ATE24614T1 - Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet. - Google Patents

Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet.

Info

Publication number
ATE24614T1
ATE24614T1 AT84113375T AT84113375T ATE24614T1 AT E24614 T1 ATE24614 T1 AT E24614T1 AT 84113375 T AT84113375 T AT 84113375T AT 84113375 T AT84113375 T AT 84113375T AT E24614 T1 ATE24614 T1 AT E24614T1
Authority
AT
Austria
Prior art keywords
contact
cards
changing
density
contacts
Prior art date
Application number
AT84113375T
Other languages
German (de)
English (en)
Inventor
Hubert Dipl-Phys Driller
Paul Mang
Original Assignee
Mania Elekt Automat Entwick
Paul Mang
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mania Elekt Automat Entwick, Paul Mang filed Critical Mania Elekt Automat Entwick
Application granted granted Critical
Publication of ATE24614T1 publication Critical patent/ATE24614T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT84113375T 1983-11-07 1984-11-06 Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet. ATE24614T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3340179A DE3340179C1 (de) 1983-11-07 1983-11-07 Anordnung an einem Leiterplattenpruefgeraet zur Anpassung der Abstaende von Kontakten
EP84113375A EP0142119B1 (de) 1983-11-07 1984-11-06 Anordnung zur Veränderung der Kontaktabstände eines Kontaktfeldrasters an einem Leiterplattenprüfgerät

Publications (1)

Publication Number Publication Date
ATE24614T1 true ATE24614T1 (de) 1987-01-15

Family

ID=6213643

Family Applications (1)

Application Number Title Priority Date Filing Date
AT84113375T ATE24614T1 (de) 1983-11-07 1984-11-06 Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet.

Country Status (6)

Country Link
US (1) US4614386A (en, 2012)
EP (1) EP0142119B1 (en, 2012)
JP (1) JPS60161569A (en, 2012)
AT (1) ATE24614T1 (en, 2012)
CA (1) CA1221470A (en, 2012)
DE (2) DE3340179C1 (en, 2012)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3568085D1 (en) * 1985-11-12 1989-03-09 Mania Gmbh Device for testing printed circuit boards with a grid of contact points of elevated density
DE3630548A1 (de) * 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
DE3638372A1 (de) * 1986-11-11 1988-05-26 Lang Dahlke Helmut Vorrichtung zum pruefen von elektrischen leiterplatten
DE3806792A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Vorrichtung zum pruefen von leiterplatten
DE3806793A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Adaptereinrichtung fuer eine vorrichtung zum pruefen von leiterplatten
DE8908326U1 (de) * 1989-07-07 1989-09-07 Siemens AG, 1000 Berlin und 8000 München Adaptiervorrichtung zur Prüfung von filmmontierten integrierten Bausteinen
US5061190A (en) * 1990-08-14 1991-10-29 Ziatech Corporation Double density backward and forward compatible card edge connector system
DE69212195T2 (de) 1991-04-11 1996-12-19 Methode Electronics Inc Gerät zum elektronischen Testen von gedruckten Leiterplatten oder ähnlichem
US5216361A (en) * 1991-07-10 1993-06-01 Schlumberger Technologies, Inc. Modular board test system having wireless receiver
JPH07244116A (ja) * 1994-03-07 1995-09-19 Hitachi Chem Co Ltd 半導体特性測定用治具とその製造法並びにその使用方法
TW381328B (en) * 1994-03-07 2000-02-01 Ibm Dual substrate package assembly for being electrically coupled to a conducting member
IT1282689B1 (it) * 1996-02-26 1998-03-31 Circuit Line Spa Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati
DE19932849C2 (de) * 1999-07-14 2003-07-03 Herbert Amrhein Kontaktiereinrichtung zum Herstellen einer elektrisch leitfähigen Verbindung
DE19943388B4 (de) 1999-09-10 2010-04-08 Atg Luther & Maelzer Gmbh Vorrichtung zum Prüfen von Leiterplatten
US7587289B1 (en) * 2007-02-13 2009-09-08 American Megatrends, Inc. Data cable powered sensor fixture
US20080238461A1 (en) * 2007-04-02 2008-10-02 Ken Skala Multi-type test interface system and method
FR2935203B1 (fr) * 2008-08-20 2014-12-12 Centre Nat Etd Spatiales Dispositif de fils electriques et boitier de fils electriques
ITVI20110343A1 (it) * 2011-12-30 2013-07-01 St Microelectronics Srl Sistema e adattatore per testare chips con circuiti integrati in un package

