-03-31
US20160233300A1 (en) 2016-08-11
EP2132355A4 (en) 2011-07-20
CA2675532A1 (en) 2008-08-07
WO2008094845A3 (en) 2008-11-27
BRPI0806833A2 (pt) 2014-05-13
MX2009007819A (es) 2009-10-26
EP2132355A2 (en) 2009-12-16
US9818822B2 (en) 2017-11-14
IL199954A0 (en) 2010-04-15
US20080187766A1 (en) 2008-08-07
RU2009131761A (ru) 2011-03-10
WO2008094845A2 (en) 2008-08-07
AU2008210794A1 (en) 2008-08-07
KR20090110863A (ko) 2009-10-22
US9337069B2 (en) 2016-05-10

Similar Documents

Publication Publication Date Title
CN101646800A (zh) 用于玻璃板半导体涂覆的系统和方法
KR101630804B1 (ko) 기판처리시스템 및 기판처리시스템의 언로드락모듈
JP2010518604A5 (zh)
CN204809191U (zh) 供串联基板处理工具中使用的门和包括所述门的串联基板处理工具
KR20110068917A (ko) 증착 장치용 컨베이어 조립체
US20130000555A1 (en) Modular system and process for continuous deposition of a thin film layer on a substrate
US9331231B2 (en) Process for continuous deposition of a sublimated source material to form a thin film layer on a substrate
US8673777B2 (en) In-line deposition system and process for deposition of a thin film layer
TWI648866B (zh) 成膜裝置及成膜方法以及太陽電池之製造方法
US10030307B2 (en) Apparatus and process for producing thin layers
KR101044772B1 (ko) 대면적 하향식 cigs 고속성막공정 시스템 및 방법
KR101680950B1 (ko) 코팅된 기판을 처리하기 위한 처리 박스, 장치 및 방법
KR20120113973A (ko) 기판처리시스템 및 그에 사용되는 트레이
US20090191031A1 (en) System and method for cooling semiconductor coated hot glass sheets
US20130098111A1 (en) Heat strengthening of a glass superstrate for thin film photovoltaic devices
US20120064658A1 (en) Entrance and Exit Roll Seal Configuration for a Vapor Deposition System
CN204144233U (zh) 基板支撑载体和用于处理基板的系统
KR101511179B1 (ko) 성막장치, 및 성막장치용 반송트레이
WO2018171909A1 (en) Apparatus and method for holding a substrate, apparatus and method for loading a substrate into a vacuum processing module, and system for vacuum processing of a substrate
KR20120113970A (ko) 기판처리시스템 및 그에 사용되는 트레이
WO2023245881A1 (zh) 传动结构
WO2023245882A1 (zh) 变距结构
KR20100130758A (ko) 박막 태양전지 제조용 화학 기상 증착 장치
US20130084668A1 (en) Temporary arc inducement of glass substrate during diffusive transport deposition
TWI438859B (zh) 真空鍍膜裝置及其中之滾輪裝置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20100210