CA2740657A1 - Gap analyzer device and method - Google Patents

Gap analyzer device and method Download PDF

Info

Publication number
CA2740657A1
CA2740657A1 CA2740657A CA2740657A CA2740657A1 CA 2740657 A1 CA2740657 A1 CA 2740657A1 CA 2740657 A CA2740657 A CA 2740657A CA 2740657 A CA2740657 A CA 2740657A CA 2740657 A1 CA2740657 A1 CA 2740657A1
Authority
CA
Canada
Prior art keywords
voltage
gap
analyzer device
casing
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA2740657A
Other languages
English (en)
French (fr)
Inventor
Stefano Giaccherini
Andrea Cassisi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuovo Pignone SpA
Original Assignee
Nuovo Pignone SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuovo Pignone SpA filed Critical Nuovo Pignone SpA
Publication of CA2740657A1 publication Critical patent/CA2740657A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/14—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring distance or clearance between spaced objects or spaced apertures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
CA2740657A 2010-05-31 2011-05-19 Gap analyzer device and method Abandoned CA2740657A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ITCO2010A000030 2010-05-31
ITCO2010A000030A IT1400054B1 (it) 2010-05-31 2010-05-31 Dispositivo e metodo per analizzatore di distanza

Publications (1)

Publication Number Publication Date
CA2740657A1 true CA2740657A1 (en) 2011-11-30

Family

ID=43413727

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2740657A Abandoned CA2740657A1 (en) 2010-05-31 2011-05-19 Gap analyzer device and method

Country Status (7)

Country Link
US (1) US20120133522A1 (ko)
EP (1) EP2390619A1 (ko)
JP (1) JP2012002807A (ko)
KR (1) KR20110132269A (ko)
CN (1) CN102331231A (ko)
CA (1) CA2740657A1 (ko)
IT (1) IT1400054B1 (ko)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101316863B1 (ko) 2011-12-09 2013-10-08 기아자동차주식회사 배기가스 재순환 진단 방법 및 시스템
US9267999B2 (en) * 2012-11-01 2016-02-23 Lg Chem, Ltd. Test system for a battery pack and a method for testing the battery pack
US9133019B2 (en) * 2013-12-03 2015-09-15 Barry John McCleland Sensor probe and related systems and methods
CN107179042A (zh) * 2017-05-08 2017-09-19 鹤山市信成配件有限公司 一种间隙测量机构及应用该机构的测量方法
CN108955863B (zh) * 2017-05-20 2023-11-07 天津大学（青岛）海洋工程研究院有限公司 一种基于电压倍增器的新型振动频率传感器系统

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JP3399697B2 (ja) * 1995-04-28 2003-04-21 大日本スクリーン製造株式会社 測定点マッピング装置およびこれを利用した半導体ウエハの測定装置
JP3924657B2 (ja) * 1995-07-10 2007-06-06 西日本旅客鉄道株式会社 スラブとレール間のはなれ測定装置
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US6933693B2 (en) * 2002-11-08 2005-08-23 Eaton Corporation Method and apparatus of detecting disturbances in a centrifugal pump
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US7333913B2 (en) * 2005-06-27 2008-02-19 General Electric Company Clearance measurement system and method of operation
CN1818540A (zh) * 2006-03-17 2006-08-16 清华大学 一种从径向测量转动轴轴向位移的方法及其传感器
JP2008070319A (ja) * 2006-09-15 2008-03-27 Canon Inc 物体計測装置および方法
WO2009116597A1 (ja) * 2008-03-18 2009-09-24 株式会社日立製作所 姿勢把握装置、姿勢把握プログラム、及び姿勢把握方法
US8274805B2 (en) * 2008-04-08 2012-09-25 Samsung Electro-Mechanics Co., Ltd. High voltage power supply
CN201277853Y (zh) * 2008-10-06 2009-07-22 湖北新火炬科技股份有限公司 一种轮毂轴承轴向游隙测量仪

Also Published As

Publication number Publication date
US20120133522A1 (en) 2012-05-31
EP2390619A1 (en) 2011-11-30
IT1400054B1 (it) 2013-05-17
KR20110132269A (ko) 2011-12-07
JP2012002807A (ja) 2012-01-05
ITCO20100030A1 (it) 2011-12-01
CN102331231A (zh) 2012-01-25

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Legal Events

Date Code Title Description
FZDE Discontinued

Effective date: 20160519