CN100445709C - Automatic device of LED testing table - Google Patents
Automatic device of LED testing table Download PDFInfo
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- CN100445709C CN100445709C CNB2005100335294A CN200510033529A CN100445709C CN 100445709 C CN100445709 C CN 100445709C CN B2005100335294 A CNB2005100335294 A CN B2005100335294A CN 200510033529 A CN200510033529 A CN 200510033529A CN 100445709 C CN100445709 C CN 100445709C
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- 238000012360 testing method Methods 0.000 title claims description 99
- 239000000523 sample Substances 0.000 claims abstract description 19
- 230000003287 optical effect Effects 0.000 claims abstract description 8
- 230000005540 biological transmission Effects 0.000 claims abstract description 6
- 239000000463 material Substances 0.000 claims description 44
- 238000007599 discharging Methods 0.000 claims description 14
- 239000004568 cement Substances 0.000 claims description 2
- 238000009413 insulation Methods 0.000 claims description 2
- 239000000084 colloidal system Substances 0.000 abstract description 7
- 238000000034 method Methods 0.000 description 13
- 238000001514 detection method Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000007664 blowing Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 208000004350 Strabismus Diseases 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
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Abstract
The present invention discloses an automatic device for an LED measurer table, which comprises a set of a feed structure, a positioning and measuring structure and a set of a discharge structure, wherein the feed structure comprises a circular vibrating tray, a flat vibrating tray connected with the circular vibrating tray, a feed jaw set and a strip jaw set. The positioning and measuring structure comprises a positioning jaw set arranged oppositely to the strip jaw set, the positioning jaw set comprises a plurality of positioning openings, and a measuring device is arranged just below the positioning jaw set and comprises a polarity probe base measuring the polarity of an LED, a rotating base and a frame foot probe base measuring the brightness and the optical wavelength of the LED. A positioning post is arranged at one end of the measuring positioning opening on the positioning jaw set, which is corresponding to the frame foot probe base, the discharge structure comprises a transmission gear and a crawler track matched with the transmission gear, and a plurality of discharge bases are clamped on the crawler track. A pneumatic push rod is arranged at the back of the discharge base, and the measuring positioning opening is provided with an elastic assembly. The automatic device of the present invention avoids colloid damaging the LED when measuring.
Description
Technical field
The present invention relates to a kind of LED test instrument, relate in particular to a kind of automation equipment of LED test table.
Background technology
Light emitting diode is after encapsulation is finished, and its luminance brightness and optical wavelength are to guarantee its yield or its usability after tested, and the method for its test then must utilize special-purpose LED test instrument to detect.Higher and the comparatively reliable light emitting diode detecting instrument of measuring accuracy of automaticity had appearred in recent years.
The patent No. is 01274956.7, Granted publication number has just been announced a kind of such testing tool for the patent that CN 2519906Y, name are called " automation equipment of LED test table ".See also Fig. 1, this patent is achieved in that mainly to be made up of one group of feeding structure, an assignment test structure and one group of discharging structure, this feeding structure is made up of following each member: its feed end is a circular vibrating disk 11, and a flat shape vibrating disk 12 arranged, as coupled as the track, and this flat shape vibrating disk 12 extends to the test section front end, and just can be connected with the test section front end; When this flat shape vibrating disk 12 extended to the appropriate location in test section the place ahead forward, the top was provided with a catch pawl 21, and this catch pawl 21 is the effect that can put light emitting diode for folding and tool retaining by spring interlock; Catch pawl 21 top appropriate locations are provided with an auxiliary charging air outlet 22, and it is connected with air delivery pipe, and the effect that continues air-supply and light emitting diode can be put to fore blow is arranged; The front end appropriate location of flat shape vibrating disk 12 belows and catch pawl 21 relative positions is provided with a charging set of jaws 23, and it cooperates horizontal power wheel and vertical power wheel to produce interlock by cam, uses the closure and the front-rear reciprocation movement thereof of control charging set of jaws 23; Catch pawl 21 terminal appropriate locations are provided with a correcting pawl 24, and the track relative position of these correcting pawl 24 sides and flat shape vibrating disk 12 has ∏ font breach, and its front end face also has the ∏ font breach of an identical size; Correcting pawl 24 rear ends are provided with a band material pawl group 26, and it is a Γ type, and front end facade place is provided with four equidistant breach.The assignment test structure is made up of following each member: a locating detent group 25, be arranged at the relative position that band is expected pawl group 26 opposites, and it is an E font, and the front end of the three-jaw of protrusion is respectively equipped with the positioning port of an indent, and corresponding with each testing station; Under the locating detent group 25 a test section P, its front end just can be connected with the end of flat shape vibrating disk 12, this test group top is three testing stations, first testing station is a polarity test, under connect a polarity probes seat, whether the polarity that can test light emitting diode meets the polar orientation of test, it under second testing station rotary seat, connect a cylinder by the air actuating under this rotary seat, whether it rotates is the result who depends on the polarity probes seat detection of below, first testing station, if do not meet the polar orientation of test, then activate cylinder by air, and make it produce the rotation of 180 degree, the tested polarity that makes the tested light emitting diode of desire is to meeting tested requirement, and below, the 3rd testing station is a frame pin probe base, and it is mainly contacted with the stitch polarization of light emitting diode by this frame pin probe base, and the brightness wavelength detection head 27 above cooperating, with brightness and the optical wavelength that detects this tested light emitting diode; Moreover, one end of the 3rd testing station also is provided with the reference column of a projection, its purpose when making light emitting diode held by the 3rd positioning port of locating detent group, can clamping except that the 3rd positioning port both sides, and can produce three-point fix with this reference column, make light emitting diode not have tested situation.Discharging structure is arranged in the end of test section, and it is made up of following each member: a colloid crawler belt 32, and there is wide groove its inboard, can supply to be meshed with transmission gear 33, and have several pawls 31 that connect material equidistantly to be fastened on the crawler belt; The pawl that connects material is the stacker of an inverted L shape, and there are a width and the moderate groove of the degree of depth in the top, and this groove can be accepted the tested materials and parts that finish.This technical scheme has realized the test automation of light emitting diode, and test result can reach higher precision.
But, still there is following shortcoming in the such scheme:
Because the light emitting diode size is variant, when it detects its wavelength and brightness in the 3rd testing station,, then can't contact with the 3rd positioning port both sides and reference column if the size of light emitting diode is less, thereby can't reach the purpose of accurate location, still can have the tested situation of squint; When if the size of light emitting diode is big, then positioning port both sides and reference column extruding diode colloid will produce its colloid and damage.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art, provide a kind of and when detecting light-emitting diode luminance and optical wavelength, can avoid tested, and can not damage the automation equipment of the LED test table of its colloid its accurate location.
The present invention is achieved by the following technical solutions:
A kind of automation equipment of LED test table, comprise one group of feeding structure, one assignment test structure and one group of discharging structure, feeding structure comprises circular vibrating disk and coupled flat shape vibrating disk, catch pawl, charging pawl group and band material pawl group, band material pawl group below is the insulation base, the assignment test structure comprises the locating detent group that places band material pawl group opposite, described locating detent group comprises several positioning ports, one test group places under the locating detent group, the polarity probes seat that comprises test light emitting diode polarity, the frame pin probe base of rotary seat and test light-emitting diode luminance and optical wavelength, be provided with reference column with corresponding test position fix mouth one end of frame pin probe base on the locating detent group, discharging structure comprises transmission gear and the crawler belt that matches with it, several discharging seats are fastened on the crawler belt, and be provided with air-leg at each discharging seat rear, described test position fix mouth place is provided with elastic parts.
The flexible member of described elastic parts can be spring, also can be other elastic material, such as: plastic cement or the like.
Described elastic parts also comprises a keeper, described keeper places the test position fix mouth, this keeper can move forward and backward in the test position fix mouth, a web member that is threaded the hole is positioned on the keeper and with keeper and fixedlys connected, other has a fixture to be fixed on the locating detent group, and it is relative with the test position fix mouth, one circular hole is arranged on the described fixture, one screw passes this circular hole and flexibly connects with fixture, be with spring on the shank of screw, the end of its shank of screw is connected by screw thread with web member, and the described spring that is enclosed within on the shank of screw contacts with web member and fixture respectively, and is in the state that freely stretches.
Described keeper can be a V-arrangement finding, can be a U-shaped finding, and described keeper also can be other shapes simultaneously.
