ATE533030T1 - Sensorgerät - Google Patents

Sensorgerät

Info

Publication number
ATE533030T1
ATE533030T1 AT10151727T AT10151727T ATE533030T1 AT E533030 T1 ATE533030 T1 AT E533030T1 AT 10151727 T AT10151727 T AT 10151727T AT 10151727 T AT10151727 T AT 10151727T AT E533030 T1 ATE533030 T1 AT E533030T1
Authority
AT
Austria
Prior art keywords
failure diagnosis
section
circuit
diagnosis object
output terminal
Prior art date
Application number
AT10151727T
Other languages
English (en)
Inventor
Takeshi Uemura
Original Assignee
Panasonic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp filed Critical Panasonic Corp
Application granted granted Critical
Publication of ATE533030T1 publication Critical patent/ATE533030T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G01D21/02—Measuring two or more variables by means not covered by a single other subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Gyroscopes (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
AT10151727T 2009-02-05 2010-01-27 Sensorgerät ATE533030T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009024664A JP4386143B1 (ja) 2009-02-05 2009-02-05 センサ装置

Publications (1)

Publication Number Publication Date
ATE533030T1 true ATE533030T1 (de) 2011-11-15

Family

ID=41549805

Family Applications (1)

Application Number Title Priority Date Filing Date
AT10151727T ATE533030T1 (de) 2009-02-05 2010-01-27 Sensorgerät

Country Status (6)

Country Link
US (1) US8131507B2 (de)
EP (1) EP2216626B1 (de)
JP (1) JP4386143B1 (de)
KR (1) KR100972506B1 (de)
CN (1) CN101819049B (de)
AT (1) ATE533030T1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4337952B1 (ja) * 2009-02-05 2009-09-30 パナソニック株式会社 センサ装置
US8131508B2 (en) * 2009-02-05 2012-03-06 Panasonic Corporation Sensor apparatus
CN102981112B (zh) * 2011-09-05 2015-04-22 北京动力源科技股份有限公司 一种故障检测方法、装置及电路
JP5892012B2 (ja) * 2012-09-11 2016-03-23 日本精工株式会社 車載電子制御装置
CN103930757B (zh) * 2012-10-23 2015-07-08 日本精工株式会社 转矩检测装置、电动助力转向装置和车辆
JP5545380B1 (ja) * 2013-01-28 2014-07-09 株式会社安川電機 ロボットシステム
US9863786B2 (en) 2013-07-17 2018-01-09 Infineon Technologies Ag Sensor with interface for functional safety
DE102014109956B4 (de) * 2013-07-17 2020-09-10 Infineon Technologies Ag Sensor mit Schnittstelle für Funktionssicherheit
US10379530B2 (en) * 2016-11-04 2019-08-13 Infineon Technologies Ag Signal protocol fault detection system and method
JP6570791B2 (ja) * 2017-04-26 2019-09-04 三菱電機株式会社 処理装置
JP7009549B2 (ja) * 2020-04-24 2022-01-25 住友理工株式会社 安全機能を有する静電容量型近接検出装置

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5636093B2 (de) * 1973-03-16 1981-08-21
US4337516A (en) * 1980-06-26 1982-06-29 United Technologies Corporation Sensor fault detection by activity monitoring
US4376298A (en) * 1980-08-06 1983-03-08 Dickey-John Corporation Combine data center
US4402054A (en) * 1980-10-15 1983-08-30 Westinghouse Electric Corp. Method and apparatus for the automatic diagnosis of system malfunctions
JPS59113893A (ja) 1982-12-21 1984-06-30 Nippon Carbide Ind Co Ltd アラニンの新規な生産方法
JPH0239167U (de) * 1988-09-09 1990-03-15
JPH0769201B2 (ja) 1990-10-26 1995-07-26 川崎重工業株式会社 機体運動センサの故障検出及び特定する方法並びに装置
US5408412A (en) * 1992-04-09 1995-04-18 United Technologies Corporation Engine fault diagnostic system
JP3190733B2 (ja) 1992-07-23 2001-07-23 株式会社東芝 伝送器システム
US5586130A (en) 1994-10-03 1996-12-17 Qualcomm Incorporated Method and apparatus for detecting fault conditions in a vehicle data recording device to detect tampering or unauthorized access
JP3430711B2 (ja) 1995-05-30 2003-07-28 松下電器産業株式会社 角速度センサ
JP3447860B2 (ja) * 1995-09-18 2003-09-16 株式会社ミクニ 故障判定機能を有する磁気式位置センサ
JP2001074503A (ja) 1999-09-07 2001-03-23 Hitachi Ltd エンコーダ及びモータ駆動装置
JP3801516B2 (ja) 2002-02-26 2006-07-26 三菱重工業株式会社 車両用空調システム、及び車両用空調システムの故障情報検出方法
JP2004301512A (ja) 2003-03-28 2004-10-28 Denso Corp 角速度センサ装置
JP4248998B2 (ja) 2003-11-18 2009-04-02 ナイルス株式会社 エンコーダ
EP1854645B1 (de) 2005-02-22 2012-01-11 Bridgestone Corporation Vorrichtung und verfahren zur beurteilung von sensorabnormalitäten
JP4056532B2 (ja) * 2005-03-31 2008-03-05 日本航空電子工業株式会社 故障診断機能付きｍｅｍｓデバイス
DE112006001925T5 (de) * 2005-07-19 2008-05-21 Kabushiki Kaisha Yaskawa Denki, Kitakyushu Codierer, der eine Anomaliedetektionsvorrichtung und ein zugehöriges Steuersystem enthält
JP5147097B2 (ja) * 2006-05-09 2013-02-20 東京エレクトロン株式会社 サーバ装置、およびプログラム
DE102006023213B3 (de) 2006-05-17 2007-09-27 Siemens Ag Betriebsverfahren für einen Geber und eine mit dem Geber kommunizierende Steuereinrichtung
US7855562B2 (en) * 2007-11-19 2010-12-21 Freescale Semiconductor, Inc. Dual sensor system having fault detection capability

Also Published As

Publication number Publication date
US20100198557A1 (en) 2010-08-05
US8131507B2 (en) 2012-03-06
KR100972506B1 (ko) 2010-07-26
CN101819049A (zh) 2010-09-01
CN101819049B (zh) 2012-09-26
JP2010181260A (ja) 2010-08-19
EP2216626A1 (de) 2010-08-11
JP4386143B1 (ja) 2009-12-16
EP2216626B1 (de) 2011-11-09

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