AU2001293734A1 - Method and device for testing printed circuit boards with a parallel tester - Google Patents

Method and device for testing printed circuit boards with a parallel tester

Info

Publication number
AU2001293734A1
AU2001293734A1 AU2001293734A AU9373401A AU2001293734A1 AU 2001293734 A1 AU2001293734 A1 AU 2001293734A1 AU 2001293734 A AU2001293734 A AU 2001293734A AU 9373401 A AU9373401 A AU 9373401A AU 2001293734 A1 AU2001293734 A1 AU 2001293734A1
Authority
AU
Australia
Prior art keywords
printed circuit
circuit board
parallel tester
testing
points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001293734A
Other languages
English (en)
Inventor
Uwe Rothaug
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATG Test Systems GmbH and Co KG
Original Assignee
ATG Test Systems GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATG Test Systems GmbH and Co KG filed Critical ATG Test Systems GmbH and Co KG
Publication of AU2001293734A1 publication Critical patent/AU2001293734A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/0061—Tools for holding the circuit boards during processing; handling transport of printed circuit boards
    • H05K13/0069—Holders for printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Selective Calling Equipment (AREA)
AU2001293734A 2000-09-05 2001-08-07 Method and device for testing printed circuit boards with a parallel tester Abandoned AU2001293734A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10043728 2000-09-05
DE10043728A DE10043728C2 (de) 2000-09-05 2000-09-05 Verfahren zum Prüfen von Leiterplatten und Verwendung einer Vorrichtung zum Ausführen des Verfahrens
PCT/EP2001/009133 WO2002021893A2 (de) 2000-09-05 2001-08-07 Verfahren und vorrichtung zum prüfen von leiterplatten mit einem paralleltester

Publications (1)

Publication Number Publication Date
AU2001293734A1 true AU2001293734A1 (en) 2002-03-22

Family

ID=7655059

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001293734A Abandoned AU2001293734A1 (en) 2000-09-05 2001-08-07 Method and device for testing printed circuit boards with a parallel tester

Country Status (10)

Country Link
EP (1) EP1315975B1 (de)
JP (1) JP3928129B2 (de)
KR (1) KR100509340B1 (de)
CN (1) CN1187619C (de)
AT (1) ATE322022T1 (de)
AU (1) AU2001293734A1 (de)
DE (2) DE10043728C2 (de)
HK (1) HK1056219A1 (de)
TW (1) TW515894B (de)
WO (1) WO2002021893A2 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10220343B4 (de) * 2002-05-07 2007-04-05 Atg Test Systems Gmbh & Co. Kg Reicholzheim Vorrichtung und Verfahren zum Prüfen von Leiterplatten und Prüfsonde
DE10337350B3 (de) * 2003-08-14 2005-11-24 Aleksej Limonow Verfahren und Einrichtung zur Entdeckung und Lokalisierung eines Defektes in einer logischen elektronischen Leiterplatte
DE102008006130A1 (de) * 2008-01-25 2009-07-30 Atg Luther & Maelzer Gmbh Modul für einen Paralleltester zum Prüfen von Leiterplatten
DE102009004555A1 (de) * 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
DE102009016789B4 (de) * 2009-04-07 2014-04-03 Robert Melder Vorrichtung eines prüflingsunabhängigen Testsystems zum elektrischen Funktionstest von ein- oder beidseitig elektrisch kontaktierbaren Prüfpunkten und Verfahren dazu
CN102554929A (zh) * 2010-12-31 2012-07-11 鸿富锦精密工业（深圳）有限公司 机械手臂中心点补偿系统及方法
JP5466686B2 (ja) * 2011-11-04 2014-04-09 セイコープレシジョン株式会社 配線板測定装置及び配線板測定方法
JP5870863B2 (ja) * 2012-06-29 2016-03-01 オムロン株式会社 基板検査装置
US9523735B2 (en) 2014-10-08 2016-12-20 Eastman Kodak Company Electrical test system with vision-guided alignment
US9557374B2 (en) 2014-10-08 2017-01-31 Eastman Kodak Company Vision-guided alignment system
US9581640B2 (en) 2014-10-08 2017-02-28 Eastman Kodak Company Vision-guided alignment method
US9535116B2 (en) 2014-10-08 2017-01-03 Eastman Kodak Company Electrical test method with vision-guided alignment
DE102015113046A1 (de) * 2015-08-07 2017-02-09 Xcerra Corp. Positioniereinrichtung für einen Paralleltester zum Testen von Leiterplatten und Paralleltester zum Testen von Leiterplatten
CN105301477A (zh) * 2015-11-06 2016-02-03 深圳市亚泰光电技术有限公司 一种电路板检测方法
CN109738788B (zh) * 2019-01-02 2021-06-01 深圳市大族数控科技股份有限公司 飞针测试机测试方法、装置、飞针测试机及存储介质
DE102019120059A1 (de) * 2019-07-24 2021-01-28 Endress+Hauser SE+Co. KG Verfahren zur Erkennung von Fehlern oder Fehlfunktionen an elektrischen oder elektronischen Bauteilen einer Schaltungsanordnung
CN111589728A (zh) * 2020-06-24 2020-08-28 金动力智能科技（深圳）有限公司 一种5g网分组件的智能测试组件
KR102444023B1 (ko) * 2022-05-31 2022-09-16 큐알티 주식회사 다종 반도체 소자의 평가 장치, 및 이의 평가 방법

