CN101031837B - 用于荧光共焦显微镜检查的方法和设备 - Google Patents

用于荧光共焦显微镜检查的方法和设备 Download PDF

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Publication number
CN101031837B
CN101031837B CN2005800314987A CN200580031498A CN101031837B CN 101031837 B CN101031837 B CN 101031837B CN 2005800314987 A CN2005800314987 A CN 2005800314987A CN 200580031498 A CN200580031498 A CN 200580031498A CN 101031837 B CN101031837 B CN 101031837B
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detecting device
optical
light
target
equipment
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CN101031837A (zh
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P·东德斯
C·扎拉特
P·A·福米乔夫
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Leica Microsystems CMS GmbH
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GE Healthcare Niagara Inc
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN2005800314987A 2004-07-23 2005-07-19 用于荧光共焦显微镜检查的方法和设备 Expired - Lifetime CN101031837B (zh)

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US59081504P 2004-07-23 2004-07-23
US60/590,815 2004-07-23
PCT/IB2005/002067 WO2006008637A1 (en) 2004-07-23 2005-07-19 Method and apparatus for fluorescent confocal microscopy

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CN101031837A CN101031837A (zh) 2007-09-05
CN101031837B true CN101031837B (zh) 2011-06-15

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US (1) US7335898B2 (enExample)
EP (1) EP1787157B1 (enExample)
JP (2) JP2008507719A (enExample)
CN (1) CN101031837B (enExample)
AU (1) AU2005264061B2 (enExample)
CA (1) CA2574343C (enExample)
WO (1) WO2006008637A1 (enExample)

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WO2006008637A1 (en) 2006-01-26
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EP1787157A1 (en) 2007-05-23
AU2005264061B2 (en) 2009-05-21
US20060017001A1 (en) 2006-01-26
US7335898B2 (en) 2008-02-26
AU2005264061A1 (en) 2006-01-26
JP2012212155A (ja) 2012-11-01
EP1787157B1 (en) 2014-09-24
JP2008507719A (ja) 2008-03-13

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