CN100550431C - 膏组合物和使用了它的太阳电池元件 - Google Patents
膏组合物和使用了它的太阳电池元件 Download PDFInfo
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- 239000006071 cream Substances 0.000 title claims abstract description 56
- 239000002131 composite material Substances 0.000 title claims abstract description 44
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 78
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 77
- 239000004411 aluminium Substances 0.000 claims abstract description 72
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 47
- 239000000758 substrate Substances 0.000 claims abstract description 47
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 46
- 239000010703 silicon Substances 0.000 claims abstract description 46
- 239000004065 semiconductor Substances 0.000 claims abstract description 45
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 claims abstract description 26
- 239000000843 powder Substances 0.000 claims abstract description 26
- 239000011521 glass Substances 0.000 claims description 16
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 claims description 3
- 229910021502 aluminium hydroxide Inorganic materials 0.000 claims description 3
- RQPZNWPYLFFXCP-UHFFFAOYSA-L barium dihydroxide Chemical compound [OH-].[OH-].[Ba+2] RQPZNWPYLFFXCP-UHFFFAOYSA-L 0.000 claims description 3
- 229910001863 barium hydroxide Inorganic materials 0.000 claims description 3
- AXCZMVOFGPJBDE-UHFFFAOYSA-L calcium dihydroxide Chemical compound [OH-].[OH-].[Ca+2] AXCZMVOFGPJBDE-UHFFFAOYSA-L 0.000 claims description 3
- 239000000920 calcium hydroxide Substances 0.000 claims description 3
- 229910001861 calcium hydroxide Inorganic materials 0.000 claims description 3
- VTHJTEIRLNZDEV-UHFFFAOYSA-L magnesium dihydroxide Chemical compound [OH-].[OH-].[Mg+2] VTHJTEIRLNZDEV-UHFFFAOYSA-L 0.000 claims description 3
- 239000000347 magnesium hydroxide Substances 0.000 claims description 3
- 229910001862 magnesium hydroxide Inorganic materials 0.000 claims description 3
- UUCCCPNEFXQJEL-UHFFFAOYSA-L strontium dihydroxide Chemical compound [OH-].[OH-].[Sr+2] UUCCCPNEFXQJEL-UHFFFAOYSA-L 0.000 claims description 3
