GB2156974B - Combined thermal analyzer and x-ray diffractometer - Google Patents

Combined thermal analyzer and x-ray diffractometer

Info

Publication number
GB2156974B
GB2156974B GB08504770A GB8504770A GB2156974B GB 2156974 B GB2156974 B GB 2156974B GB 08504770 A GB08504770 A GB 08504770A GB 8504770 A GB8504770 A GB 8504770A GB 2156974 B GB2156974 B GB 2156974B
Authority
GB
United Kingdom
Prior art keywords
ray diffractometer
thermal analyzer
combined thermal
combined
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08504770A
Other versions
GB8504770D0 (en
GB2156974A (en
Inventor
Timothy G Fawcett
William C Harris
Robert A Newman
Lawrence F Whiting
Frank J Knoll
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dow Chemical Co
Original Assignee
Dow Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dow Chemical Co filed Critical Dow Chemical Co
Publication of GB8504770D0 publication Critical patent/GB8504770D0/en
Publication of GB2156974A publication Critical patent/GB2156974A/en
Application granted granted Critical
Publication of GB2156974B publication Critical patent/GB2156974B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
    • G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Combustion & Propulsion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
GB08504770A 1984-04-02 1985-02-25 Combined thermal analyzer and x-ray diffractometer Expired GB2156974B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US59589384A 1984-04-02 1984-04-02

Publications (3)

Publication Number Publication Date
GB8504770D0 GB8504770D0 (en) 1985-03-27
GB2156974A GB2156974A (en) 1985-10-16
GB2156974B true GB2156974B (en) 1988-10-05

Family

ID=24385144

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08504770A Expired GB2156974B (en) 1984-04-02 1985-02-25 Combined thermal analyzer and x-ray diffractometer

Country Status (5)

Country Link
JP (1) JPS612050A (en)
CA (1) CA1228682A (en)
DE (1) DE3512046A1 (en)
FR (1) FR2566128B1 (en)
GB (1) GB2156974B (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07119650B2 (en) * 1987-06-01 1995-12-20 株式会社村田製作所 Spectroscopic method
JP2695165B2 (en) * 1987-10-09 1997-12-24 株式会社日立製作所 Crystal structure analysis method
JPH0623697B2 (en) * 1987-12-25 1994-03-30 新日本製鐵株式会社 Thermal analysis / microspectroscopy method and apparatus
DE19603520C1 (en) * 1996-02-01 1997-07-31 Hansgeorg Ratzenberger Multipurpose materials properties measurement apparatus
EP1184649A1 (en) * 2000-09-04 2002-03-06 Eidgenössische Technische Hochschule Zürich Calorimeter
JP2004125582A (en) * 2002-10-02 2004-04-22 Rigaku Corp Analyzer and analysis method
JP5461536B2 (en) * 2008-06-06 2014-04-02 パーキンエルマー・ヘルス・サイエンシーズ・インコーポレイテッド Calorimeter, method using the same, and control system therefor
JP2010048618A (en) * 2008-08-20 2010-03-04 Tokyo Institute Of Technology Method for measuring phase transition conditions of sample to be subjected to phase transition, and measuring apparatus therefor
JP5219281B2 (en) * 2009-03-02 2013-06-26 株式会社リガク X-ray analyzer
JP5361005B2 (en) * 2010-12-20 2013-12-04 株式会社リガク X-ray diffraction / thermal analysis simultaneous measurement system
JP6294673B2 (en) * 2014-01-08 2018-03-14 住友ゴム工業株式会社 Polymer material analysis method
WO2016170450A1 (en) * 2015-04-20 2016-10-27 Sabic Global Technologies B.V. Method of improving dehydrogenation of hydrocarbons
FR3072777B1 (en) * 2017-10-23 2019-12-27 Centre National De La Recherche Scientifique PORTABLE ANALYSIS OVEN FOR RADIATION LINE

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB923025A (en) * 1959-10-22 1963-04-10 Rigaku Denki Company Ltd An automatic recording system of x-ray diffraction patterns
GB945788A (en) * 1959-12-22 1964-01-08 Rigaku Denki Company Ltd A system for measuring the lattice spacing of a crystal by means of x-rays
GB936910A (en) * 1959-12-22 1963-09-18 Rigaku Denki Company Ltd A system for measuring the lattice spacing of a crystal by means of x-rays
US3263484A (en) * 1962-04-04 1966-08-02 Perkin Elmer Corp Differential microcalorimeter
JPS4956694A (en) * 1972-09-29 1974-06-01
GB2079465B (en) * 1980-07-02 1984-06-27 Nat Res Dev Measurement of true density
JPS5735422A (en) * 1980-08-12 1982-02-26 Toshiba Corp Semiconductor circuit
JPS5798847A (en) * 1980-12-11 1982-06-19 Nec Corp X-ray diffractometer
GB2109924B (en) * 1981-11-25 1985-02-06 Schlumberger Electronics Apparatus and method for measuring temperature profile
JPS5913945A (en) * 1982-07-15 1984-01-24 Natl Inst For Res In Inorg Mater Analyzing device of material structure in ultrahigh temperature variable atmosphere

Also Published As

Publication number Publication date
CA1228682A (en) 1987-10-27
JPS612050A (en) 1986-01-08
FR2566128B1 (en) 1987-01-16
GB8504770D0 (en) 1985-03-27
JPH0548415B2 (en) 1993-07-21
DE3512046C2 (en) 1989-05-18
DE3512046A1 (en) 1985-10-03
FR2566128A1 (en) 1985-12-20
GB2156974A (en) 1985-10-16

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19980225