DE602004003065D1 - Verfahren und schaltungsanordnung zum selbstest einer referenzspannung ins elektronischen komponenten - Google Patents

Verfahren und schaltungsanordnung zum selbstest einer referenzspannung ins elektronischen komponenten

Info

Publication number
DE602004003065D1
DE602004003065D1 DE602004003065T DE602004003065T DE602004003065D1 DE 602004003065 D1 DE602004003065 D1 DE 602004003065D1 DE 602004003065 T DE602004003065 T DE 602004003065T DE 602004003065 T DE602004003065 T DE 602004003065T DE 602004003065 D1 DE602004003065 D1 DE 602004003065D1
Authority
DE
Germany
Prior art keywords
sub
reference voltage
wien
self
bridge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004003065T
Other languages
English (en)
Other versions
DE602004003065T2 (de
Inventor
Martin Kadner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Philips Intellectual Property and Standards GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property and Standards GmbH filed Critical Philips Intellectual Property and Standards GmbH
Publication of DE602004003065D1 publication Critical patent/DE602004003065D1/de
Application granted granted Critical
Publication of DE602004003065T2 publication Critical patent/DE602004003065T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16547—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies voltage or current in AC supplies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10—AC or DC measuring bridges
    • G01R17/14—AC or DC measuring bridges with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
DE602004003065T 2003-06-25 2004-06-17 Verfahren und schaltungsanordnung zum selbstest einer referenzspannung in elektronischen komponenten Expired - Lifetime DE602004003065T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP03101870 2003-06-25
EP03101870 2003-06-25
PCT/IB2004/050927 WO2004113937A1 (en) 2003-06-25 2004-06-17 Method and circuit arrangement for the self-testing of a reference voltage in electronic components

Publications (2)

Publication Number Publication Date
DE602004003065D1 true DE602004003065D1 (de) 2006-12-14
DE602004003065T2 DE602004003065T2 (de) 2009-01-29

Family

ID=33522400

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004003065T Expired - Lifetime DE602004003065T2 (de) 2003-06-25 2004-06-17 Verfahren und schaltungsanordnung zum selbstest einer referenzspannung in elektronischen komponenten

Country Status (7)

Country Link
US (1) US7394239B2 (de)
EP (1) EP1642142B8 (de)
JP (1) JP2007516416A (de)
CN (1) CN100430737C (de)
AT (1) ATE344461T1 (de)
DE (1) DE602004003065T2 (de)
WO (1) WO2004113937A1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0611332D0 (en) * 2006-06-08 2006-07-19 Elektromotive Ltd Charging station
CN105988038B (zh) * 2015-03-06 2019-02-15 龙芯中科技术有限公司 芯片压降的测量装置及方法
JP2016212512A (ja) * 2015-04-30 2016-12-15 富士通株式会社 ストレージシステム、制御装置および制御プログラム
DE102017201303A1 (de) * 2017-01-27 2018-08-02 Robert Bosch Gmbh Schaltung und Verfahren zur Überwachung einer Versorgungsspannung
JP6979413B2 (ja) * 2017-10-27 2021-12-15 ローム株式会社 監視装置及びこれを用いた電源システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2326470C2 (de) * 1973-05-24 1982-09-16 Deutsche Babcock Ag, 4200 Oberhausen Rollenquetschmühle
CA2113492A1 (en) * 1994-01-14 1995-07-15 Donald W. Church Apparatus and method for identifying metallic tokens and coins
US5611239A (en) * 1994-09-21 1997-03-18 Magnetrol International Inc. Microwave point instrument with self-test circuit
DE4439707A1 (de) * 1994-11-05 1996-05-09 Bosch Gmbh Robert Spannungsreferenz mit Prüfung und Eigenkalibrierung

Also Published As

Publication number Publication date
CN1813195A (zh) 2006-08-02
EP1642142B1 (de) 2006-11-02
US20070216395A1 (en) 2007-09-20
WO2004113937A1 (en) 2004-12-29
ATE344461T1 (de) 2006-11-15
EP1642142B8 (de) 2007-05-09
EP1642142A1 (de) 2006-04-05
WO2004113937A8 (en) 2007-03-01
DE602004003065T2 (de) 2009-01-29
CN100430737C (zh) 2008-11-05
JP2007516416A (ja) 2007-06-21
US7394239B2 (en) 2008-07-01

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Legal Events

Date Code Title Description
8332 No legal effect for de
8370 Indication related to discontinuation of the patent is to be deleted
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL

8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN