CN1813195A - 用于在电子元件中自测试参考电压的方法和电路装置 - Google Patents

用于在电子元件中自测试参考电压的方法和电路装置 Download PDF

Info

Publication number
CN1813195A
CN1813195A CN200480018060.0A CN200480018060A CN1813195A CN 1813195 A CN1813195 A CN 1813195A CN 200480018060 A CN200480018060 A CN 200480018060A CN 1813195 A CN1813195 A CN 1813195A
Authority
CN
China
Prior art keywords
reference voltage
vienna
bridge
test
robinson
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN200480018060.0A
Other languages
English (en)
Other versions
CN100430737C (zh
Inventor
M·卡德纳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN1813195A publication Critical patent/CN1813195A/zh
Application granted granted Critical
Publication of CN100430737C publication Critical patent/CN100430737C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16547—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies voltage or current in AC supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G01R17/14—AC or DC measuring bridges with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)

Abstract

提供一种用于在电子元件中自测试参考电压的方法，通过该方法规定了一种能够以片上测试的形式来实现参考电压自测试的电路装置，即，对于片上测试，不需要任何地外部参考电压源，并且规定：将参考电压(Uref)馈送到压控振荡器，该压控振荡器的输出形成维也纳－鲁滨逊电桥的输入，在相位检测器中就维也纳－鲁滨逊电桥的输出信号相对于维也纳－鲁滨逊电桥的输入的相移而检查维也纳－鲁滨逊电桥的输出信号，以便检查维也纳－鲁滨逊电桥的平衡，维也纳－鲁滨逊电桥被设置成：在为该参考电压选定的额定值(Uref.tast)下在该振荡器中生成的频率(Ωref.tast)下达到平衡，如果该电桥达到平衡，就产生通过信号，否则，就产生失败信号。

Description

用于在电子元件中自测试参考电压的方法和电路装置
本发明涉及一种用于在电子元件中自测试参考电压的方法和电路装置。
在生产过程中，以及当在野外操作时，需要对集成电路进行测试以确保它们正确运行。由于使用外部测试装置存在许多缺点，假定必须与每个芯片单独建立接触，并且在运行条件下随后也不能对芯片进行测试，因此在芯片自身中建立测试电路已成为惯例。这种测试方法以名为BIST(嵌入式自测试)的方法为公众所知。BIST为芯片给出一种用于识别故障的闭环程序。
该电路常配有内部调节的电压源，该电压源被用作与属于该电路的集成电路内的电压或电流进行比较的参考电压的源。这些参考电压源预计是尽可能地对温度以及来自外部电源设备的电压波动的影响不敏感。为了能够进行测试来检查这些条件是否得到满足，已知的方式是把来自这种电源的参考电压与外部参考电压相比较。这还具有上述已经针对BIST描述的缺点，即当芯片在野外运行时，必须从外部与其进行接触，这就牵扯到数量不同寻常的电路和费用。
本发明的一个目的是定义一种电路装置，用于将参考电压的自测试作为片上(on-chip)测试来实现，即对于这种测试不需任何外部参考电压源。
根据本发明，依赖权利要求1和2的特征来实现该目的。
在这些权利要求之下，参考电压被馈送到压控振荡器，该压控振荡器的输出形成维也纳-鲁滨逊(Wien-Robinson)电桥的输入，在相位检测器中就维也纳-鲁滨逊电桥的输出信号相对于维也纳-鲁滨逊电桥的输入的相移而检查维也纳-鲁滨逊电桥的输出信号，以便检查维也纳-鲁滨逊电桥的平衡。该电桥被设置成在该振荡器中为该参考电压选定的额定值下具有零相移的频率时达到平衡。当这种状态存在时，该相位检测器产生通过信号，如果不存在，则产生失败信号。
一种相关联的电路装置具有压控振荡器，该压控振荡器的输出电压被馈送给维也纳-鲁滨逊电桥，该维也纳-鲁滨逊电桥的输出构成相位检测器的输入。
参考以下描述的实施例，对本发明的这些和其它方面进行描述，并且本发明的这些和其它方面就变得清楚明白。
附图中：
图1是示出了自测试原理的电路框图。
图2示出了维也纳-鲁滨逊电桥的构造。
根据本发明的片上参考测试是基于一种测量频率的维也纳-鲁滨逊电桥W的。为了使要从参考电压Uref产生的给定频率的电压能够得到测试，使用压控振荡器0来从参考电压Uref产生要加以测试的频率fx～。来自该振荡器的频率fx～对输入电压的依赖必须是明确的，毫无歧义的。然后，通过相位检测器P对维也纳-鲁滨逊电桥的输出a与b互相之间进行比较。
控制维也纳-鲁滨逊电桥的平衡状态的条件是：
R 3 ( R 0 - j 1 wC 0 ) = R 2 ( 1 1 R 1 jwC 1 )
当该电桥达到平衡时，该电桥的输出电压的相位具有零交叉。因此，维也纳-鲁滨逊电桥中的电阻R0、R1、R2、R3以及其中的电容C0、C1的值要被选择成：使得相移在为参考电压Uref选择的额定值Uref.test下为零。该相位检测器接着检查维也纳-鲁滨逊电桥的两个输出a和b之间的相移。根据结果，可以对已经测试的参考电压Uref的正确性做出评述。
除了依赖要测试的参考电压Uref以外，该结果仅仅依赖于该振荡器和维也纳-鲁滨逊中的元件的值，这些元件的值可以通过一次校准来设置。因此，该测试独立于外部参考电压。
                            参考字符表：
Uref                       参考电压
W                           维也纳-鲁滨逊电桥
a                           维也纳-鲁滨逊电桥的输出
b                           维也纳-鲁滨逊电桥的输出
0                           振荡器
P                           相位检测器
失败                        信号
通过                        信号
Rn                          电阻
Cn                          电容
fx～                       频率