- 229910001866 strontium hydroxide Inorganic materials 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- AEJIMXVJZFYIHN-UHFFFAOYSA-N copper;dihydrate Chemical compound O.O.[Cu] AEJIMXVJZFYIHN-UHFFFAOYSA-N 0.000 claims 1
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- NCNCGGDMXMBVIA-UHFFFAOYSA-L iron(ii) hydroxide Chemical compound [OH-].[OH-].[Fe+2] NCNCGGDMXMBVIA-UHFFFAOYSA-L 0.000 claims 1
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- 229910018520 Al—Si Inorganic materials 0.000 description 5
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- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 3
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- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
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Abstract
本发明提供一种膏组合物和具有用该组合物形成的电极的太阳电池元件,该膏组合物在烧制时可抑制浮泡和铝球在背面电极层产生,并且可减少硅半导体基板的变形。膏组合物是用于在硅半导体基板(1)上形成电极(8)用的膏组合物,含有铝粉末、有机质媒介物和氢氧化物。太阳电池元件具有电极(8),该电极(8)是将具有上述特征的膏组合物涂敷在硅半导体基板(1)上后,经烧制而形成的。
Description
技术领域
本发明一般涉及膏组合物和使用了它的太阳电池元件,特别涉及在构成结晶硅太阳电池的硅半导体基板上形成电极时使用的膏组合物和使用了它的太阳电池元件。
背景技术
作为在硅半导体基板上形成了电极的电子部品,已知有特开2000-90734号公报(专利文献1)和特开2004-134775号公报(专利文献2)中所公开的太阳电池元件。
图1是示意性地表示太阳电池元件的一般性截面构造的图。
如图1所示,太阳电池元件一般用厚度为220~300μm的p型硅半导体基板1而构成。在硅半导体基板1的受光面侧,形成了厚度为0.3~0.6μm的n型杂质层2,并在其上形成了防反射膜3和栅电极4。
另外,在p型硅半导体基板1的背面侧,形成了铝电极层5。铝电极层5是将由铝粉末、玻璃熔料和有机质媒介物构成的铝膏组合物经丝网印刷等进行涂敷、干燥后,在660℃(铝的熔点)以上的温度下进行短时间烧制而形成的。在该烧制时,铝扩散到p型硅半导体基板1的内部,从而在铝电极层5和p型硅半导体基板1之间形成Al-Si合金层6,同时,作为铝原子的扩散所得的杂质层而形成p+层7。因该p+层7的存在,可防止电子的再结合,从而获得提高生成载流子的收集效率的BSF(Back Surface Field)效果。
例如,特开平5-129640号公报(专利文献3)所公开的,将由铝电极层5和Al-Si合金层6构成的背面电极8用酸等去除,重新用银膏等形成了集电极层的太阳电池元件得到了实用化。但是,为去除背面电极8而使用的酸需要进行废弃处理,存在因该去除工序而使工序变得复杂等问题。为了避免该问题,最近,保留背面电极8而将其直接用作集电极来构成太阳电池元件的情况增多了。
然而,最近为了降低太阳电池的成本,探讨将硅半导体基板减薄的方案。但是,如果硅半导体基板变薄,因硅和铝的热膨胀系数的差异,在铝膏组合物烧制后,硅半导体基板就会变形,产生翘曲,使得形成了背面电极层的背面侧成为凹状。一旦产生翘曲,在太阳电池的制造工序就容易产生硅半导体基板的龟裂等。另一方面,为了抑制翘曲的产生,有减少铝膏组合物的涂敷量、将背面电极层减薄的方法。但是,如果减少铝膏组合物的涂敷量,在烧制时,背面电极层会容易产生浮泡和铝球。应力在产生的浮泡和铝球的地方集中,也会产生因此而导致的硅半导体基板的龟裂。结果,存在太阳电池的制造合格率降低的问题。
作为解决这些问题的方法,提出了各种铝膏组合物。
