ATE463828T1 - Hoch q-faktor induktivität mit im substrat vergrabenen faraday-schirm und dielektrischer wanne - Google Patents

Hoch q-faktor induktivität mit im substrat vergrabenen faraday-schirm und dielektrischer wanne

Info

Publication number
ATE463828T1
ATE463828T1 AT02711020T AT02711020T ATE463828T1 AT E463828 T1 ATE463828 T1 AT E463828T1 AT 02711020 T AT02711020 T AT 02711020T AT 02711020 T AT02711020 T AT 02711020T AT E463828 T1 ATE463828 T1 AT E463828T1
Authority
AT
Austria
Prior art keywords
substrate
faraday shield
dielectric
inductivity
tub
Prior art date
Application number
AT02711020T
Other languages
English (en)
Inventor
Raul Acosta
Jennifer Lund
Robert Groves
Joanna Rosner
Steven Cordes
Melanie Carasso
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of ATE463828T1 publication Critical patent/ATE463828T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F17/00Fixed inductances of the signal type 
    • H01F17/0006Printed inductances
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00Details of transformers or inductances, in general
    • H01F27/34Special means for preventing or reducing unwanted electric or magnetic effects, e.g. no-load losses, reactive currents, harmonics, oscillations, leakage fields
    • H01F27/36Electric or magnetic shields or screens
    • H01F27/363Electric or magnetic shields or screens made of electrically conductive material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00Details of transformers or inductances, in general
    • H01F27/34Special means for preventing or reducing unwanted electric or magnetic effects, e.g. no-load losses, reactive currents, harmonics, oscillations, leakage fields
    • H01F27/36Electric or magnetic shields or screens

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Manufacturing Cores, Coils, And Magnets (AREA)
  • Coils Or Transformers For Communication (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Inorganic Insulating Materials (AREA)
  • Element Separation (AREA)
AT02711020T 2001-02-10 2002-02-07 Hoch q-faktor induktivität mit im substrat vergrabenen faraday-schirm und dielektrischer wanne ATE463828T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/781,014 US6534843B2 (en) 2001-02-10 2001-02-10 High Q inductor with faraday shield and dielectric well buried in substrate
PCT/GB2002/000525 WO2002065490A1 (en) 2001-02-10 2002-02-07 High q inductor with faraday shield and dielectric well buried in substrate

Publications (1)

Publication Number Publication Date
ATE463828T1 true ATE463828T1 (de) 2010-04-15

Family

ID=25121395

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02711020T ATE463828T1 (de) 2001-02-10 2002-02-07 Hoch q-faktor induktivität mit im substrat vergrabenen faraday-schirm und dielektrischer wanne

Country Status (9)

Country Link
US (2) US6534843B2 (de)
EP (1) EP1358661B1 (de)
JP (1) JP3777159B2 (de)
KR (1) KR100522655B1 (de)
CN (1) CN1295717C (de)
AT (1) ATE463828T1 (de)
DE (1) DE60235872D1 (de)
TW (1) TW548798B (de)
WO (1) WO2002065490A1 (de)

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US8492872B2 (en) * 2007-10-05 2013-07-23 Taiwan Semiconductor Manufacturing Co., Ltd. On-chip inductors with through-silicon-via fence for Q improvement
US8169050B2 (en) * 2008-06-26 2012-05-01 International Business Machines Corporation BEOL wiring structures that include an on-chip inductor and an on-chip capacitor, and design structures for a radiofrequency integrated circuit
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US8164159B1 (en) 2009-07-18 2012-04-24 Intergrated Device Technologies, inc. Semiconductor resonators with electromagnetic and environmental shielding and methods of forming same
EP2302675A1 (de) * 2009-09-29 2011-03-30 STMicroelectronics (Grenoble 2) SAS Elektronische Schaltung mit einem Induktor
JP6009139B2 (ja) * 2010-06-22 2016-10-19 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
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US8644948B2 (en) 2011-10-28 2014-02-04 Medtronic, Inc. Converter device for communicating with multiple medical devices
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US9355972B2 (en) 2014-03-04 2016-05-31 International Business Machines Corporation Method for making a dielectric region in a bulk silicon substrate providing a high-Q passive resonator
TWI615860B (zh) 2015-04-24 2018-02-21 瑞昱半導體股份有限公司 積體電感
CN105140288B (zh) * 2015-09-11 2018-05-01 电子科技大学 射频ldmos器件
US9966182B2 (en) 2015-11-16 2018-05-08 Globalfoundries Inc. Multi-frequency inductors with low-k dielectric area
CN106653568B (zh) * 2016-12-02 2019-04-16 昆山纳尔格信息科技有限公司 一种低干扰电感结构的制造方法
CN106783019B (zh) * 2016-12-02 2018-08-28 江苏贺鸿电子有限公司 一种低干扰电感结构
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WO2021081728A1 (zh) * 2019-10-29 2021-05-06 华为技术有限公司 一种半导体器件及其制造方法
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Also Published As

Publication number Publication date
TW548798B (en) 2003-08-21
US20020109204A1 (en) 2002-08-15
JP2004526311A (ja) 2004-08-26
KR20030074751A (ko) 2003-09-19
US20030096435A1 (en) 2003-05-22
CN1484838A (zh) 2004-03-24
EP1358661B1 (de) 2010-04-07
DE60235872D1 (de) 2010-05-20
US6534843B2 (en) 2003-03-18
KR100522655B1 (ko) 2005-10-19
WO2002065490A1 (en) 2002-08-22
EP1358661A1 (de) 2003-11-05
JP3777159B2 (ja) 2006-05-24
US6762088B2 (en) 2004-07-13
CN1295717C (zh) 2007-01-17

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