ATE386945T1 - Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten - Google Patents

Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten

Info

Publication number
ATE386945T1
ATE386945T1 AT04736785T AT04736785T ATE386945T1 AT E386945 T1 ATE386945 T1 AT E386945T1 AT 04736785 T AT04736785 T AT 04736785T AT 04736785 T AT04736785 T AT 04736785T AT E386945 T1 ATE386945 T1 AT E386945T1
Authority
AT
Austria
Prior art keywords
sub
ref
reference voltage
deltau
self
Prior art date
Application number
AT04736785T
Other languages
English (en)
Inventor
Martin Kadner
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE386945T1 publication Critical patent/ATE386945T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16547—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies voltage or current in AC supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Control Of Electrical Variables (AREA)
  • Semiconductor Integrated Circuits (AREA)
AT04736785T 2003-06-25 2004-06-14 Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten ATE386945T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP03101869 2003-06-25

Publications (1)

Publication Number Publication Date
ATE386945T1 true ATE386945T1 (de) 2008-03-15

Family

ID=33522399

Family Applications (1)

Application Number Title Priority Date Filing Date
AT04736785T ATE386945T1 (de) 2003-06-25 2004-06-14 Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten

Country Status (7)

Country Link
US (1) US7183773B2 (de)
EP (1) EP1642143B1 (de)
JP (1) JP2007516414A (de)
CN (1) CN100430738C (de)
AT (1) ATE386945T1 (de)
DE (1) DE602004011938T2 (de)
WO (1) WO2004113938A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102435818A (zh) * 2011-11-24 2012-05-02 福州大学 高精度动态比较器的测试方法及测试电路
CN103837766B (zh) * 2013-10-30 2019-06-11 惠阳东美音响制品有限公司 一种连接电子组件的接点的自动搜寻方法
CN114113988B (zh) * 2021-12-03 2024-09-03 连云港杰瑞电子有限公司 一种信号丢失实时检测电路和方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH565468A5 (de) * 1973-01-31 1975-08-15 Bbc Brown Boveri & Cie
DE4439707A1 (de) * 1994-11-05 1996-05-09 Bosch Gmbh Robert Spannungsreferenz mit Prüfung und Eigenkalibrierung
US20030018937A1 (en) * 2001-07-18 2003-01-23 Athavale Atul S. Method and apparatus for efficient self-test of voltage and current level testing

Also Published As

Publication number Publication date
JP2007516414A (ja) 2007-06-21
WO2004113938A1 (en) 2004-12-29
DE602004011938T2 (de) 2009-02-26
EP1642143B1 (de) 2008-02-20
EP1642143A1 (de) 2006-04-05
US7183773B2 (en) 2007-02-27
DE602004011938D1 (de) 2008-04-03
CN1813196A (zh) 2006-08-02
CN100430738C (zh) 2008-11-05
US20060181282A1 (en) 2006-08-17

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Legal Events

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