JPS5686303A - Measuring device for thickness of radiant ray - Google Patents
Measuring device for thickness of radiant rayInfo
- Publication number
- JPS5686303A JPS5686303A JP16349479A JP16349479A JPS5686303A JP S5686303 A JPS5686303 A JP S5686303A JP 16349479 A JP16349479 A JP 16349479A JP 16349479 A JP16349479 A JP 16349479A JP S5686303 A JPS5686303 A JP S5686303A
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- setting unit
- plate
- compensation
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To facilitate an easy compensation for the material, by providing the setting unit which set the thickness of the standard plate to be inserted between the radiant ray source and the detector, the compensation setting unit for the plate thickness which gives a compensation to the output the plate thickness setting unit, the setting unit which converts the above described set value into the voltage plus an arithmetic process circuit for the output of said setting unit and the measurement output of the subject to be measured.
CONSTITUTION: The standard plate 3 (or subject to be measured) is provided between the radiant ray source 1 and the detector 2. For the output of the detector 2, the voltage proportional to the thickness (t) of the plate 3 is supplied to the subtractor 8 via the preamplifier 4 and the logarithm amplifier 5. Now the thickness (t) is set to the plate thickness setting unit 6a for the pure- iron standard plate, and the compensation setting unit 6b is set to zero. Thus the voltage T to the thickness (t) is delivered to the subtractor circuit 7 and the divider circuit 10 from the plate thickness setting unit 7. The value of compensation is obtained through the circuit 10 as N=[(TG-T)/ T]×100 via the subtractor circuit 8 for the output TG of the amplifiers 4 and 5 to the plate 3 having the same material as the subject to be measured and with the known thickness. This value is then delivered to the indicator 11. In such way, an easy compensation is possible for the material.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16349479A JPS5686303A (en) | 1979-12-18 | 1979-12-18 | Measuring device for thickness of radiant ray |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16349479A JPS5686303A (en) | 1979-12-18 | 1979-12-18 | Measuring device for thickness of radiant ray |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5686303A true JPS5686303A (en) | 1981-07-14 |
Family
ID=15774924
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16349479A Pending JPS5686303A (en) | 1979-12-18 | 1979-12-18 | Measuring device for thickness of radiant ray |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5686303A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5862508A (en) * | 1981-09-18 | 1983-04-14 | デ−タ・メジヤ−メント・コ−ポレ−シヨン | Device and method of measuring thickness |
| JPS60205338A (en) * | 1984-03-30 | 1985-10-16 | Toshiba Corp | Radiation tomographic inspecting device |
-
1979
- 1979-12-18 JP JP16349479A patent/JPS5686303A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5862508A (en) * | 1981-09-18 | 1983-04-14 | デ−タ・メジヤ−メント・コ−ポレ−シヨン | Device and method of measuring thickness |
| JPS60205338A (en) * | 1984-03-30 | 1985-10-16 | Toshiba Corp | Radiation tomographic inspecting device |
| JPH0345764B2 (en) * | 1984-03-30 | 1991-07-12 | Tokyo Shibaura Electric Co |
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