ATE556537T1 - Kompensation von leckagestrom und restsignalen zur integration eines detektors auf basis direkter röntgenstahlumwandlung - Google Patents
Kompensation von leckagestrom und restsignalen zur integration eines detektors auf basis direkter röntgenstahlumwandlungInfo
- Publication number
- ATE556537T1 ATE556537T1 AT07826409T AT07826409T ATE556537T1 AT E556537 T1 ATE556537 T1 AT E556537T1 AT 07826409 T AT07826409 T AT 07826409T AT 07826409 T AT07826409 T AT 07826409T AT E556537 T1 ATE556537 T1 AT E556537T1
- Authority
- AT
- Austria
- Prior art keywords
- ray
- sensor
- leakage current
- residual signals
- direct
- Prior art date
Links
- 238000006243 chemical reaction Methods 0.000 title abstract 3
- 230000010354 integration Effects 0.000 title 1
- 230000002123 temporal effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/571—Control of the dynamic range involving a non-linear response
- H04N25/573—Control of the dynamic range involving a non-linear response the logarithmic type
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06121191 | 2006-09-25 | ||
PCT/IB2007/053747 WO2008038177A1 (en) | 2006-09-25 | 2007-09-17 | Compensation of leakage current and residual signals for integrating detector based on direct x-ray conversion |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE556537T1 true ATE556537T1 (de) | 2012-05-15 |
Family
ID=39018149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07826409T ATE556537T1 (de) | 2006-09-25 | 2007-09-17 | Kompensation von leckagestrom und restsignalen zur integration eines detektors auf basis direkter röntgenstahlumwandlung |
Country Status (6)
Country | Link |
---|---|
US (1) | US8154631B2 (de) |
EP (1) | EP2070313B1 (de) |
JP (1) | JP5458260B2 (de) |
CN (1) | CN101518056B (de) |
AT (1) | ATE556537T1 (de) |
WO (1) | WO2008038177A1 (de) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2617188A4 (de) | 2010-09-13 | 2017-09-13 | Thunder Bay Regional Health Research Institute | Systeme und verfahren zur rücksetzung lichtleitender röntgenbildgebungsdetektoren |
EP2748594B1 (de) | 2011-10-26 | 2016-06-08 | Koninklijke Philips N.V. | Radiografische vorrichtung zur erfassung von photonen mit versatzkorrektur |
JP5619717B2 (ja) * | 2011-12-16 | 2014-11-05 | 株式会社日立製作所 | 放射線検出器用電源回路およびそれを用いた半導体放射線検出装置 |
JP5999921B2 (ja) * | 2012-02-24 | 2016-09-28 | ソニーセミコンダクタソリューションズ株式会社 | 撮像装置および撮像表示システム |
KR102065807B1 (ko) * | 2012-10-30 | 2020-01-13 | 케어스트림 헬스 인코포레이티드 | 디지털 방사선 촬영 검출기들을 위한 전하 주입 보상 |
WO2014091278A1 (en) * | 2012-12-12 | 2014-06-19 | Koninklijke Philips N.V. | Adaptive persistent current compensation for photon counting detectors |
KR102054368B1 (ko) | 2013-09-09 | 2019-12-11 | 삼성디스플레이 주식회사 | 표시장치 및 그 구동 방법 |
US9407843B2 (en) | 2013-10-23 | 2016-08-02 | General Electric Company | Detector system and module for compensating dark current |
WO2016087242A1 (en) * | 2014-12-03 | 2016-06-09 | Koninklijke Philips N.V. | Device and method for signal compensation in medical x-ray images |
CN108291973B (zh) | 2015-11-26 | 2022-09-09 | 皇家飞利浦有限公司 | 暗电流补偿 |
EP3532873B1 (de) * | 2016-10-27 | 2021-06-23 | Shenzhen Xpectvision Technology Co., Ltd. | Dunkelrauschkompensation bei einem strahlungsdetektor |
JP6666285B2 (ja) | 2017-03-03 | 2020-03-13 | 株式会社東芝 | 放射線検出器 |
US10594358B2 (en) * | 2017-04-21 | 2020-03-17 | Futurewei Technologies, Inc. | Leakage signal cancellation |
