CN101133457A - 存储模块的多个设备的温度确定和传送 - Google Patents
存储模块的多个设备的温度确定和传送 Download PDFInfo
- Publication number
- CN101133457A CN101133457A CNA2006800064539A CN200680006453A CN101133457A CN 101133457 A CN101133457 A CN 101133457A CN A2006800064539 A CNA2006800064539 A CN A2006800064539A CN 200680006453 A CN200680006453 A CN 200680006453A CN 101133457 A CN101133457 A CN 101133457A
- Authority
- CN
- China
- Prior art keywords
- temperature
- memory
- thermal sensor
- thermal
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/42—Circuits effecting compensation of thermal inertia; Circuits for predicting the stationary value of a temperature
- G01K7/425—Thermal management of integrated systems
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40626—Temperature related aspects of refresh operations
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
- G11C7/1063—Control signal output circuits, e.g. status or busy flags, feedback command signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5002—Characteristic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1048—Data bus control circuits, e.g. precharging, presetting, equalising
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
Abstract
Description
Claims (23)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/093,905 US7260007B2 (en) | 2005-03-30 | 2005-03-30 | Temperature determination and communication for multiple devices of a memory module |
US11/093,905 | 2005-03-30 | ||
PCT/US2006/012984 WO2006105543A2 (en) | 2005-03-30 | 2006-03-30 | Temperature determination and communication for multiple devices of a memory module |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101133457A true CN101133457A (zh) | 2008-02-27 |
CN101133457B CN101133457B (zh) | 2010-04-14 |
Family
ID=36676592
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006800064539A Expired - Fee Related CN101133457B (zh) | 2005-03-30 | 2006-03-30 | 存储模块的多个设备的温度确定和传送 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7260007B2 (zh) |
KR (1) | KR100954733B1 (zh) |
CN (1) | CN101133457B (zh) |
TW (1) | TWI306612B (zh) |
WO (1) | WO2006105543A2 (zh) |
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CN101889313A (zh) * | 2008-12-30 | 2010-11-17 | E·孔法洛涅里 | 具有扩展工作温度范围的非易失性存储器 |
CN102682841A (zh) * | 2011-03-02 | 2012-09-19 | 苹果公司 | 具有存储设备的温度传感器的使用 |
CN103077102A (zh) * | 2011-10-25 | 2013-05-01 | 鸿富锦精密工业(深圳)有限公司 | 计算机开机侦测系统 |
CN103500000A (zh) * | 2013-09-29 | 2014-01-08 | 广东欧科空调制冷有限公司 | 数据机房用制冷系统 |
CN105424226A (zh) * | 2014-09-19 | 2016-03-23 | 骏达电通股份有限公司 | 无线温度记录器校正装置及无线温度记录器校正系统 |
CN107850925A (zh) * | 2015-08-27 | 2018-03-27 | 英特尔公司 | 存储器资源的热监测 |
CN108281161A (zh) * | 2017-01-05 | 2018-07-13 | 爱思开海力士有限公司 | 能够测量温度的存储器模块及使用其的系统 |
CN109029761A (zh) * | 2018-06-06 | 2018-12-18 | 上海申矽凌微电子科技有限公司 | 一种多阈值温度传感器开关器件及其控制方法 |
CN109390003A (zh) * | 2017-08-08 | 2019-02-26 | 爱思开海力士有限公司 | 存储器系统及其操作方法 |
CN110310694A (zh) * | 2018-03-20 | 2019-10-08 | 合肥格易集成电路有限公司 | 一种温度检测电路和闪存 |
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-
2006
- 2006-03-29 TW TW095110979A patent/TWI306612B/zh not_active IP Right Cessation
- 2006-03-30 WO PCT/US2006/012984 patent/WO2006105543A2/en active Application Filing
- 2006-03-30 CN CN2006800064539A patent/CN101133457B/zh not_active Expired - Fee Related
- 2006-03-30 KR KR1020077025035A patent/KR100954733B1/ko not_active IP Right Cessation
Cited By (16)
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CN101889313B (zh) * | 2008-12-30 | 2014-12-03 | E·孔法洛涅里 | 具有扩展工作温度范围的非易失性存储器 |
CN101889313A (zh) * | 2008-12-30 | 2010-11-17 | E·孔法洛涅里 | 具有扩展工作温度范围的非易失性存储器 |
CN102682841A (zh) * | 2011-03-02 | 2012-09-19 | 苹果公司 | 具有存储设备的温度传感器的使用 |
CN102682841B (zh) * | 2011-03-02 | 2017-03-01 | 苹果公司 | 具有存储设备的温度传感器的使用 |
CN103077102A (zh) * | 2011-10-25 | 2013-05-01 | 鸿富锦精密工业(深圳)有限公司 | 计算机开机侦测系统 |
CN103500000A (zh) * | 2013-09-29 | 2014-01-08 | 广东欧科空调制冷有限公司 | 数据机房用制冷系统 |
CN105424226B (zh) * | 2014-09-19 | 2018-07-27 | 骏达电通股份有限公司 | 无线温度记录器校正装置及无线温度记录器校正系统 |
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CN107850925A (zh) * | 2015-08-27 | 2018-03-27 | 英特尔公司 | 存储器资源的热监测 |
CN108281161A (zh) * | 2017-01-05 | 2018-07-13 | 爱思开海力士有限公司 | 能够测量温度的存储器模块及使用其的系统 |
CN108281161B (zh) * | 2017-01-05 | 2021-10-08 | 爱思开海力士有限公司 | 能够测量温度的存储器模块及使用其的系统 |
CN109390003A (zh) * | 2017-08-08 | 2019-02-26 | 爱思开海力士有限公司 | 存储器系统及其操作方法 |
CN110310694A (zh) * | 2018-03-20 | 2019-10-08 | 合肥格易集成电路有限公司 | 一种温度检测电路和闪存 |
CN110310694B (zh) * | 2018-03-20 | 2021-04-13 | 合肥格易集成电路有限公司 | 一种温度检测电路和闪存 |
CN109029761A (zh) * | 2018-06-06 | 2018-12-18 | 上海申矽凌微电子科技有限公司 | 一种多阈值温度传感器开关器件及其控制方法 |
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KR100954733B1 (ko) | 2010-04-23 |
WO2006105543A2 (en) | 2006-10-05 |
US7260007B2 (en) | 2007-08-21 |
TW200643974A (en) | 2006-12-16 |
WO2006105543A3 (en) | 2006-12-14 |
KR20070116940A (ko) | 2007-12-11 |
TWI306612B (en) | 2009-02-21 |
US20060221741A1 (en) | 2006-10-05 |
CN101133457B (zh) | 2010-04-14 |
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