CN100582691C - Automatic apparatus for LED tester table - Google Patents
Automatic apparatus for LED tester table Download PDFInfo
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- CN100582691C CN100582691C CN 200510033308 CN200510033308A CN100582691C CN 100582691 C CN100582691 C CN 100582691C CN 200510033308 CN200510033308 CN 200510033308 CN 200510033308 A CN200510033308 A CN 200510033308A CN 100582691 C CN100582691 C CN 100582691C
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Abstract
The invention discloses an emitting diode test machine auto device that includes a material intake structure, an orientation testing structure and a material outlet structure. The material intake structure includes circular vibrating tray and flat vibrating tray, material intake group and material belt group. The downward of the material belt group is insulating mat base. The orientation test structure includes an orientation group, a testing group, and a frame probe base. The material outlet structure includes gear driving wheel and apron wheel. Plural material base card are on the apron wheel, gas driven handspike is set at back of material outlet base. At least on magnet is set on the insulated base. The invention could ensure the probe contact of emitting diode and frame diode or polarity diode, and improves lighting up ratio.
Description
Technical field
The present invention relates to a kind of LED test instrument, relate in particular to a kind of automation equipment of LED test table.
Background technology
Light emitting diode is after encapsulation is finished, and its luminance brightness and optical wavelength are to guarantee its yield or its usability after tested, and the method for its test then must utilize special-purpose LED test instrument to detect.Higher and the comparatively reliable light emitting diode detecting instrument of measuring accuracy of automaticity had appearred in recent years.
The patent No. is 01274956.7, Granted publication number has just been announced a kind of such testing tool for the patent that CN 2519906Y, name are called " automation equipment of LED test table ".See also Fig. 1, this patent is achieved in that mainly to be made up of one group of feeding structure, an assignment test structure and one group of discharging structure, this feeding structure is made up of following each member: its feed end is a circular vibrating disk 11, and a flat shape vibrating disk 12 arranged, as coupled as the track, and this flat shape vibrating disk 12 extends to the test section front end, and just can be connected with the test section front end; When this flat shape vibrating disk 12 extended to the appropriate location in test section the place ahead forward, the top was provided with a catch pawl 21, and this catch pawl 21 is the effect that can put light emitting diode for folding and tool retaining by spring interlock; Catch pawl 21 top appropriate locations are provided with an auxiliary charging air outlet 22, and it is connected with air delivery pipe, and the effect that continues air-supply and light emitting diode can be put to fore blow is arranged; The front end appropriate location of flat shape vibrating disk 12 belows and catch pawl 21 relative positions is provided with a charging set of jaws 23, and it cooperates horizontal power wheel and vertical power wheel to produce interlock by cam, uses the closure and the front-rear reciprocation movement thereof of control charging set of jaws 23; Catch pawl 21 terminal appropriate locations are provided with a correcting pawl 24, and the track relative position of these correcting pawl 24 sides and flat shape vibrating disk 12 has ∏ font breach, and its front end face also has the ∏ font breach of an identical size; Correcting pawl 24 rear ends are provided with a band material pawl group 26, and it is a Γ type, and front end facade place is provided with four equidistant breach.The assignment test structure is made up of following each member: a locating detent group 25, be arranged at the relative position that band is expected pawl group 26 opposites, and it is an E font, and the front end of the three-jaw of protrusion is respectively equipped with the positioning port of an indent, and corresponding with each testing station; Under the locating detent group 25 a test section P, its front end just can be connected with the end of flat shape vibrating disk 12, this test group top is three testing stations, first testing station is a polarity test, under connect a polarity probes seat, whether the polarity that can test light emitting diode meets the polar orientation of test, it under second testing station rotary seat, connect a cylinder by the air actuating under this rotary seat, whether it rotates is the result who depends on the polarity probes seat detection of below, first testing station, if do not meet the polar orientation of test, then activate cylinder by air, and make it produce the rotation of 180 degree, the tested polarity that makes the tested light emitting diode of desire is to meeting tested requirement, and below, the 3rd testing station is a frame pin probe base, and it is mainly contacted with the stitch polarization of light emitting diode by this frame pin probe base, and the brightness wavelength detection head 27 above cooperating, with brightness and the optical wavelength that detects this tested light emitting diode; Moreover, one end of the 3rd testing station also is provided with the reference column of a projection, its purpose when making light emitting diode held by the 3rd positioning port of locating detent group, can clamping except that the 3rd positioning port both sides, and can produce three-point fix with this reference column, make light emitting diode not have tested situation.Discharging structure is arranged in the end of test section, and it is made up of following each member: a colloid crawler belt 32, and there is wide groove its inboard, can supply to be meshed with transmission gear 33, and have several pawls 31 that connect material equidistantly to be fastened on the crawler belt; The pawl that connects material is the stacker of an inverted L shape, and there are a width and the moderate groove of the degree of depth in the top, and this groove can be accepted the tested materials and parts that finish.This technical scheme has realized the test automation of light emitting diode, and test result can reach higher precision.
