CN101026105A - 树脂密封电子部件的方法 - Google Patents
树脂密封电子部件的方法 Download PDFInfo
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- CN101026105A CN101026105A CNA2006101075034A CN200610107503A CN101026105A CN 101026105 A CN101026105 A CN 101026105A CN A2006101075034 A CNA2006101075034 A CN A2006101075034A CN 200610107503 A CN200610107503 A CN 200610107503A CN 101026105 A CN101026105 A CN 101026105A
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
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- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
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Abstract
Description
Claims (15)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006041026 | 2006-02-17 | ||
JP2006041026A JP4741383B2 (ja) | 2006-02-17 | 2006-02-17 | 電子部品の樹脂封止方法 |
JP2006-041026 | 2006-02-17 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101026105A true CN101026105A (zh) | 2007-08-29 |
CN101026105B CN101026105B (zh) | 2011-01-26 |
Family
ID=38428735
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2006101075034A Expired - Fee Related CN101026105B (zh) | 2006-02-17 | 2006-07-27 | 树脂密封电子部件的方法 |
Country Status (5)
Country | Link |
---|---|
US (2) | US7638367B2 (zh) |
JP (1) | JP4741383B2 (zh) |
KR (1) | KR100799141B1 (zh) |
CN (1) | CN101026105B (zh) |
TW (1) | TWI329916B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102105282A (zh) * | 2008-08-08 | 2011-06-22 | 东和株式会社 | 电子部件的压缩成形方法及模具装置 |
CN102280390A (zh) * | 2010-06-08 | 2011-12-14 | 飞思卡尔半导体公司 | 组装具有散热器的半导体器件的方法 |
CN102171801B (zh) * | 2008-09-30 | 2013-10-16 | 东和株式会社 | 电子元器件的压缩树脂密封成形方法及采用该方法的装置 |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4741383B2 (ja) * | 2006-02-17 | 2011-08-03 | 富士通セミコンダクター株式会社 | 電子部品の樹脂封止方法 |
JP5065771B2 (ja) * | 2007-06-08 | 2012-11-07 | 住友重機械工業株式会社 | 樹脂封止装置および樹脂封止方法 |
JP2009166415A (ja) * | 2008-01-18 | 2009-07-30 | Sumitomo Heavy Ind Ltd | 圧縮成形用樹脂、樹脂封止装置、及び樹脂封止方法 |
JP4954171B2 (ja) * | 2008-09-30 | 2012-06-13 | Towa株式会社 | 電子部品の圧縮樹脂封止成形方法及び装置 |
JP4954172B2 (ja) * | 2008-09-30 | 2012-06-13 | Towa株式会社 | 電子部品の圧縮樹脂封止成形方法 |
WO2010132552A1 (en) * | 2009-05-12 | 2010-11-18 | The Board Of Trustees Of The University Of Illinois | Printed assemblies of ultrathin, microscale inorganic light emitting diodes for deformable and semitransparent displays |
JP5336974B2 (ja) * | 2009-08-06 | 2013-11-06 | 住友重機械工業株式会社 | 樹脂封止装置及び樹脂封止方法 |
US20130037931A1 (en) * | 2011-08-08 | 2013-02-14 | Leo M. Higgins, III | Semiconductor package with a heat spreader and method of making |
KR101950894B1 (ko) * | 2011-11-08 | 2019-04-22 | 아피쿠 야마다 가부시키가이샤 | 수지 밀봉 장치 |
JP6397808B2 (ja) * | 2015-11-04 | 2018-09-26 | アピックヤマダ株式会社 | 樹脂成形金型および樹脂成形方法 |
WO2016125571A1 (ja) * | 2015-02-04 | 2016-08-11 | アピックヤマダ株式会社 | 樹脂成形金型、樹脂成形方法、および成形品の製造方法 |
JP6404734B2 (ja) * | 2015-02-04 | 2018-10-17 | アピックヤマダ株式会社 | 樹脂成形方法、樹脂成形金型、および成形品の製造方法 |
EP3258837A4 (en) | 2015-02-20 | 2018-10-10 | Mc10, Inc. | Automated detection and configuration of wearable devices based on on-body status, location, and/or orientation |
