CA1221470A - Adaptor for changing the pitch of a contact array used with a printed circuit board testing apparatus - Google Patents

Adaptor for changing the pitch of a contact array used with a printed circuit board testing apparatus

Info

Publication number
CA1221470A
CA1221470A CA000467102A CA467102A CA1221470A CA 1221470 A CA1221470 A CA 1221470A CA 000467102 A CA000467102 A CA 000467102A CA 467102 A CA467102 A CA 467102A CA 1221470 A CA1221470 A CA 1221470A
Authority
CA
Canada
Prior art keywords
cards
contacts
pitch
array
density
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000467102A
Other languages
English (en)
French (fr)
Inventor
Hubert Driller
Paul Mang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MANIA TECHNOLOGIE AG
Original Assignee
Mania Elektronik Automatisation Entwicklung und Geraetebau GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mania Elektronik Automatisation Entwicklung und Geraetebau GmbH filed Critical Mania Elektronik Automatisation Entwicklung und Geraetebau GmbH
Application granted granted Critical
Publication of CA1221470A publication Critical patent/CA1221470A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CA000467102A 1983-11-07 1984-11-06 Adaptor for changing the pitch of a contact array used with a printed circuit board testing apparatus Expired CA1221470A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3340179A DE3340179C1 (de) 1983-11-07 1983-11-07 Anordnung an einem Leiterplattenpruefgeraet zur Anpassung der Abstaende von Kontakten
DEP3340179.9 1983-11-07

Publications (1)

Publication Number Publication Date
CA1221470A true CA1221470A (en) 1987-05-05

Family

ID=6213643

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000467102A Expired CA1221470A (en) 1983-11-07 1984-11-06 Adaptor for changing the pitch of a contact array used with a printed circuit board testing apparatus

Country Status (6)

Country Link
US (1) US4614386A (en, 2012)
EP (1) EP0142119B1 (en, 2012)
JP (1) JPS60161569A (en, 2012)
AT (1) ATE24614T1 (en, 2012)
CA (1) CA1221470A (en, 2012)
DE (2) DE3340179C1 (en, 2012)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3568085D1 (en) * 1985-11-12 1989-03-09 Mania Gmbh Device for testing printed circuit boards with a grid of contact points of elevated density
DE3630548A1 (de) * 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
DE3638372A1 (de) * 1986-11-11 1988-05-26 Lang Dahlke Helmut Vorrichtung zum pruefen von elektrischen leiterplatten
DE3806792A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Vorrichtung zum pruefen von leiterplatten
DE3806793A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Adaptereinrichtung fuer eine vorrichtung zum pruefen von leiterplatten
DE8908326U1 (de) * 1989-07-07 1989-09-07 Siemens AG, 1000 Berlin und 8000 München Adaptiervorrichtung zur Prüfung von filmmontierten integrierten Bausteinen
US5061190A (en) * 1990-08-14 1991-10-29 Ziatech Corporation Double density backward and forward compatible card edge connector system
DE69212195T2 (de) 1991-04-11 1996-12-19 Methode Electronics Inc Gerät zum elektronischen Testen von gedruckten Leiterplatten oder ähnlichem
US5216361A (en) * 1991-07-10 1993-06-01 Schlumberger Technologies, Inc. Modular board test system having wireless receiver
JPH07244116A (ja) * 1994-03-07 1995-09-19 Hitachi Chem Co Ltd 半導体特性測定用治具とその製造法並びにその使用方法
TW381328B (en) * 1994-03-07 2000-02-01 Ibm Dual substrate package assembly for being electrically coupled to a conducting member
IT1282689B1 (it) * 1996-02-26 1998-03-31 Circuit Line Spa Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati
DE19932849C2 (de) * 1999-07-14 2003-07-03 Herbert Amrhein Kontaktiereinrichtung zum Herstellen einer elektrisch leitfähigen Verbindung
DE19943388B4 (de) 1999-09-10 2010-04-08 Atg Luther & Maelzer Gmbh Vorrichtung zum Prüfen von Leiterplatten
US7587289B1 (en) * 2007-02-13 2009-09-08 American Megatrends, Inc. Data cable powered sensor fixture
US20080238461A1 (en) * 2007-04-02 2008-10-02 Ken Skala Multi-type test interface system and method
FR2935203B1 (fr) * 2008-08-20 2014-12-12 Centre Nat Etd Spatiales Dispositif de fils electriques et boitier de fils electriques
ITVI20110343A1 (it) * 2011-12-30 2013-07-01 St Microelectronics Srl Sistema e adattatore per testare chips con circuiti integrati in un package

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3911361A (en) * 1974-06-28 1975-10-07 Ibm Coaxial array space transformer
US3963986A (en) * 1975-02-10 1976-06-15 International Business Machines Corporation Programmable interface contactor structure
US4250536A (en) * 1978-12-26 1981-02-10 General Electric Company Interconnection arrangement for circuit boards
US4340858A (en) * 1979-08-13 1982-07-20 Philip M. Hinderstein Test fixture
DE2933862A1 (de) * 1979-08-21 1981-03-12 Paul Mang Vorrichtung zur elektronischen pruefung von leiterplatten.

Also Published As

Publication number Publication date
DE3461867D1 (en) 1987-02-05
JPH0519662B2 (en, 2012) 1993-03-17
JPS60161569A (ja) 1985-08-23
ATE24614T1 (de) 1987-01-15
EP0142119A1 (de) 1985-05-22
EP0142119B1 (de) 1986-12-30
DE3340179C1 (de) 1985-05-09
US4614386A (en) 1986-09-30

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Legal Events

Date Code Title Description
MKEX Expiry