JP7536666B2 - 測量装置 - Google Patents
測量装置 Download PDFInfo
- Publication number
- JP7536666B2 JP7536666B2 JP2021006161A JP2021006161A JP7536666B2 JP 7536666 B2 JP7536666 B2 JP 7536666B2 JP 2021006161 A JP2021006161 A JP 2021006161A JP 2021006161 A JP2021006161 A JP 2021006161A JP 7536666 B2 JP7536666 B2 JP 7536666B2
- Authority
- JP
- Japan
- Prior art keywords
- optical axis
- light
- distance measurement
- unit
- angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000005259 measurement Methods 0.000 claims description 187
- 230000003287 optical effect Effects 0.000 claims description 161
- 239000006185 dispersion Substances 0.000 claims description 108
- 238000001514 detection method Methods 0.000 claims description 105
- 238000003384 imaging method Methods 0.000 claims description 91
- 238000000605 extraction Methods 0.000 claims description 11
- 230000005540 biological transmission Effects 0.000 claims description 5
- 239000000284 extract Substances 0.000 claims description 4
- 239000002131 composite material Substances 0.000 description 15
- 230000008859 change Effects 0.000 description 13
- 238000010586 diagram Methods 0.000 description 11
- 230000006870 function Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 230000004044 response Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 239000005304 optical glass Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
- G01C15/002—Active optical surveying means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
- G01C15/002—Active optical surveying means
- G01C15/008—Active optical surveying means combined with inclination sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
- G01C9/02—Details
- G01C9/06—Electric or photoelectric indication or reading means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/42—Simultaneous measurement of distance and other co-ordinates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/88—Lidar systems specially adapted for specific applications
- G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4817—Constructional features, e.g. arrangements of optical elements relating to scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
- G01C9/02—Details
- G01C9/06—Electric or photoelectric indication or reading means
- G01C2009/066—Electric or photoelectric indication or reading means optical
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Electromagnetism (AREA)
- Computer Networks & Wireless Communication (AREA)
- Measurement Of Optical Distance (AREA)
- Optical Radar Systems And Details Thereof (AREA)
Description
11 測距光射出部
12 受光部
13 検出光射出部
14 広角撮像部
15 測距演算部
16 演算制御部
18 姿勢検出部
19 射出方向検出部
24 画像処理部
26 光軸偏向部
27 狭角撮像制御部
28 測距部
31 射出光軸
35 受光光軸
37 測距光
38 反射測距光
39 測距光軸
44 検出光光軸
44′ 狭角撮像光軸
47 検出光
53,54 ディスクプリズム
55,58 波長分散補償プリズム
71 狭角撮像部
73 狭角画像
Claims (6)
- 測距光を測距光軸に沿って射出する測距光射出部と、反射測距光を受光する受光部と、前記測距光の送信信号と前記反射測距光の受光信号に基づき測定対象迄の距離と前記反射測距光の反射強度を測定する測距演算部と、前記測距光軸と一部を共用する狭角撮像光軸を有し、前記測距光軸を中心とする画像を取得する狭角撮像部と、前記測距光軸と前記狭角撮像光軸との共用部分に配置された波長分散補償プリズムと該波長分散補償プリズムの入出射端面に対して垂直又は略垂直な回転軸を有し、前記波長分散補償プリズムの回転で前記測距光軸を偏向させる光軸偏向部と、前記画像から前記波長分散補償プリズムの端面反射像を抽出する抽出手段と、前記光軸偏向部と前記測距演算部とを制御し、前記抽出手段が抽出した端面反射像に基づき前記光軸偏向部の偏向方向を演算する演算制御部とを具備する様構成された測量装置。
- 測定対象を検出する為の検出光を検出光光軸に沿って射出する検出光射出部を更に具備し、前記検出光光軸は前記測距光軸と前記狭角撮像光軸と一部を共用し、各光軸の共用部分に前記波長分散補償プリズムが配置され、前記抽出手段は、前記画像から前記波長分散補償プリズムの端面で反射された前記測距光と前記検出光の少なくとも一方を抽出する様構成された請求項1に記載の測量装置。
- 前記測距光と前記検出光の少なくとも一方を前記回転軸に対して傾斜させて前記波長分散補償プリズムの端面に入射させる様構成された請求項2に記載の測量装置。
- 前記光軸偏向部の最大偏向範囲と略同じ画角を有する広角撮像部を更に具備する請求項1~請求項3のうちのいずれか1項に記載の測量装置。
- 水平に対する傾斜を検出する姿勢検出部を更に具備し、該姿勢検出部の検出結果に基づき測定結果を補正する様構成された請求項1~請求項4のうちのいずれか1項に記載の測量装置。
- 前記演算制御部は、反射強度に基づき前記測定対象で反射された測定対象反射像と前記端面反射像とを識別可能に構成された請求項1~請求項5のうちのいずれか1項に記載の測量装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021006161A JP7536666B2 (ja) | 2021-01-19 | 2021-01-19 | 測量装置 |
US17/575,726 US20220229182A1 (en) | 2021-01-19 | 2022-01-14 | Surveying Instrument |
EP22151936.6A EP4030137B1 (en) | 2021-01-19 | 2022-01-18 | Surveying instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2021006161A JP7536666B2 (ja) | 2021-01-19 | 2021-01-19 | 測量装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2022110635A JP2022110635A (ja) | 2022-07-29 |
JP7536666B2 true JP7536666B2 (ja) | 2024-08-20 |
Family
ID=79730278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2021006161A Active JP7536666B2 (ja) | 2021-01-19 | 2021-01-19 | 測量装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20220229182A1 (ja) |
EP (1) | EP4030137B1 (ja) |
JP (1) | JP7536666B2 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112154662B (zh) * | 2018-05-22 | 2022-05-10 | 松下电器(美国)知识产权公司 | 编码装置、解码装置、编码方法、解码方法及图片压缩程序 |
EP3748289B1 (en) * | 2019-06-07 | 2024-01-10 | Leica Geosystems AG | Scanning surveying device |
JP2022135639A (ja) * | 2021-03-05 | 2022-09-15 | i-PRO株式会社 | カメラ装置および画角ずれ通知方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5150329B2 (ja) * | 2008-03-26 | 2013-02-20 | 株式会社トプコン | 測量装置及び測量システム |
JP6541365B2 (ja) | 2015-02-16 | 2019-07-10 | 株式会社トプコン | 姿勢検出装置及びデータ取得装置 |
JP6410258B2 (ja) | 2015-03-02 | 2018-10-24 | 株式会社トプコン | 光波距離計 |
CN106017362B (zh) * | 2016-08-07 | 2019-01-29 | 哈尔滨工业大学 | 一种便携式高动态精度大工作距自准直装置与方法 |
JP7138525B2 (ja) * | 2018-09-25 | 2022-09-16 | 株式会社トプコン | 測量装置及び測量装置システム |
-
2021
- 2021-01-19 JP JP2021006161A patent/JP7536666B2/ja active Active
-
2022
- 2022-01-14 US US17/575,726 patent/US20220229182A1/en active Pending
- 2022-01-18 EP EP22151936.6A patent/EP4030137B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20220229182A1 (en) | 2022-07-21 |
EP4030137A1 (en) | 2022-07-20 |
JP2022110635A (ja) | 2022-07-29 |
EP4030137B1 (en) | 2024-05-01 |
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