From top description as can be seen, advantage of the present invention is:
When light emitting diode is with material pawl group to take frame pin probe base place to detect its brightness and optical wavelength, adopted such as the elastic parts that has spring with the corresponding positioning port of this frame pin probe base, keeper both sides and reference column form three-point fix to light emitting diode in the elastic parts, it is tested that light emitting diode can not tilted, and light emitting diode is not of uniform size, when its size is bigger than normal, emitting diode glue is known from experience the extruding keeper, then the spring in the elastic parts is compressed, spring can be in different compressive states along with the not of uniform size of light emitting diode, thereby avoids damaging the colloid of light emitting diode.
Description of drawings
Fig. 1 is the stereo appearance figure of background technology of the present invention;
Fig. 2 is a stereo appearance figure of the present invention;
Fig. 3 is the stereo amplification figure of part such as face cam under part of detecting and the plate thereof in the middle of the present invention;
Fig. 4 is the exploded view of charging set of jaws of the present invention;
Fig. 5 is the stereographic map of band material pawl of the present invention;
Fig. 6 is locating detent and the stereographic map of going up elastic device thereof;
Fig. 7 is rotary seat of the present invention and the stereo appearance figure of going up the test group thereof;
Fig. 8 is the vertical view of part of detecting in the middle of the present invention;
Fig. 9 is the connect material structural representation of gas hole on pawl and following little bearing and the air blowing plate of the present invention;
Figure 10 is the side view of Fig. 9 of the present invention;
Figure 11 is a discharging structure stereo appearance figure of the present invention;
Figure 12 pushes away the action synoptic diagram of the screw of bar to the charging set of jaws on the small slide plate of the present invention;
Figure 13～Figure 20 is a charging test flow chart of the present invention.
Embodiment
The present invention is described in further detail below in conjunction with the drawings and specific embodiments.
Embodiment
A kind of automation equipment of LED test table comprises one group of feeding structure, an assignment test structure and one group of discharging structure.
Feeding structure is made up of following each member: see also Fig. 2, Fig. 3, its feed end is a circular vibrating disk 13, and has a flat shape vibrating disk 14 coupled, and this flat shape vibrating disk 14 extends to the test section front end, and just is connected with the test section front end; When this flat shape vibrating disk 14 extended to the appropriate location in test section the place ahead forward, the top was provided with a catch pawl 15; The big slide plate of flat shape vibrating disk 14 terminal sides is provided with charging set of jaws 4, be provided with the promotion screw on the blend stop (figure does not show) near charging set of jaws 4 one sides on the small slide plate, see also Fig. 4, Fig. 5, described charging set of jaws comprises material folding pawl 41, be provided with the jaw seat 42 of jaw groove, baffle plate 43 and pendulous device 44, press strip 45, described material folding pawl comprises upper gripper jaw 411 and following jaw 412, described jaw 412 down places jaw seat 42 bottommosts, upper gripper jaw 411 places jaw seat 42 middle parts, press strip 45 is arranged on topmost, and this press strip 45 is fixing by bolt and jaw seat 42.The material folding part of two jaws is stretched out from an end of jaw groove, and this material folding part just be positioned at the light emitting diode moving track under, baffle plate 43 is near jaw seat 42 other ends, be provided with spring 46 between upper gripper jaw 411 tail ends and the baffle plate 43, and be provided with pushing block 47 near blend stop one side on the upper gripper jaw 411, this pushing block 47 stretches out from the opening of jaw seat 42, described pendulous device 44 and jaw seat 42 are for removable pin is connected, and two pins 441,442 of pendulous device 44 pass the microscler pin-and-hole on the jaw seat 42 respectively and fixedly connected with following jaw 412 with upper gripper jaw 411 respectively.Pendulous device 44 also comprises a rotating shaft 443 that is provided with protruding axle therebetween, the circular hole of a fork 444 centres is passed in this rotating shaft 443 by its protruding axle, fixedly connected with fork, and fork 444 circular hole both sides are provided with pin-and-hole, described two pins 441,442 are individually fixed in two pin-and-holes; The small slide plate of described charging set of jaws 4 one sides is provided with band material pawl group 5 and blend stop (figure does not show), see also Figure 12 blend stop and be provided with screw 9, when after small slide plate is vertical, moving, with the pushing block 47 that promotes on the charging set of jaws 4, thus vertical reach of small slide plate or vertically after move will control material folding pawl 41 folding; See also Fig. 5, described band material pawl group 5 is a Γ shape, and front end facade place is provided with four equidistant breach.