WO2017147052A1 (en) | 2016-02-22 | 2017-08-31 | Mc10, Inc. | System, devices, and method for on-body data and power transmission |
WO2017169773A1 (ja) * | 2016-03-31 | 2017-10-05 | シャープ株式会社 | アイセーフ光源、およびその製造方法 |
US11154235B2 (en) | 2016-04-19 | 2021-10-26 | Medidata Solutions, Inc. | Method and system for measuring perspiration |
JP2017212419A (ja) * | 2016-05-27 | 2017-11-30 | Towa株式会社 | 樹脂封止品製造方法及び樹脂封止装置 |
US10447347B2 (en) | 2016-08-12 | 2019-10-15 | Mc10, Inc. | Wireless charger and high speed data off-loader |
CN110265332B (zh) * | 2019-06-20 | 2021-07-13 | 西安太乙电子有限公司 | 一种基于扁平封装集成电路器件剪边成型用设备 |
US11325453B2 (en) * | 2019-12-18 | 2022-05-10 | Toyota Motor Engineering & Manufacturing North America, Inc. | Battery mounting bracket for heavy duty vehicle |
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Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2758769B2 (ja) | 1992-02-28 | 1998-05-28 | 九州日本電気株式会社 | 半導体装置製造方法 |
JP3062192B1 (ja) | 1999-09-01 | 2000-07-10 | 松下電子工業株式会社 | リ―ドフレ―ムとそれを用いた樹脂封止型半導体装置の製造方法 |
JP2002137250A (ja) | 2000-10-31 | 2002-05-14 | Shibaura Mechatronics Corp | 顆粒物供給装置、及びこの装置を用いた電子部品モールド装置 |
JP3619773B2 (ja) | 2000-12-20 | 2005-02-16 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
JP4268389B2 (ja) * | 2002-09-06 | 2009-05-27 | Towa株式会社 | 電子部品の樹脂封止成形方法及び装置 |
JP4326786B2 (ja) * | 2002-11-26 | 2009-09-09 | Towa株式会社 | 樹脂封止装置 |
JP4519398B2 (ja) * | 2002-11-26 | 2010-08-04 | Towa株式会社 | 樹脂封止方法及び半導体装置の製造方法 |
JP4336499B2 (ja) * | 2003-01-09 | 2009-09-30 | Towa株式会社 | 電子部品の樹脂封止成形方法及び装置 |
JP4336502B2 (ja) * | 2003-01-30 | 2009-09-30 | Towa株式会社 | 電子部品の樹脂封止成形方法及び装置 |
JP4039298B2 (ja) | 2003-04-08 | 2008-01-30 | 株式会社デンソー | 樹脂封止型半導体装置およびその製造方法ならびに成形型 |
JP5128047B2 (ja) * | 2004-10-07 | 2013-01-23 | Towa株式会社 | 光デバイス及び光デバイスの生産方法 |
JP4749707B2 (ja) * | 2004-12-17 | 2011-08-17 | Towa株式会社 | 樹脂成形型及び樹脂成形方法 |
JP4741383B2 (ja) * | 2006-02-17 | 2011-08-03 | 富士通セミコンダクター株式会社 | 電子部品の樹脂封止方法 |
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- 2006-07-21 KR KR1020060068381A patent/KR100799141B1/ko active IP Right Grant
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CN102105282A (zh) * | 2008-08-08 | 2011-06-22 | 东和株式会社 | 电子部件的压缩成形方法及模具装置 |
CN102105282B (zh) * | 2008-08-08 | 2014-04-09 | 东和株式会社 | 电子部件的压缩成形方法及模具装置 |
CN102171801B (zh) * | 2008-09-30 | 2013-10-16 | 东和株式会社 | 电子元器件的压缩树脂密封成形方法及采用该方法的装置 |
CN102280390A (zh) * | 2010-06-08 | 2011-12-14 | 飞思卡尔半导体公司 | 组装具有散热器的半导体器件的方法 |
CN102280390B (zh) * | 2010-06-08 | 2015-12-09 | 飞思卡尔半导体公司 | 组装具有散热器的半导体器件的方法 |
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US20070196957A1 (en) | 2007-08-23 |
TWI329916B (en) | 2010-09-01 |
JP2007220969A (ja) | 2007-08-30 |
TW200733326A (en) | 2007-09-01 |
CN101026105B (zh) | 2011-01-26 |
KR100799141B1 (ko) | 2008-01-29 |
US7923303B2 (en) | 2011-04-12 |
JP4741383B2 (ja) | 2011-08-03 |
US20100052212A1 (en) | 2010-03-04 |
KR20070082838A (ko) | 2007-08-22 |
US7638367B2 (en) | 2009-12-29 |
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