Claims (2)

1.一种用于在电子元件中自测试参考电压的方法，其特征在于：该参考电压(Uref)被馈送到压控振荡器，该压控振荡器的输出形成维也纳-鲁滨逊电桥的输入，在相位检测器中就维也纳-鲁滨逊电桥的输出信号相对于维也纳-鲁滨逊电桥的输入的相移而检查维也纳-鲁滨逊电桥的输出信号，以检查维也纳-鲁滨逊电桥的平衡，该维也纳-鲁滨逊电桥被设置成：在为该参考电压选定的额定值(Uref，test)下在该振荡器中所生成的频率(Ωref，test)下达到平衡，如果该电桥达到平衡，就产生通过信号，否则，就产生失败信号。
2.一种用于在电子元件中自测试参考电压(Uref)的电路装置，其特征在于：该电路装置具有压控振荡器，该压控振荡器的输出电压被馈送给维也纳-鲁滨逊电桥，该维也纳-鲁滨逊电桥的输出构成相位检测器的输入，该维也纳-鲁滨逊电桥被设置成：在为该参考电压选定的额定值(Uref.test)下在该振荡器中生成的频率(Ωref，test)下达到平衡，如果超出阈值，该相位检测器的输出产生失败信号，否则产生通过信号。
CNB2004800180600A 2003-06-25 2004-06-17 用于在电子元件中自测试参考电压的方法和电路装置 Expired - Fee Related CN100430737C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP03101870 2003-06-25
EP03101870.8 2003-06-25

Publications (2)

Publication Number Publication Date
CN1813195A true CN1813195A (zh) 2006-08-02
CN100430737C CN100430737C (zh) 2008-11-05

Family

ID=33522400

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2004800180600A Expired - Fee Related CN100430737C (zh) 2003-06-25 2004-06-17 用于在电子元件中自测试参考电压的方法和电路装置

Country Status (7)

Country Link
US (1) US7394239B2 (zh)
EP (1) EP1642142B8 (zh)
JP (1) JP2007516416A (zh)
CN (1) CN100430737C (zh)
AT (1) ATE344461T1 (zh)
DE (1) DE602004003065T2 (zh)
WO (1) WO2004113937A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105988038A (zh) * 2015-03-06 2016-10-05 龙芯中科技术有限公司 芯片压降的测量装置及方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0611332D0 (en) * 2006-06-08 2006-07-19 Elektromotive Ltd Charging station
JP2016212512A (ja) * 2015-04-30 2016-12-15 富士通株式会社 ストレージシステム、制御装置および制御プログラム
DE102017201303A1 (de) * 2017-01-27 2018-08-02 Robert Bosch Gmbh Schaltung und Verfahren zur Überwachung einer Versorgungsspannung
JP6979413B2 (ja) * 2017-10-27 2021-12-15 ローム株式会社 監視装置及びこれを用いた電源システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2326470C2 (de) * 1973-05-24 1982-09-16 Deutsche Babcock Ag, 4200 Oberhausen Rollenquetschmühle
CA2113492A1 (en) * 1994-01-14 1995-07-15 Donald W. Church Apparatus and method for identifying metallic tokens and coins
US5611239A (en) * 1994-09-21 1997-03-18 Magnetrol International Inc. Microwave point instrument with self-test circuit
DE4439707A1 (de) * 1994-11-05 1996-05-09 Bosch Gmbh Robert Spannungsreferenz mit Prüfung und Eigenkalibrierung