The assignment test structure comprises the locating detent group 6 that places band material pawl group opposite, this locating detent group 6 is provided with four positioning ports, one test group P places under the locating detent group 6, see also Fig. 7, first positioning port 61 is corresponding with positioning point P0 on the test group, be used for the light emitting diode that charging set of jaws 4 is sent here is adjusted the location, it is second years old, three, four positioning ports 62,63,64 is corresponding with each testing station respectively, this test group top is three testing stations, the polarity of first testing station P1 test light emitting diode, under connect a polarity probes seat, the second testing station P2 is a rotary seat, connect a cylinder by the air actuating under this rotary seat, the result whether it rotates the polarity probes seat detection of depending on first testing station P1 below if do not meet the polar orientation of test, then activates cylinder by air, and making it produce 180 degree rotations, the tested polarity that makes the tested light emitting diode of desire is to meeting tested requirement; The 3rd testing station P3 below is a frame pin probe base, and it is mainly contacted with the stitch polarization of light emitting diode by this frame pin probe base, and cooperates the brightness wavelength detection head of top, with brightness and the optical wavelength that detects this tested light emitting diode; The 3rd testing station P3 one end is provided with the reference column P31 of a projection.
See also Fig. 6 and Fig. 8, the 4th positioning port 64 places of described locating detent group are provided with an elastic parts 7, this elastic parts comprises spring 71, keeper 72, described keeper 72 is the V-arrangement finding, and place the 4th positioning port 64, a connection piece 73 is positioned on the keeper 72 and with keeper 72 fixedlys connected, other has a fixture 74 to be fixed on the locating detent group 6, and face with the 4th positioning port 64, described fixture 74 is provided with a smooth circular hole, one screw 75 passes this circular hole and fixture 74 flexibly connects, spring 71 is enclosed within on the shank of screw, the end of its shank of screw and web member 73 are connected by screw thread, and described spring 71 places between web member 73 and the fixture 74.Described screw 75 is flexible connection with fixture 74, and when light emitting diode pushed elastic partss 7 by keeper 72, an end of head of screw can free in and out in the circular hole of fixture 74, and then spring is compressed between web member 73 and fixture 74.
See also Fig. 9, Figure 10 and Figure 11, discharging structure is arranged in the end of test section, and it is made up of following each member: a colloid crawler belt 81, and there is wide groove its inboard, can supply to be meshed, and have several pawls 82 that connect material equidistantly to be fastened on the crawler belt with transmission gear 83; The pawl 82 that connects material is the stacker of an inverted L shape, and there are a width and the moderate groove 88 of the degree of depth in the top, and this groove 88 can be accepted the tested materials and parts that finish, and the pore 87 on the air blowing plate 86 is corresponding with groove 88; Pawl 82 bottoms that connect material are provided with little bearing 84, and described little bearing 84 passes through in bearing groove 85.
The automation equipment of the LED test table of being made up of above-mentioned feeding structure, assignment test structure and discharging structure is the present invention.
The test process that automatic structure provided of LED test table of the present invention is as follows:
Before testing, the light emitting diode of finishing encapsulation is concentrated in the circular vibrating disk 13, because of more than of vibration light emitting diode meetings are regardless of the inlet end that the direction permutation is delivered to flat shape vibrating disk 14, flat shape vibrating disk 14 moves to catch pawl 15 forward with light emitting diode gradually, when trace routine begins, see also Figure 12, Figure 13, move after small slide plate is vertical, the locating detent group is vertically reach simultaneously, and the material folding pawl opens; See also Figure 14, big slide plate 16 then moves after laterally, and charging set of jaws 4 moves to the light emitting diode place before the catch pawl 15 thereupon, this moment band material pawl group 5 four breach and four positioning ports of locating detent group 6 face successively; See also Figure 15, small slide plate is vertically reach then, and the locating detent group also vertically retreats thereupon, the closed thereupon pin of clamping light emitting diode of material folding pawl 41; See also Figure 16, big slide plate 16 laterally moves forward and resets then, and charging set of jaws 4 brings to a positioning point P0 place with light emitting diode, and first process finishes; See also Figure 17, when moving, promptly begin second process after small slide plate is vertical once more, the material folding pawl opens, and meanwhile, locating detent group 6 vertically moves forward, and entangles light emitting diode with first positioning port 61 and adjusts its position; See also Figure 18, move after big slide plate 16 is then horizontal, before charging set of jaws 4 moves to catch pawl; See also Figure 19, small slide plate vertically moves forward then, the closed thereupon pin of clamping light emitting diode of material folding pawl 41, meanwhile, locating detent