在特开2004-134775号公报(专利文献2)中,作为烧制时的电极膜的烧制收缩小、可抑制Si晶片翘曲的导电性膏,公开了以下导电性膏:除了含有铝粉末、玻璃熔料和有机质媒介物以外,还含有在该有机质媒介物中呈难溶解性或不溶解性的粒子,该粒子是有机化合物粒子和碳粒子之中的至少一种。
另外,在特开2005-191107号公报(专利文献4)中,公开了一种太阳电池元件的制造方法,该制造方法可获得抑制了背面电极中铝球、突起的形成和电极鼓起的高特性的背面电极,并且具有减少半导体基板翘曲的高生产性,作为在该制造方法中使用的铝膏,公开了一种含有铝粉末的铝膏,该铝粉末的体积标准下的累积粒度分布的平均粒径D50为6~20μm,且粒径在平均粒径D50一半以下的铝粉相对所有粒度分布所占的比例为15%以下。
但是,即使使用这些铝膏,还是不能在烧制时充分抑制在背面电极层产生浮泡和铝球的基础上充分地减少半导体基板的翘曲。
专利文献1:特开2000-90734号公报
专利文献2:特开2004-134775号公报
专利文献3:特开平5-129640号公报
专利文献4:特开2005-191107号公报
发明内容
发明要解决的课题
因此,本发明的目的在于解决上述课题,提供一种膏组合物和具有使用该组合物而形成的电极的太阳电池元件,该膏组合物可抑制烧制时在背面电极层产生浮泡和铝球,并且可减少硅半导体基板的变形。
用于解决课题的方案
本发明者们为了解决现有技术的问题点,经过反复专心研究,结果发现使用具有特殊组成的膏组合物,即可实现上述的目的。根据该发现,基于本发明的膏组合物具有如下的特征。
基于本发明的膏组合物是一种用于在硅半导体基板上形成电极的膏组合物,其中含有铝粉末、有机质媒介物和氢氧化物。
另外,在本发明的膏组合物中,氢氧化物优选的是选自由氢氧化铝、氢氧化镁、氢氧化钙、氢氧化锶和氢氧化钡构成的组中中的至少一种。
而且,本发明的膏组合物优选的是含有氢氧化物0.1质量%以上、25.0质量%以下。
再者,本发明的膏组合物优选的是还含有玻璃熔料。
基于本发明的太阳电池元件具有电极,该电极是将具有上述任何一个特征的膏组合物涂敷在硅半导体基板上后,经烧制而形成的。
发明的效果
如上所述,根据本发明,使用除了含有铝粉末和有机质媒介物以外,还含有氢氧化物的膏组合物,从而可抑制在形成于硅半导体基板的背面的铝电极层产生浮泡和铝球,并且可减少硅半导体基板的变形,从而可提高太阳电池元件的制造合格率。
附图说明
图1是示意性地表示作为一种实施方式而适用本发明的太阳电池元件的一般性截面构造的图。
图2是示意性地表示在实施例和比较例中测定形成了铝电极层的烧制后的p型硅半导体基板的变形量的方法的图。
符号说明
1:p型硅半导体基板;2:n型杂质层;3:防反射膜;4:栅电极;5:铝电极层;6:Al-Si合金层;7:p+层;8:背面电极。
具体实施方式
本发明的膏组合物的特征在于,除了含有铝粉末和有机质媒介物以外,还含有氢氧化物。在使用了现有组成的膏时,不能抑制铝与硅的反应和铝的烧结,结果,产生以下的现象:因局部性的Al-Si合金生成量的增加而产生浮泡和铝球;因铝的过度烧结而使硅半导体基板的变形增大。在本发明中,使膏中含有氢氧化物,从而可进行控制,使得铝与硅的反应和铝的烧结不会过度地进行。膏中所含有的氢氧化物会在烧制中,在温度200~500℃下发生脱水分解反应。可以认为,因该脱水分解所涉及的吸热反应和被分解的水蒸气所涉及的铝粉末的表面氧化,可抑制浮泡和铝球的产生以及硅半导体基板的变形。
作为本发明的膏组合物中所含有的氢氧化物,只要是可获得本发明效果的东西,没有特别限定,可列举例如由铜和铁等金属元素构成的氢氧化物。作为优选的氢氧化物,只要是选自由周期表的IIa族和IIIb族的氢氧化物构成的组中的至少一种即可,更具体地讲,是选自由氢氧化铝、氢氧化镁、氢氧化钙、氢氧化锶和氢氧化钡构成的组中的至少一种即可。优选周期表的II a族和IIIb族的氢氧化物的理由是,在烧制本发明的膏组合物时,上述周期表IIa族和IIIb族的元素即使扩散到硅半导体基板中,阻碍BSF效果的程度也很小,能量转换效率降低的影响也很小。
本发明的膏组合物中所含有的氢氧化物的含量,优选的是0.1质量%以上、25.0质量%以下。当氢氧化物的含量不到0.1质量%时,有可能得不到预定的浮泡和铝球的抑制效果,从而不能获得足以抑制烧制后的硅半导体基板的变形的充分的添加效果。如果氢氧化物的含量超过25.0质量%,则背面电极层的表面电阻增大,而有可能产生膏的烧结性受到阻碍的弊端。一旦背面电极层的表面电阻增大,电极间的欧姆电阻就会增加,从而不能有效地取出在太阳光的照射下产生的能量,而导致能量转换效率的下降。将氢氧化物的含量设定在上述范围,即可将表面电阻控制在后述的优选范围内,从而铝电极层的电极功能和BSF效果就不会降低,可抑制铝电极层中的浮泡和铝球的产生,并且减少硅半导体基板的变形量。
本发明的膏组合物中所含有的铝粉末的含量,优选的是50质量%以上、80质量%以下。当铝粉末的含量不到50质量%时,烧制后的铝电极层的电阻会增高,而有可能导致太阳电池的能量转换效率下降。如果铝粉末的含量超过80质量%,则丝网印刷等中的膏的涂敷性能会降低。
