CN101044074B - 容量减小的运载器和使用方法 - Google Patents

容量减小的运载器和使用方法 Download PDF

Info

Publication number
CN101044074B
CN101044074B CN200580035790.6A CN200580035790A CN101044074B CN 101044074 B CN101044074 B CN 101044074B CN 200580035790 A CN200580035790 A CN 200580035790A CN 101044074 B CN101044074 B CN 101044074B
Authority
CN
China
Prior art keywords
substrate
carrier
housing
workpiece
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CN200580035790.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN101044074A (zh
Inventor
G·乌利塞斯
M·L·布法诺
W·福斯奈特
C·霍夫梅斯特
G·M·弗里德曼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Borucos Automation Usa Co ltd
Borukos Automation Holding Co ltd
Original Assignee
Brooks Automation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Brooks Automation Inc filed Critical Brooks Automation Inc
Publication of CN101044074A publication Critical patent/CN101044074A/zh
Application granted granted Critical
Publication of CN101044074B publication Critical patent/CN101044074B/zh
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/07Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for semiconductor wafers Not used, see H10P72/00
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/15Horizontal carrier comprising wall type elements whereby the substrates are vertically supported, e.g. comprising sidewalls
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1902Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers specially adapted for a single substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1911Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by materials, roughness, coatings or the like
    • H10P72/1912Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by materials, roughness, coatings or the like characterised by shock absorbing elements, e.g. retainers or cushions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1914Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by locking systems
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1916Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by sealing arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1921Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by substrate supports
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1924Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/10Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP]
    • H10P72/19Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers
    • H10P72/1924Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control
    • H10P72/1926Handling or holding of wafers, substrates or devices during manufacture or treatment thereof using carriers specially adapted therefor, e.g. front opening unified pods [FOUP] closed carriers characterised by atmosphere control characterised by the presence of atmosphere modifying elements inside or attached to the closed carrier
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3406Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door or cover
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/34Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H10P72/3411Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/30Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
    • H10P72/36Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations using air tracks
    • H10P72/3604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations using air tracks the workpieces being stored in a carrier, involving loading and unloading
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00Material or article handling
    • Y10S414/135Associated with semiconductor wafer handling
    • Y10S414/139Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Warehouses Or Storage Devices (AREA)
CN200580035790.6A 2004-08-19 2005-08-19 容量减小的运载器和使用方法 Expired - Lifetime CN101044074B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US60336104P 2004-08-19 2004-08-19
US60/603,361 2004-08-19
US11/207,231 2005-08-19
PCT/US2005/029757 WO2006023838A2 (en) 2004-08-19 2005-08-19 Reduced capacity carrier and method of use
US11/207,231 US8888433B2 (en) 2004-08-19 2005-08-19 Reduced capacity carrier and method of use

Related Child Applications (1)

Application Number Title Priority Date Filing Date
CN201310692043.6A Division CN103771034B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法

Publications (2)

Publication Number Publication Date
CN101044074A CN101044074A (zh) 2007-09-26
CN101044074B true CN101044074B (zh) 2014-04-02

Family

ID=35968256

Family Applications (2)

Application Number Title Priority Date Filing Date
CN200580035790.6A Expired - Lifetime CN101044074B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法
CN201310692043.6A Expired - Lifetime CN103771034B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201310692043.6A Expired - Lifetime CN103771034B (zh) 2004-08-19 2005-08-19 容量减小的运载器和使用方法

Country Status (6)

