CN101566473B - 测量装置和测量系统 - Google Patents

测量装置和测量系统 Download PDF

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Publication number
CN101566473B
CN101566473B CN2009101283242A CN200910128324A CN101566473B CN 101566473 B CN101566473 B CN 101566473B CN 2009101283242 A CN2009101283242 A CN 2009101283242A CN 200910128324 A CN200910128324 A CN 200910128324A CN 101566473 B CN101566473 B CN 101566473B
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CN
China
Prior art keywords
light
mirror
unit
measured
speed
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Expired - Fee Related
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CN2009101283242A
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English (en)
Chinese (zh)
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CN101566473A (zh
Inventor
林邦广
大友文夫
熊谷熏
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Topcon Corp
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Topcon Corp
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Publication of CN101566473A publication Critical patent/CN101566473A/zh
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Publication of CN101566473B publication Critical patent/CN101566473B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/002—Active optical surveying means
    • G01C15/004—Reference lines, planes or sectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4817—Constructional features, e.g. arrangements of optical elements relating to scanning

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
CN2009101283242A 2008-03-26 2009-03-26 测量装置和测量系统 Expired - Fee Related CN101566473B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2008081312 2008-03-26
JP2008081312A JP5150329B2 (ja) 2008-03-26 2008-03-26 測量装置及び測量システム
JP2008-081312 2008-03-26

Publications (2)

Publication Number Publication Date
CN101566473A CN101566473A (zh) 2009-10-28
CN101566473B true CN101566473B (zh) 2012-11-14

Family

ID=40790773

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009101283242A Expired - Fee Related CN101566473B (zh) 2008-03-26 2009-03-26 测量装置和测量系统

Country Status (4)

Country Link
US (1) US7965383B2 (enExample)
EP (1) EP2105706A3 (enExample)
JP (1) JP5150329B2 (enExample)
CN (1) CN101566473B (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5550855B2 (ja) * 2009-06-12 2014-07-16 株式会社トプコン 回転レーザ出射装置
JP5568363B2 (ja) * 2010-04-22 2014-08-06 株式会社トプコン レーザスキャナ
JP5738005B2 (ja) * 2011-03-01 2015-06-17 株式会社トプコン 光波距離測定装置
JP5725922B2 (ja) * 2011-03-25 2015-05-27 株式会社トプコン 測量システム及びこの測量システムに用いる測量用ポール及びこの測量システムに用いる携帯型無線送受信装置
EP2607847B1 (en) * 2011-12-19 2017-02-01 Kabushiki Kaisha TOPCON Rotation angle detecting apparatus and surveying instrument
JP2013242413A (ja) * 2012-05-21 2013-12-05 Suwa Optronics:Kk 撮像光学系、および撮像装置
US9404792B2 (en) * 2013-07-01 2016-08-02 Raytheon Company Auto-alignment system for high precision masted head mirror
JP6253973B2 (ja) * 2013-12-27 2017-12-27 株式会社トプコン 測量装置
JP6401542B2 (ja) * 2014-08-07 2018-10-10 株式会社トプコン アブソリュートエンコーダ、測量装置
CN104155657B (zh) * 2014-08-07 2016-08-24 国网安徽省电力公司淮南供电公司 用于电缆铺设测距的测距系统
EP3035076B1 (de) * 2014-12-17 2020-08-19 Leica Geosystems AG Vermessungsgerät mit Positioniereinrichtung
US20160356889A1 (en) * 2015-06-05 2016-12-08 Magenium Solutions LLC Laser Measuring System and Method
JP6670127B2 (ja) * 2016-02-24 2020-03-18 株式会社トプコン 建設機械の制御システム
JP6713847B2 (ja) * 2016-06-14 2020-06-24 株式会社トプコン 測量システム
DE102016213996B4 (de) * 2016-07-29 2021-08-05 Robert Bosch Gmbh Nivelliervorrichtung
CN106527502A (zh) * 2016-12-09 2017-03-22 中国电子科技集团公司第三十四研究所 一种无线光天线自动跟踪系统
US10976413B2 (en) * 2017-02-14 2021-04-13 Baidu Usa Llc LIDAR system with synchronized MEMS mirrors
US11536845B2 (en) * 2018-10-31 2022-12-27 Waymo Llc LIDAR systems with multi-faceted mirrors
JP7178311B2 (ja) * 2019-03-29 2022-11-25 株式会社トプコン ガイド光照射装置
CN111398513B (zh) * 2020-04-02 2021-11-05 中国矿业大学 一种高图像分辨率的检测单颗粒燃烧过程的装置及方法
JP7536666B2 (ja) * 2021-01-19 2024-08-20 株式会社トプコン 測量装置
CN113093149B (zh) * 2021-03-15 2024-02-20 昂纳科技(深圳)集团股份有限公司 一种转镜装置以及激光雷达
EP4074492B1 (de) * 2021-04-13 2023-09-20 Leister Technologies AG System zum fügen von werkstücken aus thermoplastischem kunststoff mittels laserdurchstrahlschweissen
JP2024011167A (ja) * 2022-07-14 2024-01-25 株式会社トプコン レーザースキャンの制御装置、レーザースキャン装置、レーザースキャンの制御方法およびプログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1758071A (zh) * 2004-10-06 2006-04-12 株式会社拓普康 距离测量装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5988862A (en) 1996-04-24 1999-11-23 Cyra Technologies, Inc. Integrated system for quickly and accurately imaging and modeling three dimensional objects
JP4416925B2 (ja) 2000-07-19 2010-02-17 株式会社トプコン 位置測定設定システム及びそれに使用する受光センサ装置
JP2004212058A (ja) * 2002-12-26 2004-07-29 Topcon Corp 作業位置測定装置
JP4263549B2 (ja) 2003-07-23 2009-05-13 株式会社トプコン 測量誘導装置
US7079228B2 (en) * 2004-04-15 2006-07-18 Rosemount Aerospace Inc. Combined laser altimeter and ground velocity measurement apparatus
JP4383308B2 (ja) * 2004-10-06 2009-12-16 有限会社コンチェルト 自動測量装置
JP4639812B2 (ja) * 2005-01-19 2011-02-23 株式会社デンソー スキャニング装置
CA2595324C (en) * 2005-01-21 2015-08-11 Massachusetts Institute Of Technology Methods and apparatus for optical coherence tomography scanning
US7306339B2 (en) * 2005-02-01 2007-12-11 Laser Projection Technologies, Inc. Laser projection with object feature detection
JP4819403B2 (ja) * 2005-06-06 2011-11-24 株式会社トプコン 距離測定装置
JP2007248225A (ja) * 2006-03-15 2007-09-27 Omron Corp レーザビーム照射装置及び測距装置
JP2007279017A (ja) * 2006-03-15 2007-10-25 Omron Corp レーダ装置
JP5020585B2 (ja) * 2006-09-27 2012-09-05 株式会社トプコン 測定システム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1758071A (zh) * 2004-10-06 2006-04-12 株式会社拓普康 距离测量装置

Also Published As

Publication number Publication date
US7965383B2 (en) 2011-06-21
US20090241359A1 (en) 2009-10-01
EP2105706A3 (en) 2013-07-24
CN101566473A (zh) 2009-10-28
EP2105706A2 (en) 2009-09-30
JP2009236601A (ja) 2009-10-15
JP5150329B2 (ja) 2013-02-20

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Granted publication date: 20121114