CN101258401B - 热流型差示扫描量热仪 - Google Patents

热流型差示扫描量热仪 Download PDF

Info

Publication number
CN101258401B
CN101258401B CN2006800322583A CN200680032258A CN101258401B CN 101258401 B CN101258401 B CN 101258401B CN 2006800322583 A CN2006800322583 A CN 2006800322583A CN 200680032258 A CN200680032258 A CN 200680032258A CN 101258401 B CN101258401 B CN 101258401B
Authority
CN
China
Prior art keywords
heat
heat flow
sample
holder
flow path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2006800322583A
Other languages
English (en)
Chinese (zh)
Other versions
CN101258401A (zh
Inventor
木下良一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Science Corp
Original Assignee
SII NanoTechnology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SII NanoTechnology Inc filed Critical SII NanoTechnology Inc
Publication of CN101258401A publication Critical patent/CN101258401A/zh
Application granted granted Critical
Publication of CN101258401B publication Critical patent/CN101258401B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
    • G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
CN2006800322583A 2005-09-01 2006-08-23 热流型差示扫描量热仪 Expired - Fee Related CN101258401B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP253704/2005 2005-09-01
JP2005253704A JP4611154B2 (ja) 2005-09-01 2005-09-01 熱流束型示差走査熱量計
PCT/JP2006/316445 WO2007029491A1 (ja) 2005-09-01 2006-08-23 熱流束型示差走査熱量計

Publications (2)

Publication Number Publication Date
CN101258401A CN101258401A (zh) 2008-09-03
CN101258401B true CN101258401B (zh) 2011-12-14

Family

ID=37835615

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2006800322583A Expired - Fee Related CN101258401B (zh) 2005-09-01 2006-08-23 热流型差示扫描量热仪

Country Status (5)

Country Link
US (1) US7588366B2 (enExample)
JP (1) JP4611154B2 (enExample)
CN (1) CN101258401B (enExample)
DE (1) DE112006002277B4 (enExample)
WO (1) WO2007029491A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1021400C2 (nl) * 2002-09-05 2004-03-08 Tno Werkwijze en inrichting voor het bepalen van een faseovergang van een stof.
US8266042B2 (en) * 2004-12-21 2012-09-11 Weather Risk Solutions, Llc Financial activity based on natural peril events
JP2008089474A (ja) * 2006-10-03 2008-04-17 Rigaku Corp 熱分析装置のセンサユニットおよびその製造方法
JP4831487B2 (ja) * 2006-12-21 2011-12-07 エスアイアイ・ナノテクノロジー株式会社 示差走査熱量計
JP5540241B2 (ja) * 2009-10-02 2014-07-02 イマジニアリング株式会社 熱流束計測装置、及び熱流束計測方法
DE102013102088B3 (de) * 2013-03-04 2014-07-17 Netzsch-Gerätebau GmbH Verfahren und Vorrichtung zur Materialanalyse
CN106093110A (zh) * 2016-06-08 2016-11-09 大连理工大学 一种用于测定微藻类生长曲线的自动量热装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1488934A (zh) * 2002-10-10 2004-04-14 中国石油化工股份有限公司 一种差示扫描量热仪及其防腐处理方法
CN1598558A (zh) * 2004-08-27 2005-03-23 南京大学 液氮气化扫描量热法及液氮气化扫描量热仪

