AU2014203283B2 - A filtered radiation hardened flip flop with reduced power consumption - Google Patents

A filtered radiation hardened flip flop with reduced power consumption Download PDF

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Publication number
AU2014203283B2
AU2014203283B2 AU2014203283A AU2014203283A AU2014203283B2 AU 2014203283 B2 AU2014203283 B2 AU 2014203283B2 AU 2014203283 A AU2014203283 A AU 2014203283A AU 2014203283 A AU2014203283 A AU 2014203283A AU 2014203283 B2 AU2014203283 B2 AU 2014203283B2
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Australia
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stage
flip flop
input
gate
output
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AU2014203283A
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AU2014203283A1 (en
Inventor
Manuel F. Cabanas-Holmen
Ethan Cannon
Salim A. Rabaa
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Boeing Co
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Boeing Co
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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/01—Details
    • H03K3/012—Modifications of generator to improve response time or to decrease power consumption
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/037—Bistable circuits
    • H03K3/0375—Bistable circuits provided with means for increasing reliability; for protection; for ensuring a predetermined initial state when the supply voltage has been applied; for storing the actual state when the supply voltage fails

Landscapes

  • Pulse Circuits (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
AU2014203283A 2013-09-11 2014-06-17 A filtered radiation hardened flip flop with reduced power consumption Active AU2014203283B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/024,310 2013-09-11
US14/024,310 US9013219B2 (en) 2013-09-11 2013-09-11 Filtered radiation hardened flip flop with reduced power consumption

Publications (2)

Publication Number Publication Date
AU2014203283A1 AU2014203283A1 (en) 2015-03-26
AU2014203283B2 true AU2014203283B2 (en) 2018-10-18

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Family Applications (1)

Application Number Title Priority Date Filing Date
AU2014203283A Active AU2014203283B2 (en) 2013-09-11 2014-06-17 A filtered radiation hardened flip flop with reduced power consumption

Country Status (6)

Country Link
US (1) US9013219B2 (enExample)
JP (1) JP6438237B2 (enExample)
CN (1) CN104426532B (enExample)
AU (1) AU2014203283B2 (enExample)
SG (1) SG10201405181VA (enExample)
TW (1) TWI631825B (enExample)

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* Cited by examiner, † Cited by third party
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US11374567B2 (en) * 2017-02-11 2022-06-28 Klas Olof Lilja Circuit for low power, radiation hard logic cell
SG11202005673VA (en) * 2017-12-29 2020-07-29 Bae Systems Radiation-hardened d flip-flop circuit
CN111656688B (zh) 2018-01-22 2024-12-31 卓思私人有限公司 用于设定电路晶体管的宽长比的方法、电路及电路布置
CN112119591B (zh) 2018-03-19 2024-12-20 南洋理工大学 电路布置及其形成方法
WO2019235363A1 (ja) * 2018-06-04 2019-12-12 国立大学法人京都工芸繊維大学 Ｄ型フリップフロップ回路
US12294363B2 (en) 2019-10-08 2025-05-06 Zero-Error Systems Pte. Ltd Circuit for mitigating single-event-transients
US11177795B1 (en) * 2020-04-22 2021-11-16 Xilinx, Inc. Master latch design for single event upset flip-flop
US11601119B2 (en) 2020-12-18 2023-03-07 The Boeing Company Radiation hardened flip-flop circuit for mitigating single event transients
CN112737560B (zh) * 2020-12-24 2022-09-13 中国人民解放军国防科技大学 一种无频率损耗的集成电路抗单粒子瞬态加固方法
JP2023034938A (ja) * 2021-08-31 2023-03-13 ローム株式会社 フリップフロップ回路、半導体集積回路装置、及び車両
CN120567108B (zh) * 2025-07-30 2025-10-03 中国电子科技集团公司第五十八研究所 一种基于互连线串扰计算的抗辐照d触发器

Citations (1)

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JP2001237675A (ja) * 2000-02-24 2001-08-31 Ando Electric Co Ltd Ｄ−ｆｆ回路
US7523371B2 (en) * 2004-06-30 2009-04-21 Intel Corporation System and shadow bistable circuits coupled to output joining circuit
JP4551731B2 (ja) * 2004-10-15 2010-09-29 株式会社東芝 半導体集積回路
US20060267653A1 (en) 2005-05-25 2006-11-30 Honeywell International Inc. Single-event-effect hardened circuitry
JP4332652B2 (ja) * 2005-12-12 2009-09-16 独立行政法人 宇宙航空研究開発機構 シングルイベント耐性のラッチ回路及びフリップフロップ回路
US8767444B2 (en) * 2006-03-27 2014-07-01 Honeywell International Inc. Radiation-hardened memory element with multiple delay elements
US20080115023A1 (en) * 2006-10-27 2008-05-15 Honeywell International Inc. Set hardened register
US7795927B2 (en) 2007-08-17 2010-09-14 Raytheon Company Digital circuits with adaptive resistance to single event upset
KR20090131010A (ko) * 2008-06-17 2009-12-28 주식회사 동부하이텍 듀얼 모드 에지 트리거 플립플롭
CN101499788A (zh) * 2009-02-19 2009-08-05 上海交通大学 抗单粒子翻转和单粒子瞬态脉冲的d触发器
JP5372613B2 (ja) * 2009-06-18 2013-12-18 株式会社日立製作所 フリップフロップ、半導体集積回路、半導体デバイスおよびブレードサーバ
US8054099B2 (en) * 2009-07-29 2011-11-08 The Boeing Company Method and apparatus for reducing radiation and cross-talk induced data errors
JP2012023436A (ja) * 2010-07-12 2012-02-02 Nippon Telegr & Teleph Corp <Ntt> 多チャンネルｏｓｎｒモニタ
US8493120B2 (en) * 2011-03-10 2013-07-23 Arm Limited Storage circuitry and method with increased resilience to single event upsets
CN102394595B (zh) * 2011-10-21 2013-12-11 中国人民解放军国防科学技术大学 抗单粒子翻转的可置位和复位d触发器

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Also Published As

Publication number Publication date
TWI631825B (zh) 2018-08-01
US9013219B2 (en) 2015-04-21
JP2015056892A (ja) 2015-03-23
AU2014203283A1 (en) 2015-03-26
TW201524123A (zh) 2015-06-16
US20150070062A1 (en) 2015-03-12
SG10201405181VA (en) 2015-04-29
CN104426532A (zh) 2015-03-18
JP6438237B2 (ja) 2018-12-12
CN104426532B (zh) 2019-06-28

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