But, still there is following shortcoming in the such scheme:
Because light emitting diode lighter weight, when it detects its polarity in first testing station, when its wavelength and brightness are detected in the 3rd testing station, because of making stitch, inclination can't contact easily with frame pin probe base, thereby light emitting diode can not be lighted, use this technical scheme tester table its light rate and can only arrive 70～80%.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art, a kind of automation equipment that can improve the LED test table of the rate of lighting is provided.
The present invention is achieved by the following technical solutions:
A kind of automation equipment of LED test table, comprise one group of feeding structure, an assignment test structure and one group of discharging structure, feeding structure comprises circular vibrating disk and coupled flat shape vibrating disk, catch pawl, charging set of jaws and band material pawl group, and band material pawl group below is the insulation base; The assignment test structure comprises the locating detent group that places band material pawl group opposite, described locating detent group comprises four positioning ports, one test group places under the locating detent group, the frame pin probe base that comprises polarity probes seat, rotary seat and the test light-emitting diode luminance and the optical wavelength of test light emitting diode polarity, locating detent group first positioning port is used for the light emitting diode that the charging set of jaws is sent here is transposed, the locating detent group second and third, four positioning ports are corresponding with polarity probes seat, rotary seat and frame pin probe base respectively, the 3rd testing station one end is provided with reference column; Discharging structure comprises transmission gear and the crawler belt that matches with it, several pawls that connect material are fastened on the crawler belt, and little bearing is installed in the pawl bottom of connecting material, from bearing groove that it matches in pass through, can guarantee steady feeding like this, and be provided with the air blowing plate at the pawl rear that respectively connects material.
Described charging set of jaws is fixed on the big slide plate, big slide plate is provided with small slide plate, big slide plate can only drive small slide plate and laterally move together, small slide plate also can be done and vertically move, band material pawl group is arranged on the small slide plate, side near the charging set of jaws on small slide plate is provided with thrust unit, described charging set of jaws comprises the material folding pawl, be provided with the jaw seat of jaw groove, baffle plate, pushing block and pendulous device, the material folding pawl is made up of upper gripper jaw that cooperatively interacts and following jaw, described jaw down places the jaw trench bottom of jaw seat, upper gripper jaw is positioned on the following jaw, the material folding part of two jaws is stretched out from an end of jaw groove, baffle plate is provided with spring near the jaw seat other end between upper gripper jaw tail end and the baffle plate, and described spring is in the flexible state of nature.Upper gripper jaw is provided with pushing block near a side of thrust unit, this pushing block stretches out from the opening of jaw seat side, and the width of this opening is greater than the width of pushing block, described pendulous device is that removable pin is connected with the jaw seat, two pins pass two microscler pin-and-holes on the jaw seat respectively and fixedly connected with following jaw with upper gripper jaw respectively, and the pin that is fixed in upper gripper jaw is arranged in above the jaw seat microscler pin-and-hole away from an end of baffle plate, be arranged in below the jaw seat that microscler pin-and-hole is near an end of baffle plate and be fixed in the following pin of jaw, the material folding pawl is in closure state.Described pendulous device also comprises a rotating shaft that is provided with protruding axle therebetween, this rotating shaft is passed the middle circular hole of a fork by its protruding axle, fixedly connected with fork, and fork circular hole both sides are provided with pin-and-hole, described two pins are individually fixed in two pin-and-holes, described thrust unit is to be arranged on the screw on the blend stop on the small slide plate, also is provided with a press strip above the upper gripper jaw in the described jaw seat, fixes by bolt and jaw seat.Upper gripper jaw tail end in the jaw seat also is provided with a circular hole, and described spring one end places in this hole, and baffle plate and upper gripper jaw relative position place also are provided with a circular hole, and described spring the other end places in this hole.Described upper gripper jaw one side is provided with breach, and described pushing block is fixed in this breach.
