FR2113310A5 - - Google Patents

Info

Publication number
FR2113310A5
FR2113310A5 FR7138581A FR7138581A FR2113310A5 FR 2113310 A5 FR2113310 A5 FR 2113310A5 FR 7138581 A FR7138581 A FR 7138581A FR 7138581 A FR7138581 A FR 7138581A FR 2113310 A5 FR2113310 A5 FR 2113310A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7138581A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Landis and Gyr AG
Original Assignee
Landis and Gyr AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Landis and Gyr AG filed Critical Landis and Gyr AG
Application granted granted Critical
Publication of FR2113310A5 publication Critical patent/FR2113310A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7138581A 1970-10-29 1971-10-27 Expired FR2113310A5 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1597970A CH522877A (de) 1970-10-29 1970-10-29 Verfahren und Einrichtung zur kontinuierlichen Überwachung der Dicke der aufgetragenen Schicht eines beschichteten Werkstoffes mit Hilfe von Fluoreszenzstrahlen und Anwendung dieses Verfahrens

Publications (1)

Publication Number Publication Date
FR2113310A5 true FR2113310A5 (fr) 1972-06-23

Family

ID=4413518

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7138581A Expired FR2113310A5 (fr) 1970-10-29 1971-10-27

Country Status (3)

Country Link
CH (1) CH522877A (fr)
FR (1) FR2113310A5 (fr)
GB (1) GB1331160A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4656357A (en) * 1985-04-16 1987-04-07 Twin City International, Inc. Apparatus for measuring coating thickness

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5029337A (en) * 1989-01-19 1991-07-02 Tava Corporation Method for measuring coating thickness
FR2895792B1 (fr) * 2005-12-29 2008-02-22 Commissariat Energie Atomique Mesure d'epaisseur de film(s) present(s) en couche mince sur un support echantillon
AU2020210650B2 (en) * 2019-01-25 2021-03-18 Allied Bioscience, Inc. Analysis of antimicrobial coatings using XRF
CN110926399A (zh) * 2019-12-10 2020-03-27 中国电子科技集团公司第四十六研究所 一种金属细丝超薄金属镀层厚度测试方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4656357A (en) * 1985-04-16 1987-04-07 Twin City International, Inc. Apparatus for measuring coating thickness

Also Published As

Publication number Publication date
GB1331160A (en) 1973-09-26
CH522877A (de) 1972-05-15

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Legal Events

Date Code Title Description
ST Notification of lapse