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3911361A (en) * 1974-06-28 1975-10-07 Ibm Coaxial array space transformer
US3963986A (en) * 1975-02-10 1976-06-15 International Business Machines Corporation Programmable interface contactor structure
US4250536A (en) * 1978-12-26 1981-02-10 General Electric Company Interconnection arrangement for circuit boards
US4340858A (en) * 1979-08-13 1982-07-20 Philip M. Hinderstein Test fixture
DE2933862A1 (de) * 1979-08-21 1981-03-12 Paul Mang Vorrichtung zur elektronischen pruefung von leiterplatten.

Also Published As

Publication number Publication date
DE3461867D1 (en) 1987-02-05
JPH0519662B2 (en, 2012) 1993-03-17
JPS60161569A (ja) 1985-08-23
EP0142119A1 (de) 1985-05-22
CA1221470A (en) 1987-05-05
EP0142119B1 (de) 1986-12-30
DE3340179C1 (de) 1985-05-09
US4614386A (en) 1986-09-30

Similar Documents

Publication Publication Date Title
ATE24614T1 (de) Anordnung zur veraenderung der kontaktabstaende eines kontaktfeldrasters an einem leiterplattenpruefgeraet.
NO159319C (no) Proevesamler.
ATE36197T1 (de) Vorrichtung zum elektronischen pruefen von leiterplatten oder dergleichen.
ATE7436T1 (de) Flache anzeigetafel und biegsame schaltungsplatte zum zusammenhalten und kontaktieren einer mehrzahl von festkoerpervorrichtungen wie lichtemittierenden dioden.
DE69302400D1 (de) Testanordnung mit filmadaptor fuer leiterplatten
EP0365310A3 (en) Colour detection and/or recognition apparatus
ATE15741T1 (de) Bildaufnahme und-ableseeinrichtung.
JP3924724B2 (ja) プリント回路基板を検査するための検査装置のモジュール
TW202142871A (zh) 垂直式測試裝置
ATE39387T1 (de) Vorrichtung zur auslese eines zweidimensionalen ladungsbildes mittels eines arrays.
TW202115411A (zh) 交錯式探針卡
CN207925456U (zh) 一种六排双列的引线框架版件
JPS5651073A (en) Memory unit
SU1550641A1 (ru) Контрольна плата дл проверки контактных устройств
JPS6138575A (ja) プリント配線板検査機用アダプタユニツト
ATE40603T1 (de) Leiterplattenpruefgeraet mit einem kontaktpunktraster erhoehter kontaktpunktdichte.
ATE1656T1 (de) Integrierte serien-solarzellenanordnung.
ES242187U (es) Juego educativo
JPS56164879A (en) Heat printing device
KR830003107A (ko) 핵연료집합체
JPS6451630A (en) Collecting substrate for electronic device
GB1089888A (en) Improvements relating to the housing of printed or other circuit boards
GB1305822A (en, 2012)
FR2249518A1 (en) Multi-layer printed circuit - incorporates double-face printed circuit in each plane and local interconnections
IT8211596U1 (it) Gioco per due giocatori, con serie di pezzi rotondi aventi impressi simboli geometrici, svolgendosi su piano esagonale diviso in settori

Legal Events

Date Code Title Description
REN Ceased due to non-payment of the annual fee