The insulation base of described band material pawl group below is provided with one or an above magnet, and described magnet has at least and is positioned at frame pin probe base right opposite more than one or one.
The automation equipment of described LED test table, the magnet of insulation on the base have and are positioned at polarity probes seat right opposite more than one or one.
The automation equipment of described LED test table, the surface that faces with frame pin probe base on the described insulation base is provided with and the identical breach of gasket shape size, and with this place's magnet shape, hole that size is identical, and magnet places this hole, described spacers covers magnet in insulation base indentation, there.
The automation equipment of described LED test table, be provided with the breach identical on the insulation base with the gasket shape size with surface that the polarity probes seat faces, and with this place's magnet shape, hole that size is identical, and magnet places this hole, described spacers covers magnet in insulation base indentation, there.
The automation equipment of described LED test table, the magnet at frame pin probe base right opposite place can be right cylinder, regular triangular prism, four-prism, circular or the like.
The automation equipment of described LED test table, the magnet at polarity probes seat right opposite place can be right cylinder, regular triangular prism, four-prism, circular or the like.
For guaranteeing that light emitting diode is subjected to no longer tilting after the attractive force of magnet, thereby pin can be contacted with the probe of frame pin probe base and polarity probes seat, the shape of magnet is rotational symmetry or center symmetry preferably, and the magnet perpendicular bisector at frame pin probe base right opposite place just in time is positioned on the middle vertical plane between frame pin probe base two probes, and the magnet perpendicular bisector at polarity probes seat right opposite place just in time is positioned on the middle vertical plane between polarity probes seat two probes.
From top description as can be seen, advantage of the present invention is:
Owing to adopted magnet and pad, when detecting light-emitting diode luminance and optical wavelength, or test its polarity chron, the attractive force that its pin is subjected to magnet can not tilt, thereby can guarantee to contact with the probe of frame pin diode or polarity diode, avoided because led pins tilts and can't contact with probe, and caused the generation of the situation of can not lighting, improved the rate of lighting.
Description of drawings
Fig. 1 is the stereo appearance figure of background technology of the present invention;
Fig. 2 is a stereo appearance figure of the present invention;
Fig. 3 is the stereo amplification figure of part such as face cam under part of detecting and the plate thereof in the middle of the present invention;
Fig. 4 is the stereo appearance figure of charging set of jaws of the present invention;
Fig. 5 is the stereographic map of band material pawl of the present invention;
Fig. 6 is locating detent and the stereographic map of going up elastic device thereof;
Fig. 7 is rotary seat of the present invention and the stereo appearance figure of going up the test group thereof;
Fig. 8 is a discharging structure stereo appearance figure of the present invention;
Fig. 9 is the sectional view of discharging structure of the present invention;
Figure 10 is the insulation base exploded view that magnet is equipped with in the present invention;
Figure 11 is the insulation base outboard profile that magnet is equipped with in the present invention;
Figure 12 pushes away the action synoptic diagram of the screw of bar to the charging set of jaws on the small slide plate of the present invention;
Figure 13～Figure 20 is a charging test flow chart of the present invention.
