AU2001278818A1 - Substrate for manufacturing a semiconductor device with three element alloy - Google Patents

Substrate for manufacturing a semiconductor device with three element alloy

Info

Publication number
AU2001278818A1
AU2001278818A1 AU2001278818A AU7881801A AU2001278818A1 AU 2001278818 A1 AU2001278818 A1 AU 2001278818A1 AU 2001278818 A AU2001278818 A AU 2001278818A AU 7881801 A AU7881801 A AU 7881801A AU 2001278818 A1 AU2001278818 A1 AU 2001278818A1
Authority
AU
Australia
Prior art keywords
substrate
manufacturing
semiconductor device
element alloy
alloy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001278818A
Inventor
Soon Sung Hong
Ji Yong Lee
Byung Jun Park
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Acqutek Semiconductor and Technology Co Ltd
Original Assignee
HYUK WON KWON
Acqutek Semiconductor and Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HYUK WON KWON, Acqutek Semiconductor and Technology Co Ltd filed Critical HYUK WON KWON
Publication of AU2001278818A1 publication Critical patent/AU2001278818A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/22—Secondary treatment of printed circuits
    • H05K3/24—Reinforcing the conductive pattern
    • H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/12—Mountings, e.g. non-detachable insulating substrates
    • H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
    • H01L23/142—Metallic substrates having insulating layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495—Lead-frames or other flat leads
    • H01L23/49579—Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
    • H01L23/49582—Metallic layers on lead frames
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144—Gold (Au) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01014—Silicon [Si]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01028—Nickel [Ni]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/102—Material of the semiconductor or solid state bodies
    • H01L2924/1025—Semiconducting materials
    • H01L2924/10251—Elemental semiconductors, i.e. Group IV
    • H01L2924/10253—Silicon [Si]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/927—Electromigration resistant metallization
AU2001278818A 2000-08-23 2001-08-17 Substrate for manufacturing a semiconductor device with three element alloy Abandoned AU2001278818A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
KR0048799 2000-08-23
KR10-2000-0048799A KR100379128B1 (en) 2000-08-23 2000-08-23 Substrate for mannfacturing the environmentally favorable semiconductor device using three element alloy
PCT/KR2001/001400 WO2002017396A1 (en) 2000-08-23 2001-08-17 Substrate for manufacturing a semiconductor device with three element alloy

Publications (1)

Publication Number Publication Date
AU2001278818A1 true AU2001278818A1 (en) 2002-03-04

Family

ID=19684599

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001278818A Abandoned AU2001278818A1 (en) 2000-08-23 2001-08-17 Substrate for manufacturing a semiconductor device with three element alloy

Country Status (8)

Country Link
US (1) US6424046B1 (en)
EP (1) EP1184904A3 (en)
JP (1) JP2002173796A (en)
KR (1) KR100379128B1 (en)
CN (1) CN1245756C (en)
AU (1) AU2001278818A1 (en)
TW (1) TW529126B (en)
WO (1) WO2002017396A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10103294C1 (en) * 2001-01-25 2002-10-31 Siemens Ag Carrier with a metal surface and at least one chip arranged thereon, in particular power semiconductors
KR100422271B1 (en) * 2001-05-02 2004-03-10 이규한 beam lead of micro BGA type semiconductor package
TW200414453A (en) * 2002-03-26 2004-08-01 Sumitomo Electric Wintec Inc Bonding wire and IC device using the bonding wire
US7021346B2 (en) * 2004-01-26 2006-04-04 Ao Yu Chang Bamboo mat board and method for producing the same
JP4640802B2 (en) 2005-07-07 2011-03-02 日東電工株式会社 Suspension board with circuit
CN100468845C (en) * 2005-08-12 2009-03-11 鸿富锦精密工业（深圳）有限公司 Integrated circuit board and its manufacturing method
JP4615427B2 (en) 2005-12-01 2011-01-19 日東電工株式会社 Printed circuit board
JP4865453B2 (en) 2006-08-30 2012-02-01 日東電工株式会社 Wiring circuit board and manufacturing method thereof
JP2008282995A (en) 2007-05-10 2008-11-20 Nitto Denko Corp Wiring circuit board
CN102312120A (en) * 2011-09-01 2012-01-11 王一平 Electromigration-resistant silver-indium alloy bonding wire and preparation method thereof
US9070392B1 (en) 2014-12-16 2015-06-30 Hutchinson Technology Incorporated Piezoelectric disk drive suspension motors having plated stiffeners
WO2017003782A1 (en) 2015-06-30 2017-01-05 Hutchinson Technology Incorporated Disk drive head suspension structures having improved gold-dielectric joint reliability

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1177373A (en) * 1966-01-21 1970-01-14 Engelhard Min & Chem Improvements in or relating to gold electroplating
GB1461474A (en) * 1974-07-03 1977-01-13 Fulmer Res Inst Ltd Electrical connectors and a method of preparing stable electro platings
JPS5716193A (en) * 1980-05-23 1982-01-27 Furukawa Electric Co Ltd:The Silver coating material for electronic parts
EP0250146A1 (en) 1986-06-16 1987-12-23 Texas Instruments Incorporated Palladium plated lead frame for integrated circuit
JPH06184789A (en) * 1992-12-22 1994-07-05 Asahi Glass Co Ltd Oxidation-resistant metallic member, plating solution and circuit device
JPH09223771A (en) * 1995-12-15 1997-08-26 Furukawa Seimitsu Kinzoku Kogyo Kk Electronic component lead member and its manufacture
JPH09275182A (en) * 1996-04-02 1997-10-21 Seiichi Serizawa Lead frame for semiconductor device
JPH1027873A (en) * 1996-07-11 1998-01-27 Nippon Koujiyundo Kagaku Kk Lead frame for semiconductor device
JPH118341A (en) * 1997-06-18 1999-01-12 Mitsui High Tec Inc Lead frame for semiconductor device

Also Published As

Publication number Publication date
KR100379128B1 (en) 2003-04-08
US6424046B1 (en) 2002-07-23
JP2002173796A (en) 2002-06-21
EP1184904A3 (en) 2006-05-17
EP1184904A2 (en) 2002-03-06
CN1339822A (en) 2002-03-13
TW529126B (en) 2003-04-21
KR20010088882A (en) 2001-09-29
WO2002017396A1 (en) 2002-02-28
US20020074662A1 (en) 2002-06-20
CN1245756C (en) 2006-03-15

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