CN101226877B - 基板处理装置及基板处理方法 - Google Patents

基板处理装置及基板处理方法 Download PDF

Info

Publication number
CN101226877B
CN101226877B CN2008100023991A CN200810002399A CN101226877B CN 101226877 B CN101226877 B CN 101226877B CN 2008100023991 A CN2008100023991 A CN 2008100023991A CN 200810002399 A CN200810002399 A CN 200810002399A CN 101226877 B CN101226877 B CN 101226877B
Authority
CN
China
Prior art keywords
mentioned
substrate
conductive layer
film
insulating properties
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2008100023991A
Other languages
English (en)
Chinese (zh)
Other versions
CN101226877A (zh
Inventor
菅原卓也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of CN101226877A publication Critical patent/CN101226877A/zh
Application granted granted Critical
Publication of CN101226877B publication Critical patent/CN101226877B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0431Apparatus for thermal treatment
    • H10P72/0436Apparatus for thermal treatment mainly by radiation
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/40Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0402Apparatus for fluid treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • H10P95/90Thermal treatments, e.g. annealing or sintering

Landscapes

  • Chemical Vapour Deposition (AREA)
  • Photovoltaic Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
CN2008100023991A 2007-01-17 2008-01-17 基板处理装置及基板处理方法 Expired - Fee Related CN101226877B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007008306A JP4361568B2 (ja) 2007-01-17 2007-01-17 基板処理装置および基板処理方法
JP2007008306 2007-01-17
JP2007-008306 2007-01-17

Publications (2)

Publication Number Publication Date
CN101226877A CN101226877A (zh) 2008-07-23
CN101226877B true CN101226877B (zh) 2010-12-01

Family

ID=39704110

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2008100023991A Expired - Fee Related CN101226877B (zh) 2007-01-17 2008-01-17 基板处理装置及基板处理方法

Country Status (4)

Country Link
JP (1) JP4361568B2 (https=)
KR (1) KR100967923B1 (https=)
CN (1) CN101226877B (https=)
TW (1) TW200849455A (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100988667B1 (ko) 2009-01-23 2010-10-18 장석호 발전 효율과 회전력 향상이 이루어진 발전장치
WO2011104740A1 (ja) * 2010-02-23 2011-09-01 株式会社テオス Cvd処理方法およびその方法を使用するcvd装置
JP5902073B2 (ja) * 2012-09-25 2016-04-13 株式会社日立国際電気 半導体装置の製造方法、基板処理方法及び基板処理装置
CN107217240A (zh) * 2017-07-11 2017-09-29 江苏星特亮科技有限公司 一种石墨烯薄膜的制备方法
CN109402575A (zh) * 2018-12-27 2019-03-01 北京铂阳顶荣光伏科技有限公司 基座以及蒸镀设备

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05235391A (ja) * 1991-03-07 1993-09-10 Mitsubishi Electric Corp 薄膜太陽電池及びその製造方法並びに半導体装置の製造方法
JPH1126470A (ja) * 1997-07-08 1999-01-29 Sony Corp 半導体基板、半導体装置および太陽電池、半導体基板の製造方法および薄膜半導体の製造方法、半導体基板に対する処理装置
JP4433858B2 (ja) * 2004-03-31 2010-03-17 パナソニック電工株式会社 電子源装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
JP特开2005-294033A 2005.10.20
JP特开平11-26470A 1999.01.29

Also Published As

Publication number Publication date
CN101226877A (zh) 2008-07-23
TW200849455A (en) 2008-12-16
KR20080067965A (ko) 2008-07-22
KR100967923B1 (ko) 2010-07-06
JP2008177289A (ja) 2008-07-31
JP4361568B2 (ja) 2009-11-11
TWI353649B (https=) 2011-12-01

Similar Documents

Publication Publication Date Title
KR101103453B1 (ko) 가열 장치 및 이의 제조 방법
TWI449121B (zh) 調節基板溫度之基板支撐件及其應用
CN101226877B (zh) 基板处理装置及基板处理方法
TWI524432B (zh) 沉積薄膜電晶體之方法與系統
JP5236405B2 (ja) 透明電極膜の改質方法及び透明電極膜付基板の製造方法
Liao et al. Oxygen-deficient indium tin oxide thin films annealed by atmospheric pressure plasma jets with/without air-quenching
CN101395706A (zh) 利用焦耳加热晶化非晶硅的方法
JP4110752B2 (ja) 基材上に設けた透明導電膜を低抵抗化する方法。
Plumley et al. Crystallization of electrically conductive visibly transparent ITO thin films by wavelength-range-specific pulsed Xe arc lamp annealing
TWI362704B (en) Method for annealing silicon thin films using conductive layer and polycrystalline silicon thin films prepared therefrom
CN107170697B (zh) 一种基板退火装置
US20120073640A1 (en) Pulsed photothermal phase transformation control for titanium oxide structures and reversible bandgap shift for solar absorption
TW201025455A (en) Method and apparatus for manufacturing semiconductor device
JP2001135149A (ja) 酸化亜鉛系透明電極
US20060046360A1 (en) Method of fabricating thin film transistor
JPH0325880A (ja) 加熱方法及び加熱装置
JP4096529B2 (ja) アニール装置
JP2011029148A (ja) 導電性金属酸化物の後処理方法及び成膜兼後処理装置
JP2007258468A (ja) 可視光透過半導体素子およびその製造方法
TW201251063A (en) Method for making transparent conducting film and method for making solar cell
KR101456239B1 (ko) 용액공정을 이용한 산화물 박막 소결용 자외선 램프 장치
JP3846633B2 (ja) 透明電極薄膜の形成方法と装置
JP2011187336A (ja) 透明導電膜の改質方法及び透明導電膜付基板の製造方法
CN108468019A (zh) 一种采用红外线加热退火优化透明导电薄膜质量的方法
JP2002184790A (ja) 基板加熱用板材、およびテルル化カドミウム膜の製造方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20101201

Termination date: 20140117