CA1228682A - Combined thermal analyzer and x-ray diffractometer - Google Patents

Combined thermal analyzer and x-ray diffractometer

Info

Publication number
CA1228682A
CA1228682A CA000477340A CA477340A CA1228682A CA 1228682 A CA1228682 A CA 1228682A CA 000477340 A CA000477340 A CA 000477340A CA 477340 A CA477340 A CA 477340A CA 1228682 A CA1228682 A CA 1228682A
Authority
CA
Canada
Prior art keywords
sample
ray
detector
holder assembly
sample holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000477340A
Other languages
English (en)
French (fr)
Inventor
Timothy G. Fawcett
William C. Harris, Jr.
Frank J. Knoll
Lawrence F. Whiting
Robert A. Newman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Duquesne Univ of Holy Spirit
Original Assignee
Dow Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dow Chemical Co filed Critical Dow Chemical Co
Application granted granted Critical
Publication of CA1228682A publication Critical patent/CA1228682A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
    • G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Combustion & Propulsion (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
CA000477340A 1984-04-02 1985-03-25 Combined thermal analyzer and x-ray diffractometer Expired CA1228682A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US59589384A 1984-04-02 1984-04-02
US595,893 1984-04-02

Publications (1)

Publication Number Publication Date
CA1228682A true CA1228682A (en) 1987-10-27

Family

ID=24385144

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000477340A Expired CA1228682A (en) 1984-04-02 1985-03-25 Combined thermal analyzer and x-ray diffractometer

Country Status (5)

Country Link
JP (1) JPS612050A (de)
CA (1) CA1228682A (de)
DE (1) DE3512046A1 (de)
FR (1) FR2566128B1 (de)
GB (1) GB2156974B (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07119650B2 (ja) * 1987-06-01 1995-12-20 株式会社村田製作所 分光分析法
JP2695165B2 (ja) * 1987-10-09 1997-12-24 株式会社日立製作所 結晶構造解析法
JPH0623697B2 (ja) * 1987-12-25 1994-03-30 新日本製鐵株式会社 熱分析・顕微分光方法及びその装置
DE19603520C1 (de) * 1996-02-01 1997-07-31 Hansgeorg Ratzenberger Anordnung zur dynamischen-multi-simultan-Thermoanalyse
EP1184649A1 (de) * 2000-09-04 2002-03-06 Eidgenössische Technische Hochschule Zürich Kalorimeter
JP2004125582A (ja) * 2002-10-02 2004-04-22 Rigaku Corp 分析装置及び分析方法
WO2009149333A1 (en) * 2008-06-06 2009-12-10 Perkinelmer Health Sciences, Inc. Calorimeter and methods of using it and control systems therefor
JP2010048618A (ja) * 2008-08-20 2010-03-04 Tokyo Institute Of Technology 相転移する試料の相転移条件の測定方法およびそのための測定装置
JP5219281B2 (ja) * 2009-03-02 2013-06-26 株式会社リガク Ｘ線分析装置
JP5361005B2 (ja) * 2010-12-20 2013-12-04 株式会社リガク Ｘ線回折・熱分析同時測定装置
JP6294673B2 (ja) * 2014-01-08 2018-03-14 住友ゴム工業株式会社 高分子材料解析方法
WO2016170450A1 (en) * 2015-04-20 2016-10-27 Sabic Global Technologies B.V. Method of improving dehydrogenation of hydrocarbons
FR3072777B1 (fr) * 2017-10-23 2019-12-27 Centre National De La Recherche Scientifique Four d'analyse portable pour ligne de rayonnement

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB923025A (en) * 1959-10-22 1963-04-10 Rigaku Denki Company Ltd An automatic recording system of x-ray diffraction patterns
GB945788A (en) * 1959-12-22 1964-01-08 Rigaku Denki Company Ltd A system for measuring the lattice spacing of a crystal by means of x-rays
GB936910A (en) * 1959-12-22 1963-09-18 Rigaku Denki Company Ltd A system for measuring the lattice spacing of a crystal by means of x-rays
US3263484A (en) * 1962-04-04 1966-08-02 Perkin Elmer Corp Differential microcalorimeter
JPS4956694A (de) * 1972-09-29 1974-06-01
GB2079465B (en) * 1980-07-02 1984-06-27 Nat Res Dev Measurement of true density
JPS5735422A (en) * 1980-08-12 1982-02-26 Toshiba Corp Semiconductor circuit
JPS5798847A (en) * 1980-12-11 1982-06-19 Nec Corp X-ray diffractometer
GB2109924B (en) * 1981-11-25 1985-02-06 Schlumberger Electronics Apparatus and method for measuring temperature profile
JPS5913945A (ja) * 1982-07-15 1984-01-24 Natl Inst For Res In Inorg Mater 超高温可変雰囲気の物質構造解析装置

Also Published As

Publication number Publication date
GB2156974A (en) 1985-10-16
FR2566128B1 (fr) 1987-01-16
JPS612050A (ja) 1986-01-08
FR2566128A1 (fr) 1985-12-20
GB8504770D0 (en) 1985-03-27
DE3512046A1 (de) 1985-10-03
DE3512046C2 (de) 1989-05-18
GB2156974B (en) 1988-10-05
JPH0548415B2 (de) 1993-07-21

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