CN101103277A - 自动测试设备中具有用于同步的接口的仪器 - Google Patents

自动测试设备中具有用于同步的接口的仪器 Download PDF

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Publication number
CN101103277A
CN101103277A CNA2005800469189A CN200580046918A CN101103277A CN 101103277 A CN101103277 A CN 101103277A CN A2005800469189 A CNA2005800469189 A CN A2005800469189A CN 200580046918 A CN200580046918 A CN 200580046918A CN 101103277 A CN101103277 A CN 101103277A
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CN
China
Prior art keywords
clock
instrument
circuit
time
input end
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Pending
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CNA2005800469189A
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English (en)
Chinese (zh)
Inventor
彼得·A·贝凯尔特
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Teradyne Inc
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Teradyne Inc
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Filing date
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Publication of CN101103277A publication Critical patent/CN101103277A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
CNA2005800469189A 2004-11-22 2005-11-22 自动测试设备中具有用于同步的接口的仪器 Pending CN101103277A (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US63011104P 2004-11-22 2004-11-22
US60/630,111 2004-11-22
US11/063,078 US7319936B2 (en) 2004-11-22 2005-02-22 Instrument with interface for synchronization in automatic test equipment
US11/063,078 2005-02-22
PCT/US2005/042473 WO2006058082A1 (en) 2004-11-22 2005-11-22 Instrument with interface for synchronization in automatic test equipment

Publications (1)

Publication Number Publication Date
CN101103277A true CN101103277A (zh) 2008-01-09

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Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2005800469189A Pending CN101103277A (zh) 2004-11-22 2005-11-22 自动测试设备中具有用于同步的接口的仪器

Country Status (6)

Country Link
US (2) US7319936B2 (enExample)
EP (1) EP1828792A1 (enExample)
JP (2) JP2008525761A (enExample)
KR (2) KR101240242B1 (enExample)
CN (1) CN101103277A (enExample)
WO (1) WO2006058082A1 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102124357A (zh) * 2008-08-19 2011-07-13 爱德万测试株式会社 测试装置及测试方法
CN104730362A (zh) * 2013-12-20 2015-06-24 致茂电子股份有限公司 自动测试设备以及时脉同步方法
CN105307187A (zh) * 2014-07-31 2016-02-03 深圳罗德与施瓦茨贸易有限公司 用于开始时间同步信号产生的测量装置和测量方法
CN107005444A (zh) * 2014-09-11 2017-08-01 森特理克联网家居有限公司 设备同步和测试
CN107223211A (zh) * 2015-02-19 2017-09-29 泰拉丁公司 用于雷达应用的虚拟距离测试技术
CN108061851A (zh) * 2016-11-09 2018-05-22 德克萨斯仪器股份有限公司 用于测试插入点的方法和装置

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Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102124357A (zh) * 2008-08-19 2011-07-13 爱德万测试株式会社 测试装置及测试方法
CN104730362A (zh) * 2013-12-20 2015-06-24 致茂电子股份有限公司 自动测试设备以及时脉同步方法
CN105307187A (zh) * 2014-07-31 2016-02-03 深圳罗德与施瓦茨贸易有限公司 用于开始时间同步信号产生的测量装置和测量方法
CN105307187B (zh) * 2014-07-31 2019-06-25 深圳罗德与施瓦茨贸易有限公司 用于开始时间同步信号产生的测量装置和测量方法
CN107005444A (zh) * 2014-09-11 2017-08-01 森特理克联网家居有限公司 设备同步和测试
CN107223211A (zh) * 2015-02-19 2017-09-29 泰拉丁公司 用于雷达应用的虚拟距离测试技术
CN107223211B (zh) * 2015-02-19 2021-10-15 泰拉丁公司 用于雷达应用的虚拟距离测试技术
CN108061851A (zh) * 2016-11-09 2018-05-22 德克萨斯仪器股份有限公司 用于测试插入点的方法和装置
CN108061851B (zh) * 2016-11-09 2022-03-01 德克萨斯仪器股份有限公司 用于测试插入点的方法和装置

Also Published As

Publication number Publication date
EP1828792A1 (en) 2007-09-05
WO2006058082A1 (en) 2006-06-01
KR20120013452A (ko) 2012-02-14
US7769559B2 (en) 2010-08-03
JP2015064390A (ja) 2015-04-09
JP2008525761A (ja) 2008-07-17
KR101240242B1 (ko) 2013-03-11
US7319936B2 (en) 2008-01-15
US20080077350A1 (en) 2008-03-27
KR20070095298A (ko) 2007-09-28
US20060123296A1 (en) 2006-06-08
KR101249709B1 (ko) 2013-04-05
JP6006344B2 (ja) 2016-10-12

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