group 6 is moved after vertically, and the band material pawl group 5 on the small slide plate is along with small slide plate vertically moves forward, and band material pawl group 5 first breach entangle the light emitting diode of first process; See also Figure 20, big slide plate 16 laterally resets then, and will the transpose light emitting diode of some P0 place first process of band material pawl group 5 first breach brings to the first testing station P1, and charging set of jaws 4 brings to a positioning P0 place, the end of second process with light emitting diode; Equally, when after small slide plate continues vertically, moving, the 3rd process begins, material folding pawl 41 opens, simultaneously, locating detent group 6 vertically moves forward, entangle the light emitting diode at positioning point P0 place with first positioning port 61, adjust its position, entangle the light emitting diode at P1 place, first testing station with second positioning port 62, and it is carried out polarity detect, big slide plate 16 moves after laterally then, and before charging set of jaws 4 moved to catch pawl 15, small slide plate vertically moved forward then, material folding pawl 41 is closed thereupon and clamp the pin of light emitting diode, meanwhile, locating detent group 6 is moved after vertically, and band material pawl group 5 is entangled the light emitting diode at positioning point P0 place with first breach, entangle the light emitting diode of the P1 of place, first testing station with second breach, big slide plate laterally resets then, and band material pawl group 5 first breach bring to the first testing station P1 with light emitting diode, and second breach brings to the second testing station P2 with light emitting diode, charging set of jaws 4 brings to positioning point P0 place with folded light emitting diode, and the 3rd process finishes; When after small slide plate is then vertical, moving, the 4th process begins, material folding pawl 41 opens, simultaneously, locating detent group 6 vertically moves forward, entangle the light emitting diode at positioning point P0 place with first positioning port, adjust its position, entangle the light emitting diode at P1 place, first testing station with second positioning port, it is carried out polarity detects, entangle the light emitting diode at P2 place, second testing station with the 3rd positioning port, testing result according to the 3rd process is rotated or waits for it, big slide plate 16 moves after laterally then, before charging set of jaws 4 moves to catch pawl, small slide plate vertically moves forward then, material folding pawl 41 is closed thereupon and clamp the pin of light emitting diode, meanwhile, locating detent group 6 is moved after vertically, band material pawl group 5 is entangled the light emitting diode at positioning point P0 place with first breach, entangle the light emitting diode of the P1 of place, first testing station with second breach, entangle the light emitting diode at P2 place, second testing station with the 3rd breach, big slide plate 16 laterally resets then, band material pawl group 5 first breach bring to the first testing station P1 with light emitting diode, second breach brings to the second testing station P2 with light emitting diode, the 3rd breach brings to the 3rd testing station P3 with light emitting diode, and the charging set of jaws brings to positioning point P0 place with folded light emitting diode, and the 4th process finishes; The rest may be inferred, when the light emitting diode of the 5th process is fed set of jaws 4 and brings to positioning point P0 place, the light emitting diode that band material pawl group 5 the 4th breach has detected P3 place, the 3rd testing station brings on the pawl 82 that connects material, the do action that so constantly goes round and begins again by band material pawl group 5 and charging set of jaws 4, can carry out automatic test to light emitting diode, and simple in structure.
Although the present invention has done detailed explanation and has quoted some instantiations as proof; but for those skilled in the art; only otherwise leave that the spirit and scope of the present invention can be done various variations or correction is obvious, all should be included within the protection domain of claim of the present invention.
Claims (7)
1. the automation equipment of a LED test table, comprise one group of feeding structure, one assignment test structure and one group of discharging structure, feeding structure comprises circular vibrating disk, flat shape vibrating disk, charging pawl group and band material pawl group, circular vibrating disk links to each other with parallel vibrating disk, band material pawl group below is the insulation base, the assignment test structure comprises the locating detent group that places band material pawl group opposite, described locating detent group comprises several positioning ports, one test group places under the locating detent group, the polarity probes seat that comprises test light emitting diode polarity, the frame pin probe base of rotary seat and test light-emitting diode luminance and optical wavelength, be provided with reference column with corresponding test position fix mouth one end of frame pin probe base on the locating detent group, discharging structure comprises transmission gear and the crawler belt that matches with it, several discharging seats are fastened on the crawler belt, and be provided with air-leg at each discharging seat rear, it is characterized in that: described test position fix mouth place is provided with elastic parts.