Country Link
US (2) US8888433B2 (enExample)
EP (1) EP1786710A4 (enExample)
JP (2) JP5386082B2 (enExample)
KR (1) KR101233101B1 (enExample)
CN (2) CN101044074B (enExample)
WO (1) WO2006023838A2 (enExample)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5386082B2 (ja) 2004-08-19 2014-01-15 ブルックス オートメーション インコーポレイテッド 低収容力のキャリア及びその使用方法
US8267634B2 (en) * 2005-11-07 2012-09-18 Brooks Automation, Inc. Reduced capacity carrier, transport, load port, buffer system
US20080107507A1 (en) * 2005-11-07 2008-05-08 Bufano Michael L Reduced capacity carrier, transport, load port, buffer system
KR20140091768A (ko) * 2005-11-07 2014-07-22 브룩스 오토메이션 인코퍼레이티드 반도체 작업대상물 공정처리 시스템
US20070140822A1 (en) * 2005-12-16 2007-06-21 Applied Materials, Inc. Methods and apparatus for opening and closing substrate carriers
JP5461760B2 (ja) * 2006-07-26 2014-04-02 株式会社カネカ 半導体製造装置及び半導体製造方法
KR20140069354A (ko) 2006-08-18 2014-06-09 브룩스 오토메이션 인코퍼레이티드 용량이 축소된 캐리어, 이송, 로드 포트, 버퍼 시스템
JP5543205B2 (ja) * 2006-08-18 2014-07-09 ブルックス オートメーション インコーポレイテッド 半導体ワークピース処理システム
JP2008060513A (ja) * 2006-09-04 2008-03-13 Tokyo Electron Ltd 処理装置及び処理方法
US9105673B2 (en) 2007-05-09 2015-08-11 Brooks Automation, Inc. Side opening unified pod
KR102110585B1 (ko) * 2007-05-17 2020-05-13 브룩스 오토메이션 인코퍼레이티드 측면 개방형 기판 캐리어 및 로드 포트
DE102007025339A1 (de) * 2007-05-31 2008-12-04 Advanced Micro Devices, Inc., Sunnyvale Verfahren und System zum Entfernen leerer Trägerbehälter von Prozessanlagen durch Steuern einer Zuordnung zwischen Steuerungsaufgaben und Trägerbehälter
DE102007035839B4 (de) * 2007-07-31 2017-06-22 Globalfoundries Dresden Module One Limited Liability Company & Co. Kg Verfahren und System zum lokalen Aufbewahren von Substratbehältern in einem Deckentransportsystem zum Verbessern der Aufnahme/Abgabe-Kapazitäten von Prozessanlagen
DE202010017181U1 (de) * 2010-08-04 2011-03-24 Centrotherm Thermal Solutions Gmbh + Co. Kg Vorrichtung zum Schließen und Öffnen einer Be-/Entladeöffnung einer Prozesskammer
JP2013143425A (ja) * 2012-01-10 2013-07-22 Tokyo Electron Ltd 基板処理システム及び基板位置矯正方法
JP6180954B2 (ja) * 2014-02-05 2017-08-16 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
CN106462084B (zh) * 2014-05-07 2018-10-19 迈普尔平版印刷Ip有限公司 用于目标处理机械的封闭件
JP2016178133A (ja) * 2015-03-19 2016-10-06 シンフォニアテクノロジー株式会社 ドア開閉装置、搬送装置、ソータ装置、収納容器のドッキング方法
JP6451453B2 (ja) * 2015-03-31 2019-01-16 Tdk株式会社 ガスパージ装置、ロードポート装置、パージ対象容器の設置台およびガスパージ方法
JP6554872B2 (ja) * 2015-03-31 2019-08-07 Tdk株式会社 ガスパージ装置、ロードポート装置、パージ対象容器の設置台およびガスパージ方法
US11569138B2 (en) * 2015-06-16 2023-01-31 Kla Corporation System and method for monitoring parameters of a semiconductor factory automation system
TWI681915B (zh) * 2015-08-04 2020-01-11 日商昕芙旎雅股份有限公司 裝載埠
TWI708309B (zh) 2015-08-04 2020-10-21 日商昕芙旎雅股份有限公司 門開閉系統及具備門開閉系統之載入埠
JP6544128B2 (ja) * 2015-08-07 2019-07-17 シンフォニアテクノロジー株式会社 収納容器の蓋体及び収納容器
DE102015219564A1 (de) * 2015-10-09 2017-04-13 Robert Bosch Gmbh Werkzeuganalyseeinrichtung und verfahren zur analyse einer bearbeitung eines werkstücks mit einem werkzeug
US10153282B1 (en) 2017-08-11 2018-12-11 Lam Research Corporation Ultra-high vacuum transport and storage
JP6969936B2 (ja) * 2017-08-29 2021-11-24 株式会社ディスコ ウエーハ収容カセット
JP7009194B2 (ja) * 2017-12-12 2022-01-25 株式会社ディスコ ウエーハ生成装置および搬送トレー
JP7164396B2 (ja) * 2018-10-29 2022-11-01 株式会社ディスコ ウエーハ生成装置
US11348817B2 (en) * 2018-11-29 2022-05-31 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer transport system and method for transporting wafers
KR102015485B1 (ko) * 2019-02-18 2019-08-28 주식회사 윈텍 오엘이디 제조 챔버 장비용 오토 리드 장치
JP6721852B2 (ja) * 2019-07-16 2020-07-15 シンフォニアテクノロジー株式会社 ロードポート
KR102278078B1 (ko) * 2019-10-17 2021-07-19 세메스 주식회사 기판 반송 장치 및 기판 처리 장치
JP7564475B2 (ja) * 2022-02-08 2024-10-09 シンフォニアテクノロジー株式会社 ロードポート及びロードポートの駆動方法
JP7820191B2 (ja) * 2022-03-03 2026-02-25 株式会社ディスコ 搬送治具

