ATE464535T1 - Stereoskopisches dreidimensionales metrologiesystem und -verfahren - Google Patents

Stereoskopisches dreidimensionales metrologiesystem und -verfahren

Info

Publication number
ATE464535T1
ATE464535T1 AT02806181T AT02806181T ATE464535T1 AT E464535 T1 ATE464535 T1 AT E464535T1 AT 02806181 T AT02806181 T AT 02806181T AT 02806181 T AT02806181 T AT 02806181T AT E464535 T1 ATE464535 T1 AT E464535T1
Authority
AT
Austria
Prior art keywords
test article
stereoscopic
metrology system
feature
dimensional metrology
Prior art date
Application number
AT02806181T
Other languages
English (en)
Inventor
Donald Snow
John Strom
Raymond Kraft
Original Assignee
Rudolph Technologies Inc
Mariner Acquisition Company Ll
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rudolph Technologies Inc, Mariner Acquisition Company Ll filed Critical Rudolph Technologies Inc
Application granted granted Critical
Publication of ATE464535T1 publication Critical patent/ATE464535T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/0015—Orientation; Alignment; Positioning

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Multimedia (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
AT02806181T 2001-12-28 2002-12-18 Stereoskopisches dreidimensionales metrologiesystem und -verfahren ATE464535T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US34644701P 2001-12-28 2001-12-28
PCT/US2002/040610 WO2003058158A2 (en) 2001-12-28 2002-12-18 Stereoscopic three-dimensional metrology system and method

Publications (1)

Publication Number Publication Date
ATE464535T1 true ATE464535T1 (de) 2010-04-15

Family

ID=23359434

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02806181T ATE464535T1 (de) 2001-12-28 2002-12-18 Stereoskopisches dreidimensionales metrologiesystem und -verfahren

Country Status (7)

Country Link
US (2) US7231081B2 (de)
EP (1) EP1466137B1 (de)
JP (2) JP4896373B2 (de)
AT (1) ATE464535T1 (de)
AU (1) AU2002357335A1 (de)
DE (1) DE60236019D1 (de)
WO (1) WO2003058158A2 (de)

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Also Published As

Publication number Publication date
EP1466137B1 (de) 2010-04-14
JP2005514606A (ja) 2005-05-19
EP1466137A2 (de) 2004-10-13
US20030142862A1 (en) 2003-07-31
DE60236019D1 (de) 2010-05-27
JP2010038923A (ja) 2010-02-18
JP4896373B2 (ja) 2012-03-14
WO2003058158A2 (en) 2003-07-17
US7634128B2 (en) 2009-12-15
US20070269103A1 (en) 2007-11-22
EP1466137A4 (de) 2005-03-23
WO2003058158A3 (en) 2003-09-18
US7231081B2 (en) 2007-06-12
AU2002357335A8 (en) 2003-07-24
AU2002357335A1 (en) 2003-07-24

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