ATE540093T1 - Zusammensetzung für das chemisch-mechanische polieren und verwendung - Google Patents
Zusammensetzung für das chemisch-mechanische polieren und verwendungInfo
- Publication number
- ATE540093T1 ATE540093T1 AT05725517T AT05725517T ATE540093T1 AT E540093 T1 ATE540093 T1 AT E540093T1 AT 05725517 T AT05725517 T AT 05725517T AT 05725517 T AT05725517 T AT 05725517T AT E540093 T1 ATE540093 T1 AT E540093T1
- Authority
- AT
- Austria
- Prior art keywords
- alumina
- chemical
- mechanical polishing
- mixtures
- composition
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01F—COMPOUNDS OF THE METALS BERYLLIUM, MAGNESIUM, ALUMINIUM, CALCIUM, STRONTIUM, BARIUM, RADIUM, THORIUM, OR OF THE RARE-EARTH METALS
- C01F7/00—Compounds of aluminium
- C01F7/02—Aluminium oxide; Aluminium hydroxide; Aluminates
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/807,944 US20050211950A1 (en) | 2004-03-24 | 2004-03-24 | Chemical-mechanical polishing composition and method for using the same |
PCT/US2005/008411 WO2005100496A2 (en) | 2004-03-24 | 2005-03-14 | Chemical-mechanical polishing composition and method for using the same |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE540093T1 true ATE540093T1 (de) | 2012-01-15 |
Family
ID=34962673
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT05725517T ATE540093T1 (de) | 2004-03-24 | 2005-03-14 | Zusammensetzung für das chemisch-mechanische polieren und verwendung |
Country Status (11)
Country | Link |
---|---|
US (2) | US20050211950A1 (de) |
EP (1) | EP1730246B1 (de) |
JP (2) | JP2007531274A (de) |
KR (1) | KR101082154B1 (de) |
CN (1) | CN1938392B (de) |
AT (1) | ATE540093T1 (de) |
IL (2) | IL176669A0 (de) |
MY (1) | MY146598A (de) |
SG (1) | SG150494A1 (de) |
TW (1) | TWI299747B (de) |
WO (1) | WO2005100496A2 (de) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7247567B2 (en) * | 2004-06-16 | 2007-07-24 | Cabot Microelectronics Corporation | Method of polishing a tungsten-containing substrate |
JP4814502B2 (ja) * | 2004-09-09 | 2011-11-16 | 株式会社フジミインコーポレーテッド | 研磨用組成物及びそれを用いた研磨方法 |
US20060108325A1 (en) * | 2004-11-19 | 2006-05-25 | Everson William J | Polishing process for producing damage free surfaces on semi-insulating silicon carbide wafers |
US7955519B2 (en) * | 2005-09-30 | 2011-06-07 | Cabot Microelectronics Corporation | Composition and method for planarizing surfaces |
US7998866B2 (en) * | 2006-09-05 | 2011-08-16 | Cabot Microelectronics Corporation | Silicon carbide polishing method utilizing water-soluble oxidizers |
US20080105652A1 (en) * | 2006-11-02 | 2008-05-08 | Cabot Microelectronics Corporation | CMP of copper/ruthenium/tantalum substrates |
WO2008142093A1 (en) | 2007-05-24 | 2008-11-27 | Basf Se | Chemical-mechanical polishing composition comprising metal-organic framework materials |
US8425797B2 (en) * | 2008-03-21 | 2013-04-23 | Cabot Microelectronics Corporation | Compositions for polishing aluminum/copper and titanium in damascene structures |
CN102113096A (zh) * | 2008-08-06 | 2011-06-29 | 日立化成工业株式会社 | 化学机械研磨用研磨液以及使用了该研磨液的基板的研磨方法 |
KR101492969B1 (ko) * | 2008-11-14 | 2015-02-16 | 일진다이아몬드(주) | 고경도 피복 분말 및 그 제조 방법 |
TWI454562B (zh) * | 2009-07-16 | 2014-10-01 | Hitachi Chemical Co Ltd | 鈀研磨用cmp研磨液以及研磨方法 |
US9799532B2 (en) * | 2010-02-15 | 2017-10-24 | Hitachi Chemical Company, Ltd. | CMP polishing solution and polishing method |
CN102212334B (zh) * | 2011-04-19 | 2013-06-26 | 浙江露笑光电有限公司 | 蓝宝石衬底片粗磨研磨液及其配制方法 |
CN102699811B (zh) * | 2012-05-29 | 2015-07-29 | 上海瑞钼特金属新材料有限公司 | 表面高光洁度的难熔金属合金箔片零件及其制备方法 |
US9604339B2 (en) | 2012-10-29 | 2017-03-28 | Wayne O. Duescher | Vacuum-grooved membrane wafer polishing workholder |
US8998677B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Bellows driven floatation-type abrading workholder |
US9233452B2 (en) | 2012-10-29 | 2016-01-12 | Wayne O. Duescher | Vacuum-grooved membrane abrasive polishing wafer workholder |
