GB1331160A - Determination of the thickness of a coating - Google Patents

Determination of the thickness of a coating

Info

Publication number
GB1331160A
GB1331160A GB4950771A GB4950771A GB1331160A GB 1331160 A GB1331160 A GB 1331160A GB 4950771 A GB4950771 A GB 4950771A GB 4950771 A GB4950771 A GB 4950771A GB 1331160 A GB1331160 A GB 1331160A
Authority
GB
United Kingdom
Prior art keywords
coating
thickness
ionization chamber
radiation
oct
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB4950771A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Landis and Gyr AG
Original Assignee
Landis and Gyr AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Landis and Gyr AG filed Critical Landis and Gyr AG
Publication of GB1331160A publication Critical patent/GB1331160A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

1331160 Automatic control of thickness LANDIS & GYR A G 25 Oct 1971 [29 Oct 1970] 49507/71 Heading G3R [Also in division G1] The thickness of a coating 2 on a continuously moving coated material 3 is measured and/or controlled by irradiating the material with radiation from a radio-active source 1, detecting the fluorescent radiation from the coating with an ionization chamber 5, comparing at 6 the chamber output current with a reference current corresponding to the desired coating thickness, and using the amplified differential current to measure and/or control the coating process. In monitoring a Zn coating on Fe, the source is Am 241. The admission aperture of the ionization chamber is chosen so as to suppress the fluorescence radiation from the base material 3. The comparator 6 may be an ohmic resistor. The reference current may be derived from a comparison ionization chamber 7. The device 9 for controlling the coating process may be provided with an indicator calibrated for the thickness of the zinc coating.
GB4950771A 1970-10-29 1971-10-25 Determination of the thickness of a coating Expired GB1331160A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1597970A CH522877A (en) 1970-10-29 1970-10-29 Method and device for continuous monitoring of the thickness of the applied layer of a coated material with the aid of fluorescent rays and application of this method

Publications (1)

Publication Number Publication Date
GB1331160A true GB1331160A (en) 1973-09-26

Family

ID=4413518

Family Applications (1)

Application Number Title Priority Date Filing Date
GB4950771A Expired GB1331160A (en) 1970-10-29 1971-10-25 Determination of the thickness of a coating

Country Status (3)

Country Link
CH (1) CH522877A (en)
FR (1) FR2113310A5 (en)
GB (1) GB1331160A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007074166A1 (en) * 2005-12-29 2007-07-05 Commissariat A L'energie Atomique Measurement of the thickness of (a) film(s) present as a thin layer on a sample support
CN110926399A (en) * 2019-12-10 2020-03-27 中国电子科技集团公司第四十六研究所 Method for testing thickness of metal filament ultrathin metal coating
AU2021201925B2 (en) * 2019-01-25 2022-04-14 Allied Bioscience, Inc. Analysis of antimicrobial coatings using XRF

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4656357A (en) * 1985-04-16 1987-04-07 Twin City International, Inc. Apparatus for measuring coating thickness
US5029337A (en) * 1989-01-19 1991-07-02 Tava Corporation Method for measuring coating thickness

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007074166A1 (en) * 2005-12-29 2007-07-05 Commissariat A L'energie Atomique Measurement of the thickness of (a) film(s) present as a thin layer on a sample support
FR2895792A1 (en) * 2005-12-29 2007-07-06 Commissariat Energie Atomique Thin layer film`s e.g. mold oil film, thickness measuring device for e.g. substrate, has comparison unit comparing X fluorescence signal value with standard values to deduce thickness of thin layer from number of detected X photons
AU2021201925B2 (en) * 2019-01-25 2022-04-14 Allied Bioscience, Inc. Analysis of antimicrobial coatings using XRF
CN110926399A (en) * 2019-12-10 2020-03-27 中国电子科技集团公司第四十六研究所 Method for testing thickness of metal filament ultrathin metal coating

Also Published As

Publication number Publication date
CH522877A (en) 1972-05-15
FR2113310A5 (en) 1972-06-23

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Legal Events

Date Code Title Description
PS Patent sealed
PLNP Patent lapsed through nonpayment of renewal fees