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5682436A (en) * 1979-12-08 1981-07-06 Shimadzu Corp Differential scanning calorimeter
JPS59153156A (ja) * 1983-02-22 1984-09-01 Shinku Riko Kk 熱量計
JPS6064250A (ja) 1983-09-20 1985-04-12 Niigata Eng Co Ltd 工具損傷検出装置
JPS6064250U (ja) 1983-10-07 1985-05-07 セイコーインスツルメンツ株式会社 示差走査熱量計
JPH0823535B2 (ja) * 1987-04-13 1996-03-06 セイコー電子工業株式会社 示差走査熱量計
JPH04348264A (ja) * 1991-05-24 1992-12-03 Rigaku Corp 熱分析装置
JP2909950B2 (ja) * 1993-09-24 1999-06-23 セイコーインスツルメンツ株式会社 熱分析装置
JP3434694B2 (ja) * 1997-12-01 2003-08-11 セイコーインスツルメンツ株式会社 示差走査熱量計
JP3137605B2 (ja) * 1998-07-14 2001-02-26 セイコーインスツルメンツ株式会社 熱流束型示差走査熱量計
US6843595B2 (en) * 2001-01-26 2005-01-18 Waters Investment Limited Differential scanning calorimeter accounting for heat leakage
JP2003042985A (ja) * 2001-08-03 2003-02-13 Seiko Instruments Inc 示差走査熱量計
EP1371973B1 (en) * 2002-06-10 2011-08-24 Mettler-Toledo AG Method and apparatus for thermally investigating a material
US7371006B2 (en) * 2004-02-10 2008-05-13 Perkinelmer Las, Inc. Differential scanning calorimeter (DSC) with temperature controlled furnace

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1488934A (zh) * 2002-10-10 2004-04-14 中国石油化工股份有限公司 一种差示扫描量热仪及其防腐处理方法
CN1598558A (zh) * 2004-08-27 2005-03-23 南京大学 液氮气化扫描量热法及液氮气化扫描量热仪

Also Published As

Publication number Publication date
JP2007064882A (ja) 2007-03-15
US7588366B2 (en) 2009-09-15
DE112006002277B4 (de) 2014-12-18
CN101258401A (zh) 2008-09-03
WO2007029491A1 (ja) 2007-03-15
US20080187020A1 (en) 2008-08-07
DE112006002277T5 (de) 2008-07-24
JP4611154B2 (ja) 2011-01-12

Similar Documents

Publication Publication Date Title
US4095453A (en) Differential thermal analysis cell
US7470057B2 (en) Differential scanning calorimeter sensor and method
JP5642525B2 (ja) 示差走査熱量計
US5711604A (en) Method for measuring the coefficient of heat conductivity of a sample
EP2976610B1 (en) Thermopile differential scanning calorimeter sensor
US8943887B2 (en) Thermal-based flow sensing apparatuses and methods for high-performance liquid chromatography
EP1909081A1 (en) Sensor unit of thermal analysis equipment and method of manufacturing the same
US7588366B2 (en) Heat flow flux type differential scanning calorimeter
US6431747B1 (en) Heat flux differential scanning calorimeter sensor
JP2003042985A (ja) 示差走査熱量計
JP2013528292A (ja) 熱分析試料保持器
US5779363A (en) Capillary calorimetric cell and method of manufacturing same
JP2001513882A (ja) 化学分析用マイクロフローモジュール
US6422742B1 (en) Differential scanning calorimeter
US3545253A (en) Temperature measuring devices for thermal analysis
JP2004020509A (ja) 熱量計
JP3163711U (ja) 示差走査熱量計
JPH1026594A (ja) 熱分析用素子及びその製造方法
JP2002181751A (ja) 示差走査熱量計
JP2909922B2 (ja) 熱機械的分析の温度補正方法
JP2004279074A (ja) 熱機械分析装置
JP4852740B2 (ja) 高圧測定可能な示差走査型熱量計及びそれを用いた示差走査型熱流計装置
JPS62231148A (ja) 熱分析装置
JPH0514202Y2 (enExample)
CN102565114A (zh) 一种dta/dsc测量及加热装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C56 Change in the name or address of the patentee

Owner name: HITACHI HIGH TECH SCIENCE CORP.

Free format text: FORMER NAME: SEIKO NANOTECHNOLOGY INC.

CP03 Change of name, title or address

Address after: Tokyo, Japan, Japan

Patentee after: Hitachi High Tech Science Corp.

Address before: Chiba County, Japan

Patentee before: Seiko Nanotechnology Inc.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20111214

Termination date: 20180823