ATE496275T1 - Instrument und verfahren zur oberflächenstrukturmessung - Google Patents

Instrument und verfahren zur oberflächenstrukturmessung

Info

Publication number
ATE496275T1
ATE496275T1 AT09166419T AT09166419T ATE496275T1 AT E496275 T1 ATE496275 T1 AT E496275T1 AT 09166419 T AT09166419 T AT 09166419T AT 09166419 T AT09166419 T AT 09166419T AT E496275 T1 ATE496275 T1 AT E496275T1
Authority
AT
Austria
Prior art keywords
workpiece
measurement
controller
inclination angle
detector
Prior art date
Application number
AT09166419T
Other languages
English (en)
Inventor
Toshihiro Kanematsu
Hideki Mishima
Nobuyuki Hama
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Application granted granted Critical
Publication of ATE496275T1 publication Critical patent/ATE496275T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Coating With Molten Metal (AREA)
AT09166419T 2008-07-28 2009-07-27 Instrument und verfahren zur oberflächenstrukturmessung ATE496275T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008193884A JP5270246B2 (ja) 2008-07-28 2008-07-28 表面性状測定機および測定方法

Publications (1)

Publication Number Publication Date
ATE496275T1 true ATE496275T1 (de) 2011-02-15

Family

ID=41170948

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09166419T ATE496275T1 (de) 2008-07-28 2009-07-27 Instrument und verfahren zur oberflächenstrukturmessung

Country Status (5)

Country Link
US (1) US8276435B2 (de)
EP (1) EP2149774B1 (de)
JP (1) JP5270246B2 (de)
AT (1) ATE496275T1 (de)
DE (1) DE602009000618D1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7874079B2 (en) * 2007-02-06 2011-01-25 National Optronics, Inc. Holding mechanism for use with an ophthalmic tracer, and method
US8047069B2 (en) * 2009-05-26 2011-11-01 E.I. Du Pont De Nemours And Company Apparatus for determining cut resistance
TWM477342U (zh) * 2013-09-25 2014-05-01 China Steel Corp 加工機台之量測裝置
TWI558978B (zh) * 2015-06-24 2016-11-21 智泰科技股份有限公司 真圓度量測裝置及真圓度量測方法
CN106017250A (zh) * 2016-06-23 2016-10-12 山东钢铁股份有限公司 一种大型结构件的高精度测量仪器
JP6777589B2 (ja) * 2017-05-24 2020-10-28 株式会社ミツトヨ 表面性状測定装置
JP7384675B2 (ja) * 2020-01-15 2023-11-21 株式会社ディスコ 傾き調整機構
US11555693B2 (en) 2020-05-12 2023-01-17 The Boeing Company Measurement of surface profiles using unmanned aerial vehicles
CN114413729B (zh) * 2021-12-22 2024-07-19 浙江零跑科技股份有限公司 一种车辆金属装饰亮条检具
CN114608424B (zh) * 2022-03-19 2023-03-24 南昌航空大学 一种地下建筑工程平整度检测仪
CN120043945B (zh) * 2025-03-14 2025-08-12 镇江市镇特合金材料有限公司 一种电镀锌导电辊检测装置及方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3769350D1 (de) * 1986-03-04 1991-05-23 Rank Taylor Hobson Ltd Positionskontrolle eines zu bearbeitenden werkstuecks.
JPH0419461Y2 (de) * 1987-04-06 1992-05-01
JP2607952B2 (ja) * 1989-03-23 1997-05-07 株式会社 ミツトヨ 表面粗さ測定装置
JPH0830743B2 (ja) * 1991-03-07 1996-03-27 株式会社ミツトヨ レベリング装置
JP3064184B2 (ja) * 1994-07-12 2000-07-12 株式会社ミツトヨ 形状測定機
JPH0886631A (ja) * 1994-07-22 1996-04-02 Toray Ind Inc 物体の姿勢測定装置、姿勢測定方法、姿勢制御装置および物体表面の検査装置
JP3482362B2 (ja) * 1999-01-12 2003-12-22 株式会社ミツトヨ 表面性状測定機、表面性状測定機用の傾斜調整装置および表面性状測定機における測定対象物の姿勢調整方法
US6745616B1 (en) * 1999-10-21 2004-06-08 Mitutoyo Corporation Surface texture measuring machine, leveling device for surface texture measuring machine and orientation-adjusting method of workpiece of surface texture measuring machine
TW550375B (en) * 2001-09-07 2003-09-01 Olympus Optical Co Apparatus for measuring a surface profile
EP1703252A1 (de) * 2005-03-07 2006-09-20 Mitutoyo Corporation Verfahren und Computerprogramm zum Nivellieren eines Werkstücks
JP5441302B2 (ja) * 2006-11-28 2014-03-12 キヤノン株式会社 形状測定装置

Also Published As

Publication number Publication date
EP2149774B1 (de) 2011-01-19
US8276435B2 (en) 2012-10-02
DE602009000618D1 (de) 2011-03-03
JP2010032322A (ja) 2010-02-12
EP2149774A1 (de) 2010-02-03
JP5270246B2 (ja) 2013-08-21
US20100018298A1 (en) 2010-01-28

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Legal Events

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