CN101268417A - 具有灰度的光掩模及其制造方法 - Google Patents

具有灰度的光掩模及其制造方法 Download PDF

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Publication number
CN101268417A
CN101268417A CNA2006800345852A CN200680034585A CN101268417A CN 101268417 A CN101268417 A CN 101268417A CN A2006800345852 A CNA2006800345852 A CN A2006800345852A CN 200680034585 A CN200680034585 A CN 200680034585A CN 101268417 A CN101268417 A CN 101268417A
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CN
China
Prior art keywords
film
light
shielding film
photomask
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2006800345852A
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English (en)
Chinese (zh)
Inventor
藤川润二
岛田周
吉田雄一
佐佐木志保
天野刚
伊藤公夫
登山伸人
毛利弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Publication of CN101268417A publication Critical patent/CN101268417A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
    • G03F1/46—Antireflective coatings
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/36—Masks having proximity correction features; Preparation thereof, e.g. optical proximity correction [OPC] design processes
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/54—Absorbers, e.g. of opaque materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
    • H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
    • H10P76/2041—Photolithographic processes
    • H10P76/2043—Photolithographic processes using an anti-reflective coating

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
CNA2006800345852A 2005-09-21 2006-09-19 具有灰度的光掩模及其制造方法 Pending CN101268417A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005273601 2005-09-21
JP273601/2005 2005-09-21

Publications (1)

Publication Number Publication Date
CN101268417A true CN101268417A (zh) 2008-09-17

Family

ID=37888972

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2006800345852A Pending CN101268417A (zh) 2005-09-21 2006-09-19 具有灰度的光掩模及其制造方法

Country Status (5)

Country Link
US (1) US8124301B2 (https=)
KR (1) KR20080037702A (https=)
CN (1) CN101268417A (https=)
TW (1) TW200717176A (https=)
WO (1) WO2007034930A1 (https=)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102103323B (zh) * 2009-12-21 2012-10-10 北京京东方光电科技有限公司 半色调掩模板及其制作方法
CN102308256B (zh) * 2009-02-16 2013-09-25 大日本印刷株式会社 光掩模、光掩模的制造方法及修正方法
TWI502623B (zh) * 2010-01-07 2015-10-01 Ｈｏｙａ股份有限公司 光罩之製造方法、光罩、及顯示裝置之製造方法
CN104155810B (zh) * 2014-07-22 2017-01-25 京东方科技集团股份有限公司 一种掩膜板
CN111095108A (zh) * 2017-07-17 2020-05-01 Asml荷兰有限公司 信息确定设备和方法
CN111367142A (zh) * 2018-12-26 2020-07-03 聚灿光电科技（宿迁）有限公司 一种包含不同透光性的新型光学掩膜版
CN113296354A (zh) * 2020-02-22 2021-08-24 长鑫存储技术有限公司 应用于半导体光刻工艺中的掩膜版及光刻工艺方法
CN113311660A (zh) * 2021-06-03 2021-08-27 上海传芯半导体有限公司 掩模基版的制作方法及具有等离子体加热装置的涂胶设备

