JPH0519662B2 - - Google Patents

Info

Publication number
JPH0519662B2
JPH0519662B2 JP59233382A JP23338284A JPH0519662B2 JP H0519662 B2 JPH0519662 B2 JP H0519662B2 JP 59233382 A JP59233382 A JP 59233382A JP 23338284 A JP23338284 A JP 23338284A JP H0519662 B2 JPH0519662 B2 JP H0519662B2
Authority
JP
Japan
Prior art keywords
contacts
printed circuit
circuit board
edge
substrates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59233382A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60161569A (ja
Inventor
Doriraa Hyuuberuto
Mangu Pauru
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MANIA EREKUTORONITSUKU AUTOMATEIZACHION ENTOBITSUKURUNKU UNTO GEREETEBAU GmbH
Original Assignee
MANIA EREKUTORONITSUKU AUTOMATEIZACHION ENTOBITSUKURUNKU UNTO GEREETEBAU GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MANIA EREKUTORONITSUKU AUTOMATEIZACHION ENTOBITSUKURUNKU UNTO GEREETEBAU GmbH filed Critical MANIA EREKUTORONITSUKU AUTOMATEIZACHION ENTOBITSUKURUNKU UNTO GEREETEBAU GmbH
Publication of JPS60161569A publication Critical patent/JPS60161569A/ja
Publication of JPH0519662B2 publication Critical patent/JPH0519662B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59233382A 1983-11-07 1984-11-07 プリント基板試験装置に用いられる接点配列のピツチ変更用アダプタ Granted JPS60161569A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3340179.9 1983-11-07
DE3340179A DE3340179C1 (de) 1983-11-07 1983-11-07 Anordnung an einem Leiterplattenpruefgeraet zur Anpassung der Abstaende von Kontakten

Publications (2)

Publication Number Publication Date
JPS60161569A JPS60161569A (ja) 1985-08-23
JPH0519662B2 true JPH0519662B2 (en, 2012) 1993-03-17

Family

ID=6213643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59233382A Granted JPS60161569A (ja) 1983-11-07 1984-11-07 プリント基板試験装置に用いられる接点配列のピツチ変更用アダプタ

Country Status (6)

Country Link
US (1) US4614386A (en, 2012)
EP (1) EP0142119B1 (en, 2012)
JP (1) JPS60161569A (en, 2012)
AT (1) ATE24614T1 (en, 2012)
CA (1) CA1221470A (en, 2012)
DE (2) DE3340179C1 (en, 2012)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3568085D1 (en) * 1985-11-12 1989-03-09 Mania Gmbh Device for testing printed circuit boards with a grid of contact points of elevated density
DE3630548A1 (de) * 1986-09-08 1988-03-10 Mania Gmbh Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster
DE3638372A1 (de) * 1986-11-11 1988-05-26 Lang Dahlke Helmut Vorrichtung zum pruefen von elektrischen leiterplatten
DE3806792A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Vorrichtung zum pruefen von leiterplatten
DE3806793A1 (de) * 1988-02-29 1989-09-07 Siemens Ag Adaptereinrichtung fuer eine vorrichtung zum pruefen von leiterplatten
DE8908326U1 (de) * 1989-07-07 1989-09-07 Siemens AG, 1000 Berlin und 8000 München Adaptiervorrichtung zur Prüfung von filmmontierten integrierten Bausteinen
US5061190A (en) * 1990-08-14 1991-10-29 Ziatech Corporation Double density backward and forward compatible card edge connector system
DE69212195T2 (de) 1991-04-11 1996-12-19 Methode Electronics Inc Gerät zum elektronischen Testen von gedruckten Leiterplatten oder ähnlichem
US5216361A (en) * 1991-07-10 1993-06-01 Schlumberger Technologies, Inc. Modular board test system having wireless receiver
JPH07244116A (ja) * 1994-03-07 1995-09-19 Hitachi Chem Co Ltd 半導体特性測定用治具とその製造法並びにその使用方法
TW381328B (en) * 1994-03-07 2000-02-01 Ibm Dual substrate package assembly for being electrically coupled to a conducting member
IT1282689B1 (it) * 1996-02-26 1998-03-31 Circuit Line Spa Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati
DE19932849C2 (de) * 1999-07-14 2003-07-03 Herbert Amrhein Kontaktiereinrichtung zum Herstellen einer elektrisch leitfähigen Verbindung
DE19943388B4 (de) 1999-09-10 2010-04-08 Atg Luther & Maelzer Gmbh Vorrichtung zum Prüfen von Leiterplatten
US7587289B1 (en) * 2007-02-13 2009-09-08 American Megatrends, Inc. Data cable powered sensor fixture
US20080238461A1 (en) * 2007-04-02 2008-10-02 Ken Skala Multi-type test interface system and method
FR2935203B1 (fr) * 2008-08-20 2014-12-12 Centre Nat Etd Spatiales Dispositif de fils electriques et boitier de fils electriques
ITVI20110343A1 (it) * 2011-12-30 2013-07-01 St Microelectronics Srl Sistema e adattatore per testare chips con circuiti integrati in un package