US9011207B2 (en) | 2012-10-29 | 2015-04-21 | Wayne O. Duescher | Flexible diaphragm combination floating and rigid abrading workholder |
US8998678B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Spider arm driven flexible chamber abrading workholder |
US8845394B2 (en) | 2012-10-29 | 2014-09-30 | Wayne O. Duescher | Bellows driven air floatation abrading workholder |
US9199354B2 (en) | 2012-10-29 | 2015-12-01 | Wayne O. Duescher | Flexible diaphragm post-type floating and rigid abrading workholder |
US9039488B2 (en) | 2012-10-29 | 2015-05-26 | Wayne O. Duescher | Pin driven flexible chamber abrading workholder |
US8920667B2 (en) * | 2013-01-30 | 2014-12-30 | Cabot Microelectronics Corporation | Chemical-mechanical polishing composition containing zirconia and metal oxidizer |
CN103254799A (zh) * | 2013-05-29 | 2013-08-21 | 陈玉祥 | 一种亲水金刚石悬浮研磨抛光液及其制备方法 |
US9434859B2 (en) * | 2013-09-24 | 2016-09-06 | Cabot Microelectronics Corporation | Chemical-mechanical planarization of polymer films |
SG11201602877RA (en) | 2013-10-18 | 2016-05-30 | Cabot Microelectronics Corp | Polishing composition and method for nickel-phosphorous coated memory disks |
CN104592935B (zh) * | 2015-01-04 | 2016-04-27 | 江苏中晶科技有限公司 | 硬质材料研磨用加速剂 |
US10926378B2 (en) | 2017-07-08 | 2021-02-23 | Wayne O. Duescher | Abrasive coated disk islands using magnetic font sheet |
US11286403B2 (en) | 2018-07-20 | 2022-03-29 | Dongjin Semichem Co., Ltd | Chemical mechanical polishing composition, chemical mechanical polishing slurry and method for polishing substrate |
EP3894497A4 (de) * | 2018-12-10 | 2022-09-14 | CMC Materials, Inc. | Oxidationsmittelfreie aufschlämmung für ruthenium-cmp |
US11691241B1 (en) * | 2019-08-05 | 2023-07-04 | Keltech Engineering, Inc. | Abrasive lapping head with floating and rigid workpiece carrier |
CN111421391A (zh) * | 2020-03-09 | 2020-07-17 | 大连理工大学 | 一种单晶金刚石晶片的双面化学机械抛光方法 |
CN115926748A (zh) * | 2022-12-21 | 2023-04-07 | 广东红日星实业有限公司 | 一种研磨液及其制备方法和应用 |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01257563A (ja) * | 1988-04-08 | 1989-10-13 | Showa Denko Kk | アルミニウム磁気ディスク研磨用組成物 |
US4959113C1 (en) * | 1989-07-31 | 2001-03-13 | Rodel Inc | Method and composition for polishing metal surfaces |
US5693239A (en) * | 1995-10-10 | 1997-12-02 | Rodel, Inc. | Polishing slurries comprising two abrasive components and methods for their use |
US6110396A (en) * | 1996-11-27 | 2000-08-29 | International Business Machines Corporation | Dual-valent rare earth additives to polishing slurries |
US20030077221A1 (en) * | 2001-10-01 | 2003-04-24 | Shivkumar Chiruvolu | Aluminum oxide powders |
US6099604A (en) * | 1997-08-21 | 2000-08-08 | Micron Technology, Inc. | Slurry with chelating agent for chemical-mechanical polishing of a semiconductor wafer and methods related thereto |
JPH1180708A (ja) * | 1997-09-09 | 1999-03-26 | Fujimi Inkooporeetetsudo:Kk | 研磨用組成物 |
US6432828B2 (en) * | 1998-03-18 | 2002-08-13 | Cabot Microelectronics Corporation | Chemical mechanical polishing slurry useful for copper substrates |
US5972124A (en) | 1998-08-31 | 1999-10-26 | Advanced Micro Devices, Inc. | Method for cleaning a surface of a dielectric material |
JP2000212776A (ja) * | 1999-01-18 | 2000-08-02 | Jsr Corp | 化学機械研磨用水系分散体 |
US6443812B1 (en) * | 1999-08-24 | 2002-09-03 | Rodel Holdings Inc. | Compositions for insulator and metal CMP and methods relating thereto |
US20030006396A1 (en) * | 1999-12-14 | 2003-01-09 | Hongyu Wang | Polishing composition for CMP having abrasive particles |
US20020039839A1 (en) * | 1999-12-14 | 2002-04-04 | Thomas Terence M. | Polishing compositions for noble metals |
KR20020070319A (ko) * | 1999-12-14 | 2002-09-05 | 로델 홀딩스 인코포레이티드 | 반도체 기판용 연마 조성물 |
JP2001187876A (ja) * | 1999-12-28 | 2001-07-10 | Nec Corp | 化学的機械的研磨用スラリー |
JP2001210640A (ja) | 2000-01-27 | 2001-08-03 | Inst Of Physical & Chemical Res | 半導体の保護膜の形成方法 |
