CN101277566B - 光源装置以及使用该光源装置的曝光装置 - Google Patents
光源装置以及使用该光源装置的曝光装置 Download PDFInfo
- Publication number
- CN101277566B CN101277566B CN2007101489335A CN200710148933A CN101277566B CN 101277566 B CN101277566 B CN 101277566B CN 2007101489335 A CN2007101489335 A CN 2007101489335A CN 200710148933 A CN200710148933 A CN 200710148933A CN 101277566 B CN101277566 B CN 101277566B
- Authority
- CN
- China
- Prior art keywords
- light
- discharge lamp
- illumination
- mentioned
- supply apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70075—Homogenization of illumination intensity in the mask plane by using an integrator, e.g. fly's eye lens, facet mirror or glass rod, by using a diffusing optical element or by beam deflection
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
- Y02B20/40—Control techniques providing energy savings, e.g. smart controller or presence detection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Public Health (AREA)
- Epidemiology (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-079179 | 2007-03-26 | ||
JP2007079179A JP4937808B2 (ja) | 2007-03-26 | 2007-03-26 | 光源装置ならびにこれを用いた露光装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101277566A CN101277566A (zh) | 2008-10-01 |
CN101277566B true CN101277566B (zh) | 2012-07-18 |
Family
ID=39913351
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2007101489335A Active CN101277566B (zh) | 2007-03-26 | 2007-09-12 | 光源装置以及使用该光源装置的曝光装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4937808B2 (ko) |
KR (1) | KR101314559B1 (ko) |
CN (1) | CN101277566B (ko) |
TW (1) | TWI421643B (ko) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101725542B1 (ko) | 2009-04-09 | 2017-04-10 | 가부시키가이샤 브이 테크놀로지 | 노광 장치용 광 조사 장치 및 그 점등 제어 방법, 그리고 노광 장치 및 기판 |
JP5355261B2 (ja) * | 2009-07-07 | 2013-11-27 | 株式会社日立ハイテクノロジーズ | プロキシミティ露光装置、プロキシミティ露光装置の露光光形成方法、及び表示用パネル基板の製造方法 |
JP5281987B2 (ja) * | 2009-08-26 | 2013-09-04 | 株式会社日立ハイテクノロジーズ | 露光装置およびそれを用いた露光方法並びに表示用パネル基板の製造方法 |
JP5674195B2 (ja) * | 2010-01-14 | 2015-02-25 | Nskテクノロジー株式会社 | 露光装置及び露光方法 |
CN102369484B (zh) * | 2010-02-05 | 2015-05-20 | 恩斯克科技有限公司 | 曝光装置用照光装置及其亮灯控制方法、以及曝光装置、曝光方法及基板 |
KR101437210B1 (ko) * | 2010-02-24 | 2014-11-03 | 엔에스케이 테쿠노로지 가부시키가이샤 | 노광 장치용 광조사 장치, 노광 장치, 노광 방법, 기판의 제조 방법, 마스크, 및 피노광 기판 |
JP5799306B2 (ja) * | 2010-07-22 | 2015-10-21 | 株式会社ブイ・テクノロジー | 露光装置用光照射装置の制御方法、及び露光方法 |
WO2012011497A1 (ja) * | 2010-07-22 | 2012-01-26 | Nskテクノロジー株式会社 | 露光装置用光照射装置、光照射装置の制御方法、露光装置及び露光方法 |
CN102483587B (zh) * | 2010-07-22 | 2014-11-05 | 恩斯克科技有限公司 | 曝光装置用光照射装置、光照射装置的控制方法、曝光装置以及曝光方法 |
US9041993B2 (en) | 2010-07-26 | 2015-05-26 | Lg Chem, Ltd. | Mask |
TWI463272B (zh) * | 2010-11-30 | 2014-12-01 | Ushio Electric Inc | Light irradiation device |
CN102098839B (zh) * | 2010-12-29 | 2013-09-11 | 东北大学 | 机场航站楼照明节能控制系统 |