Embodiment
The present invention is described in further detail below in conjunction with the drawings and specific embodiments.
Embodiment
Feeding structure is made up of following each member: see also Fig. 2, Fig. 3, its feed end is a circular vibrating disk 13, and has a flat shape vibrating disk 14 coupled, and this flat shape vibrating disk 14 extends to the test section front end, and just is connected with the test section front end; When this flat shape vibrating disk 14 extended to the appropriate location in test section the place ahead forward, the top was provided with a catch pawl 15; The big slide plate of flat shape vibrating disk 14 terminal sides is provided with charging set of jaws 4, be provided with the promotion screw on the blend stop (figure does not show) near charging set of jaws 4 one sides on the small slide plate, see also Fig. 4, described charging set of jaws comprises material folding pawl 41, is provided with the jaw seat 42 of jaw groove, baffle plate 43 and pendulous device 44, press strip 45, described material folding pawl comprises upper gripper jaw 411 and following jaw 412, described jaw 412 down places jaw seat 42 bottommosts, upper gripper jaw 411 places jaw seat 42 middle parts, press strip 45 is arranged on topmost, and this press strip 45 is fixing by bolt and jaw seat 42.The material folding part of two jaws is stretched out from an end of jaw groove, and this material folding part just be positioned at the light emitting diode moving track under, baffle plate 43 is near jaw seat 42 other ends, be provided with spring 46 between upper gripper jaw 411 tail ends and the baffle plate 43, and be provided with pushing block 47 near blend stop one side on the upper gripper jaw 411, this pushing block 47 stretches out from the opening of jaw seat 42, described pendulous device 44 and jaw seat 42 are for removable pin is connected, and two pins 441,442 of pendulous device 44 pass the microscler pin-and-hole on the jaw seat 42 respectively and fixedly connected with following jaw 412 with upper gripper jaw 411 respectively.Pendulous device 44 also comprises a rotating shaft 443 that is provided with protruding axle therebetween, the circular hole of a fork 444 centres is passed in this rotating shaft 443 by its protruding axle, fixedly connected with fork, and fork 444 circular hole both sides are provided with pin-and-hole, described two pins 441,442 are individually fixed in two pin-and-holes; The small slide plate of described charging set of jaws 4 one sides is provided with band material pawl group 5 and blend stop (figure does not show), see also Figure 12 blend stop and be provided with screw 9, when after small slide plate is vertical, moving, with the pushing block 47 that promotes on the charging set of jaws 4, thus vertical reach of small slide plate or vertically after move will control material folding pawl 41 folding; See also the described band material of Fig. 5 pawl group 5 and be a Γ shape, front end facade place is provided with four equidistant breach.
The assignment test structure comprises the locating detent group 6 that places band material pawl group opposite, this locating detent group 6 is provided with four positioning ports, one test group P places under the locating detent group 6, see also Fig. 6, Fig. 7 first positioning port 61 is corresponding with positioning point P0 on the test group, be used for the light emitting diode that charging set of jaws 4 is sent here is adjusted the location, it is second years old, three, four positioning ports 62,63,64 is corresponding with each testing station respectively, this test group top is three testing stations, the polarity of first testing station P1 test light emitting diode, under connect a polarity probes seat, the second testing station P2 is a rotary seat, connect a cylinder by the air actuating under this rotary seat, whether it rotates the result of the polarity probes seat detection of depending on first testing station P1 below, if do not meet the polar orientation of test, then activate cylinder by air, and make it produce 180 degree rotations, the tested polarity that makes the tested light emitting diode of desire is to meeting tested requirement; The 3rd testing station P3 below is a frame pin probe base, and it is mainly contacted with the stitch polarization of light emitting diode by this frame pin probe base, and cooperates the brightness wavelength detection head of top, with brightness and the optical wavelength that detects this tested light emitting diode; The 3rd testing station P3 one end is provided with the reference column P31 of a projection.
