CN101226877B - 基板处理装置及基板处理方法 - Google Patents
基板处理装置及基板处理方法 Download PDFInfo
- Publication number
- CN101226877B CN101226877B CN2008100023991A CN200810002399A CN101226877B CN 101226877 B CN101226877 B CN 101226877B CN 2008100023991 A CN2008100023991 A CN 2008100023991A CN 200810002399 A CN200810002399 A CN 200810002399A CN 101226877 B CN101226877 B CN 101226877B
- Authority
- CN
- China
- Prior art keywords
- mentioned
- substrate
- conductive layer
- film
- insulating properties
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0431—Apparatus for thermal treatment
- H10P72/0436—Apparatus for thermal treatment mainly by radiation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P95/00—Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
- H10P95/90—Thermal treatments, e.g. annealing or sintering
Landscapes
- Chemical Vapour Deposition (AREA)
- Photovoltaic Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007008306A JP4361568B2 (ja) | 2007-01-17 | 2007-01-17 | 基板処理装置および基板処理方法 |
| JP2007008306 | 2007-01-17 | ||
| JP2007-008306 | 2007-01-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101226877A CN101226877A (zh) | 2008-07-23 |
| CN101226877B true CN101226877B (zh) | 2010-12-01 |
Family
ID=39704110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2008100023991A Expired - Fee Related CN101226877B (zh) | 2007-01-17 | 2008-01-17 | 基板处理装置及基板处理方法 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4361568B2 (https=) |
| KR (1) | KR100967923B1 (https=) |
| CN (1) | CN101226877B (https=) |
| TW (1) | TW200849455A (https=) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100988667B1 (ko) | 2009-01-23 | 2010-10-18 | 장석호 | 발전 효율과 회전력 향상이 이루어진 발전장치 |
| WO2011104740A1 (ja) * | 2010-02-23 | 2011-09-01 | 株式会社テオス | Cvd処理方法およびその方法を使用するcvd装置 |
| JP5902073B2 (ja) * | 2012-09-25 | 2016-04-13 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| CN107217240A (zh) * | 2017-07-11 | 2017-09-29 | 江苏星特亮科技有限公司 | 一种石墨烯薄膜的制备方法 |
| CN109402575A (zh) * | 2018-12-27 | 2019-03-01 | 北京铂阳顶荣光伏科技有限公司 | 基座以及蒸镀设备 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05235391A (ja) * | 1991-03-07 | 1993-09-10 | Mitsubishi Electric Corp | 薄膜太陽電池及びその製造方法並びに半導体装置の製造方法 |
| JPH1126470A (ja) * | 1997-07-08 | 1999-01-29 | Sony Corp | 半導体基板、半導体装置および太陽電池、半導体基板の製造方法および薄膜半導体の製造方法、半導体基板に対する処理装置 |
| JP4433858B2 (ja) * | 2004-03-31 | 2010-03-17 | パナソニック電工株式会社 | 電子源装置 |
-
2007
- 2007-01-17 JP JP2007008306A patent/JP4361568B2/ja not_active Expired - Fee Related
-
2008
- 2008-01-04 TW TW097100472A patent/TW200849455A/zh not_active IP Right Cessation
- 2008-01-11 KR KR1020080003358A patent/KR100967923B1/ko not_active Expired - Fee Related
- 2008-01-17 CN CN2008100023991A patent/CN101226877B/zh not_active Expired - Fee Related
Non-Patent Citations (2)
| Title |
|---|
| JP特开2005-294033A 2005.10.20 |
| JP特开平11-26470A 1999.01.29 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101226877A (zh) | 2008-07-23 |
| TW200849455A (en) | 2008-12-16 |
| KR20080067965A (ko) | 2008-07-22 |
| KR100967923B1 (ko) | 2010-07-06 |
| JP2008177289A (ja) | 2008-07-31 |
| JP4361568B2 (ja) | 2009-11-11 |
| TWI353649B (https=) | 2011-12-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101201 Termination date: 20140117 |