在本发明中,可使用平均粒子径为1~20μm的大范围的铝粉末,在调配到膏组合物中时,优选的是使用2~15μm,更优选的是使用3~10μm的铝粉末。当平均粒子径不到1μm时,铝粉末的比表面积会增加而不能令人满意。如果平均粒子径超过20μm,在使之含有铝粉末而构成膏组合物时不能得到适当的粘度而不能令人满意。另外,就本发明的膏组合物中所含有的铝粉末而言,对于粉末的形状、粉末的制造方法没有特别限定。
本发明的膏组合物中所含有的有机质媒介物的成分虽然没有特别限定,但是可以使用乙基纤维素、醇酸等树脂和乙二醇类、松油醇类等溶剂。有机质媒介物的含量优选的是15质量%以上、40质量%以下。如果有机质媒介物的含量不到15质量%,则膏的印刷性能下降,不能形成良好的铝电极层。另外,如果有机质媒介物的含量超过40质量%,则会产生以下的问题:不仅膏的粘度增大,而且铝的烧制因过剩的有机质媒介物的存在而受到阻碍。
而且,本发明的膏组合物还可以含有玻璃熔料。本发明的膏组合物中的玻璃熔料的含量虽然没有特别限定,但是优选的是8质量%以下。如果玻璃熔料的含量超过8质量%,则有可能产生玻璃的偏析,铝电极层的电阻增大,从而使太阳电池的发电效率降低。玻璃熔料的含量的下限值虽然没有特别限定,但是通常为0.1质量%以上。
作为本发明的膏组合物中所含有的玻璃熔料的组成虽然没有特别限定,但是通常可列举以下述物质为主成分的玻璃类的组成:选自由PbO、B2O3、ZnO、Bi2O3、SiO2、Al2O3、MgO和BaO构成的组中的至少两种氧化物。
本发明的膏组合物中所含有的玻璃熔料的粒子的平均粒径虽然没有特别限定,但是优选的是20μm以下。
本发明的膏组合物可根据需要而含有调整膏的特性的分散剂、可塑剂、防沉淀剂、触变剂等各种添加剂来使用。添加剂的组成虽然没有特别限定,但是含量优选的是10质量%以下。
实施例
下面说明本发明的一个实施例。
首先,配制了在50~80质量%的范围内含有铝粉末、在0.1~8质量%的范围内含有玻璃熔料、在15~40质量%的范围内含有将乙基纤维素溶解于乙二醇醚类有机溶剂所得的有机质媒介物,并且按表1所示的比例添加了各种氢氧化物的膏组合物。
具体地讲,在将乙基纤维素溶解于乙二醇醚类有机溶剂所得的有机质媒介物中,加入铝粉末和ZnO-B2O3-SiO2类的玻璃熔料,并以表1所示的添加量加入各种氢氧化物,通过用众所周知的混合机进行混合,配制了膏组合物(实施例1~18)。另外,用和上述同样的方法,配制了如表1所示不含氢氧化物的膏组合物(比较例1)。
在此,鉴于铝粉末和硅半导体基板的反应性能的保证、涂敷性以及涂敷膜的均匀性,铝粉末使用了由具有平均粒径为2~20μm的球形或接近球形形状的粒子构成的粉末。玻璃熔料使用了粒子的平均粒径为1~12μm的玻璃熔料。
将上述各种膏组合物用165目的丝网印刷板涂敷、印刷在厚度为220μm、大小为155mm×155mm的p型硅半导体基板上,并使之干燥。涂敷量设定为:在干燥前为1.5±0.1g/张。
将印刷了膏所得的p型硅半导体基板干燥后,在红外线连续烧制炉中,在空气气氛中进行了烧制。烧制炉的烧制区的温度设定为760~780℃,基板的滞留时间(烧制时间)设定为8~12秒。烧制后进行冷却,从而得到了如图1所示在p型硅半导体基板1上形成了铝电极层5和Al-Si合金层6的构造。
用目视数出在形成于硅半导体基板上的铝电极层5中,铝电极层5的测定表面积每150×150mm2的浮泡和铝球的生数量,并将其合计值在表1中表示。为了防止在制造工序中产生硅半导体基板的龟裂,浮泡和铝球的产生数量的目标值设定为10。
用4探针式表面电阻测定器(那普生公司制RG-5型薄片电阻测定器)测定了背面电极8的表面电阻,该背面电极8的表面电阻影响电极间的欧姆电阻。测定条件设定为:电压为4mV,电流为100mA,赋予表面的负荷为200grf(1.96N)。其测定值在表1的背面电极表面电阻(mΩ/□)中表示。
然后,将形成了背面电极8的p型硅半导体基板浸渍在盐酸水溶液中,从而溶解去除铝电极层5和Al-Si合金层6,并用上述表面电阻测定器测定了形成了p+层7的p型硅半导体基板的表面电阻。
p+层7的表面电阻和BSF效果之间存在相关关系,表现为:其表面电阻越小,BSF效果越高。在此,优选的表面电阻的值,对于背面电极8为20mΩ/□以下,对于p+层7为21Ω/□以下。
形成了铝电极层的烧制后的p型硅半导体基板的变形量是在烧制、冷却后,如图2所示,使铝电极层朝上,如箭头P1和P2所示,按住基板四角的对角上的两端,测定了另外两端的浮起量(包含基板的厚度)X1和X2。另外,按照和上述同样的方法,如箭头P1和P2所示,按住在上述测定中测定了浮起量X1和X2的地方,测定了如箭头P1和P2所示按住的地方的两端的浮起量X3和X4。计算浮起量X1、X2、X3和X4的平均值,将其作为硅半导体基板的“变形量(mm)”。另外,变形量的目标值为3.0mm以下。