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5486080A (en) * 1994-06-30 1996-01-23 Diamond Semiconductor Group, Inc. High speed movement of workpieces in vacuum processing
CN1242753A (zh) * 1997-10-17 2000-01-26 奥林巴斯光学工业株式会社 晶片搬运装置
US6203268B1 (en) * 1996-04-24 2001-03-20 Tokyo Electron Limited Positioning apparatus for substrates to be processed
US6244812B1 (en) * 1998-07-10 2001-06-12 H-Square Corporation Low profile automated pod door removal system
US20020106267A1 (en) * 1999-10-19 2002-08-08 Toshiaki Fujii Container and loader for substrate
US6530736B2 (en) * 2001-07-13 2003-03-11 Asyst Technologies, Inc. SMIF load port interface including smart port door

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5097421A (en) * 1984-12-24 1992-03-17 Asyst Technologies, Inc. Intelligent waxer carrier
JPS61228647A (ja) 1985-04-02 1986-10-11 Mitsubishi Electric Corp ウエハ並べ換え装置
US4724874A (en) * 1986-05-01 1988-02-16 Asyst Technologies Sealable transportable container having a particle filtering system
US4995430A (en) * 1989-05-19 1991-02-26 Asyst Technologies, Inc. Sealable transportable container having improved latch mechanism
DE4024973C2 (de) * 1990-08-07 1994-11-03 Ibm Anordnung zum Lagern, Transportieren und Einschleusen von Substraten
US5169272A (en) * 1990-11-01 1992-12-08 Asyst Technologies, Inc. Method and apparatus for transferring articles between two controlled environments
US5256204A (en) * 1991-12-13 1993-10-26 United Microelectronics Corporation Single semiconductor water transfer method and manufacturing system
US5469963A (en) * 1992-04-08 1995-11-28 Asyst Technologies, Inc. Sealable transportable container having improved liner
JPH09232407A (ja) * 1996-02-21 1997-09-05 Hitachi Ltd ワーク搬送装置およびそれを用いた半導体製造装置
FR2747111B1 (fr) * 1996-04-03 1998-04-30 Commissariat Energie Atomique Systeme d'accouplement pour un transfert confine d'un objet plat d'une boite de confinement vers une unite de traitement de l'objet
JPH10270526A (ja) 1997-03-24 1998-10-09 Canon Inc 基板収納容器および基板搬送装置
US6390754B2 (en) * 1997-05-21 2002-05-21 Tokyo Electron Limited Wafer processing apparatus, method of operating the same and wafer detecting system
JP3772011B2 (ja) * 1997-12-24 2006-05-10 大日本スクリーン製造株式会社 基板処理装置
US5988233A (en) * 1998-03-27 1999-11-23 Asyst Technologies, Inc. Evacuation-driven SMIF pod purge system
FR2779421B1 (fr) * 1998-06-08 2000-08-18 Incam Solutions Dispositif adaptateur pour des boites de confinement d'au moins un objet plat sous atmosphere ultrapropre
US6271917B1 (en) 1998-06-26 2001-08-07 Thomas W. Hagler Method and apparatus for spectrum analysis and encoder
JP4305988B2 (ja) 1999-01-27 2009-07-29 シンフォニアテクノロジー株式会社 ウエーハキャリア
JP2000286319A (ja) * 1999-03-31 2000-10-13 Canon Inc 基板搬送方法および半導体製造装置
TW461686U (en) 1999-04-06 2001-10-21 Benq Corp Housing decoration cap set
US6612797B1 (en) * 1999-05-18 2003-09-02 Asyst Technologies, Inc. Cassette buffering within a minienvironment
DE19922936B4 (de) 1999-05-19 2004-04-29 Infineon Technologies Ag Anlage zur Bearbeitung von Wafern
JP3939062B2 (ja) 2000-01-25 2007-06-27 松下電器産業株式会社 基板検出装置
US6633050B1 (en) * 2000-08-15 2003-10-14 Asml Holding Nv. Virtual gauging system for use in lithographic processing
US6901971B2 (en) * 2001-01-10 2005-06-07 Entegris, Inc. Transportable container including an internal environment monitor
JP3697478B2 (ja) * 2001-08-20 2005-09-21 ソニー株式会社 基板の移送方法及びロードポート装置並びに基板移送システム
US6745901B2 (en) * 2001-10-12 2004-06-08 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer cassette equipped with piezoelectric sensors
US20030077153A1 (en) * 2001-10-19 2003-04-24 Applied Materials, Inc. Identification code reader integrated with substrate carrier robot
KR100469360B1 (ko) * 2002-02-22 2005-02-02 엘지.필립스 엘시디 주식회사 액정표시소자의 제조 장비용 진공 합착 장치 및 구동 방법
JP4168642B2 (ja) * 2002-02-28 2008-10-22 東京エレクトロン株式会社 被処理体収納容器体及び処理システム
JP2003264216A (ja) * 2002-03-08 2003-09-19 Murata Mach Ltd 搬送システム
US6691416B2 (en) * 2002-06-26 2004-02-17 Hsiu-Man Yu Chen Cutter for vehicle safety belts or the like
US6719142B1 (en) * 2002-07-16 2004-04-13 Ion Systems, Inc. Apparatus and method for measuring static charge on wafers, disks, substrates, masks, and flat panel displays
US6826451B2 (en) * 2002-07-29 2004-11-30 Asml Holding N.V. Lithography tool having a vacuum reticle library coupled to a vacuum chamber
US7328836B2 (en) * 2004-02-03 2008-02-12 Taiwan Semiconductor Manufacturing Co., Ltd. Smart tag holder and cover housing
JP5386082B2 (ja) 2004-08-19 2014-01-15 ブルックス オートメーション インコーポレイテッド 低収容力のキャリア及びその使用方法
JP2008511178A (ja) * 2004-08-23 2008-04-10 ブルックス オートメーション インコーポレイテッド エレベータベースのツールローディング及びバッファリングシステム
JP2011186366A (ja) 2010-03-11 2011-09-22 Noriko Takamine 香るチラシの作成方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5486080A (en) * 1994-06-30 1996-01-23 Diamond Semiconductor Group, Inc. High speed movement of workpieces in vacuum processing
US6203268B1 (en) * 1996-04-24 2001-03-20 Tokyo Electron Limited Positioning apparatus for substrates to be processed
CN1242753A (zh) * 1997-10-17 2000-01-26 奥林巴斯光学工业株式会社 晶片搬运装置
US6244812B1 (en) * 1998-07-10 2001-06-12 H-Square Corporation Low profile automated pod door removal system
US20020106267A1 (en) * 1999-10-19 2002-08-08 Toshiaki Fujii Container and loader for substrate
US6530736B2 (en) * 2001-07-13 2003-03-11 Asyst Technologies, Inc. SMIF load port interface including smart port door