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI446105B (zh) * 2007-07-23 2014-07-21 Hoya Corp 光罩之製造方法、圖案轉印方法、光罩以及資料庫
CN101393385B (zh) * 2007-09-21 2013-09-11 北京京东方光电科技有限公司 可调节透射率的半色调掩模版及其制造方法
JP4934237B2 (ja) * 2007-09-29 2012-05-16 Ｈｏｙａ株式会社 グレートーンマスクの製造方法及びグレートーンマスク、並びにパターン転写方法
US8685596B2 (en) * 2007-12-04 2014-04-01 Sharp Laboratories Of America, Inc. Semi-transparent film grayscale mask
JP5108551B2 (ja) * 2008-02-15 2012-12-26 Ｈｏｙａ株式会社 多階調フォトマスク及びそれを用いたパターン転写方法
KR101079161B1 (ko) * 2008-12-22 2011-11-02 엘지이노텍 주식회사 하프톤 마스크 및 그 제조방법
CN101990058A (zh) * 2009-07-30 2011-03-23 鸿富锦精密工业（深圳）有限公司 晶圆级相机模组的镀膜方法及晶圆级相机模组
DE102009046878A1 (de) * 2009-07-31 2011-02-03 Advanced Mask Technology Center Gmbh & Co. Kg Verringerung der lonenwanderung von Absorbermaterialien von Lithographiemasken durch Chrompassivierung
CN102986311B (zh) * 2010-07-08 2016-05-04 Lg伊诺特有限公司 印刷电路板及其制造方法
KR101679721B1 (ko) 2010-12-13 2016-11-28 삼성전자주식회사 포토마스크 및 그 제조 방법
JP6021365B2 (ja) * 2012-03-12 2016-11-09 キヤノン株式会社 インプリント装置、それを用いた物品の製造方法
JP5837257B2 (ja) * 2013-09-24 2015-12-24 Hoya株式会社 マスクブランク、転写用マスクおよび転写用マスクの製造方法
KR102157644B1 (ko) * 2014-08-13 2020-09-21 (주)에스앤에스텍 다계조 포토 마스크 및 그의 제조 방법
KR102286886B1 (ko) * 2014-11-18 2021-08-09 삼성디스플레이 주식회사 포토 마스크 및 이의 제조 방법
KR102502202B1 (ko) 2015-06-29 2023-02-21 삼성디스플레이 주식회사 발광 표시 장치 및 그 제조 방법
GB201517273D0 (en) * 2015-09-30 2015-11-11 Univ Manchester Resist composition
US20170147652A1 (en) * 2015-11-19 2017-05-25 Institute For Information Industry Search servers, end devices, and search methods for use in a distributed network
CN107145035A (zh) * 2017-03-30 2017-09-08 惠科股份有限公司 光罩及其主动开关阵列基板的制造方法
KR102757231B1 (ko) * 2017-07-21 2025-01-21 칼 짜이스 에스엠티 게엠베하 포토리소그래피 마스크의 과잉 재료의 폐기를 위한 방법 및 장치
US10811492B2 (en) 2018-10-31 2020-10-20 Texas Instruments Incorporated Method and device for patterning thick layers

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW517286B (en) * 2000-12-19 2003-01-11 Hoya Corp Gray tone mask and method for producing the same
KR100599054B1 (ko) * 2001-04-11 2006-07-12 삼성전자주식회사 투과량 조절 마스크 및 그 제조방법
DE10310136B4 (de) * 2003-03-07 2007-05-03 Infineon Technologies Ag Maskensatz zur Projektion von jeweils auf den Masken des Satzes angeordneten und aufeinander abgestimmten Strukturmustern auf einen Halbleiterwafer
JP2005091855A (ja) * 2003-09-18 2005-04-07 Dainippon Printing Co Ltd 階調マスクの製造方法
JP4608882B2 (ja) 2003-12-22 2011-01-12 セイコーエプソン株式会社 露光用マスク及びその製造方法、並びに液晶装置の製造方法
JP2005241693A (ja) * 2004-02-24 2005-09-08 Shin Etsu Chem Co Ltd ハーフトーン型位相シフトマスクブランク及びその製造方法並びにハーフトーン型位相シフトマスク及びその製造方法

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102308256B (zh) * 2009-02-16 2013-09-25 大日本印刷株式会社 光掩模、光掩模的制造方法及修正方法
CN102103323B (zh) * 2009-12-21 2012-10-10 北京京东方光电科技有限公司 半色调掩模板及其制作方法
TWI502623B (zh) * 2010-01-07 2015-10-01 Ｈｏｙａ股份有限公司 光罩之製造方法、光罩、及顯示裝置之製造方法
CN104155810B (zh) * 2014-07-22 2017-01-25 京东方科技集团股份有限公司 一种掩膜板
CN111095108A (zh) * 2017-07-17 2020-05-01 Asml荷兰有限公司 信息确定设备和方法
CN111367142A (zh) * 2018-12-26 2020-07-03 聚灿光电科技（宿迁）有限公司 一种包含不同透光性的新型光学掩膜版
CN113296354A (zh) * 2020-02-22 2021-08-24 长鑫存储技术有限公司 应用于半导体光刻工艺中的掩膜版及光刻工艺方法
CN113296354B (zh) * 2020-02-22 2023-04-07 长鑫存储技术有限公司 应用于半导体光刻工艺中的掩膜版及光刻工艺方法
CN113311660A (zh) * 2021-06-03 2021-08-27 上海传芯半导体有限公司 掩模基版的制作方法及具有等离子体加热装置的涂胶设备

Also Published As

Publication number Publication date
US20090220867A1 (en) 2009-09-03
KR20080037702A (ko) 2008-04-30
TWI363247B (https=) 2012-05-01
WO2007034930A1 (ja) 2007-03-29
US8124301B2 (en) 2012-02-28
TW200717176A (en) 2007-05-01

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Application publication date: 20080917