CN100570342C - 光学测定方法及其装置 - Google Patents

光学测定方法及其装置 Download PDF

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Publication number
CN100570342C
CN100570342C CNB038161745A CN03816174A CN100570342C CN 100570342 C CN100570342 C CN 100570342C CN B038161745 A CNB038161745 A CN B038161745A CN 03816174 A CN03816174 A CN 03816174A CN 100570342 C CN100570342 C CN 100570342C
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China
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back side
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mentioned
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Expired - Lifetime
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CNB038161745A
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English (en)
Chinese (zh)
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CN1666100A (zh
Inventor
松村淳一
林睦
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Toray Engineering Co Ltd
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Toray Engineering Co Ltd
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Publication of CN1666100A publication Critical patent/CN1666100A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N2021/8908—Strip illuminator, e.g. light tube

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CNB038161745A 2002-07-08 2003-07-08 光学测定方法及其装置 Expired - Lifetime CN100570342C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP198074/2002 2002-07-08
JP2002198074A JP4104924B2 (ja) 2002-07-08 2002-07-08 光学的測定方法およびその装置

Publications (2)

Publication Number Publication Date
CN1666100A CN1666100A (zh) 2005-09-07
CN100570342C true CN100570342C (zh) 2009-12-16

Family

ID=30112417

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB038161745A Expired - Lifetime CN100570342C (zh) 2002-07-08 2003-07-08 光学测定方法及其装置

Country Status (5)

Country Link
JP (1) JP4104924B2 (enExample)
KR (1) KR100876257B1 (enExample)
CN (1) CN100570342C (enExample)
TW (1) TW200409912A (enExample)
WO (1) WO2004005902A1 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7200190B2 (en) * 2003-06-30 2007-04-03 Motorola, Inc. Unbiased signal to interference ratio in wireless communications devices and methods therefor
JP4417205B2 (ja) * 2004-08-27 2010-02-17 大日本スクリーン製造株式会社 基板処理装置
JP5082552B2 (ja) * 2007-04-05 2012-11-28 コニカミノルタホールディングス株式会社 光学的測定装置及び光学的測定方法
KR101209857B1 (ko) * 2009-02-20 2012-12-10 삼성코닝정밀소재 주식회사 유리 표면 이물 검사 장치 및 방법
US7929129B2 (en) 2009-05-22 2011-04-19 Corning Incorporated Inspection systems for glass sheets
TWI485392B (zh) * 2010-02-08 2015-05-21 Ygk Corp Foreign body inspection device and inspection method
KR101685703B1 (ko) * 2010-02-25 2016-12-12 가부시끼가이샤 야마나시 기쥬쯔 고오보오 이물질 검사 장치 및 검사 방법
DE102011103003A1 (de) * 2011-05-24 2012-11-29 Lufthansa Technik Ag Verfahren und Vorrichtung zur Rissprüfung eines Flugzeug- oder Gasturbinen-Bauteils
JP2013140061A (ja) * 2012-01-02 2013-07-18 Yamanashi Gijutsu Kobo:Kk 透明平板基板の表裏異物の検出方法及びその方法を用いた異物検査装置
KR20150056713A (ko) 2013-11-15 2015-05-27 삼성전자주식회사 영상표시장치의 비파괴 검사 시스템 및 방법과 이를 위한 비파괴 검사 장치
US10388028B2 (en) 2014-06-17 2019-08-20 Heraeus Quartz North America Llc Apparatus and method for measurement of transparent cylindrical articles
JP7183155B2 (ja) * 2016-11-02 2022-12-05 コーニング インコーポレイテッド 透明基板上の欠陥部検査方法および装置
JP2018128326A (ja) * 2017-02-07 2018-08-16 大塚電子株式会社 光学スペクトル測定装置および光学スペクトル測定方法
CN107764841B (zh) * 2017-11-17 2024-03-01 仝人智能科技(江苏)有限公司 一种检测并区分透明玻璃盖板上下表面缺陷的装置及方法
KR102580487B1 (ko) * 2018-06-18 2023-09-21 주식회사 케이씨텍 패드 모니터링 장치 및 이를 포함하는 패드 모니터링 시스템, 패드 모니터링 방법

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1008003B (zh) * 1985-04-01 1990-05-16 欧文斯-伊利诺衣公司 透明物体中折光缺陷的检测系统
JP2001208702A (ja) * 2000-01-31 2001-08-03 Nippon Sheet Glass Co Ltd 欠点検査方法及び欠点検査装置
US6396039B1 (en) * 1999-03-11 2002-05-28 Corning Incorporated Focusing filament for autofocus system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52130381A (en) * 1976-04-26 1977-11-01 Hitachi Ltd Device for detecting faulty part on plate surface
JPH06281418A (ja) * 1993-03-24 1994-10-07 Asahi Glass Co Ltd 凹凸を有する板状透明体の光学的厚さ測定方法
JP3480176B2 (ja) * 1996-03-18 2003-12-15 日立電子エンジニアリング株式会社 ガラス基板の表裏欠陥識別方法
JPH1048144A (ja) * 1996-07-31 1998-02-20 Dainippon Printing Co Ltd ガラス基板検査装置
JP2000074849A (ja) * 1998-08-31 2000-03-14 Toshiba Corp 異物検出方法およびその装置
JP4599507B2 (ja) * 2000-08-23 2010-12-15 旭硝子株式会社 ガラス板の形状測定方法及び形状測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1008003B (zh) * 1985-04-01 1990-05-16 欧文斯-伊利诺衣公司 透明物体中折光缺陷的检测系统
US6396039B1 (en) * 1999-03-11 2002-05-28 Corning Incorporated Focusing filament for autofocus system
JP2001208702A (ja) * 2000-01-31 2001-08-03 Nippon Sheet Glass Co Ltd 欠点検査方法及び欠点検査装置

Also Published As

Publication number Publication date
CN1666100A (zh) 2005-09-07
JP2004037400A (ja) 2004-02-05
TW200409912A (en) 2004-06-16
JP4104924B2 (ja) 2008-06-18
KR20050035243A (ko) 2005-04-15
KR100876257B1 (ko) 2008-12-26
WO2004005902A1 (ja) 2004-01-15
TWI320099B (enExample) 2010-02-01

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Granted publication date: 20091216