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2953597A1 (de) * 1979-05-08 1981-04-09 Tokyo Shibaura Electric Co Pulse motor driving apparatus for automatic testing system
ATE45427T1 (de) * 1983-11-07 1989-08-15 Martin Maelzer Adapter fuer ein leiterplattenpruefgeraet.
EP0215146B1 (de) * 1985-09-16 1988-08-03 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Vorrichtung zum elektronischen Prüfen von Leiterplatten oder dergleichen
DE3838413A1 (de) * 1988-11-12 1990-05-17 Mania Gmbh Adapter fuer elektronische pruefvorrichtungen fuer leiterplatten und dergl.
DE4237591A1 (de) * 1992-11-06 1994-05-11 Mania Gmbh Leiterplatten-Prüfeinrichtung mit Folienadapter
DE4109684C2 (de) * 1990-07-25 2001-07-12 Atg Test Systems Gmbh Kontaktierungsvorrichtung für Prüfzwecke
EP0468153B1 (de) * 1990-07-25 1995-10-11 atg test systems GmbH Kontaktierungsvorrichtung für Prüfzwecke
DE4323276A1 (de) * 1993-07-12 1995-01-19 Mania Gmbh Vollmaterialadapter
IT1266653B1 (it) * 1993-11-02 1997-01-09 Circuit Line Spa Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati
US5506793A (en) * 1994-01-14 1996-04-09 Gerber Systems Corporation Method and apparatus for distortion compensation in an automatic optical inspection system
DE4406538A1 (de) * 1994-02-28 1995-08-31 Mania Gmbh Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben
DE9416526U1 (de) * 1994-05-20 1995-06-08 Luther & Maelzer Gmbh, 31515 Wunstorf Vorrichtung zum Prüfen von elektrischen Leiterplatten unter Verwendung eines Prüfadapters mit Prüfstiften
DE19709938A1 (de) * 1997-03-11 1998-09-17 Emil Woschko Fensteranordnung
DE19709939A1 (de) * 1997-03-11 1998-09-17 Atg Test Systems Gmbh Verfahren und Vorrichtung zum Prüfen von Leiterplatten
IT1291643B1 (it) * 1997-04-22 1999-01-19 Circuit Line Spa Metodo di regolazione automatica per l'eliminazione dell'errore di centraggio in fase di test elettrico di circuiti stampati

Also Published As

Publication number Publication date
DE10043728C2 (de) 2003-12-04
TW515894B (en) 2003-01-01
EP1315975B1 (de) 2006-03-29
WO2002021893A2 (de) 2002-03-14
JP2004508569A (ja) 2004-03-18
ATE322022T1 (de) 2006-04-15
DE10043728A1 (de) 2002-03-28
JP3928129B2 (ja) 2007-06-13
KR20030041987A (ko) 2003-05-27
DE50109393D1 (de) 2006-05-18
CN1449499A (zh) 2003-10-15
CN1187619C (zh) 2005-02-02
KR100509340B1 (ko) 2005-08-22
WO2002021893A3 (de) 2002-06-27
EP1315975A2 (de) 2003-06-04
HK1056219A1 (en) 2004-02-06

Similar Documents

Publication Publication Date Title
AU2001293734A1 (en) Method and device for testing printed circuit boards with a parallel tester
DE50006191D1 (de) Vorrichtung zum testen von leiterplatten
WO1996029610A3 (en) Manufacturing defect analyzer with improved fault coverage
DE69734866D1 (de) Prüfadapter mit Kontaktstiftführung für bestückte Leiterplatten
SG109584A1 (en) Integrated printed circuit board and test contactor for high speed semiconductor testing
WO2007079006A3 (en) Connection verification technique
WO2005072406A3 (en) Test system and method for reduced index time
EP1455388A4 (de) Zuverlässigkeitsbewertungstester, zuverlässigkeitsbewertungstestsystem, kontaktor und zuverlässigkeitsbewertungstestverfahren
TW200641377A (en) Apparatus and method for testing component built in circuit board
WO2008028171A3 (en) Method and apparatus for switching tester resources
TW200730829A (en) Finger tester for the testing of non-componented printed circuit boards and method of testing non-componented printed circuit boards with a finger tester
TW200508615A (en) Electronic component test apparatus
TW200710411A (en) Method and apparatus for electrical testing of a unit under test, as well as a method for production of a contact-making apparatus which is used for testing
DE59712909D1 (de) Adapter zum Prüfen von elektrischen Leiterplatten
SE9602564L (sv) Kretskortstest
TW200613738A (en) Method and apparatus for a twisting fixture probe for probing test access point structures
TW358885B (en) Apparatus and method for testing non-componented printed circuit boards
SG129234A1 (en) Adapter method and apparatus for interfacing a tester with a device under test
FR2780792B1 (fr) Appareillage de test de puces electroniques
AU2001270952A1 (en) Probe, systems and methods for integrated circuit board testing
ATE285078T1 (de) Vorrichtung und verfahren zur prüfung von unbestückten gedruckten schaltungen
TW200608035A (en) Clamp for inspecting printed circuit board
DE59900130D1 (de) Vorrichtung zum prüfen von leiterplatten
AU2001285859A1 (en) Method and device for testing the operativeness of printed circuit boards
WO2002004966A3 (en) An apparatus and method for testing a socket on a burn-in board using a flex strip probe