ATE446577T1 - Nichtflüchtiger speicher mit einer vorspannung auf der source-elektrode für hci-programmierung - Google Patents

Nichtflüchtiger speicher mit einer vorspannung auf der source-elektrode für hci-programmierung

Info

Publication number
ATE446577T1
ATE446577T1 AT04760554T AT04760554T ATE446577T1 AT E446577 T1 ATE446577 T1 AT E446577T1 AT 04760554 T AT04760554 T AT 04760554T AT 04760554 T AT04760554 T AT 04760554T AT E446577 T1 ATE446577 T1 AT E446577T1
Authority
AT
Austria
Prior art keywords
cells
programmed
programming
cell
threshold voltage
Prior art date
Application number
AT04760554T
Other languages
German (de)
English (en)
Inventor
Jon Choy
Gowrishankar Chindalore
Original Assignee
Freescale Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Freescale Semiconductor Inc filed Critical Freescale Semiconductor Inc
Application granted granted Critical
Publication of ATE446577T1 publication Critical patent/ATE446577T1/de

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
AT04760554T 2003-04-30 2004-04-16 Nichtflüchtiger speicher mit einer vorspannung auf der source-elektrode für hci-programmierung ATE446577T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/426,282 US6909638B2 (en) 2003-04-30 2003-04-30 Non-volatile memory having a bias on the source electrode for HCI programming
PCT/US2004/011870 WO2004100216A2 (en) 2003-04-30 2004-04-16 A non-volatile memory having a bias on the source electrode for hci programming

Publications (1)

Publication Number Publication Date
ATE446577T1 true ATE446577T1 (de) 2009-11-15

Family

ID=33309831

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04760554T ATE446577T1 (de) 2003-04-30 2004-04-16 Nichtflüchtiger speicher mit einer vorspannung auf der source-elektrode für hci-programmierung

Country Status (9)

Country Link
US (1) US6909638B2 (enExample)
EP (1) EP1623431B1 (enExample)
JP (1) JP4658039B2 (enExample)
KR (1) KR101060034B1 (enExample)
CN (1) CN1781157B (enExample)
AT (1) ATE446577T1 (enExample)
DE (1) DE602004023714D1 (enExample)
TW (1) TW200506939A (enExample)
WO (1) WO2004100216A2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7695843B2 (en) * 2004-02-13 2010-04-13 Microcell Corporation Microfibrous fuel cell assemblies comprising fiber-supported electrocatalyst layers, and methods of making same
US7227783B2 (en) 2005-04-28 2007-06-05 Freescale Semiconductor, Inc. Memory structure and method of programming
US7428172B2 (en) * 2006-07-17 2008-09-23 Freescale Semiconductor, Inc. Concurrent programming and program verification of floating gate transistor
US7583554B2 (en) 2007-03-02 2009-09-01 Freescale Semiconductor, Inc. Integrated circuit fuse array
US7787323B2 (en) * 2007-04-27 2010-08-31 Freescale Semiconductor, Inc. Level detect circuit
KR100965076B1 (ko) * 2008-11-14 2010-06-21 주식회사 하이닉스반도체 불휘발성 메모리 장치의 프로그램 방법
US7764550B2 (en) * 2008-11-25 2010-07-27 Freescale Semiconductor, Inc. Method of programming a non-volatile memory
US9312002B2 (en) 2014-04-04 2016-04-12 Sandisk Technologies Inc. Methods for programming ReRAM devices

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57150193A (en) * 1981-03-13 1982-09-16 Toshiba Corp Non-volatile semiconductor memory device
US4888735A (en) * 1987-12-30 1989-12-19 Elite Semiconductor & Systems Int'l., Inc. ROM cell and array configuration
US5218571A (en) * 1990-05-07 1993-06-08 Cypress Semiconductor Corporation EPROM source bias circuit with compensation for processing characteristics
US5923585A (en) * 1997-01-10 1999-07-13 Invox Technology Source biasing in non-volatile memory having row-based sectors
US5798966A (en) * 1997-03-31 1998-08-25 Intel Corporation Flash memory VDS compensation techiques to reduce programming variability
JP3920415B2 (ja) * 1997-03-31 2007-05-30 三洋電機株式会社 不揮発性半導体メモリ装置
US6046932A (en) 1999-08-13 2000-04-04 Advanced Micro Devices, Inc. Circuit implementation to quench bit line leakage current in programming and over-erase correction modes in flash EEPROM
US6275415B1 (en) 1999-10-12 2001-08-14 Advanced Micro Devices, Inc. Multiple byte channel hot electron programming using ramped gate and source bias voltage
IT1308855B1 (it) * 1999-10-29 2002-01-11 St Microelectronics Srl Metodo di riprogrammazione controllata per celle di memoria nonvolatile,in particolare di tipo flash eeprom ed eprom.
JP2001195890A (ja) * 2000-01-12 2001-07-19 Sharp Corp 不揮発性半導体メモリ装置の書込み方式および書込み回路
JP4559606B2 (ja) * 2000-09-28 2010-10-13 ルネサスエレクトロニクス株式会社 不揮発性半導体記憶装置
JP2003123493A (ja) * 2001-10-12 2003-04-25 Fujitsu Ltd ソース電位を制御してプログラム動作を最適化した不揮発性メモリ
JP3908957B2 (ja) * 2002-01-24 2007-04-25 シャープ株式会社 不揮発性半導体メモリ装置

Also Published As

Publication number Publication date
EP1623431B1 (en) 2009-10-21
TW200506939A (en) 2005-02-16
CN1781157A (zh) 2006-05-31
JP2006525622A (ja) 2006-11-09
WO2004100216A3 (en) 2005-01-06
KR101060034B1 (ko) 2011-08-29
WO2004100216A2 (en) 2004-11-18
JP4658039B2 (ja) 2011-03-23
US6909638B2 (en) 2005-06-21
EP1623431A2 (en) 2006-02-08
DE602004023714D1 (de) 2009-12-03
WO2004100216B1 (en) 2005-03-10
US20040218421A1 (en) 2004-11-04
EP1623431A4 (en) 2007-10-17
KR20060008942A (ko) 2006-01-27
CN1781157B (zh) 2012-02-29

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