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105988038A (zh) * 2015-03-06 2016-10-05 龙芯中科技术有限公司 芯片压降的测量装置及方法
CN105988038B (zh) * 2015-03-06 2019-02-15 龙芯中科技术有限公司 芯片压降的测量装置及方法

Also Published As

Publication number Publication date
ATE344461T1 (de) 2006-11-15
EP1642142B8 (en) 2007-05-09
EP1642142B1 (en) 2006-11-02
DE602004003065T2 (de) 2009-01-29
US20070216395A1 (en) 2007-09-20
US7394239B2 (en) 2008-07-01
WO2004113937A8 (en) 2007-03-01
EP1642142A1 (en) 2006-04-05
CN100430737C (zh) 2008-11-05
JP2007516416A (ja) 2007-06-21
DE602004003065D1 (de) 2006-12-14
WO2004113937A1 (en) 2004-12-29

Similar Documents

Publication Publication Date Title
US6118293A (en) High resolution (quiescent) supply current system (IDD monitor)
US8686798B2 (en) Method and system for testing oscillator circuit
KR101224251B1 (ko) 반도체 장치 및 그 검사 방법
Devarayanadurg et al. Dynamic test signal design for analog ICs
CN1813195A (zh) 用于在电子元件中自测试参考电压的方法和电路装置
Saikiran et al. Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection
US5973571A (en) Semiconductor integrated circuit having a phase locked loop
Roh et al. A comprehensive signature analysis scheme for oscillation-test
US20040239358A1 (en) Output buffer circuit having signal path used for testing and integrated circuit and test method including the same
US20050270054A1 (en) Method and apparatus for iddq measuring
JP5291582B2 (ja) 測定装置、試験システム、および測定方法
US6949946B1 (en) Integrated semiconductor circuit and method for functional testing of pad cells
US7183773B2 (en) Method and circuit arrangement for the self-testing of a reference voltage in electronic components
US6396256B1 (en) Power supply slew time testing of electronic circuits
JP2003130902A (ja) コンデンサのスクリーニング方法およびコンデンサへのバイアス印加回路
Atzema et al. Computer-aided testability analysis for analog circuits
KR100492994B1 (ko) 논리 디바이스 테스트 장치 및 방법
JP2022506169A (ja) 車両用の制御機器の過電圧保護回路、車両用の制御機器および車両用の制御機器の過電圧保護回路のテスト方法
KOLAR et al. The test bed for investigation of the machine tools’ auxiliary units’ energy consumption
JPH05273298A (ja) 半導体集積回路装置及びそのテスト方法
Yuan et al. A TDC based BIST scheme for operational amplifier
Tiwari et al. Mixed signal IC (CP-PLL) Testing scheme using a novel approach
Atzema Computer-Aided testability analysis for analog circuits Bert Atzema, Eric Bruls, Manoj Sachdev, Taco Zwemstra Philips Research Laboratories, Eindhoven, The Netherlands
JP2001343435A (ja) 電子回路の検査方法及び検査装置
Cherubal et al. An efficient hierarchical fault isolation technique for mixed-signal boards

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
ASS Succession or assignment of patent right

Owner name: NXP CO., LTD.

Free format text: FORMER OWNER: KONINKLIJKE PHILIPS ELECTRONICS N.V.

Effective date: 20071012

C41 Transfer of patent application or patent right or utility model
TA01 Transfer of patent application right

Effective date of registration: 20071012

Address after: Holland Ian Deho Finn

Applicant after: Koninkl Philips Electronics NV

Address before: Holland Ian Deho Finn

Applicant before: Koninklijke Philips Electronics N.V.

C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20081105

Termination date: 20130617