AU502350B2 - Hybrid oxide - Google Patents

Hybrid oxide

Info

Publication number
AU502350B2
AU502350B2 AU21088/77A AU2108877A AU502350B2 AU 502350 B2 AU502350 B2 AU 502350B2 AU 21088/77 A AU21088/77 A AU 21088/77A AU 2108877 A AU2108877 A AU 2108877A AU 502350 B2 AU502350 B2 AU 502350B2
Authority
AU
Australia
Prior art keywords
hybrid oxide
hybrid
oxide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU21088/77A
Other languages
English (en)
Other versions
AU2108877A (en
Inventor
S. H. Fabula J. J Cohen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RCA Corp
Original Assignee
RCA Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RCA Corp filed Critical RCA Corp
Publication of AU2108877A publication Critical patent/AU2108877A/en
Application granted granted Critical
Publication of AU502350B2 publication Critical patent/AU502350B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/02227Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
    • H01L21/0223Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate
    • H01L21/02233Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer
    • H01L21/02236Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor
    • H01L21/02238Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by oxidation, e.g. oxidation of the substrate of the semiconductor substrate or a semiconductor layer group IV semiconductor silicon in uncombined form, i.e. pure silicon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02107Forming insulating materials on a substrate
    • H01L21/02225Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
    • H01L21/02227Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process
    • H01L21/02255Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a process other than a deposition process formation by thermal treatment

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Formation Of Insulating Films (AREA)
  • Silicon Compounds (AREA)
AU21088/77A 1976-01-12 1977-01-06 Hybrid oxide Expired AU502350B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US64845576A 1976-01-12 1976-01-12
USUS648455 1976-01-12

Publications (2)

Publication Number Publication Date
AU2108877A AU2108877A (en) 1978-07-13
AU502350B2 true AU502350B2 (en) 1979-07-19

Family

ID=24600841

Family Applications (1)

Application Number Title Priority Date Filing Date
AU21088/77A Expired AU502350B2 (en) 1976-01-12 1977-01-06 Hybrid oxide

Country Status (9)

Country Link
JP (1) JPS5286070A (de)
AU (1) AU502350B2 (de)
DE (1) DE2700094A1 (de)
FR (1) FR2337941A1 (de)
GB (1) GB1513640A (de)
IN (1) IN145547B (de)
IT (1) IT1064328B (de)
SE (1) SE7614145L (de)
YU (1) YU301876A (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58188162A (ja) * 1982-04-28 1983-11-02 Agency Of Ind Science & Technol ゲ−ト絶縁膜の形成方法
DE3425531A1 (de) * 1984-07-11 1986-01-16 Siemens AG, 1000 Berlin und 8000 München Verfahren zum verfliessenlassen von dotierten sio(pfeil abwaerts)2(pfeil abwaerts)-schichten bei der herstellung von integrierten mos-halbleiterschaltungen
JPS61193456A (ja) * 1985-02-21 1986-08-27 Toshiba Corp 半導体素子の製造方法
NL8603111A (nl) * 1986-12-08 1988-07-01 Philips Nv Werkwijze voor het vervaardigen van een halfgeleiderinrichting waarbij een siliciumplak aan zijn oppervlak wordt voorzien van veldoxidegebieden.
JP3310386B2 (ja) * 1993-05-25 2002-08-05 忠弘 大見 絶縁酸化膜の形成方法及び半導体装置
EP1014432A1 (de) * 1998-12-23 2000-06-28 Infineon Technologies North America Corp. Methode zur Herstellung des Gate-Oxids von Metal-Oxid-Halbleiterbauelementen

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2014382B1 (de) * 1968-06-28 1974-03-15 Motorola Inc
JPS4913909B1 (de) * 1970-05-04 1974-04-03

Also Published As

Publication number Publication date
YU301876A (en) 1982-06-30
SE7614145L (sv) 1977-07-13
GB1513640A (en) 1978-06-07
IT1064328B (it) 1985-02-18
FR2337941A1 (fr) 1977-08-05
IN145547B (de) 1978-11-04
AU2108877A (en) 1978-07-13
FR2337941B1 (de) 1982-05-28
JPS5286070A (en) 1977-07-16
JPS5615573B2 (de) 1981-04-10
DE2700094A1 (de) 1977-07-21

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