CN111226136B (zh) | 2017-10-30 | 2023-07-18 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪声补偿 |
CN108169791B (zh) | 2018-03-23 | 2024-03-08 | 京东方科技集团股份有限公司 | 用于x射线探测器的读取装置及其方法、x射线探测器 |
EP3567405A1 (de) * | 2018-05-08 | 2019-11-13 | Koninklijke Philips N.V. | Spektrales ct basierend auf photonenzählung |
EP3887868A1 (de) | 2018-11-29 | 2021-10-06 | Oy AJAT Ltd. | Detektorschaltung |
US10827090B1 (en) * | 2019-09-16 | 2020-11-03 | Innolux Corporation | Electronic device and method for operating electronic device |
CN115268540B (zh) * | 2021-04-29 | 2023-08-11 | 圣邦微电子(北京)股份有限公司 | 一种具有采样保持功能的带隙基准电路 |
WO2023018766A1 (en) | 2021-08-11 | 2023-02-16 | American Sterilizer Company | Dynamic fixed pattern noise calibrations |
US20240103559A1 (en) * | 2022-09-28 | 2024-03-28 | Delphi Technologies Ip Limited | Systems and methods for oscillator calibrator for inverter for electric vehicle |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6346077A (ja) * | 1986-08-13 | 1988-02-26 | Hitachi Ltd | 撮像装置の暗電流除去方式 |
JPH0269691A (ja) * | 1988-09-05 | 1990-03-08 | Toshiba Corp | X線ct用放射線検出器 |
JPH02147923A (ja) * | 1988-11-30 | 1990-06-06 | Hitachi Ltd | 光検出回路 |
JPH05234120A (ja) * | 1992-02-19 | 1993-09-10 | Ricoh Co Ltd | 光ディスク装置の受光素子回路 |
DE4439759C1 (de) * | 1994-11-07 | 1996-02-01 | Siemens Ag | Photodiodenarray |
JP3893181B2 (ja) * | 1996-02-26 | 2007-03-14 | キヤノン株式会社 | 放射線撮像装置及び該装置の駆動方法 |
US5784178A (en) * | 1996-03-06 | 1998-07-21 | Dyna Image Corporation | High performance contact image sensor |
JPH10115551A (ja) * | 1996-08-19 | 1998-05-06 | Hamamatsu Photonics Kk | 光検出装置および固体撮像装置 |
JP2000111649A (ja) * | 1998-10-02 | 2000-04-21 | Toshiba Corp | 放射線検出システム |
JP5329732B2 (ja) | 2000-02-02 | 2013-10-30 | コーニンクレッカ フィリップス エヌ ヴェ | センサ及びセンサの動作方法 |
US7068312B2 (en) * | 2000-02-10 | 2006-06-27 | Minolta Co., Ltd. | Solid-state image-sensing device |
JP4829426B2 (ja) * | 2001-06-05 | 2011-12-07 | キヤノン株式会社 | 放射線撮像装置及び方法、並びに記録媒体及びプログラム |
US7483515B2 (en) | 2003-06-05 | 2009-01-27 | Koninklijke Philips Electronics N.V. | Detector for the detection of X-radiation |
JP2005287661A (ja) * | 2004-03-31 | 2005-10-20 | Shimadzu Corp | 放射線撮像装置 |
US7773139B2 (en) | 2004-04-16 | 2010-08-10 | Apple Inc. | Image sensor with photosensitive thin film transistors |
US7122803B2 (en) * | 2005-02-16 | 2006-10-17 | Hologic, Inc. | Amorphous selenium flat panel x-ray imager for tomosynthesis and static imaging |
-
2007
- 2007-09-17 CN CN2007800354729A patent/CN101518056B/zh not_active Expired - Fee Related
- 2007-09-17 EP EP07826409A patent/EP2070313B1/de not_active Not-in-force
- 2007-09-17 WO PCT/IB2007/053747 patent/WO2008038177A1/en active Application Filing
- 2007-09-17 JP JP2009528831A patent/JP5458260B2/ja active Active
- 2007-09-17 US US12/441,593 patent/US8154631B2/en not_active Expired - Fee Related
- 2007-09-17 AT AT07826409T patent/ATE556537T1/de active
Also Published As
Publication number | Publication date |
---|---|
WO2008038177A1 (en) | 2008-04-03 |
EP2070313A1 (de) | 2009-06-17 |
US20090290050A1 (en) | 2009-11-26 |
CN101518056B (zh) | 2012-11-14 |
CN101518056A (zh) | 2009-08-26 |
EP2070313B1 (de) | 2012-05-02 |
JP2010504518A (ja) | 2010-02-12 |
JP5458260B2 (ja) | 2014-04-02 |
US8154631B2 (en) | 2012-04-10 |
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