The 4th positioning port 64 places of described locating detent group are provided with an elastic parts 7, this elastic parts comprises spring 71, keeper 72, described keeper 72 is the V-arrangement finding, and place the 4th positioning port 64, a connection piece 73 is positioned on the keeper 72 and with keeper 72 fixedlys connected, other has a fixture 74 to be fixed on the locating detent group 6, and face with the 4th positioning port 64, described fixture 74 is provided with a smooth circular hole, one screw 75 passes this circular hole and fixture 74 flexibly connects, spring 71 is enclosed within on the shank of screw, and the end of its shank of screw and web member 73 are connected by screw thread, and described spring 71 places between web member 73 and the fixture 74.Described screw 75 is flexible connection with fixture 74, and when light emitting diode pushed elastic partss 7 by keeper 72, an end of head of screw can free in and out in the circular hole of fixture 74, and then spring is compressed between web member 73 and fixture 74.
See also Fig. 8, Fig. 9, discharging structure is arranged in the end of test section, and it is made up of following each member: a colloid crawler belt 81, and there is wide groove its inboard, can supply to be meshed with transmission gear 83, and have several pawls 82 that connect material equidistantly to be fastened on the crawler belt; The pawl 82 that connects material is the stacker of an inverted L shape, and there are a width and the moderate groove 88 of the degree of depth in the top, and this groove 88 can be accepted the tested materials and parts that finish, and the pore 87 on the air blowing plate 86 is corresponding with groove 88; Pawl 82 bottoms that connect material are provided with little bearing 84, and described little bearing 84 passes through in bearing groove 85.
See also Figure 10, the automation equipment of the described LED test table of Figure 11, band material pawl group 5 belows and frame pin probe base, be respectively arranged with circular hole on the insulation base 173 that the polarity probes seat faces, two circular hole outsides are provided with two breach, and two circular holes respectively with the polarity probes seat, frame pin probe base faces, the diameter of two circular holes is 8 centimetres, the degree of depth is 2 centimetres, wherein be equipped with cylinder-shaped magnet 172, size dimension and two circular holes are identical, be fixed with the insulation spacer 171 identical in two breach of described circular hole outside with its size, magnet is covered, the thickness of described insulation spacer is the same with notch depth, that is to say insulation spacer 171 is fixed on indentation, there after, insulation spacer 171 surfaces and insulation base 173 surfaces are in one plane.
The automation equipment of the LED test table of being made up of above-mentioned feeding structure, assignment test structure and discharging structure is the present invention.
The test process that automatic structure provided of LED test table of the present invention is as follows:
Before testing, the light emitting diode of finishing encapsulation is concentrated in the circular vibrating disk 13, because of more than of vibration light emitting diode meetings are regardless of the inlet end that the direction permutation is delivered to flat shape vibrating disk 14, flat shape vibrating disk 14 moves to catch pawl 15 forward with light emitting diode gradually, when trace routine begins, see also Figure 12, Figure 13, move after small slide plate is vertical, the locating detent group is vertically reach simultaneously, and the material folding pawl opens; See also Figure 14, big slide plate 16 then moves after laterally, and charging set of jaws 4 moves to the light emitting diode place before the catch pawl 15 thereupon, this moment band material pawl group 5 four breach and four positioning ports of locating detent group 6 face successively; See also Figure 15, small slide plate is vertically reach then, and the locating detent group also vertically retreats thereupon, the closed thereupon pin of clamping light emitting diode of material folding pawl 41; See also Figure 16, big slide plate 16 laterally moves forward and resets then, and charging set of jaws 4 brings to a positioning point P0 place with light emitting diode, and first process finishes; See also Figure 17, when moving, promptly begin second process after small slide plate is vertical once more, the material folding pawl opens, and meanwhile, locating detent group 6 vertically moves forward, and entangles light emitting diode with first positioning port 61 and adjusts its position; See also Figure 18, move after big slide plate 16 is then horizontal, before charging set of jaws 4 moves to catch pawl; See also Figure 19, small slide plate vertically moves forward then, the closed thereupon pin of clamping light emitting diode of material folding pawl 41, meanwhile, locating detent group 6 is moved after vertically, and the band material pawl group 5 on the small slide plate is along with small slide plate vertically moves forward, and band material pawl group 5 first breach entangle the light emitting diode of first process; See also Figure 20, big slide plate 16 laterally resets then, and will the transpose light emitting diode of some P0 place first process of band material pawl group 5 first breach brings to the first testing station P1, and charging set of jaws 4 brings to a positioning P0 place, the end of second process with light emitting diode; Equally, when after small slide plate continues vertically, moving, the 3rd process begins, material folding pawl 41 opens, simultaneously, locating detent group 6 vertically moves forward, entangle the light emitting diode at positioning point P0 place with first positioning port 61, adjust its position, entangle the light emitting diode at P1 place, first testing station with second positioning port 62, and it is carried out polarity detect, big slide plate 16 moves after laterally then, and before charging set of jaws 4 moved to catch pawl 15, small slide plate vertically moved forward then, material folding pawl 41 is closed thereupon and clamp the pin of light emitting diode, meanwhile, locating detent group 6 is moved after vertically, and band material pawl group 5 is entangled the light emitting diode at positioning point P0 place with first breach, entangle the light emitting diode of the P1 of place, first testing station with second breach, big slide plate laterally resets then, and band material pawl group 5 first breach bring to the first testing station P1 with light emitting diode, and second breach brings to the second testing station P2 with light emitting diode, charging set of jaws 4 brings to positioning point P0 place with folded light emitting diode, and the 3rd process finishes; When after small slide plate is then vertical, moving, the 4th process begins, material folding pawl 41 opens, simultaneously, locating detent group 6 vertically moves forward, entangle the light emitting diode at positioning point P0 place with first positioning port, adjust its position, entangle the light emitting diode at P1 place, first testing station with second positioning port, it is carried out polarity detects, entangle the light emitting diode at P2 place, second testing station with the 3rd positioning port, testing result according to the 3rd process is rotated or waits for it, big slide plate 16 moves after laterally then, before charging set of jaws 4 moves to catch pawl, small slide plate vertically moves forward then, material folding pawl 41 is closed thereupon and clamp the pin of light emitting diode, meanwhile, locating detent group 6 is moved after vertically, band material pawl group 5 is entangled the light emitting diode at positioning point P0 place with first breach, entangle the light emitting diode of the P1 of place, first testing station with second breach, entangle the light emitting diode at P2 place, second testing station with the 3rd breach, big slide plate 16 laterally resets then, band material pawl group 5 first breach bring to the first testing station P1 with light emitting diode, second breach brings to the second testing station P2 with light emitting diode, the 3rd breach brings to the 3rd testing station P3 with light emitting diode, and the charging set of jaws brings to positioning point P0 place with folded light emitting diode, and the 4th process finishes; The rest may be inferred, when the light emitting diode of the 5th process is fed set of jaws 4 and brings to positioning point P0 place, the light emitting diode that band material pawl group 5 the 4th breach has detected P3 place, the 3rd testing station brings on the pawl 82 that connects material, the do action that so constantly goes round and begins again by band material pawl group 5 and charging set of jaws 4, can carry out automatic test to light emitting diode, and simple in structure.
Although the present invention has done detailed explanation and has quoted instantiation as proof; but for those skilled in the art; only otherwise leave that the spirit and scope of the present invention can be done various variations or correction is obvious, all should be included within the protection domain of claim of the present invention.
Claims (10)
1. the automation equipment of a LED test table, comprise one group of feeding structure, one assignment test structure and one group of discharging structure, feeding structure comprises circular vibrating disk, flat shape vibrating disk, charging pawl group and band material pawl group, described circular vibrating disk links to each other with flat shape vibrating disk, band material pawl group below is the insulation base, the assignment test structure comprises the locating detent group that places band material pawl group opposite, one test group places under the locating detent group, described test group comprises the polarity probes seat of test light emitting diode polarity, the frame pin probe base of rotary seat and test light-emitting diode luminance and optical wavelength, discharging structure comprises transmission gear and the crawler belt that matches with described transmission gear, several discharging seats are fastened on the crawler belt, and be provided with air-leg at each discharging seat rear, it is characterized in that: described insulation base is provided with at least one block of magnet, and described magnet has at least one to be positioned at frame pin probe base right opposite.
2. the automation equipment of LED test table according to claim 1, it is characterized in that: when the magnet that is provided with on the described insulation base was no less than two, the magnet on the described insulation base had at least one to be positioned at polarity probes seat right opposite.
3. the automation equipment of LED test table according to claim 1, it is characterized in that: the surface that faces with frame pin probe base on the described insulation base is provided with and the identical breach of gasket shape size, and with this place's magnet shape, hole that size is identical, and magnet places this hole, described spacers covers magnet in insulation base indentation, there.
4. the automation equipment of LED test table according to claim 2, it is characterized in that: be provided with the breach identical on the described insulation base with surface that the polarity probes seat faces with the gasket shape size, and with this place's magnet shape, hole that size is identical, and magnet places this hole, described spacers covers magnet in insulation base indentation, there.
5. the automation equipment of LED test table according to claim 3, it is characterized in that: described magnet is right cylinder.
6. the automation equipment of LED test table according to claim 4, it is characterized in that: described magnet is right cylinder.
7. the automation equipment of LED test table according to claim 3, it is characterized in that: described magnet is regular prism.
8. the automation equipment of LED test table according to claim 4, it is characterized in that: described magnet is regular prism.
9. the automation equipment of LED test table according to claim 3, it is characterized in that: described magnet is circular.
10. the automation equipment of LED test table according to claim 4, it is characterized in that: described magnet is circular.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510033308 CN100582691C (en) | 2005-02-22 | 2005-02-22 | Automatic apparatus for LED tester table |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510033308 CN100582691C (en) | 2005-02-22 | 2005-02-22 | Automatic apparatus for LED tester table |
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| Publication Number | Publication Date |
|---|---|
| CN1825073A CN1825073A (en) | 2006-08-30 |
| CN100582691C true CN100582691C (en) | 2010-01-20 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 200510033308 Expired - Fee Related CN100582691C (en) | 2005-02-22 | 2005-02-22 | Automatic apparatus for LED tester table |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101581742B (en) * | 2008-05-15 | 2011-07-20 | 中茂电子(深圳)有限公司 | Detection machine station with contact impedance detection device |
| CN102623374A (en) * | 2012-04-13 | 2012-08-01 | 常州先进制造技术研究所 | Pole identification and position correcting and sequencing device in plug-in mounting process of diode |
| CN105025698B (en) * | 2015-06-19 | 2017-12-08 | 深圳市景颢光电科技有限公司 | A kind of more feeding position adopting surface mounted LED device bulk cargo vibrator supply equipment of single track |
| CN113702791B (en) * | 2021-07-13 | 2022-05-31 | 成都思科瑞微电子股份有限公司 | Semiconductor discrete device testing arrangement |
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| CN1825073A (en) | 2006-08-30 |
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Owner name: BIG WIN CNC EQUIPMENT ( SHENZHEN ) CO., LTD. Free format text: FORMER OWNER: HAN JINLONG; APPLICANT Effective date: 20071228 |
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Effective date of registration: 20071228 Address after: Guangdong city of Shenzhen province Baoan District Fuyong new streets and community Fuyuan Road HUAFA Industrial Park building A11 post encoding: 518103 Applicant after: Daying Numerical Control Equipment (Shenzhen) Co., Ltd. Address before: Postal code of D building, Shuang Jin Hui Industrial Town, Heping Village, Fuyong Town, Shenzhen, Guangdong, Baoan District, China: 518103 Applicant before: Han Jin Long Co-applicant before: Luo Huicai Co-applicant before: Yang Shaochen |
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Granted publication date: 20100120 Termination date: 20110222 |