2. the automation equipment of LED test table according to claim 1, it is characterized in that: the flexible member of described elastic parts is a spring.
3. the automation equipment of LED test table according to claim 2, it is characterized in that: described elastic parts also comprises a keeper.
4. the automation equipment of LED test table according to claim 3, it is characterized in that: described keeper places the test position fix mouth, a connection piece is positioned on the keeper and with keeper fixedlys connected, other has a fixture to be fixed on the locating detent group, and it is relative with the test position fix mouth, one circular hole is arranged on the described fixture, one screw passes this circular hole and fixture flexibly connects, be with spring on the shank of screw, the end of its shank of screw is connected by screw thread with web member, and described spring places between web member and the fixture.
5. according to the automation equipment of claim 3 or 4 arbitrary described LED test tables, it is characterized in that: described keeper is a V-arrangement part.
6. according to the automation equipment of claim 3 or 4 arbitrary described LED test tables, it is characterized in that: described keeper is a U-shaped part.
7. the automation equipment of LED test table according to claim 1, it is characterized in that: the elastic part of described elastic parts is a plastic cement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100335294A CN100445709C (en) | 2005-03-07 | 2005-03-07 | Automatic device of LED testing table |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100335294A CN100445709C (en) | 2005-03-07 | 2005-03-07 | Automatic device of LED testing table |
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| Publication Number | Publication Date |
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| CN1831497A CN1831497A (en) | 2006-09-13 |
| CN100445709C true CN100445709C (en) | 2008-12-24 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB2005100335294A Expired - Fee Related CN100445709C (en) | 2005-03-07 | 2005-03-07 | Automatic device of LED testing table |
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| CN (1) | CN100445709C (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JP5030624B2 (en) * | 2007-03-13 | 2012-09-19 | 株式会社ヒューモラボラトリー | Rotary electrode device |
| CN101581742B (en) * | 2008-05-15 | 2011-07-20 | 中茂电子(深圳)有限公司 | Detection machine station with contact impedance detection device |
| CN102012477A (en) * | 2010-10-13 | 2011-04-13 | 苏州快可光伏电子有限公司 | Diode test system of junction box |
| CN102623374A (en) * | 2012-04-13 | 2012-08-01 | 常州先进制造技术研究所 | Pole identification and position correcting and sequencing device in plug-in mounting process of diode |
| CN103901334A (en) * | 2012-12-28 | 2014-07-02 | 深圳市劲升迪龙科技发展有限公司 | Micro-adjustable wafer test machine |
| CN108584388A (en) * | 2018-03-17 | 2018-09-28 | 东莞市元鹏五金电子科技有限公司 | The transmitting of optoelectronic switch or reception pipe convey detection output device and method automatically |
| CN108722912A (en) * | 2018-03-17 | 2018-11-02 | 东莞市元鹏五金电子科技有限公司 | The transmitting of optoelectronic switch or reception pipe conveying detection correction waste discharge apparatus and method |
| CN108549015A (en) * | 2018-03-17 | 2018-09-18 | 东莞市元鹏五金电子科技有限公司 | A kind of transmitting of optoelectronic switch or reception pipe conveying detection means for correcting and method |
| CN108499907A (en) * | 2018-03-17 | 2018-09-07 | 东莞市元鹏五金电子科技有限公司 | A kind of transmitting of optoelectronic switch or reception pipe transportation and detection apparatus and method |
| CN108521757A (en) * | 2018-03-17 | 2018-09-11 | 东莞市元鹏五金电子科技有限公司 | A kind of LED automatic detection devices and method |
| CN108745953A (en) * | 2018-03-17 | 2018-11-06 | 东莞市元鹏五金电子科技有限公司 | A kind of LED conveys detection waste discharge apparatus and method automatically |
| CN108482987A (en) * | 2018-03-17 | 2018-09-04 | 东莞市元鹏五金电子科技有限公司 | A kind of transmitting of optoelectronic switch or reception pipe conveying detection charging equipment and method |
| CN117976586B (en) * | 2024-04-02 | 2024-06-07 | 深圳市协创鑫智能装备有限公司 | Automatic triode assembling equipment |
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| CN1501089A (en) * | 2002-11-07 | 2004-06-02 | 伊斯梅卡半导体控股公司 | Method and apparatus for testing electronic components |
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| CN1831497A (en) | 2006-09-13 |
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