GB936910A - A system for measuring the lattice spacing of a crystal by means of x-rays - Google Patents

A system for measuring the lattice spacing of a crystal by means of x-rays

Info

Publication number
GB936910A
GB936910A GB4359459A GB4359459A GB936910A GB 936910 A GB936910 A GB 936910A GB 4359459 A GB4359459 A GB 4359459A GB 4359459 A GB4359459 A GB 4359459A GB 936910 A GB936910 A GB 936910A
Authority
GB
United Kingdom
Prior art keywords
motor
lattice spacing
outputs
crystal
goniometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4359459A
Inventor
Yoshihiro Shimula
Hiroshi Uchida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Priority to GB4359459A priority Critical patent/GB936910A/en
Publication of GB936910A publication Critical patent/GB936910A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

936,910. X-ray spectrometers. RIGAKU DENKI CO. Ltd. Dec. 22, 1959, No. 43594/59. Class 40 (3). [Also in Group XX] A goniometer having an X-ray source 3 and a heatable crystal 2 has a counter tube of twinned construction, 4 1 , 4 2 , the difference in the two outputs being utilized to control a motor which rotates the goniometer until the outputs are equal again. As shown, the motor 6 rotates the counter tubes 4 1 , 4 2 and the crystal 2 so that the speed of the former is twice that of the latter, in the usual way. The outputs of the two counter tubes are taken off separately, balanced, and fed through an amplifier to the motor 6. When the two outputs are equal, the motor remains inactive, and the lattice spacing can be calculated from the usual Bragg equation. When the crystal is heated, and variation in the lattice spacing occurs, the radiation intensity received by the two counters becomes unequal; the difference is amplified and caused to drive motor 6, which rotates the goniometer one way or the other to restore the equality, after which the motor stops again. The motor also alters the position of the slider of a potentiometer 11 which controls an automatic recorder 12. This has a roll of recording paper moving at a uniform speed in direction t (Fig. 3), along which temperature gradients are marked. The value in the direction d gives the lattice spacing, and since the recorder is continuous-reading, the variations of lattice spacing with change of temperature are automatically plotted.
GB4359459A 1959-12-22 1959-12-22 A system for measuring the lattice spacing of a crystal by means of x-rays Expired GB936910A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB4359459A GB936910A (en) 1959-12-22 1959-12-22 A system for measuring the lattice spacing of a crystal by means of x-rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4359459A GB936910A (en) 1959-12-22 1959-12-22 A system for measuring the lattice spacing of a crystal by means of x-rays

Publications (1)

Publication Number Publication Date
GB936910A true GB936910A (en) 1963-09-18

Family

ID=10429459

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4359459A Expired GB936910A (en) 1959-12-22 1959-12-22 A system for measuring the lattice spacing of a crystal by means of x-rays

Country Status (1)

Country Link
GB (1) GB936910A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2156974A (en) * 1984-04-02 1985-10-16 Dow Chemical Co Combined thermal analysis and X-ray diffractometry
DE3439471A1 (en) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München METHOD AND DEVICE FOR TESTING SINGLE-CRYSTAL OBJECTS
US4821303A (en) * 1986-12-05 1989-04-11 The Dow Chemical Company Combined thermal analyzer and x-ray diffractometer
CN112782203A (en) * 2021-02-22 2021-05-11 长江存储科技有限责任公司 Judging method of crystalline phase structure and crystalline phase calibration template
RU2791430C1 (en) * 2022-12-08 2023-03-07 Федеральное государственное бюджетное учреждение науки Институт сильноточной электроники Сибирского отделения Российской академии наук (ИСЭ СО РАН) Method of determining the effect of cyclic thermal influences on the characteristics of multilayer coatings with use synchrotron radiation

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2156974A (en) * 1984-04-02 1985-10-16 Dow Chemical Co Combined thermal analysis and X-ray diffractometry
DE3439471A1 (en) * 1984-10-27 1986-04-30 MTU Motoren- und Turbinen-Union München GmbH, 8000 München METHOD AND DEVICE FOR TESTING SINGLE-CRYSTAL OBJECTS
GB2166630A (en) * 1984-10-27 1986-05-08 Mtu Muenchen Gmbh Method and apparatus for inspecting a crystalline object
US4821303A (en) * 1986-12-05 1989-04-11 The Dow Chemical Company Combined thermal analyzer and x-ray diffractometer
CN112782203A (en) * 2021-02-22 2021-05-11 长江存储科技有限责任公司 Judging method of crystalline phase structure and crystalline phase calibration template
CN112782203B (en) * 2021-02-22 2024-02-20 长江存储科技有限责任公司 Crystal phase structure judging method and crystal phase calibration template
RU2791430C1 (en) * 2022-12-08 2023-03-07 Федеральное государственное бюджетное учреждение науки Институт сильноточной электроники Сибирского отделения Российской академии наук (ИСЭ СО РАН) Method of determining the effect of cyclic thermal influences on the characteristics of multilayer coatings with use synchrotron radiation

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