如上所述测定的背面电极8的表面电阻、p+层7的表面电阻和硅半导体基板的变形量在表1中表示。
表1
从表1所示的结果可知,与不含氢氧化物的现有的膏组合物(比较例1)相比,由于使用本发明的使用了氢氧化物的膏组合物(实施例1~18),因而铝电极层的电极功能和BSF效果不会降低,可抑制铝电极层中的浮泡和铝球的产生,并且减少硅半导体基板的变形量。
可以认为,以上公开的实施方式和实施例在所有的方面都是例示,并非限制性的。本发明的范围不是以上实施方式和实施例,而是由权利要求的范围来表示,旨在包含与权利要求的范围等同的含义和范围内的所有的修改和变形。
工业实用性
按照本发明,使用除了含有铝粉末和有机质媒介物以外,还含有氢氧化物的膏组合物,可抑制在形成于硅半导体基板的背面的铝电极层上产生浮泡和铝球,并且可减少硅半导体基板的变形,从而能够提高太阳电池元件的制造合格率。
Claims (3)
1.一种膏组合物,用于在构成太阳电池的硅半导体基板(1)上形成电极(8),其中含有铝粉末、有机质媒介物和氢氧化物,
所述氢氧化物是选自由氢氧化铝、氢氧化镁、氢氧化钙、氢氧化锶、氢氧化钡、氢氧化铁和氢氧化铜构成的组中的至少一种,
所述氢氧化物的含量在0.1质量%以上且在25.0质量%以下。
2.根据权利要求1所述的膏组合物,其中,还含有玻璃熔料。
3.一种太阳电池元件,其中,具有电极(8),该电极(8)是将权利要求1所述的膏组合物涂敷在硅半导体基板(1)上后,经烧制而形成的。
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JP4373774B2 (ja) | 2003-12-24 | 2009-11-25 | 京セラ株式会社 | 太陽電池素子の製造方法 |
JP2005200585A (ja) | 2004-01-16 | 2005-07-28 | Gp Daikyo Corp | 樹脂組成物並びにそれを用いた樹脂成形品及びその製造方法 |
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2006
- 2006-09-22 WO PCT/JP2006/318816 patent/WO2007046214A1/ja active Application Filing
- 2006-09-22 ES ES06810429T patent/ES2361974T3/es active Active
- 2006-09-22 EP EP06810429A patent/EP1939943B1/en not_active Not-in-force
- 2006-09-22 US US11/990,618 patent/US8877100B2/en not_active Expired - Fee Related
- 2006-09-22 DE DE602006021767T patent/DE602006021767D1/de active Active
- 2006-09-22 CN CNB2006800386392A patent/CN100550431C/zh not_active Expired - Fee Related
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Also Published As
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DE602006021767D1 (de) | 2011-06-16 |
TWI382546B (zh) | 2013-01-11 |
CN101292363A (zh) | 2008-10-22 |
EP1939943A4 (en) | 2009-12-30 |
JPWO2007046214A1 (ja) | 2009-04-23 |
US8877100B2 (en) | 2014-11-04 |
TW200725923A (en) | 2007-07-01 |
WO2007046214A1 (ja) | 2007-04-26 |
US20090223563A1 (en) | 2009-09-10 |
EP1939943B1 (en) | 2011-05-04 |
KR101031060B1 (ko) | 2011-04-25 |
ES2361974T3 (es) | 2011-06-24 |
NO20082281L (no) | 2008-05-19 |
NO339124B1 (no) | 2016-11-14 |
EP1939943A1 (en) | 2008-07-02 |
JP4949263B2 (ja) | 2012-06-06 |
KR20080068638A (ko) | 2008-07-23 |
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