JP2001308042A (ja) * | 2000-04-26 | 2001-11-02 | Okamoto Machine Tool Works Ltd | 基板用研磨剤スラリ− |
US6468913B1 (en) * | 2000-07-08 | 2002-10-22 | Arch Specialty Chemicals, Inc. | Ready-to-use stable chemical-mechanical polishing slurries |
DE10048477B4 (de) | 2000-09-29 | 2008-07-03 | Qimonda Ag | Verfahren zum chemisch-mechanischen Polieren von Schichten aus Metallen der Platingruppe |
US6649523B2 (en) * | 2000-09-29 | 2003-11-18 | Nutool, Inc. | Method and system to provide material removal and planarization employing a reactive pad |
JP4153657B2 (ja) * | 2000-11-21 | 2008-09-24 | 富士フイルム株式会社 | 磁気記録媒体 |
EP1211024A3 (de) * | 2000-11-30 | 2004-01-02 | JSR Corporation | Polierverfahren |
JP2004526308A (ja) * | 2001-01-16 | 2004-08-26 | キャボット マイクロエレクトロニクス コーポレイション | シュウ酸アンモニウムを含有する研磨系及び方法 |
JP2002231666A (ja) * | 2001-01-31 | 2002-08-16 | Fujimi Inc | 研磨用組成物およびそれを用いた研磨方法 |
US6812193B2 (en) * | 2001-08-31 | 2004-11-02 | International Business Machines Corporation | Slurry for mechanical polishing (CMP) of metals and use thereof |
US6884723B2 (en) * | 2001-12-21 | 2005-04-26 | Micron Technology, Inc. | Methods for planarization of group VIII metal-containing surfaces using complexing agents |
US6730592B2 (en) * | 2001-12-21 | 2004-05-04 | Micron Technology, Inc. | Methods for planarization of metal-containing surfaces using halogens and halide salts |
US20030162398A1 (en) * | 2002-02-11 | 2003-08-28 | Small Robert J. | Catalytic composition for chemical-mechanical polishing, method of using same, and substrate treated with same |
KR20040000009A (ko) * | 2002-06-19 | 2004-01-03 | 주식회사 하이닉스반도체 | 플라티늄-cmp용 용액 |
US20040029494A1 (en) * | 2002-08-09 | 2004-02-12 | Souvik Banerjee | Post-CMP cleaning of semiconductor wafer surfaces using a combination of aqueous and CO2 based cryogenic cleaning techniques |
WO2005019364A1 (en) * | 2003-08-14 | 2005-03-03 | Ekc Technology, Inc. | Periodic acid compositions for polishing ruthenium/high k substrates |
-
2004
- 2004-03-24 US US10/807,944 patent/US20050211950A1/en not_active Abandoned
-
2005
- 2005-03-01 TW TW094105987A patent/TWI299747B/zh not_active IP Right Cessation
- 2005-03-14 CN CN2005800096376A patent/CN1938392B/zh not_active Expired - Fee Related
- 2005-03-14 JP JP2007505001A patent/JP2007531274A/ja not_active Withdrawn
- 2005-03-14 AT AT05725517T patent/ATE540093T1/de active
- 2005-03-14 SG SG200900786-5A patent/SG150494A1/en unknown
- 2005-03-14 WO PCT/US2005/008411 patent/WO2005100496A2/en active Application Filing
- 2005-03-14 EP EP05725517A patent/EP1730246B1/de not_active Not-in-force
- 2005-03-22 MY MYPI20051241A patent/MY146598A/en unknown
-
2006
- 2006-07-02 IL IL176669A patent/IL176669A0/en not_active IP Right Cessation
- 2006-09-22 KR KR1020067019562A patent/KR101082154B1/ko active IP Right Grant
-
2009
- 2009-02-26 US US12/393,489 patent/US8101093B2/en not_active Expired - Fee Related
-
2011
- 2011-12-02 JP JP2011264253A patent/JP5781906B2/ja not_active Expired - Fee Related
-
2012
- 2012-04-30 IL IL219496A patent/IL219496A/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI299747B (en) | 2008-08-11 |
KR20060134996A (ko) | 2006-12-28 |
TW200540240A (en) | 2005-12-16 |
JP2007531274A (ja) | 2007-11-01 |
US8101093B2 (en) | 2012-01-24 |
WO2005100496A3 (en) | 2005-12-29 |
IL219496A (en) | 2013-04-30 |
KR101082154B1 (ko) | 2011-11-09 |
EP1730246B1 (de) | 2012-01-04 |
IL219496A0 (en) | 2012-06-28 |
JP5781906B2 (ja) | 2015-09-24 |
SG150494A1 (en) | 2009-03-30 |
MY146598A (en) | 2012-08-30 |
US20090152240A1 (en) | 2009-06-18 |
CN1938392A (zh) | 2007-03-28 |
IL176669A0 (en) | 2006-10-31 |
CN1938392B (zh) | 2010-09-01 |
JP2012049570A (ja) | 2012-03-08 |
EP1730246A2 (de) | 2006-12-13 |
WO2005100496A2 (en) | 2005-10-27 |
US20050211950A1 (en) | 2005-09-29 |
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