CA2214109A1 - An improved laser ablateable material - Google Patents

An improved laser ablateable material Download PDF

Info

Publication number
CA2214109A1
CA2214109A1 CA002214109A CA2214109A CA2214109A1 CA 2214109 A1 CA2214109 A1 CA 2214109A1 CA 002214109 A CA002214109 A CA 002214109A CA 2214109 A CA2214109 A CA 2214109A CA 2214109 A1 CA2214109 A1 CA 2214109A1
Authority
CA
Canada
Prior art keywords
pdp
plasma
gas
chamber
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002214109A
Other languages
English (en)
French (fr)
Inventor
Meir Janai
Yoram Cassuto
Michael Stephen Silverstein
Sharone Zehavi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chip Express Corp
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2214109A1 publication Critical patent/CA2214109A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02109Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
    • H01L21/02112Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
    • H01L21/02118Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer carbon based polymeric organic or inorganic material, e.g. polyimides, poly cyclobutene or PVC
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/0226Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
    • H01L21/02263Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
    • H01L21/02271Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H01L21/02274Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/311Etching the insulating layers by chemical or physical means
    • H01L21/31105Etching inorganic layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
  • Laser Beam Processing (AREA)
CA002214109A 1995-02-28 1996-02-27 An improved laser ablateable material Abandoned CA2214109A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL11282695A IL112826A (en) 1995-02-28 1995-02-28 Method for settling a deposited plasma polymer layer
IL112,826 1995-02-28

Publications (1)

Publication Number Publication Date
CA2214109A1 true CA2214109A1 (en) 1996-09-06

Family

ID=11067145

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002214109A Abandoned CA2214109A1 (en) 1995-02-28 1996-02-27 An improved laser ablateable material

Country Status (6)

Country Link
EP (1) EP0812477A4 (de)
JP (1) JPH11502060A (de)
KR (1) KR19980702598A (de)
CA (1) CA2214109A1 (de)
IL (1) IL112826A (de)
WO (1) WO1996027212A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8268675B2 (en) * 2011-02-11 2012-09-18 Nordson Corporation Passivation layer for semiconductor device packaging
KR102394994B1 (ko) 2013-09-04 2022-05-04 도쿄엘렉트론가부시키가이샤 유도 자기 조립용 화학 템플릿을 생성하기 위한 경화 포토레지스트의 자외선을 이용한 박리
US9793137B2 (en) 2013-10-20 2017-10-17 Tokyo Electron Limited Use of grapho-epitaxial directed self-assembly applications to precisely cut logic lines
US9349604B2 (en) 2013-10-20 2016-05-24 Tokyo Electron Limited Use of topography to direct assembly of block copolymers in grapho-epitaxial applications
GB2529620A (en) * 2014-08-18 2016-03-02 Flexenable Ltd Patterning layer stacks for electronic devices
US9947597B2 (en) 2016-03-31 2018-04-17 Tokyo Electron Limited Defectivity metrology during DSA patterning
JP7356902B2 (ja) 2016-07-15 2023-10-05 ブルーワー サイエンス アイ エヌ シー. レーザーアブレーションの誘電性物質

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4177474A (en) * 1977-05-18 1979-12-04 Energy Conversion Devices, Inc. High temperature amorphous semiconductor member and method of making the same
US4226898A (en) * 1978-03-16 1980-10-07 Energy Conversion Devices, Inc. Amorphous semiconductors equivalent to crystalline semiconductors produced by a glow discharge process
EP0050973B1 (de) * 1980-10-28 1986-01-22 Kabushiki Kaisha Toshiba Verfahren zur Maskierung von Halbleiteranordnungen unter Verwendung einer Polymerschicht
US4374179A (en) * 1980-12-18 1983-02-15 Honeywell Inc. Plasma polymerized ethane for interlayer dielectric
JPS5893241A (ja) * 1981-11-30 1983-06-02 Sony Corp 半導体装置
US4517223A (en) * 1982-09-24 1985-05-14 Sovonics Solar Systems Method of making amorphous semiconductor alloys and devices using microwave energy
ATE80955T1 (de) * 1984-06-20 1992-10-15 Gould Inc Laserverfahren zur photomaskenreparatur.
US5329152A (en) * 1986-11-26 1994-07-12 Quick Technologies Ltd. Ablative etch resistant coating for laser personalization of integrated circuits
US5310624A (en) * 1988-01-29 1994-05-10 Massachusetts Institute Of Technology Integrated circuit micro-fabrication using dry lithographic processes
WO1989007285A1 (en) * 1988-01-29 1989-08-10 Massachusetts Institute Of Technology Integrated circuit micro-fabrication using dry lithographic processes
US5470661A (en) * 1993-01-07 1995-11-28 International Business Machines Corporation Diamond-like carbon films from a hydrocarbon helium plasma
US5302547A (en) * 1993-02-08 1994-04-12 General Electric Company Systems for patterning dielectrics by laser ablation
WO1995006900A1 (fr) * 1993-09-03 1995-03-09 Hitachi, Ltd. Procede et appareil de realisation de motifs

Also Published As

Publication number Publication date
KR19980702598A (ko) 1998-08-05
WO1996027212A1 (en) 1996-09-06
IL112826A0 (en) 1995-05-26
EP0812477A4 (de) 1998-10-07
JPH11502060A (ja) 1999-02-16
EP0812477A1 (de) 1997-12-17
IL112826A (en) 1998-09-24

Similar Documents

Publication Publication Date Title
US5246885A (en) Deposition method for high aspect ratio features using photoablation
Holber et al. Copper deposition by electron cyclotron resonance plasma
US6127273A (en) Process for anisotropic plasma etching of different substrates
US5173441A (en) Laser ablation deposition process for semiconductor manufacture
US7557511B2 (en) Apparatus and method utilizing high power density electron beam for generating pulsed stream of ablation plasma
US6921722B2 (en) Coating, modification and etching of substrate surface with particle beam irradiation of the same
KR0134326B1 (ko) 불활성 가스이온 플라즈마의 조사에 의한 반도체 디바이스의 접촉홀 충진 방법 및 장치
JPH08274064A (ja) 多層工作物をパターン加工する方法
CA2030763A1 (en) Method for forming through holes in a polyimide substrate
WO2002039500A3 (en) Use of a barrier sputter reactor to remove an underlying barrier layer
KR20010032498A (ko) 손상없는 스컵쳐 코팅 증착
JPH08279496A (ja) エッチング成形方法およびエッチング速度制御方法
US20010023860A1 (en) Excimer laser ablation process control of multilaminate materials
US20190221402A1 (en) Plasma beam penetration of millimeter scale holes with high aspect ratios
CA2214109A1 (en) An improved laser ablateable material
TW201318746A (zh) 於基板中產生高品質之孔或凹陷或井之方法
EP0583997B1 (de) Topografische, selektive Muster
US6841082B2 (en) Method of manufacturing Er-doped silicon nano-dot array and laser ablation appparatus used therein
US6255718B1 (en) Laser ablateable material
US6162585A (en) Polyimide as a mask in vapor hydrogen fluoride etching
Brannon Excimer laser ablation and etching
JP2006522443A (ja) 基板からの材料の除去
US20200051826A1 (en) Modified etch-and-deposit bosch process in silicon
JP2791329B2 (ja) レーザを用いた付着方法
JPS59119853A (ja) 半導体装置の製造方法

Legal Events

Date Code Title Description
FZDE Discontinued