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP昭和61-228647A 1986.10.11

Also Published As

Publication number Publication date
US9881825B2 (en) 2018-01-30
US20150155192A1 (en) 2015-06-04
EP1786710A4 (en) 2011-10-12
CN103771034A (zh) 2014-05-07
KR101233101B1 (ko) 2013-02-14
JP5386082B2 (ja) 2014-01-15
CN101044074A (zh) 2007-09-26
JP2012015550A (ja) 2012-01-19
US20060088272A1 (en) 2006-04-27
US8888433B2 (en) 2014-11-18
WO2006023838A3 (en) 2006-08-17
JP2008511142A (ja) 2008-04-10
CN103771034B (zh) 2016-06-29
KR20070045322A (ko) 2007-05-02
WO2006023838A2 (en) 2006-03-02
EP1786710A2 (en) 2007-05-23

Similar Documents

Publication Publication Date Title
CN101044074B (zh) 容量减小的运载器和使用方法
CN101048861B (zh) 基于升降机的工具装载和缓冲系统
US6517304B1 (en) Method for transporting substrates and a semiconductor manufacturing apparatus using the method
CN101548361B (zh) 高产量串行晶片处理终端站
US7409263B2 (en) Methods and apparatus for repositioning support for a substrate carrier
US5788458A (en) Method and apparatus for vertical transfer of a semiconductor wafer cassette
KR20010071819A (ko) 웨이퍼 캐리어 및 최소의 접촉으로 웨이퍼를 핸들링하기위한 방법
KR20020064918A (ko) 웨이퍼 이송 시스템
US6364592B1 (en) Small footprint carrier front end loader
JP3962705B2 (ja) 処理装置
CN101189713B (zh) 在多个工作站之间的传送腔室
TWI788792B (zh) 半導體製造設備系統及其操作方法
JP2002261150A (ja) 基板処理装置
JP3894513B2 (ja) 半導体製造装置
JP2003086653A (ja) 基板処理装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20220310

Address after: Massachusetts

Patentee after: Borukos automation Holding Co.,Ltd.

Address before: Massachusetts

Patentee before: BROOKS AUTOMATION, Inc.

Effective date of registration: 20220310

Address after: Massachusetts

Patentee after: Borucos automation USA Co.,Ltd.

Address before: Massachusetts

Patentee before: Borukos automation Holding Co.,Ltd.

TR01 Transfer of patent right
CX01 Expiry of patent term

Granted publication date: 20140402

CX01 Expiry of patent term