DE602004011938D1 - Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten - Google Patents

Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten

Info

Publication number
DE602004011938D1
DE602004011938D1 DE602004011938T DE602004011938T DE602004011938D1 DE 602004011938 D1 DE602004011938 D1 DE 602004011938D1 DE 602004011938 T DE602004011938 T DE 602004011938T DE 602004011938 T DE602004011938 T DE 602004011938T DE 602004011938 D1 DE602004011938 D1 DE 602004011938D1
Authority
DE
Germany
Prior art keywords
sub
ref
reference voltage
deltau
self
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004011938T
Other languages
English (en)
Other versions
DE602004011938T2 (de
Inventor
Martin Kadner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
NXP BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NXP BV filed Critical NXP BV
Publication of DE602004011938D1 publication Critical patent/DE602004011938D1/de
Application granted granted Critical
Publication of DE602004011938T2 publication Critical patent/DE602004011938T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16547—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies voltage or current in AC supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control Of Electrical Variables (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE602004011938T 2003-06-25 2004-06-14 Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten Expired - Lifetime DE602004011938T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP03101869 2003-06-25
EP03101869 2003-06-25
PCT/IB2004/050897 WO2004113938A1 (en) 2003-06-25 2004-06-14 Method and circuit arrangement for the self-testing of a reference voltage in electronic components

Publications (2)

Publication Number Publication Date
DE602004011938D1 true DE602004011938D1 (de) 2008-04-03
DE602004011938T2 DE602004011938T2 (de) 2009-02-26

Family

ID=33522399

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004011938T Expired - Lifetime DE602004011938T2 (de) 2003-06-25 2004-06-14 Verfahren und schaltungsanordnung zum selbsttest einer referenzspannung in elektronischen komponenten

Country Status (7)

Country Link
US (1) US7183773B2 (de)
EP (1) EP1642143B1 (de)
JP (1) JP2007516414A (de)
CN (1) CN100430738C (de)
AT (1) ATE386945T1 (de)
DE (1) DE602004011938T2 (de)
WO (1) WO2004113938A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102435818A (zh) * 2011-11-24 2012-05-02 福州大学 高精度动态比较器的测试方法及测试电路
CN103837766B (zh) * 2013-10-30 2019-06-11 惠阳东美音响制品有限公司 一种连接电子组件的接点的自动搜寻方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH565468A5 (de) * 1973-01-31 1975-08-15 Bbc Brown Boveri & Cie
DE4439707A1 (de) * 1994-11-05 1996-05-09 Bosch Gmbh Robert Spannungsreferenz mit Prüfung und Eigenkalibrierung
US20030018937A1 (en) * 2001-07-18 2003-01-23 Athavale Atul S. Method and apparatus for efficient self-test of voltage and current level testing

Also Published As

Publication number Publication date
CN100430738C (zh) 2008-11-05
EP1642143B1 (de) 2008-02-20
ATE386945T1 (de) 2008-03-15
WO2004113938A1 (en) 2004-12-29
EP1642143A1 (de) 2006-04-05
US7183773B2 (en) 2007-02-27
JP2007516414A (ja) 2007-06-21
CN1813196A (zh) 2006-08-02
US20060181282A1 (en) 2006-08-17
DE602004011938T2 (de) 2009-02-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition