CN100423128C - 带有单元比率小的存储单元的半导体存储装置 - Google Patents
带有单元比率小的存储单元的半导体存储装置 Download PDFInfo
- Publication number
- CN100423128C CN100423128C CNB031550827A CN03155082A CN100423128C CN 100423128 C CN100423128 C CN 100423128C CN B031550827 A CNB031550827 A CN B031550827A CN 03155082 A CN03155082 A CN 03155082A CN 100423128 C CN100423128 C CN 100423128C
- Authority
- CN
- China
- Prior art keywords
- bit
- line
- storage unit
- voltage
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/412—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Memories (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Abstract
Description
Claims (11)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP363600/2002 | 2002-12-16 | ||
JP2002363600A JP4260469B2 (ja) | 2002-12-16 | 2002-12-16 | 半導体記憶装置 |
JP363600/02 | 2002-12-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1508806A CN1508806A (zh) | 2004-06-30 |
CN100423128C true CN100423128C (zh) | 2008-10-01 |
Family
ID=32588210
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB031550827A Expired - Fee Related CN100423128C (zh) | 2002-12-16 | 2003-08-27 | 带有单元比率小的存储单元的半导体存储装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6859386B2 (zh) |
JP (1) | JP4260469B2 (zh) |
KR (1) | KR100510034B1 (zh) |
CN (1) | CN100423128C (zh) |
DE (1) | DE10335070A1 (zh) |
TW (1) | TWI244653B (zh) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006040466A (ja) * | 2004-07-29 | 2006-02-09 | Renesas Technology Corp | 半導体記憶装置 |
JP2007234073A (ja) * | 2006-02-27 | 2007-09-13 | Fujitsu Ltd | 半導体記憶装置 |
KR20080060666A (ko) * | 2006-12-27 | 2008-07-02 | 삼성전자주식회사 | 메모리 셀 워드라인의 스트레스 시간을 줄이는 워드라인구동 방법 및 회로 |
JP2009048772A (ja) * | 2008-12-05 | 2009-03-05 | Renesas Technology Corp | 半導体記憶装置 |
US7924633B2 (en) * | 2009-02-20 | 2011-04-12 | International Business Machines Corporation | Implementing boosted wordline voltage in memories |
US8488396B2 (en) * | 2010-02-04 | 2013-07-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Dual rail static random access memory |
KR101799482B1 (ko) * | 2010-12-29 | 2017-11-20 | 삼성전자주식회사 | 기입 어시스트 회로를 포함하는 정적 메모리 장치 |
JP2013062001A (ja) * | 2011-09-12 | 2013-04-04 | Toshiba Corp | 半導体記憶装置 |
EP2713372B1 (en) | 2012-09-28 | 2017-08-23 | Imec | Non-volatile resistive memory devices with boosting capacitor and methods for baising resistive memory structures thereof |
US9299404B1 (en) * | 2013-03-12 | 2016-03-29 | Altera Corporation | Methods and apparatus for performing boosted bit line precharge |
CN109841240B (zh) * | 2018-12-21 | 2020-10-16 | 北京时代民芯科技有限公司 | 一种sram型存储器高速灵敏放大器电路 |
CN113646839A (zh) | 2019-03-29 | 2021-11-12 | 株式会社半导体能源研究所 | 半导体装置 |
TWI723944B (zh) * | 2020-09-21 | 2021-04-01 | 崛智科技有限公司 | 記憶體裝置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5051952A (en) * | 1989-09-29 | 1991-09-24 | Fujitsu Limited | Semiconductor memory device having capacitors through which data read/write is carried out |
US6141240A (en) * | 1998-09-17 | 2000-10-31 | Texas Instruments Incorporated | Apparatus and method for static random access memory array |
US6160733A (en) * | 1997-08-29 | 2000-12-12 | Enable Semiconductor, Inc. | Low voltage and low power static random access memory (SRAM) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62257698A (ja) | 1986-04-30 | 1987-11-10 | Oki Electric Ind Co Ltd | 半導体スタテイツクメモリセル |
JPH0680806B2 (ja) | 1986-11-18 | 1994-10-12 | 日本電気株式会社 | スタテイツク型misメモリセル |
US6650580B1 (en) * | 2002-07-26 | 2003-11-18 | International Business Machines Corporation | Method for margin testing |
-
2002
- 2002-12-16 JP JP2002363600A patent/JP4260469B2/ja not_active Expired - Fee Related
-
2003
- 2003-06-09 TW TW092115521A patent/TWI244653B/zh not_active IP Right Cessation
- 2003-06-24 US US10/602,050 patent/US6859386B2/en not_active Expired - Fee Related
- 2003-07-31 DE DE10335070A patent/DE10335070A1/de not_active Withdrawn
- 2003-08-26 KR KR10-2003-0058945A patent/KR100510034B1/ko not_active IP Right Cessation
- 2003-08-27 CN CNB031550827A patent/CN100423128C/zh not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5051952A (en) * | 1989-09-29 | 1991-09-24 | Fujitsu Limited | Semiconductor memory device having capacitors through which data read/write is carried out |
US6160733A (en) * | 1997-08-29 | 2000-12-12 | Enable Semiconductor, Inc. | Low voltage and low power static random access memory (SRAM) |
US6141240A (en) * | 1998-09-17 | 2000-10-31 | Texas Instruments Incorporated | Apparatus and method for static random access memory array |
Also Published As
Publication number | Publication date |
---|---|
US20040130931A1 (en) | 2004-07-08 |
TWI244653B (en) | 2005-12-01 |
CN1508806A (zh) | 2004-06-30 |
DE10335070A1 (de) | 2004-07-15 |
US6859386B2 (en) | 2005-02-22 |
KR100510034B1 (ko) | 2005-08-25 |
JP2004199726A (ja) | 2004-07-15 |
KR20040053752A (ko) | 2004-06-24 |
JP4260469B2 (ja) | 2009-04-30 |
TW200411669A (en) | 2004-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: RENESAS ELECTRONICS CORPORATION Free format text: FORMER OWNER: RENESAS TECHNOLOGY CORP. Effective date: 20101019 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: TOKYO TO, JAPAN TO: KAWASAKI CITY, KANAGAWA PREFECTURE, JAPAN |
|
TR01 | Transfer of patent right |
Effective date of registration: 20101019 Address after: Kawasaki, Kanagawa, Japan Patentee after: Renesas Electronics Corporation Address before: Tokyo, Japan, Japan Patentee before: Renesas Technology Corp. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081001 Termination date: 20140827 |
|
EXPY | Termination of patent right or utility model |