SE9602564L - Kretskortstest - Google Patents
KretskortstestInfo
- Publication number
- SE9602564L SE9602564L SE9602564A SE9602564A SE9602564L SE 9602564 L SE9602564 L SE 9602564L SE 9602564 A SE9602564 A SE 9602564A SE 9602564 A SE9602564 A SE 9602564A SE 9602564 L SE9602564 L SE 9602564L
- Authority
- SE
- Sweden
- Prior art keywords
- test
- signal
- arrangement
- circuit board
- pattern
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9602564A SE515553C2 (sv) | 1996-06-28 | 1996-06-28 | Kretskortstest |
PCT/SE1997/001148 WO1998000724A1 (en) | 1996-06-28 | 1997-06-26 | Circuit board test |
AU34708/97A AU3470897A (en) | 1996-06-28 | 1997-06-26 | Circuit board test |
US08/883,904 US5812563A (en) | 1996-06-28 | 1997-06-27 | Circuit board testing |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9602564A SE515553C2 (sv) | 1996-06-28 | 1996-06-28 | Kretskortstest |
Publications (3)
Publication Number | Publication Date |
---|---|
SE9602564D0 SE9602564D0 (sv) | 1996-06-28 |
SE9602564L true SE9602564L (sv) | 1997-12-29 |
SE515553C2 SE515553C2 (sv) | 2001-08-27 |
Family
ID=20403202
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE9602564A SE515553C2 (sv) | 1996-06-28 | 1996-06-28 | Kretskortstest |
Country Status (4)
Country | Link |
---|---|
US (1) | US5812563A (sv) |
AU (1) | AU3470897A (sv) |
SE (1) | SE515553C2 (sv) |
WO (1) | WO1998000724A1 (sv) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6092224A (en) * | 1998-05-27 | 2000-07-18 | Compaq Computer Corporation | Logic analyzer probe assembly with probe and interface boards |
KR100334660B1 (ko) * | 2000-12-19 | 2002-04-27 | 우상엽 | 반도체 메모리 테스트 장치의 타이밍 클럭 제어기 |
US6685498B1 (en) | 2002-09-27 | 2004-02-03 | Ronald Jones | Logic analyzer testing method and configuration and interface assembly for use therewith |
TWI245169B (en) * | 2002-10-28 | 2005-12-11 | Asml Netherlands Bv | Method for detecting defect in mask, computer program, and reference substrate |
EP1416326B1 (en) * | 2002-10-28 | 2008-06-11 | ASML Netherlands B.V. | Method, inspection system, computer program and reference substrate for detecting mask defects |
CN100383542C (zh) * | 2003-11-07 | 2008-04-23 | 深圳创维-Rgb电子有限公司 | 检测电路板的方法及装置 |
US7188037B2 (en) * | 2004-08-20 | 2007-03-06 | Microcraft | Method and apparatus for testing circuit boards |
US8269505B2 (en) * | 2009-12-15 | 2012-09-18 | International Business Machines Corporation | Locating short circuits in printed circuit boards |
US8860448B2 (en) * | 2011-07-15 | 2014-10-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Test schemes and apparatus for passive interposers |
US10520542B2 (en) * | 2016-05-25 | 2019-12-31 | Huntron, Inc. | System for fault determination for electronic circuits |
WO2022019814A1 (en) * | 2020-07-22 | 2022-01-27 | Telefonaktiebolaget Lm Ericsson (Publ) | Method and system for testing a printed circuit board |
TWI742865B (zh) * | 2020-09-28 | 2021-10-11 | 蔚華科技股份有限公司 | 具數據處理功能的自動化測試機及其資訊處理方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4176780A (en) * | 1977-12-06 | 1979-12-04 | Ncr Corporation | Method and apparatus for testing printed circuit boards |
US4194113A (en) * | 1978-04-13 | 1980-03-18 | Ncr Corporation | Method and apparatus for isolating faults in a logic circuit |
CA1286724C (en) * | 1986-03-27 | 1991-07-23 | Richard Ralph Goulette | Method and apparatus for monitoring electromagnetic emission levels |
EP0527321A1 (de) * | 1991-08-05 | 1993-02-17 | Siemens Aktiengesellschaft | Verfahren zur automatischen Fehlerdiagnose von elektrischen Baugruppen |
-
1996
- 1996-06-28 SE SE9602564A patent/SE515553C2/sv not_active IP Right Cessation
-
1997
- 1997-06-26 WO PCT/SE1997/001148 patent/WO1998000724A1/en active Application Filing
- 1997-06-26 AU AU34708/97A patent/AU3470897A/en not_active Abandoned
- 1997-06-27 US US08/883,904 patent/US5812563A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
WO1998000724A1 (en) | 1998-01-08 |
AU3470897A (en) | 1998-01-21 |
US5812563A (en) | 1998-09-22 |
SE9602564D0 (sv) | 1996-06-28 |
SE515553C2 (sv) | 2001-08-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
NUG | Patent has lapsed |