CN1813196A - 电子元件中基准电压的自测试的方法和电路装置 - Google Patents
电子元件中基准电压的自测试的方法和电路装置 Download PDFInfo
- Publication number
- CN1813196A CN1813196A CN200480017699.7A CN200480017699A CN1813196A CN 1813196 A CN1813196 A CN 1813196A CN 200480017699 A CN200480017699 A CN 200480017699A CN 1813196 A CN1813196 A CN 1813196A
- Authority
- CN
- China
- Prior art keywords
- ref
- reference voltage
- test
- value
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 51
- 238000000034 method Methods 0.000 title claims abstract description 6
- 238000005070 sampling Methods 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007620 mathematical function Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3004—Current or voltage test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16547—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies voltage or current in AC supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Control Of Electrical Variables (AREA)
- Measurement Of Current Or Voltage (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (2)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03101869.0 | 2003-06-25 | ||
EP03101869 | 2003-06-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1813196A true CN1813196A (zh) | 2006-08-02 |
CN100430738C CN100430738C (zh) | 2008-11-05 |
Family
ID=33522399
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004800176997A Expired - Fee Related CN100430738C (zh) | 2003-06-25 | 2004-06-14 | 用于电子元件中基准电压的自测试的方法和电路装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7183773B2 (zh) |
EP (1) | EP1642143B1 (zh) |
JP (1) | JP2007516414A (zh) |
CN (1) | CN100430738C (zh) |
AT (1) | ATE386945T1 (zh) |
DE (1) | DE602004011938T2 (zh) |
WO (1) | WO2004113938A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102435818A (zh) * | 2011-11-24 | 2012-05-02 | 福州大学 | 高精度动态比较器的测试方法及测试电路 |
CN103837766A (zh) * | 2013-10-30 | 2014-06-04 | 惠阳东美音响制品有限公司 | 一种连接电子组件的接点的自动搜寻方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH565468A5 (zh) * | 1973-01-31 | 1975-08-15 | Bbc Brown Boveri & Cie | |
DE4439707A1 (de) * | 1994-11-05 | 1996-05-09 | Bosch Gmbh Robert | Spannungsreferenz mit Prüfung und Eigenkalibrierung |
US20030018937A1 (en) * | 2001-07-18 | 2003-01-23 | Athavale Atul S. | Method and apparatus for efficient self-test of voltage and current level testing |
-
2004
- 2004-06-14 WO PCT/IB2004/050897 patent/WO2004113938A1/en active IP Right Grant
- 2004-06-14 CN CNB2004800176997A patent/CN100430738C/zh not_active Expired - Fee Related
- 2004-06-14 DE DE602004011938T patent/DE602004011938T2/de not_active Expired - Lifetime
- 2004-06-14 EP EP04736785A patent/EP1642143B1/en not_active Expired - Lifetime
- 2004-06-14 JP JP2006516685A patent/JP2007516414A/ja not_active Withdrawn
- 2004-06-14 AT AT04736785T patent/ATE386945T1/de not_active IP Right Cessation
- 2004-06-14 US US10/562,075 patent/US7183773B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102435818A (zh) * | 2011-11-24 | 2012-05-02 | 福州大学 | 高精度动态比较器的测试方法及测试电路 |
CN103837766A (zh) * | 2013-10-30 | 2014-06-04 | 惠阳东美音响制品有限公司 | 一种连接电子组件的接点的自动搜寻方法 |
CN103837766B (zh) * | 2013-10-30 | 2019-06-11 | 惠阳东美音响制品有限公司 | 一种连接电子组件的接点的自动搜寻方法 |
Also Published As
Publication number | Publication date |
---|---|
CN100430738C (zh) | 2008-11-05 |
EP1642143B1 (en) | 2008-02-20 |
ATE386945T1 (de) | 2008-03-15 |
WO2004113938A1 (en) | 2004-12-29 |
EP1642143A1 (en) | 2006-04-05 |
US7183773B2 (en) | 2007-02-27 |
JP2007516414A (ja) | 2007-06-21 |
US20060181282A1 (en) | 2006-08-17 |
DE602004011938D1 (de) | 2008-04-03 |
DE602004011938T2 (de) | 2009-02-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: NXP CO., LTD. Free format text: FORMER OWNER: KONINKLIJKE PHILIPS ELECTRONICS N.V. Effective date: 20071012 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20071012 Address after: Holland Ian Deho Finn Applicant after: NXP B.V. Address before: Holland Ian Deho Finn Applicant before: Koninklijke Philips Electronics N.V. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: KALAI HANXILE CO., LTD. Free format text: FORMER OWNER: KONINKL PHILIPS ELECTRONICS NV Effective date: 20120113 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120113 Address after: American Delaware Patentee after: Callehan Tiele Co.,Ltd. Address before: Holland Ian Deho Finn Patentee before: NXP B.V. |
|
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20081105 |