AU2001264279A1 - Semiconductor manufacturing apparatus detecting a state of connection between controllers - Google Patents

Semiconductor manufacturing apparatus detecting a state of connection between controllers

Info

Publication number
AU2001264279A1
AU2001264279A1 AU2001264279A AU6427901A AU2001264279A1 AU 2001264279 A1 AU2001264279 A1 AU 2001264279A1 AU 2001264279 A AU2001264279 A AU 2001264279A AU 6427901 A AU6427901 A AU 6427901A AU 2001264279 A1 AU2001264279 A1 AU 2001264279A1
Authority
AU
Australia
Prior art keywords
controllers
connection
state
manufacturing apparatus
semiconductor manufacturing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001264279A
Other languages
English (en)
Inventor
Tadahito Nezu
Kiminori Okada
Toru Yamauchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of AU2001264279A1 publication Critical patent/AU2001264279A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67276—Production flow monitoring, e.g. for increasing throughput
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0428—Safety, monitoring
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/22—Pc multi processor system
    • G05B2219/2208—Each processor controls a different function of the machine
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24119—Compare control states to allowed and forbidden combination of states
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/25—Pc structure of the system
    • G05B2219/25156—Full echo communication check, echo back
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/25—Pc structure of the system
    • G05B2219/25209—Device status answer, response, acknowledge
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/45—Nc applications
    • G05B2219/45031—Manufacturing semiconductor wafers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Automation & Control Theory (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Programmable Controllers (AREA)
  • General Factory Administration (AREA)
AU2001264279A 2000-06-16 2001-06-14 Semiconductor manufacturing apparatus detecting a state of connection between controllers Abandoned AU2001264279A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000181972 2000-06-16
JP2000-181972 2000-06-16
PCT/JP2001/005059 WO2001097262A1 (en) 2000-06-16 2001-06-14 Semiconductor manufacturing apparatus detecting a state of connection between controllers

Publications (1)

Publication Number Publication Date
AU2001264279A1 true AU2001264279A1 (en) 2001-12-24

Family

ID=18682821

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001264279A Abandoned AU2001264279A1 (en) 2000-06-16 2001-06-14 Semiconductor manufacturing apparatus detecting a state of connection between controllers

Country Status (7)

Country Link
US (1) US6754554B2 (ko)
JP (1) JP5236142B2 (ko)
KR (1) KR100781406B1 (ko)
CN (1) CN1178274C (ko)
AU (1) AU2001264279A1 (ko)
TW (1) TW533457B (ko)
WO (1) WO2001097262A1 (ko)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4673548B2 (ja) * 2003-11-12 2011-04-20 東京エレクトロン株式会社 基板処理装置及びその制御方法
US20050205209A1 (en) * 2004-03-18 2005-09-22 Aelan Mosden Replacing chamber components in a vacuum environment
TWI397830B (zh) * 2005-05-02 2013-06-01 Mks Instr Inc 具有統計上可重複之回應時間的通用半導體製造控制器
CN100429887C (zh) * 2006-02-09 2008-10-29 北京北方微电子基地设备工艺研究中心有限责任公司 刻蚀机集群控制器与工艺模块控制器通讯系统及方法
JP2008123427A (ja) * 2006-11-15 2008-05-29 Mitsubishi Electric Corp 監視制御システムの表示方式
JP2010524201A (ja) * 2007-03-22 2010-07-15 クロッシング オートメイション， インコーポレイテッド モジュラクラスタツール
US20090319699A1 (en) * 2008-06-23 2009-12-24 International Business Machines Corporation Preventing Loss of Access to a Storage System During a Concurrent Code Load
JP5424628B2 (ja) * 2008-12-11 2014-02-26 株式会社日立ハイテクノロジーズ 真空処理装置
CN103414622A (zh) * 2013-08-15 2013-11-27 上海固泰科技有限公司 基于can总线的仿真方法
US9666461B1 (en) * 2016-02-05 2017-05-30 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor process and semiconductor processing device using the same
US20180359130A1 (en) * 2017-06-13 2018-12-13 Schlumberger Technology Corporation Well Construction Communication and Control
US11143010B2 (en) 2017-06-13 2021-10-12 Schlumberger Technology Corporation Well construction communication and control
US11021944B2 (en) 2017-06-13 2021-06-01 Schlumberger Technology Corporation Well construction communication and control
CN109935537B9 (zh) * 2017-12-15 2021-03-19 辛耘企业股份有限公司 基板处理系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2857562B2 (ja) * 1993-02-22 1999-02-17 大日本スクリーン製造株式会社 ユニット間基板搬送装置
JP3592861B2 (ja) * 1996-10-23 2004-11-24 大日本スクリーン製造株式会社 基板処理装置
JPH11175142A (ja) 1997-12-10 1999-07-02 Hitachi Ltd 製造装置の運転支援システム
KR100269942B1 (ko) 1998-02-03 2000-10-16 윤종용 반도체제조설비관리방법
US6466838B1 (en) * 1998-05-14 2002-10-15 Canon Kabushiki Kaisha Semiconductor exposure apparatus and device manufacturing method using the same
US6546307B1 (en) * 1999-08-20 2003-04-08 Taiwan Semiconductor Manufacturing Co., Ltd. Method and apparatus for detecting proper orientation of a semiconductor wafer in a wafer transfer system

Also Published As

Publication number Publication date
US20030182012A1 (en) 2003-09-25
JP2004503935A (ja) 2004-02-05
TW533457B (en) 2003-05-21
WO2001097262A1 (en) 2001-12-20
JP5236142B2 (ja) 2013-07-17
KR100781406B1 (ko) 2007-12-03
US6754554B2 (en) 2004-06-22
KR20030009528A (ko) 2003-01-29
CN1178274C (zh) 2004-12-01
CN1443363A (zh) 2003-09-17

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