US20130207544A1 (en) * | 2011-09-30 | 2013-08-15 | Pinebrook Imaging Technology, Ltd. | Illumination system |
KR101260221B1 (ko) * | 2011-12-01 | 2013-05-06 | 주식회사 엘지화학 | 마스크 |
US9140979B2 (en) | 2011-12-01 | 2015-09-22 | Lg Chem, Ltd. | Mask |
TWI609247B (zh) * | 2013-04-09 | 2017-12-21 | Orc Manufacturing Co Ltd | Light source apparatus and exposure apparatus including the light source apparatus |
CN105045043B (zh) * | 2014-04-28 | 2018-01-05 | 株式会社V技术 | 曝光装置和曝光方法 |
JP5869713B1 (ja) * | 2015-04-13 | 2016-02-24 | フェニックス電機株式会社 | 光源装置及び露光装置とその検査方法 |
JP6503235B2 (ja) * | 2015-06-02 | 2019-04-17 | 株式会社アドテックエンジニアリング | 光源装置、露光装置及び光源制御方法 |
JP7141126B2 (ja) * | 2017-08-23 | 2022-09-22 | フェニックス電機株式会社 | 光源装置、露光装置、および光源装置の判定方法 |
CN111466011B (zh) * | 2017-12-08 | 2023-05-23 | 凤凰电机公司 | 灯的点亮方法 |
JP7379036B2 (ja) * | 2019-09-13 | 2023-11-14 | キヤノン株式会社 | シャッタ装置、光量制御方法、リソグラフィ装置及び物品の製造方法 |
CN111965946A (zh) * | 2020-08-13 | 2020-11-20 | Tcl华星光电技术有限公司 | 光刻用照光装置及自动调整其照度的方法 |
WO2022220229A1 (ja) * | 2021-04-16 | 2022-10-20 | フェニックス電機株式会社 | 露光用光源、光照射装置、露光装置、および露光方法 |
CN117157589A (zh) * | 2021-04-16 | 2023-12-01 | 凤凰电机公司 | 曝光用光源、光照射装置、曝光装置、以及曝光方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1841204A (zh) * | 2005-03-28 | 2006-10-04 | 东丽工程株式会社 | 外围曝光装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05127086A (ja) * | 1991-11-01 | 1993-05-25 | Matsushita Electric Ind Co Ltd | 光強度の均一化方法およびそれを用いた露光装置 |
KR100205518B1 (ko) * | 1996-08-31 | 1999-07-01 | 구자홍 | 노광장치 및 노광방법 |
KR20010068399A (ko) * | 2000-01-05 | 2001-07-23 | 김영남 | 노광대 조도 제어장치 |
JP2002174551A (ja) | 2000-12-05 | 2002-06-21 | Oyo Denki Kk | 照度校正システム |
JP2004056086A (ja) * | 2002-05-31 | 2004-02-19 | Ushio Inc | ランプ点灯制御装置および光照射装置 |
JP4391136B2 (ja) * | 2003-06-05 | 2009-12-24 | 株式会社目白ゲノッセン | 露光用照明装置 |
JP2005227465A (ja) * | 2004-02-12 | 2005-08-25 | Mejiro Genossen:Kk | 照明光学系の使用方法及びフラットパネルディスプレイの製造方法 |
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2007
- 2007-03-26 JP JP2007079179A patent/JP4937808B2/ja active Active
- 2007-08-15 TW TW096130174A patent/TWI421643B/zh active
- 2007-09-12 CN CN2007101489335A patent/CN101277566B/zh active Active
- 2007-09-28 KR KR1020070097811A patent/KR101314559B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1841204A (zh) * | 2005-03-28 | 2006-10-04 | 东丽工程株式会社 | 外围曝光装置 |
Also Published As
Publication number | Publication date |
---|---|
TWI421643B (zh) | 2014-01-01 |
JP4937808B2 (ja) | 2012-05-23 |
CN101277566A (zh) | 2008-10-01 |
KR20080087630A (ko) | 2008-10-01 |
KR101314559B1 (ko) | 2013-10-07 |
JP2008241877A (ja) | 2008-10-09 |
TW200839454A (en) | 2008-10-01 |
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C06 | Publication | ||
PB01 | Publication | ||
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SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
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