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3911361A (en) * 1974-06-28 1975-10-07 Ibm Coaxial array space transformer
US3963986A (en) * 1975-02-10 1976-06-15 International Business Machines Corporation Programmable interface contactor structure
US4250536A (en) * 1978-12-26 1981-02-10 General Electric Company Interconnection arrangement for circuit boards
US4340858A (en) * 1979-08-13 1982-07-20 Philip M. Hinderstein Test fixture
DE2933862A1 (de) * 1979-08-21 1981-03-12 Paul Mang Vorrichtung zur elektronischen pruefung von leiterplatten.

Also Published As

Publication number Publication date
DE3461867D1 (en) 1987-02-05
JPS60161569A (ja) 1985-08-23
ATE24614T1 (de) 1987-01-15
EP0142119A1 (de) 1985-05-22
CA1221470A (en) 1987-05-05
EP0142119B1 (de) 1986-12-30
DE3340179C1 (de) 1985-05-09
US4614386A (en) 1986-09-30

Similar Documents

Publication Publication Date Title
JPH0519662B2 (en, 2012)
US5399982A (en) Printed circuit board testing device with foil adapter
US6847221B2 (en) Probe pin assembly
US7692435B2 (en) Probe card and probe device for inspection of a semiconductor device
JP2755486B2 (ja) フォイル・アダプタを有するプリント回路基板テスト装置
KR100606284B1 (ko) 프로우브 장치
US6204674B1 (en) Assembly structure for making integrated circuit chip probe cards
US4598960A (en) Methods and apparatus for connecting closely spaced large conductor arrays employing multi-conductor carrier boards
US4516072A (en) Device for use in testing printed circuit board components
JP3604233B2 (ja) 検査用ヘッド
KR100249098B1 (ko) Ic소켓 및 가이드부재
JP3924724B2 (ja) プリント回路基板を検査するための検査装置のモジュール
JP5528532B2 (ja) 基板検査装置
US7982481B2 (en) Module for a parallel tester for the testing of circuit boards
US20090117759A1 (en) Electrical connecting apparatus
JP2000292441A5 (en, 2012)
JP4505342B2 (ja) 電気的接続装置
JP3030978B2 (ja) 回路基板の検査電極装置および検査方法
JP2001124815A (ja) プリント回路基板検査器
JP4060985B2 (ja) プローブカード
JPH10282147A (ja) 平板状被検査体の試験用ヘッド
JPH0447689A (ja) Ｉｃタブ用ソケット
JP2001267024A (ja) 拡張端子部品
JPH08315879A (ja) 多極端子板およびプローブ装置
JP2002082129A (ja) コンタクトプローブ及びプローブ装置