GB2156974B - Combined thermal analyzer and x-ray diffractometer - Google Patents
Combined thermal analyzer and x-ray diffractometerInfo
- Publication number
- GB2156974B GB2156974B GB08504770A GB8504770A GB2156974B GB 2156974 B GB2156974 B GB 2156974B GB 08504770 A GB08504770 A GB 08504770A GB 8504770 A GB8504770 A GB 8504770A GB 2156974 B GB2156974 B GB 2156974B
- Authority
- GB
- United Kingdom
- Prior art keywords
- ray diffractometer
- thermal analyzer
- combined thermal
- combined
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
- G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
- G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
- G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method
Landscapes
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Combustion & Propulsion (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US59589384A | 1984-04-02 | 1984-04-02 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8504770D0 GB8504770D0 (en) | 1985-03-27 |
GB2156974A GB2156974A (en) | 1985-10-16 |
GB2156974B true GB2156974B (en) | 1988-10-05 |
Family
ID=24385144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08504770A Expired GB2156974B (en) | 1984-04-02 | 1985-02-25 | Combined thermal analyzer and x-ray diffractometer |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS612050A (en) |
CA (1) | CA1228682A (en) |
DE (1) | DE3512046A1 (en) |
FR (1) | FR2566128B1 (en) |
GB (1) | GB2156974B (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07119650B2 (en) * | 1987-06-01 | 1995-12-20 | 株式会社村田製作所 | Spectroscopic method |
JP2695165B2 (en) * | 1987-10-09 | 1997-12-24 | 株式会社日立製作所 | Crystal structure analysis method |
JPH0623697B2 (en) * | 1987-12-25 | 1994-03-30 | 新日本製鐵株式会社 | Thermal analysis / microspectroscopy method and apparatus |
DE19603520C1 (en) * | 1996-02-01 | 1997-07-31 | Hansgeorg Ratzenberger | Multipurpose materials properties measurement apparatus |
EP1184649A1 (en) * | 2000-09-04 | 2002-03-06 | Eidgenössische Technische Hochschule Zürich | Calorimeter |
JP2004125582A (en) | 2002-10-02 | 2004-04-22 | Rigaku Corp | Analyzer and analysis method |
US8231267B2 (en) * | 2008-06-06 | 2012-07-31 | Perkinelmer Health Sciences, Inc. | Calorimeter and methods of using it and control systems therefor |
JP2010048618A (en) * | 2008-08-20 | 2010-03-04 | Tokyo Institute Of Technology | Method for measuring phase transition conditions of sample to be subjected to phase transition, and measuring apparatus therefor |
JP5219281B2 (en) * | 2009-03-02 | 2013-06-26 | 株式会社リガク | X-ray analyzer |
JP5361005B2 (en) * | 2010-12-20 | 2013-12-04 | 株式会社リガク | X-ray diffraction / thermal analysis simultaneous measurement system |
JP6294673B2 (en) * | 2014-01-08 | 2018-03-14 | 住友ゴム工業株式会社 | Polymer material analysis method |
WO2016170450A1 (en) * | 2015-04-20 | 2016-10-27 | Sabic Global Technologies B.V. | Method of improving dehydrogenation of hydrocarbons |
FR3072777B1 (en) * | 2017-10-23 | 2019-12-27 | Centre National De La Recherche Scientifique | PORTABLE ANALYSIS OVEN FOR RADIATION LINE |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB923025A (en) * | 1959-10-22 | 1963-04-10 | Rigaku Denki Company Ltd | An automatic recording system of x-ray diffraction patterns |
GB945788A (en) * | 1959-12-22 | 1964-01-08 | Rigaku Denki Company Ltd | A system for measuring the lattice spacing of a crystal by means of x-rays |
GB936910A (en) * | 1959-12-22 | 1963-09-18 | Rigaku Denki Company Ltd | A system for measuring the lattice spacing of a crystal by means of x-rays |
US3263484A (en) * | 1962-04-04 | 1966-08-02 | Perkin Elmer Corp | Differential microcalorimeter |
JPS4956694A (en) * | 1972-09-29 | 1974-06-01 | ||
GB2079465B (en) * | 1980-07-02 | 1984-06-27 | Nat Res Dev | Measurement of true density |
JPS5735422A (en) * | 1980-08-12 | 1982-02-26 | Toshiba Corp | Semiconductor circuit |
JPS5798847A (en) * | 1980-12-11 | 1982-06-19 | Nec Corp | X-ray diffractometer |
GB2109924B (en) * | 1981-11-25 | 1985-02-06 | Schlumberger Electronics | Apparatus and method for measuring temperature profile |
JPS5913945A (en) * | 1982-07-15 | 1984-01-24 | Natl Inst For Res In Inorg Mater | Analyzing device of material structure in ultrahigh temperature variable atmosphere |
-
1985
- 1985-02-25 GB GB08504770A patent/GB2156974B/en not_active Expired
- 1985-03-25 CA CA000477340A patent/CA1228682A/en not_active Expired
- 1985-03-28 FR FR8504661A patent/FR2566128B1/en not_active Expired
- 1985-04-02 DE DE19853512046 patent/DE3512046A1/en active Granted
- 1985-04-02 JP JP60069889A patent/JPS612050A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
GB2156974A (en) | 1985-10-16 |
JPH0548415B2 (en) | 1993-07-21 |
DE3512046C2 (en) | 1989-05-18 |
CA1228682A (en) | 1987-10-27 |
DE3512046A1 (en) | 1985-10-03 |
FR2566128B1 (en) | 1987-01-16 |
FR2566128A1 (en) | 1985-12-20 |
GB8504770D0 (en) | 1985-03-27 |
JPS612050A (en) | 1986-01-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19980225 |